WO2012115005A1

WO2012115005A1 - Method for inspecting liquid crystal panel, and liquid crystal panel

Info

Publication number: WO2012115005A1
Application number: PCT/JP2012/053813
Authority: WO
Inventors: 悠二郎武田
Original assignee: シャープ株式会社
Priority date: 2011-02-25
Filing date: 2012-02-17
Publication date: 2012-08-30

Abstract

Provided is a liquid crystal panel on which a plurality of inspections can be carried out without using six inspection pads. A liquid crystal panel (100) which is provided with: a matrix region (50) in which a plurality of picture element regions (20) are arranged; and a plurality of signal lines (12) that are arranged so as to perpendicularly intersect a plurality of scan lines (11). The plurality of signal lines (12) include: a first signal line group (12(R)) that passes through a first picture element region (20(R)) that defines red (R); a second signal line group (12(G)) that passes through a second picture element region (20(G)) that defines green (G); and a third signal line group (12(B)) that passes through a third picture element region (20(B)) that defines blue (B). The first signal line group (12(R)) is connected to a first inspection pad (25(R)) via a first short-circuit wire (22(R)); the second signal line group (12(G)) is connected to a second inspection pad (25(G)) via a second short-circuit wire (22(G)); and the third signal line group (12(B)) is connected to a third inspection pad (25(B)) via a third short-circuit wire (22(B)).

Description

Liquid crystal panel inspection method and liquid crystal panel

The present invention relates to a liquid crystal panel inspection method and a liquid crystal panel. In particular, the present invention relates to an inspection method for an array substrate of a liquid crystal panel.
Note that this application claims priority based on Japanese Patent Application No. 2011-39288 filed on Feb. 25, 2011, the entire contents of which are incorporated herein by reference. .

A liquid crystal panel, which is a component of a liquid crystal display device (LCD), has a structure in which a pair of glass substrates are opposed to each other with a predetermined gap secured. In the manufacturing process of the liquid crystal panel, first, the glass substrate on the array side (mother glass) and the glass substrate on the color filter side (mother glass) are processed in separate steps.

On the glass substrate on the array side, the film forming process, the photolithography process, and the etching process are repeated (TFT array process), and after forming a thin film transistor (TFT), a transparent electrode, a wiring connecting them, etc., finally an alignment film Process. The processing on the color filter side is omitted. When entering the cell process, a liquid crystal material is injected through a spacer between the glass substrate on the array side and the glass substrate on the color filter side. Then, after dividing into each panel size, films, such as a polarizing plate, are pasted up. In this way, a liquid crystal panel is manufactured.

There are two functional inspections for the inspection of liquid crystal panels. One is an inspection performed at the end of the array process. This inspection is for inspecting the function and short circuit of the TFT circuit fabricated on the glass substrate. The other is an inspection performed at the end of the cell process. In this inspection, a panel (array substrate) enclosing a liquid crystal is turned on to display a test pattern, thereby confirming the operation state of the panel. This inspection is also called a lighting inspection, and confirms chromaticity, color unevenness, and operation state of the panel.

As described above, when a liquid crystal panel is manufactured, a defect inspection of the liquid crystal panel is performed. The defect inspection of the liquid crystal panel will be described with reference to FIG. 1 (see, for example, Patent Document 1).

FIG. 1 shows an equivalent circuit diagram of the liquid crystal panel 1000. In the liquid crystal panel 1000 shown in FIG. 1, a plurality of scanning signal wirings 11 and image signal wirings 12 are provided in a matrix. A pixel electrode 13 is provided at each intersection of the scanning signal wiring 11 and the image signal wiring 12. A switching transistor (TFT) 14 having a source / drain terminal connected to the pixel electrode 13 and the image signal wiring 12 and a gate terminal connected to the scanning signal wiring 11 is provided. An additional capacitor 16 for holding charges is provided between the pixel electrode 13 and the counter electrode 15.

In such a liquid crystal panel 1000, before connecting a driving circuit (not shown) to the terminals of the scanning signal wiring 11 and the image signal wiring 12, it is inspected whether or not it operates normally. When performing such an inspection, a plurality of scanning signal lines 11 are short-circuited by a short-circuit ring 11a, and a plurality of image signal lines 12 are short-circuited by a short-circuit ring 12a. Then, a full lighting test was performed by supplying the scanning signal V _G and the image signal V _S to the plurality of scanning signal wirings 11 and the plurality of image signal wirings 12.

JP-A-6-82817

In the inspection of the liquid crystal panel (array substrate) 1000, point defects can be inspected with simple inspection wiring and terminals. That is, in the structure 1000 shown in FIG. 1, since all the image signal wirings (source wirings) 12 are short-circuited by the short-circuit ring 12a, all the pixel regions (or sub-pixel regions) are turned on at a time. As a result, point defects can be inspected. However, a predetermined picture element region cannot be turned on, and therefore, the occurrence of source wiring-source wiring (SS) leakage and the inspection of single color unevenness cannot be performed. Therefore, it is possible to inspect point defects (which picture element areas are not lit), but for other inspections (SS leak, single color unevenness), the drive circuit is scanned in the mounting process. Only after connection to the terminals of the signal wiring 11 and the image signal wiring 12 can be carried out.

On the other hand, in order to perform various inspections (point defects, SS leaks, single color unevenness) before connecting the driving circuit to the terminals of the scanning signal wiring 11 and the image signal wiring 12, the source wiring of each column is connected. A structure may be adopted in which each type is bundled and short-circuited and connected to the inspection pad, and the image signal Vs can be supplied to the inspection pad. That is, the source voltage (or image signal) Vs can be applied to all the source wirings 12 so that point defects can be detected, and the source voltage Vs is applied to the adjacent source wirings 12 so that SS leakage can be detected. The structure can be applied. In order to detect single color unevenness, a structure in which the source voltage Vs can be selectively applied to the pixel regions (R (red), G (green), and B (blue)) that define each color is also required. .

FIG. 2 shows a structure of the array substrate 200 capable of executing inspection of point defects, SS leaks, and single color unevenness. In the matrix region 50 in which the pixel regions 20 are arranged in a matrix, source wiring (image signal wiring) 12 is formed so as to extend in the column direction. In the matrix region 50, gate wiring (scanning signal wiring) extending in the row direction is omitted.

In the matrix area 50, the picture element areas 20 are arranged in the order of R, G, B from the left. Each pixel region 20 is formed with a source wiring 12 extending in the column direction. The odd-numbered (Odd) source wiring 12 (o) and the even-numbered (Even) source wiring 12 (e). Are lined up alternately. The odd-numbered pixel region 20 in the matrix region 50 is represented by “Ro”, “Go”, “Bo”, and the even-numbered pixel region 20 is represented by “Re”, “Ge”, “Be”. ".

In the array substrate 200 shown in FIG. 2, a short-circuit wiring for inspection that bundles the source wirings 12 of “Ro”, “Go”, “Bo”, “Re”, “Ge”, and “Be” in the matrix region 50. 22 is formed. An inspection pad 25 is connected to each short-circuit wiring 22. The array substrate 200 can be inspected by applying a source voltage (Vs) to the inspection pad 25.

Here, for example, if the source voltage (Vs) is applied to the inspection pad 25 (Ro), the gate voltage applied to the gate wiring (not shown) is controlled to thereby control the pixel region 20 (Ro). A lighting test can be performed. Then, if the source voltage (Vs) is applied to all the inspection pads 25 (Ro, Go, Bo, Re, Ge, Be), the full lighting inspection can be performed. From this, it is possible to execute an inspection of a pixel area (point defect) that is not lit.

Further, by applying a source voltage to the pad 25 for the source wiring 12 in the adjacent picture element region 20, a leak between the source wiring and the source wiring (SS leak) can be determined. For example, if a source voltage (Vs) is applied to the pad 25 (Ro) and the pad 25 (Ge), the source wiring 12 (o) of the pixel region 20 (Ro) and the source of the pixel region 20 (Ge) It is possible to determine a leak (SS leak) between the wiring 12 (e).

Furthermore, if the picture element region 20 (Ro, Re) that defines a predetermined color (for example, R) is turned on, it is possible to perform a single color unevenness inspection. Specifically, by applying a source voltage to the pads 25 (Ro) and (Re), the matrix region 50 can be brought into the same state as that of red display, and thereby, single-color unevenness can be detected.

In the case of the array substrate 200 shown in FIG. 2, six inspection pads 25 (Ro, Go, Bo, Re, Ge, Be) are required. These six pads 25 are arranged in a non-display area (an area other than the matrix area 50) of the liquid crystal panel. Although the pad 25 has a size of about 1 mm square, it has become difficult to arrange the six pads 25 in the non-display area due to the influence of the narrow frame design in recent years. Further, since the arrangement interval of the six pads 25 is narrow, it may be difficult to bring the inspection terminals into contact with all the pads 25 arranged in the narrow interval.

In addition, the array substrate 200 using the six pads 25 is difficult to arrange the pads 25 and the layout of the short-circuit lines 22 connected to the pads 25 is not simple, so the design of the array substrate 200 is complicated. Become. In recent years, from the viewpoint of cost reduction, a design that is as simple as possible is required rather than a complicated design, and the array substrate 200 has a problem also in this respect.

The present invention has been made in view of such a point, and a main object thereof is to provide a liquid crystal panel capable of performing a plurality of inspections without using six inspection pads and an inspection method thereof.

The liquid crystal panel according to the present invention includes a matrix region in which a plurality of picture element regions are arranged, a plurality of scanning lines in the matrix region, which are arranged in parallel, and arranged orthogonal to the plurality of scanning lines. A plurality of signal lines, wherein the plurality of signal lines are a first signal line group that passes through a first pixel region that defines red and a second signal pixel region that defines blue. Two signal line groups and a third signal line group passing through a third picture element region defining green, and the first signal line group is connected to the first test pad via a first short-circuit wiring. The second signal line group is connected to the second test pad via a second short-circuit wiring, and the third signal line group is connected to the third test pad via a third short-circuit wiring. Has been.

In a preferred embodiment, by applying an inspection signal to the first inspection pad, the second inspection pad, and the third inspection pad, a point defect, a leak between adjacent signal lines, and a single color unevenness A check is performed.

An inspection method according to the present invention is an inspection method for a liquid crystal panel, wherein the liquid crystal panel includes a matrix region in which a plurality of pixel regions are arranged, and a plurality of scanning lines in the matrix region and arranged in parallel. And a plurality of signal lines arranged orthogonally to the plurality of scanning lines, the plurality of signal lines defining a first signal line group passing through a first pixel region defining red, and defining blue A second signal line group passing through the second picture element region, and a third signal line group passing through the third picture element region defining green, the first signal line group passing through the first short-circuit wiring The second signal line group is connected to the second test pad via a second short-circuit wiring, and the third signal line group is connected to the first test pad. Are connected to a third test pad via the first test pad, the second test pad, and the third test pad. By applying a source voltage to the third inspection pad, point defects, leakage between the adjacent signal lines, and performs a test of single-color unevenness.

According to the present invention, the plurality of signal lines include a first signal line group passing through the first pixel region defining red, a second signal line group passing through the second pixel region defining blue, and green. A third signal line group passing through a third pixel region to be defined, the first signal line group being connected to the first inspection pad via a first short-circuit wiring, and the second signal line group being a second short-circuit The third signal line group is connected to the third inspection pad via a third short-circuit wiring. Therefore, by applying an inspection voltage to the first inspection pad, the second inspection pad, and the third inspection pad, it is possible to execute inspection of point defects, leakage between adjacent signal lines, and single-color unevenness. As a result, a liquid crystal panel capable of performing a plurality of tests without using six test pads can be provided.

6 is an equivalent circuit diagram of a liquid crystal panel 1000 disclosed in Patent Document 1. FIG. It is a figure which shows the structure of the liquid crystal panel 200 used as a comparative example. It is a figure which shows the structure of the liquid crystal panel 100 which concerns on embodiment of this invention. It is a figure which shows the structure of the liquid crystal panel 300 used as a comparative example. It is a figure which shows the structure of the liquid crystal panel 400 used as a comparative example. (A) And (b) is a figure for demonstrating the test | inspection method of the liquid crystal panel 100. FIG.

Hereinafter, embodiments of the present invention will be described with reference to the drawings. In the following drawings, components having substantially the same function are denoted by the same reference numerals for the sake of brevity. In addition, this invention is not limited to the following embodiment.

FIG. 3 is a view for explaining the structure of the liquid crystal panel 100 according to the embodiment of the present invention. The liquid crystal panel 100 according to the present embodiment includes a matrix region 50 in which a plurality of pixel regions 20 are arranged, a plurality of scanning lines 11 arranged in parallel, and a plurality of rows arranged orthogonal to the plurality of scanning lines 11. And a signal line 12. The plurality of scanning lines 11 and the plurality of signal lines 12 extend through the matrix region 50.

The matrix region 50 of the present embodiment includes a first pixel region 20 (R) that defines red (R), a second pixel region 20 (G) that defines green (G), and blue (B). The third picture element region 20 (B) is defined. In the configuration of the present embodiment, in the matrix region 50, the first pixel region 20 (R), the second pixel region 20 (G), and the third pixel region 20 (B) are arranged in this order. For the sake of convenience, in FIG. 3, the odd-numbered (odd) pixel region 20 is represented by Ro, Go, or Bo, and the even-numbered (even) pixel region 20 is represented by Re, Ge, or Be.

In the present embodiment, the minimum unit for displaying each color is referred to as “picture element” or “picture element region”, while the minimum unit for performing color display is referred to as “pixel” or “pixel region”. Therefore, in the case of a liquid crystal panel displaying three primary colors of red (R), green (G), and blue (B), the “picture element region” of red (R), green (G), and blue (B) The unit is referred to as a “pixel region”. Here, if the “pixel region” is referred to as a pixel, the “picture element region” may be referred to as a sub-pixel.

In each picture element region 20, a scanning line 11 and a signal line 12 extend. In the example shown in FIG. 3, the scanning line (gate wiring) 11 extends in the row direction and is connected to the gate of a transistor (TFT) 15 formed in each pixel region 20. The signal line (source wiring) 12 extends in the column direction and is connected to the source of a transistor (TFT) 15 formed in each picture element region. The drain of the TFT 15 is connected to the pixel electrode 17.

The signal lines 12 of the present embodiment include a first signal line group 12 (R) that passes through the first pixel region 20 (R) and a second signal line group 12 (G that passes through the second pixel region 20 (G). ) And a third signal line group 12 (B) passing through the third picture element region 20 (B). The first signal line group 12 (R) is connected to the first inspection pad 25 (R) via the first short-circuit wiring 22 (R). The second signal line group 12 (G) is connected to the second inspection pad 25 (G) via the second short-circuit wiring 22 (G). The third signal line group 12 (B) is connected to the third inspection pad 25 (B) via the third short-circuit wiring 22 (B).

In addition, the 1st short circuit wiring 22 (R), the 2nd short circuit wiring 22 (G), and the 3rd short circuit wiring 22 (B) are wiring patterns for a test | inspection. The first short-circuit wiring 22 (R) is a wiring that short-circuits the first signal line group 12 (R) and connects it to the first inspection pad 25 (R). Similarly, the second short-circuit wiring 22 (G) is a wiring that short-circuits the second signal line group 12 (G) and connects it to the second inspection pad 25 (G). The third short-circuit wiring 22 (B) is a wiring that short-circuits the third signal line group 12 (B) and connects it to the third inspection pad 25 (B).

In the liquid crystal panel 100 (especially the array substrate) of the present embodiment, by applying an inspection signal to the first inspection pad 25 (R), the second inspection pad 25 (G), and the third inspection pad 25 (B), Inspection of point defects, leaks between adjacent signal lines 12, and single color unevenness can be performed. Specifically, using an inspection apparatus provided with a probe (contact terminal) that can contact the first inspection pad 25 (R), the second inspection pad 25 (G), and the third inspection pad 25 (B), The probe is brought into contact with the first test pad 25 (R), the second test pad 25 (G), and the third test pad 25 (B) to conduct.

In the case of the configuration of this embodiment, when a voltage (source voltage for inspection: Vs) is applied to the first inspection pad 25 (R), the second inspection pad 25 (G), and the third inspection pad 25 (B), a picture is displayed. Since all of the elementary regions 20 (20 (R), 20 (G), 20 (B)) are lit, point defects can be inspected.

Further, when a voltage (Vs) is applied to the first test pad 25 (R) and the second test pad 25 (G), the first pixel region 20 (R) and the second pixel region 20 (G) are adjacent to each other. Therefore, a leak between adjacent signal lines 12, that is, a leak between the first signal line 12 (R) and the second signal line 12 (G) can be inspected.

Similarly, when a voltage (Vs) is applied to the second inspection pad 25 (G) and the third inspection pad 25 (B), the second pixel region 20 (G) and the third pixel region 20 (B) Since they are adjacent to each other, a leak between the adjacent signal lines 12, that is, a leak between the second signal line 12 (G) and the third signal line 12 (B) can be inspected. Further, when a voltage (Vs) is applied to the third inspection pad 25 (B) and the first inspection pad 25 (R), the third pixel region 20 (B) and the first pixel region 20 (R) are adjacent to each other. Therefore, the leak between the third signal line 12 (B) and the first signal line 12 (R) can be inspected.

In addition, when the voltage (Vs) is selectively applied to the first inspection pad 25 (R), the first pixel region 20 (R) can be selectively lit, so that the single color unevenness (red unevenness) is reduced. An inspection can be performed. Similarly, when the voltage (Vs) is selectively applied to the second inspection pad 25 (G), the second picture element region 20 (G) can be selectively lit, so that the single color unevenness (green unevenness) is reduced. An inspection can be performed. Further, when the voltage (Vs) is selectively applied to the third inspection pad 25 (B), the third pixel region 20 (B) can be selectively lit, so that the inspection of the single color unevenness (blue unevenness) is performed. Can be executed.

Therefore, according to the configuration of the present embodiment, three inspection pads 25 (25 (R), 25 (G), 25 (B)) are used to perform three types of inspections (point defects, SS leaks, single color unevenness). ) Can be provided. Therefore, in the configuration of the present embodiment, three types of inspection (point defect, SS leak, single color unevenness) were performed with six inspection pads as shown in FIG. It is possible to execute with the inspection pad 25, and as a result, three types of inspection can be executed with a simple configuration.

FIG. 4 is a diagram showing the structure of a liquid crystal panel 300 as a comparative example. In the structure shown in FIG. 4, all the signal lines 12 are connected to the test pad 25 (All) via the short-circuit wiring 22. In this comparative example 300, a point defect can be inspected by applying an inspection signal to the inspection pad 25 (All). However, the inspection of leaks between adjacent signal lines 12 and single-color unevenness cannot be performed.

Next, FIG. 5 is a diagram showing a structure of a liquid crystal panel 400 as a comparative example. In the structure shown in FIG. 5, the odd-numbered signal line 12 (o) is connected to the test pad 25 (o) via the short-circuit wiring 22 (o). On the other hand, the even-numbered signal line 12 (e) is connected to the test pad 25 (e) via the short-circuit wiring 22 (e). Therefore, in this comparative example 400, not only point defects but also leaks between adjacent signal lines 12 are inspected by applying an inspection signal to the inspection pads 25 (o) and / or 25 (e). be able to. However, in this comparative example 400, since monochrome display cannot be performed, it is not possible to perform inspection for monochrome unevenness.

As described above, in order to execute three types of inspection (point defect, SS leak, single color unevenness), as shown in FIG. 2, six inspection pads are required. In the configuration, three types of inspection (point defect, SS leak, single color unevenness) can be executed by the three inspection pads 25 (25 (R), 25 (G), 25 (B)). In the configuration using the six test pads 25, it is difficult to cope with the narrowing of the frame of the liquid crystal panel, and there is a problem in design difficulty and cost because the structure of the test wiring is complicated. On the other hand, in the configuration 100 of this embodiment, since only three test pads 25 are used, it is easy to cope with the narrowing of the frame of the liquid crystal panel, and the design is easy and the cost is reduced. Can do.

FIG. 6A is a diagram for explaining the execution of the SS leak inspection and the single color unevenness inspection in the liquid crystal panel 100 of the present embodiment. The source applied to each pixel region 20 is shown in FIG. The state of the voltage Vs (inspection signal) is shown.

The liquid crystal panel 100 shown in FIG. 6A shows a state where a red (R) single color display is performed. In the liquid crystal panel 100 according to the present embodiment, each single color display of red (R), green (G), and blue (B) can be performed, so that a single color unevenness inspection can be performed. Here, the source voltage (+) indicates, for example, + 5V and the source voltage (−) indicates, for example, −5V, but is not limited thereto.

The liquid crystal panel 100 shown in FIG. 6B shows a state in which SS leak inspection is being performed. Here, for example, an SS leak between the red (R) column and the green (G) column is inspected. Note that the application state of the left red row (R1) and the right red row (R2) is the same as the state shown in FIG. 6 (a). And the green row | line | column (G1, G2) adjacent to them (R1, R2) is made into the antiphase. In this state, if the SS leak is inspected, if a leak occurs, an inspection result of 0 V (or a value close thereto) will be obtained.

As mentioned above, although this invention has been demonstrated by suitable embodiment, such description is not a limitation matter and, of course, various modifications are possible.

According to the present invention, it is possible to provide a liquid crystal panel capable of performing a plurality of inspections (three types of inspections) without using six inspection pads, and an inspection method thereof.

11 Scanning line (scanning signal wiring, gate wiring)
11a Shorting ring 12 Signal line (image signal wiring, source wiring)
12a Short-circuit ring 13 Pixel electrode 15 Counter electrode 16 Additional capacitance 17 Pixel electrode 20 Pixel region 22 Short-circuit wiring 25 Inspection pad 50 Matrix region 100 Liquid crystal panel 200 Liquid crystal panel 300 Liquid crystal panel 400 Liquid crystal panel 1000 Liquid crystal panel

Claims

A matrix region in which a plurality of pixel regions are arranged; and
A plurality of scanning lines arranged in parallel in the matrix region;
A plurality of signal lines arranged orthogonal to the plurality of scanning lines, and a liquid crystal panel comprising:
The plurality of signal lines are:
A first signal line group passing through a first pixel region defining red;
A second signal line group passing through the second pixel region defining green;
A third signal line group passing through a third pixel region defining blue, and
The first signal line group is connected to a first inspection pad via a first short-circuit wiring,
The second signal line group is connected to a second inspection pad via a second short-circuit wiring,
The liquid crystal panel, wherein the third signal line group is connected to a third inspection pad via a third short-circuit wiring.
By applying inspection signals to the first inspection pad, the second inspection pad, and the third inspection pad, inspection of point defects, leakage between adjacent signal lines, and single-color unevenness is executed. The liquid crystal panel according to claim 1, which is characterized.
An inspection method for a liquid crystal panel,
The liquid crystal panel is
A matrix region in which a plurality of pixel regions are arranged; and
A plurality of scanning lines arranged in parallel in the matrix region;
A plurality of signal lines arranged orthogonal to the plurality of scanning lines, and
The plurality of signal lines are:
A first signal line group passing through a first pixel region defining red;
A second signal line group passing through the second pixel region defining green;
A third signal line group passing through a third pixel region defining blue, and
The first signal line group is connected to a first inspection pad via a first short-circuit wiring,
The second signal line group is connected to a second inspection pad via a second short-circuit wiring,
The third signal line group is connected to a third inspection pad via a third short-circuit wiring,
An inspection method for inspecting point defects, leakage between adjacent signal lines, and single-color unevenness by applying inspection signals to the first inspection pad, the second inspection pad, and the third inspection pad. .