JP2010164714A - Display, inspecting device, and inspection method - Google Patents

Abstract

<P>PROBLEM TO BE SOLVED: To provide a display, an inspection device, and an inspection method with a simple configuration excellent in manufacturing efficiency and capable of detecting leak current with a high degree of precision. <P>SOLUTION: A liquid crystal panel 1 comprises: a drive substrate and a counter substrate facing each other; an electric optical material enclosed between the drive substrate and the counter substrate; a plurality of source lines S and a plurality of gate lines G that are disposed on the drive substrate and intersect each other; pixel electrodes PE that are disposed at points where the source lines S and the gate lines G intersect, and applies charge input from the source line to the electric optical material; a TFT12 that switches the state of the charge application from the source line S to the pixel electrode PE according to a drive signal input from the gate line G; a plurality of common electrode lines that are disposed on the counter substrate and connected to the pixel electrodes PE; and a plurality of common electrode inspection lines that divide the plurality of the common electrode lines into two or more phases and connect the common electrode lines of each phase. <P>COPYRIGHT: (C)2010,JPO&INPIT

Description

  The present invention relates to a display body that displays an image, an inspection apparatus that inspects a line-to-line leak defect in the display body, and an inspection method thereof.

  2. Description of the Related Art Conventionally, inspection apparatuses and inspection methods for inspecting display abnormalities in a display body such as a liquid crystal panel are known. (For example, see Patent Documents 1 to 3).

  In Patent Document 1, the liquid crystal panel includes a plurality of signal electrodes and a plurality of scanning electrodes. When the liquid crystal panel is inspected, the signal electrode is brought into contact with the signal electrode conductive member, and the scan electrode is brought into contact with the scan electrode conductive member, so that each signal electrode and each scan electrode are short-circuited. In this state, a predetermined drive voltage is applied to all the signal lines to display, for example, a white or black image, and defects in the display area are detected by observing the image visually or by imaging with a camera. To do.

  In Patent Document 2, the liquid crystal panel includes a plurality of gate bus lines and a plurality of source bus lines, and each gate bus line and each source bus line are provided in the inspection apparatus when performing inspection by the inspection apparatus. Connect to the inspection terminal. In this inspection apparatus, the terminals connecting the gate bus lines are separated into odd and even numbers, connected by common wiring, connected to the corresponding inspection terminals, and the terminals connected to the source bus lines are common. Connected by wiring and connected to a predetermined inspection terminal. Then, a predetermined voltage is sequentially applied to the inspection terminals connected to these common wires to detect leak defects.

  In Patent Document 3, a configuration is adopted in which a plurality of video signal wirings (source lines) are connected on a liquid crystal display panel by common bus wirings corresponding to respective colors (RGB). In addition, the leak defect is detected by bringing the terminal of the inspection device into contact with the end of the common bus wiring. In addition, in this liquid crystal display panel, after the defect detection is completed, only the display area is cut by laser cutting to produce a product.

JP-A-9-329799 JP-A-7-294374 Japanese Patent Laid-Open No. 9-185072

By the way, in the inspection apparatus and the inspection method as described in Patent Document 1, the defect inspection is performed by short-circuiting all the signal electrodes and the scanning electrodes divided into two or more phases by a conductive member. Yes. Such an inspection method has a problem that it is difficult to detect when there is a leak between adjacent pixels or between wirings.
On the other hand, the inspection apparatus and inspection method described in Patent Document 2 can detect leakage between pixels and between wirings, but each inspection terminal is brought into contact with each terminal of the gate bus line and the source bus line. It is necessary to connect, the configuration of the inspection apparatus becomes complicated, an expensive apparatus is required, and the required alignment accuracy for accurately bringing the terminals into contact with each other increases.
In addition, the method described in Patent Document 3 has a problem that a manufacturing process is increased because a cutting process by laser cutting is required after the inspection.

  In view of the above-described problems, an object of the present invention is to provide a display body, an inspection apparatus, and an inspection method that have good manufacturing efficiency and can accurately detect a leak current with a simple configuration.

  The display according to the present invention includes a drive substrate and a counter substrate facing each other, an electro-optical material sealed between the drive substrate and the counter substrate, and a plurality of source lines provided on the drive substrate and orthogonal to each other And a plurality of gate lines, a plurality of pixel electrodes provided in the vicinity of intersections of the plurality of source lines and the plurality of gate lines, and applying a charge output to the source lines to the electro-optic material, A switching element that is connected to the gate line, the source line, and the pixel electrode, and that switches a charge application state from the source line to the pixel electrode in accordance with a gate signal input from the gate line; A plurality of common electrode lines connected to the pixel electrode and a plurality of the common electrode lines are divided into two or more phases and provided on the counter substrate. A plurality of common electrodes test line for connecting the common electrode line, respectively, characterized by comprising a.

According to the present invention, the common electrode line is divided into a plurality of phases in the display body. Such a display uses probe bumps that collectively short-circuit each source line and each gate line at the time of inspection of leakage current, and displays a test image by applying a predetermined test voltage to these probe bumps. Thus, the pixel defect in the display area can be easily inspected. Also, only each gate line is short-circuited at once with probe bumps, the source line is opened, and the common electrode inspection line corresponding to the common electrode line connected to the source line to be inspected via the pixel electrode is supplied with current, for example. A detecting means for detecting leakage current such as a meter is connected. And an alternating voltage is applied to another common electrode test | inspection line, and the electric current which flows into a detection means is test | inspected. By performing such an inspection method, it is possible to easily inspect the leakage current generated between the source lines. Even in this case, each gate line may be a simple wiring that is simply short-circuited by a probe bump or the like, so in the inspection apparatus, a connection terminal for connecting each gate line is unnecessary, and the configuration of the inspection apparatus can be simplified. The leakage current can be inspected by an easy inspection method.
In addition, each source line and gate line is not configured to be divided into multiple phases and connected, but each is provided on the driving substrate alone, so that a cutting process such as laser cutting is not required after the defect inspection is completed. The manufacturing process can be simplified.

  In the display of the present invention, the source line includes an R source line to which a red source signal is input, a G source line to which a green source signal is input, and a B source line to which a blue source signal is input. The common electrode line includes an R common electrode line, a G common electrode line, and a B common electrode line, which are provided corresponding to each color source line, and the common electrode inspection line includes the R common electrode lines, the G common electrode lines, and the G common electrode lines. It is preferable to connect the common electrode lines and the B common electrode lines, respectively.

  According to this invention, each common electrode line corresponding to each color source line is connected by the common electrode inspection line. For this reason, at the time of the inspection of the display body, it is possible to inspect the leakage current between lines for each color, and the inspection efficiency can be improved.

  The inspection apparatus according to the present invention includes a drive substrate and a counter substrate facing each other, an electro-optical material sealed between the drive substrate and the counter substrate, and a plurality of source lines provided on the drive substrate and orthogonal to each other. And a plurality of gate lines, a plurality of pixel electrodes provided in the vicinity of intersections of the plurality of source lines and the plurality of gate lines, and applying a charge output to the source lines to the electro-optic material, A switching element that is connected to the gate line, the source line, and the pixel electrode, and that switches a charge application state from the source line to the pixel electrode in accordance with a gate signal input from the gate line; A plurality of common electrode lines provided on the counter substrate and connected to the pixel electrodes and a plurality of the common electrode lines are divided into two or more phases. An inspection apparatus for inspecting a leak defect in a display body comprising a plurality of common electrode inspection lines that respectively connect the common electrode lines of a phase, wherein the plurality of the contacted plurality are in contact with the plurality of gate lines And the gate probe connected to the gate inspection terminal and a plurality of the source lines are short-circuited, and the contacted source lines are collectively short-circuited and connected to the source inspection terminal. A source probe, a plurality of common electrode probes connected to each common electrode inspection line and connected to a common electrode inspection terminal, and a connection state between the source probe and the source line at least of disconnection and connection A source connection switching means for switching to either one of the common electrode inspection terminals other than the inspection target among the common electrode inspection terminals. Characterized by comprising an AC voltage application means for applying, and a current detecting means for detecting a leakage current flowing through the common electrode test terminal to be tested.

  In addition, the inspection method of the present invention includes a plurality of drive substrates and counter substrates facing each other, an electro-optic material sealed between the drive substrates and the counter substrate, and a plurality of orthogonally provided to the drive substrates. A source line and a plurality of gate lines; and a plurality of pixel electrodes provided in the vicinity of intersections of the plurality of source lines and the plurality of gate lines to apply the charge output to the source lines to the electro-optic material A switching element connected to the gate line, the source line, and the pixel electrode, and switching a charge application state from the source line to the pixel electrode according to a gate signal input from the gate line; A plurality of common electrode lines provided on the counter substrate and connected to the pixel electrodes, and the plurality of common electrode lines are divided into two or more phases, An inspection method for inspecting a leak defect in a display body comprising a plurality of common electrode inspection lines respectively connecting the common electrode lines of each phase, and a plurality of gate probes connected to a gate inspection terminal The gate lines are brought into contact with each other, the plurality of contacted gate lines are collectively short-circuited, and the source probes connected to the source inspection terminals are separated from the plurality of source lines so that the respective source lines are in an open state. A common electrode probe connected to an electrode inspection terminal is connected to each common electrode inspection line, and among the common electrode inspection terminals, an AC voltage is applied to a common electrode inspection terminal other than the inspection target, and the common electrode to be inspected A leak current flowing through the inspection terminal is detected.

  According to these inventions, as in the case of the above-described invention, when the display body is inspected, the connection between the source inspection terminal and the source line is disconnected, and the common electrode inspection line other than the inspection object is common among the plurality of common electrode inspection lines. By applying an AC voltage to the electrode inspection terminal and inspecting the leakage current flowing through the common electrode inspection terminal to be inspected by the current detection means, it is not necessary to provide a complicated connection terminal in the inspection apparatus, and it is easy with a simple configuration In addition, the presence or absence of a leakage current defect can be inspected with high accuracy.

  Hereinafter, a liquid crystal panel which is a display according to an embodiment of the present invention and an inspection apparatus for inspecting a leak defect of the liquid crystal panel will be described with reference to the drawings.

[Configuration of LCD panel]
FIG. 1 is a diagram showing a schematic configuration of a liquid crystal panel according to an embodiment of the present invention.
In FIG. 1, reference numeral 1 denotes a liquid crystal TFT (Thin Film Transistor) panel 1 (hereinafter referred to as a liquid crystal panel 1) constituting the display body of the present invention. The liquid crystal panel 1 is based on an input signal. This is a device that displays a color image by mixing, for example, red (R), green (G), and blue (B) as basic colors. In this embodiment, an amorphous TFT panel in which amorphous silicon is used as a liquid crystal that is an electro-optic material is exemplified. For example, an LTPS-TFT panel (Low-Temperature Poly-Silicon TFT) A TFT in which polysilicon is used as the liquid crystal may be used, such as an HTPS-TFT panel (High Temperature Poly-Sillicon TFT). Moreover, although the liquid crystal panel 1 was illustrated as a display body, it is not limited to this, For example, display panels, such as an OLED panel (Organic Light Emitting Diode: organic EL) which employ | adopted organic substances, such as diamine and anthracene, as an electro-optical material are used. Can also be used.

  Although this liquid crystal panel 1 omits detailed drawings, a pair of transparent substrates (a driving substrate and a counter substrate) opposed to each other in a housing and a spacer that divides the transparent substrates into a plurality of regions are provided. A pixel 11 is formed in a region surrounded by the pair of transparent substrates and spacers. Here, in the liquid crystal panel 1, pixels 11 that develop a single basic color (R, G, B) are arranged along the column direction, and these pixels 11 are R, G, B along the row direction. It is arranged repeatedly in the order of arrangement. Specifically, a deflection filter (not shown) that transmits only a light beam having a wavelength corresponding to the basic color of each pixel 11 is provided facing the liquid crystal panel 1. Thereby, in each pixel 11, only the light beam of the basic color that has passed through the deflection filter is transmitted.

A plurality of gate lines G and source lines S (S1, S2, S3,... Sn) orthogonal to each other are arranged on the drive substrate. The gate line G is divided into, for example, horizontal left and right (left and right in FIG. 1) of the liquid crystal panel 1. Specifically, the gate line G includes an L gate line Gl (Gl1, Gl2, Gl3...) Whose signal input terminal is provided on the left side, and an R gate line Gr (Gr1, Gr2, Gr3) whose signal input terminal is provided on the right side. …). The L gate line Gl and the R gate line Gr are wired along the horizontal direction as shown in FIG. 1, and the L gate line G11, the R gate line Gr1, and the L gate are arranged along the vertical direction orthogonal to the horizontal direction. The lines G12,... Are alternately arranged. The source line S is wired along the vertical direction. Here, the source line S corresponds to each color pixel of R, G, R source lines (S1, S4, S7... Sn) to which a red image signal is input, and G source lines (S2) to which a green image signal is input. , S5, S8... Sn + 1) and a B source line (S3, S6, S9... Sn + 2) to which a blue image signal is input, are alternately arranged in the order of R source line, G source line, and B source line. Yes. In the following description, the R source line is referred to as R source line Sr, the G source line is referred to as G source line Sg, and the B source line is referred to as B source line Sb.
Further, ring transistors (RingTr) are respectively connected to the terminal portions of the source lines S and the gate lines G, and, for example, R common electrode inspection lines 14r (G common electrode inspection lines 14g and B common) are connected via the ring transistors. It may be an electrode inspection line 14b). Here, the ring transistor removes static electricity generated in the circuit and performs electrostatic protection processing, and also maintains a constant amount of current flowing through the gate line G and the source line S. Thereby, excessive current passage to the gate line G and the source line S is suppressed, and power consumption can be reduced. Further, the ring transistor has a characteristic that the current is allowed to pass as the potential difference between the connection portions sandwiching the ring transistor is larger, and when the potential difference is small, the current is hardly allowed to pass, and the inconvenience such as the backflow of the current is prevented.

In the vicinity of each intersection of the gate line G and the source line S, a pixel electrode PE for applying a voltage to the liquid crystal cell LV constituting the pixel is formed. These pixel electrodes PE are formed of, for example, an ITO (Idium Tin Oxide) film or the like.
In addition, a TFT as a switching element that connects each source line S and each pixel electrode PE to the drive substrate and switches the application state of the voltage to the pixel electrode PE according to the voltage output to the gate line. (Thin Film Transistor) 12 is provided. These TFTs 12 include a gate connected to the gate line G, a source connected to the source line S, and a drain connected to the pixel electrode PE.

When an on voltage (for example, +15 V) is applied to the TFT 12 from a driver (not shown) that drives the liquid crystal panel 1 or a later-described inspection device via the gate line G, the TFT 12 is turned on (the source and drain are connected). A low impedance state) and current conduction between the source and drain is allowed. In this state, when a video signal is applied to the source from the driver or the inspection apparatus 2 via the source line S, the charge related to the video signal is conducted between the source and the drain, and the pixel electrode PE connected to the drain. To be applied.
On the other hand, when an off voltage (for example, −10 V) is applied to the gate from the driver or the inspection apparatus 2 via the gate line G, the TFT 12 is turned off (a high impedance state between the source and the drain), and between the source and the drain. Current conduction is regulated. Therefore, even when a charge related to the video signal is applied to the source line S connected to the source, the current does not conduct between the source and the drain, and the application of the charge to the pixel electrode PE is restricted.

  The pixel electrode PE is connected to the liquid crystal cell LV and is connected to the holding capacitor CV. This holding capacitor CV is intended to suppress the amplitude of the voltage required for driving the liquid crystal panel 1 to be low, and to save power and prevent flicker of the liquid crystal panel 1. The liquid crystal cell LV and the holding capacitor CV are connected not only to the pixel electrode PE but also to the counter electrode of the counter substrate. In the liquid crystal cell LV and the holding capacitor CV, a charge corresponding to the potential difference between the voltage applied to the pixel electrode PE from the source line S via the TFT 12 and the voltage applied to the counter electrode is written. Retained.

  Each of the pixels 11 includes a TFT 12, a pixel electrode PE, a liquid crystal cell LV, and a holding capacitor CV, and the display area of the liquid crystal panel 1 is configured by all these pixels 11.

  Further, the liquid crystal cell LV and the holding capacitor CV connected to the pixel electrode PE are connected to a common electrode line formed on the counter electrode. The common electrode line corresponds to each source line S, that is, one common electrode line is provided for one source line. Here, the R common electrode line (R common electrode line 13r) with respect to the R source line Sr, the G color common electrode line (G common electrode line 13g) with respect to the G source line Sg, and the B with respect to the B source line Sb. A common electrode line (B common electrode line 13b) is provided. Each R common electrode line 13r is connected to an R common electrode inspection line 14r, for example, at a panel end edge, and this R common electrode inspection line 14r is connected to an R common electrode terminal VcomR. Similarly, each G common electrode line 13g is connected to a G common electrode inspection line 14g, for example, at a panel end edge, and this G common electrode inspection line 14g is connected to a G common electrode terminal VcomG. Each B common electrode line 13b is connected to a B common electrode inspection line 14b, for example, at a panel end edge, and the B common electrode inspection line 14b is connected to a B common electrode terminal VcomB.

[Configuration of inspection equipment]
Next, based on FIG. 2 and FIG. 3, the structure of the test | inspection apparatus 2 which test | inspects the said liquid crystal panel 1 is demonstrated.
FIG. 2 is a block diagram showing a schematic configuration of an inspection apparatus according to an embodiment of the present invention.
FIG. 3 is a diagram illustrating a schematic configuration of a connection portion of the inspection apparatus.
The inspection apparatus 2 applies a predetermined voltage to the source line S, the gate line G, and the common electrode line of the liquid crystal panel 1 to drive the liquid crystal panel 1, for example, a line leak defect that occurs in a part of the liquid crystal panel 1. It is a device that detects defects such as.
As shown in FIG. 2, the inspection apparatus 2 includes a connection unit 21, a drive unit 22, a measurement unit 23, and a control unit 24.

As shown in FIG. 3, the connection unit 21 includes a connection substrate 211. On the connection substrate 211, an L gate connection unit 212A, an R gate connection unit 212B, a source connection unit 212C, an R common electrode connection unit 212D, A G common electrode connection portion 212E and a B common electrode connection portion 212F are provided.
In the L gate connection portion 212A, gate terminals formed at the tips of the L gate lines Gl are alternately arranged in a staggered manner, for example, as shown in FIG. The L gate connection section 212A includes an L gate probe 213A that contacts each gate terminal of the arranged L gate line Gl and short-circuits it at once. The L gate probe 213A is connected to the L gate inspection terminal GLc.
The R gate connection portion 212B is similar to the L gate connection portion 212A, and the gate terminals of the R gate lines Gr are arranged in a staggered manner as shown in FIG. The R gate connection portion 212B includes an R gate probe 213B connected to the R gate inspection terminal GRc, and the gate terminals of the R gate line Gr are collectively short-circuited by the R gate probe 213B.

Further, the source connection portion 212C is configured in substantially the same manner as the L gate connection portion 212A and the R gate connection portion 212B. That is, in the source connection section 212C, source lines S are alternately arranged in a staggered manner, and source probes 213C that can contact the source lines S and can be short-circuited together and connected to the source inspection terminal Sc are provided. Yes. This source probe 213C is provided so as to be movable toward and away from each source terminal of the source line S arranged at the source connection portion 212C. The moving mechanism of the source probe 213C is not particularly limited. For example, a configuration in which the source probe 213C is driven in a direction away from or in the vicinity of the connection substrate 211 by a driving force generated by a driving generation unit such as a motor. It can be illustrated.
The source connection unit 212C includes probe control means 214 that controls the source probe 213C. The probe control unit 214 controls the drive generation unit based on the control signal output from the control unit 24 to drive the source probe 213C. Thereby, the probe control means 214 switches the connection state in which the source probe 213C and the source terminal are in contact and the disconnected state in which the source probe 213C and the source terminal are separated from each other.

An R common electrode terminal VcomR formed at the tip of the R common electrode inspection line 14r is disposed in the R common electrode connection portion 212D. The R common electrode connection portion 212D includes an R common electrode probe 213D that contacts the R common electrode terminal VcomR and is connected to the R common electrode inspection terminal VcomRc.
The same applies to the G common electrode connection portion 212E and the B common electrode connection portion 212F. The G common electrode connection portion 212E and the B common electrode connection portion 212F are provided with the G common electrode terminal VcomG and the B common electrode terminal VcomB, respectively. Is done. The G common electrode connection portion 212E includes a G common electrode probe 213E that contacts the G common electrode terminal VcomG and is connected to the G common electrode inspection terminal VcomGc. The B common electrode connection portion 212F includes a B common electrode probe 213F that contacts the B common electrode terminal VcomB and is connected to the B common electrode inspection terminal VcomBc.

  Further, the L gate inspection terminal GLc, the R gate inspection terminal GRc, the source inspection terminal Sc, the R common electrode inspection terminal VcomRc, the G common electrode inspection terminal VcomGc, and the B common electrode inspection terminal VcomBc described above are as shown in FIG. These are connected to the drive unit 22 and the measurement unit 23 through switches, respectively.

The drive unit 22 applies a predetermined voltage to each inspection terminal of the connection unit 21 to drive the liquid crystal panel 1. Moreover, the drive part 22 comprises the alternating voltage application means of this invention with the drive voltage control means 242 of the control part 24, and applies an alternating voltage to a predetermined common electrode test | inspection terminal.
The measurement unit 23 includes, for example, a plurality of ammeters connected to the respective inspection terminals, and detects currents input from the respective inspection terminals of the connection unit 21. The measuring unit 23 constitutes a current measuring unit of the present invention.

The control unit 24 includes drive switching means 241, drive voltage control means 242, defect detection means 243, and result output means 244.
The drive switching unit 241 switches the inspection mode of the liquid crystal panel 1. Specifically, the drive switching unit 241 switches the inspection mode to one of the pattern display mode and the inter-line leak inspection mode, for example, by an operator setting input. Here, the pattern display mode is a mode in which a predetermined drive voltage is applied to the source line S and the gate line G to display a predetermined pattern image on the liquid crystal panel 1. Further, the inter-line leak inspection mode is a mode in which, for example, a inter-line leak defect generated between adjacent source lines S is detected based on a current measured by the measurement unit 23. Further, the drive switching unit 241 outputs a control signal to the probe control unit 214 in the inter-line leak inspection mode, and separates the source probe 213C from the source inspection terminal Sc so as to be in a disconnected state.

The drive voltage control unit 242 controls the voltage applied from the drive unit 22 to each inspection terminal, and drives the liquid crystal panel 1.
Specifically, the drive voltage control unit 242 applies a voltage having a pattern as shown in FIG. 4 when the drive switching unit 241 switches to the pattern display mode. FIG. 4 is a diagram illustrating a voltage application pattern and timing in the pattern display mode. Note that the liquid crystal panel 1 in the present embodiment is normally white, and transmits light from a light source such as a backlight as it is when no driving voltage is applied and no charge is accumulated in the liquid crystal cell LV. It is assumed that white light is developed.

That is, when displaying a gray image on the liquid crystal panel 1, the drive voltage control unit 242 applies an alternating voltage (pattern C) in which voltages of 0 V and 5 V are alternately switched at a predetermined cycle to the source inspection terminal Sc, An alternating voltage (pattern D) having an opposite phase to the pattern A is applied to the common electrode inspection terminals VcomRc, VcomGc, and VcomBc.
Further, the drive voltage control unit 242 applies 15 V, which is an on-voltage, to the L gate inspection terminal GLc at the timing when the signal voltage of 5 V is applied to the source inspection terminal Sc (timing T1 in FIG. 2). At this time, −10 V, which is an off voltage, is applied to the R gate inspection terminal GRc. In addition, as shown in FIG. 4, the period during which the on-voltage is applied is a slight period that is sufficiently small with respect to the cycle of the alternating voltage, and after the on-voltage is applied, the voltage to the source inspection terminal Sc is switched to 0V. Before switching to off voltage. In addition, after the signal voltage of the source inspection terminal Sc is switched to 0V, the drive voltage control unit 242 applies an ON voltage to the R gate inspection terminal GRc at timing T2. At this time, the L gate inspection terminal GLc holds a voltage of −10 V, which is an off signal. Note that the input period of the on-voltage applied to the R gate inspection terminal GRc is also set to a slight period sufficiently small with respect to the cycle of the AC voltage. That is, the drive voltage control unit 242 holds the charge based on the drive signal (5V) in the liquid crystal cell LV of the pixel 11 controlled by the L gate line Gl at the timing T1, and the R gate line Gr at the timing T2. The charge stored in the liquid crystal cell LV of the pixel 11 to be controlled is discharged. Thereby, a gray image is displayed only by the pixel 11 corresponding to the L gate line of the liquid crystal panel 1.

The drive voltage control unit 242 opens a predetermined period Tm after displaying the gray image only on the pixel 11 corresponding to the L gate line Gl, and displays the gray image only on the pixel 11 corresponding to the R gate line Gr. Take control. For this purpose, an operation opposite to the timings T1 and T2 is performed at the timings T3 and T4.
That is, the driving voltage control unit 242 applies the 0V to the source inspection terminal Sc and applies the arbitrary voltage (0 to 5v) to the common electrode inspection terminals VcomRc, VcomGc, and VcomBc at the timing T3. An on-voltage is applied to. During this time, the R gate inspection terminal GRc is held at the off voltage. Further, the drive voltage control unit 242 applies an on-voltage to the R gate inspection terminal GRc after the voltage applied to the source inspection terminal Sc is switched to 5V. During this time, the L gate inspection terminal GLc is held at the off voltage.
As described above, in the liquid crystal panel 1, it is possible to display gray images alternately between the pixels 11 connected to the L gate line Gl and the pixels 11 connected to the R gate line Gr.

  Further, when displaying a basic color image on the liquid crystal panel 1, the drive voltage control means 242 applies an AC voltage having the same pattern C as the source inspection terminal Sc to the common electrode inspection terminal corresponding to the basic color to be displayed. Then, an alternating voltage of pattern D having an opposite phase to the alternating voltage of pattern C is applied to the other common electrode inspection terminal. For example, when a red image is displayed on the liquid crystal panel 1, the drive voltage control means 242 uses the pattern C AC voltage, the G common electrode inspection terminals VcomGc and B common to the source inspection terminal Sc as in the case of displaying the gray image. An AC voltage of pattern D is applied to the electrode inspection terminal VcomBc, a driving voltage of pattern A is applied to the L gate inspection terminal GLc, and a driving voltage of pattern B is applied to the R gate inspection terminal GRc. On the other hand, the drive voltage control unit 242 applies an AC voltage having the same pattern C as that of the source inspection terminal Sc to the R common electrode inspection terminal VcomRc. As described above, in the liquid crystal panel 1, it is possible to display red images alternately between the pixels 11 connected to the L gate line Gl and the pixels 11 connected to the R gate line Gr.

Further, the drive voltage control means 242 drives the liquid crystal panel 1 at the timing shown in FIG. 5 in the line leakage inspection mode. FIG. 5 is a diagram showing a voltage application pattern and a detected current in the line leakage inspection mode.
In this line leakage inspection mode, when the line switching leakage inspection mode is set by the drive switching means 241, the source inspection terminal Sc and the source probe are disconnected, so that the source inspection terminal Sc is in an open state and is always 0V. Become. In the line leakage inspection mode, as shown in FIG. 5, the drive voltage control unit 242 continues to apply an ON voltage of 15 V to the L gate inspection terminal GLc and the R gate inspection terminal GRc. Further, the drive voltage control means 242 applies an AC voltage to the common electrode inspection terminal other than the common electrode inspection terminal corresponding to the common electrode line connected to the source line S to be inspected.
For example, when inspecting a leak between lines leaking to the G source line Sg from another source line S adjacent to the G source line Sg, the drive voltage control means 242 includes the R common electrode inspection terminal VcomRc and the B common electrode inspection. An AC voltage is applied to the terminal VcomBc. In this case, charge and discharge are repeated in the liquid crystal cell Lv or the holding capacitor CV connected to the R source line Sr or the B source line Sb. Therefore, when line-to-line leakage occurs, current flows into the G source line Sg when the charge is discharged in the liquid crystal cell Lv or the holding capacitor CV, and the “common” in FIG. Is detected. On the other hand, when there is no line-to-line leakage, no current is detected at the G common electrode inspection terminal VcomGc as shown by “non-defective product” in FIG.

The defect detection unit 243 reads a current value measured by the measurement unit 23 when the line switching inspection mode is selected by the drive switching unit 241, and leaks to the common electrode inspection line to be inspected. It is determined whether or not there is a leak defect.
Specifically, as indicated by “defective” in FIG. 5, the defect detection unit 243 determines that there is a line-to-line leak when a periodic current value is detected, and “good” in FIG. 5. If the current value is not detected as indicated by, it is determined that there is no line-to-line leak defect.

  The result output unit 244 outputs the presence / absence of a leak defect determined by the defect detection unit 243. Specifically, the result output unit 244 displays the presence / absence of a leak defect on a display unit (not shown) provided in the inspection apparatus 2. The result output unit 244 may output the presence / absence of the leak defect in other manners. For example, the result output unit 244 outputs the data to a storage medium as data, prints, or informs the presence / absence of the leak defect by voice. You may do it.

[Operation of inspection equipment]
Next, operation | movement of the inspection apparatus 2 mentioned above is demonstrated based on drawing.
In the inspection method using the inspection apparatus 2, the inspection apparatus 2 recognizes the current inspection mode, outputs a drive signal corresponding to the inspection mode to the liquid crystal panel 1, and performs defect inspection processing.

(Pattern display mode)
FIG. 6 is a flowchart of the pattern display mode in the operation of the inspection apparatus.
When the inspection apparatus 2 is requested to set the pattern display mode as the inspection mode, for example, by an operator setting input, the drive switching unit 241 switches the inspection mode to the pattern display mode (step S101).
In this pattern display mode, the drive switching unit 241 controls the probe control unit 214 to bring the source probe 213C into contact with the source line S to be in a connected state (step S102).

Thereafter, the drive voltage control unit 242 controls the drive unit 22 to apply a pattern voltage as shown in FIG. 4 to each inspection terminal (step S103).
That is, in the case of displaying a gray image, the drive voltage control unit 242 applies an AC voltage of the pattern C to the source inspection terminal Sc, and a pattern having an opposite phase to the pattern C to each common electrode inspection terminal VcomRc, VcomGc, VcomBc. An AC voltage of D is applied. Then, the drive voltage of the pattern A is applied to the L gate inspection terminal GLc, and the drive voltage of the pattern B is applied to the R gate inspection terminal GRc.
When displaying red, green, and blue images, the drive voltage control unit 242 applies the AC voltage of the pattern C to the common electrode inspection terminal corresponding to the display target basic color. For example, in the case of displaying a red image, the drive voltage control unit 242 applies an AC voltage of the pattern C to the source inspection terminal Sc, and has an opposite phase to the pattern C to the G common electrode inspection terminal VcomGc and the B common electrode inspection terminal VcomBc. An alternating voltage of pattern D is applied, and an alternating voltage of pattern C is applied to the R common electrode inspection terminal VcomRc. Then, the drive voltage of the pattern A is applied to the L gate inspection terminal GLc, and the drive voltage of the pattern B is applied to the R gate inspection terminal GRc.
Thereby, the pixels 11 controlled by the L gate line Gl and the pixels 11 controlled by the R gate line Gr of the liquid crystal panel 1 are alternately driven, and a pattern image is displayed on the liquid crystal panel 1 (step S104). .
In such a pattern display image, for example, when there is a leak defect between the pixels 11 adjacent in the vertical direction, the adjacent pixels are also driven and displayed by, for example, a bright spot. Accordingly, it is possible to easily determine the inter-pixel leak defect by visually confirming the liquid crystal panel 1 or by imaging with an imaging means such as a camera.

[Line leak inspection mode]
Next, the line leak inspection mode in the operation of the inspection apparatus 2 will be described. FIG. 7 is a flowchart of the line-to-line leak inspection mode in the operation of the inspection apparatus according to the present embodiment.

When the inspection apparatus 2 is requested to set the inter-line leak inspection mode as the inspection mode, for example, by an operator setting input, the drive switching unit 241 switches the inspection mode to the inter-line leak inspection mode ( Step S201).
In this line-to-line leak inspection mode, the drive switching unit 241 controls the probe control unit 214 to move the source probe 213C in a direction away from the source line S to be in a disconnected state (step S202).

Thereafter, the drive voltage control unit 242 controls the drive unit 22 to apply a pattern voltage as shown in FIG. 5 to each inspection terminal (step S203). At this time, the common electrode inspection terminal corresponding to the source line S to be inspected is connected to the measurement unit 23 by switching processing.
For example, as shown in FIG. 5, when measuring the leakage current flowing into the G source line Sg, the G common electrode inspection terminal VcomGc is connected to the measurement unit 23. Then, the drive voltage control unit 242 applies an ON voltage to the L gate inspection terminal GLc and the R gate inspection terminal GRc, and applies an AC voltage to the R common electrode inspection terminal VcomRc and the B common electrode inspection terminal VcomBc.

Further, the defect detection means 243 determines whether or not a leakage current flowing through the measurement unit 23 has been detected by the process of step S203 (step S204). In step S204, if a current having a waveform corresponding to the AC voltage applied to the common electrode inspection terminal is detected, it is determined that there is a line-to-line leak defect (step S205). On the other hand, if no current value is detected in step S204, it is determined that there is no line leakage defect (step S206).
Then, the result output unit 244 causes the display unit to display the inspection result of the line-to-line leak defect in step S205 and step S206 (step S207).

[Effects of the present embodiment]
As described above, the liquid crystal panel 1 divides the common electrode lines provided corresponding to the source lines S for each basic color and connects them with the common electrode inspection lines.
In general, a liquid crystal panel having a high resolution has a large number of gate lines G and source lines S. For example, even in a QVGA (Quarter Video Graphics Array) having a small image size, 320 gate lines and 720 lines (240 × 3). However, in the configuration in which the probe is connected to each of the gate line G and the source line S, the configuration becomes complicated and the cost increases. On the other hand, in the liquid crystal panel 1, at the time of inspection, the entire gate line G is divided into two types, an L gate line and an R gate line, and an L gate probe 213A and an R gate line that collectively short-circuit the L gate line Gl. Since the R gate probe 213B that collectively short-circuits Gr and the source probe 213C that collectively short-circuits all the source lines S are used, the probe configuration can be simplified and the cost of the inspection apparatus 2 can be reduced.
Further, even in such a configuration in which each gate line G and each source line S are short-circuited together, the voltage applied to the common electrode inspection terminal connected to the common electrode inspection line divided into a plurality of phases is shown in FIG. By controlling as shown in FIG. 5, it is possible to perform inspection of pixel defects such as inter-pixel leakage and inspection of inter-line leakage defects.
In addition, since each gate line G and each source line S are wired independently in the liquid crystal panel 1, after the defect inspection of the liquid crystal panel 1 is completed, only the display area portion of the liquid crystal panel 1 is subjected to laser cutting or the like. There is no need to cut, and it can be incorporated into the module as it is.
As described above, since the cutting step of the liquid crystal panel 1 is unnecessary, the pixel-to-pixel leak defect and the line-to-line leak defect are accurately detected in the liquid crystal panel 1 with a simple and inexpensive probe configuration without reducing the manufacturing efficiency. be able to.

  The liquid crystal panel 1 is divided into an R common electrode inspection line 14r, a G common electrode inspection line 14g, and a B common electrode inspection line 14b corresponding to each basic color. For this reason, when the inspection mode of the liquid crystal panel 1 is set to the pattern display mode, as shown in FIG. 4, among the common electrode inspection terminals, the common electrode terminal corresponding to the basic color to be displayed is connected to the source inspection terminal. By applying an alternating voltage of the same pattern C to Sc, a pattern image corresponding to the basic color can be easily displayed, and an inter-pixel leak defect can be inspected for each basic color. The same applies to the inter-line leak inspection mode, and inter-line leak defects can be inspected for each source line S corresponding to each basic color. Therefore, when there is a leak defect, it is possible to easily detect a pixel position or a line having a defect, and to improve detection accuracy.

Further, the inspection apparatus 2 includes a source probe 213C provided so as to be movable toward and away from each source line S. When the inspection mode is switched by the drive switching unit 241, the probe control unit 214 is controlled to move the source probe 213C. That is, the drive switching unit 241 switches the source probe 213C and each source line S to the connected state in the pattern display mode, and switches the source probe 213C and each source line S to the disconnected state in the inter-line leak inspection mode.
For this reason, in the pattern display mode, by applying a driving voltage from the source line S to each pixel 11, the liquid crystal panel 1 can be driven to display a predetermined pattern image. In the line-to-line leak inspection mode, the source probe 213C and each source line are disconnected, an AC voltage is applied to the common electrode inspection terminal, and charge is charged in the liquid crystal cell LV and the holding capacitor CV of each pixel 11. Further, by performing the discharge, it is possible to easily inspect the leak between lines flowing through the source line S to be inspected.

  The gate line G includes an L gate line Gl and an R gate line Gr. The L gate line Gl contacts the L gate probe 213A and is connected to the L gate inspection terminal GLc. The R gate line Gr is an R gate probe. Is connected to the R gate inspection terminal GRc. For this reason, in the pattern display mode, the pixel 11 controlled by the L gate line Gl of the liquid crystal panel 1 and the R gate line are switched by alternately switching the drive voltage applied to the L gate inspection terminal GLc and the R gate inspection terminal GRc. The pixels 11 controlled by Gr can be driven alternately. Therefore, by observing whether or not inconveniences such as bright spots appear in the pixels 11 that are not driven, pixel defects such as inter-pixel leakage can be easily inspected, and inspection accuracy can be improved.

[Other Embodiments]
It should be noted that the present invention is not limited to the above-described embodiments, and modifications, improvements, and the like within the scope that can achieve the object of the present invention are included in the present invention.

  For example, in the above, the gate line G includes the L gate line Gl and the R gate line Gr, and is configured to be connected to the L gate inspection terminal GLc and the R gate inspection terminal GRc by a probe. Further, it may be configured such that three or more probes are connected to different gate inspection terminals GL. The same applies to the source line S, and the source probe 213C that short-circuits all the source lines S is illustrated. However, the source line S is divided into two or more groups, and one group includes One source probe and the second group may be in contact with the other group.

  In the above embodiment, the common electrode line is divided into three phases corresponding to each basic color. However, the common electrode line may be divided into two phases, or may be divided into four or more layers.

  In addition, the specific structure and procedure for carrying out the present invention can be appropriately changed to other structures and the like within a range in which the object of the present invention can be achieved.

It is a figure which shows schematic structure of the liquid crystal panel which concerns on one embodiment of this invention. It is a block diagram showing a schematic structure of an inspection device of one embodiment concerning the present invention. It is a figure which shows schematic structure of the connection part of a test | inspection apparatus. It is a figure which shows the application pattern and timing of a voltage in pattern display mode. It is a figure which shows the voltage application pattern and the detected electric current in line | wire leak test | inspection mode. It is a flowchart of the pattern display mode in operation | movement of the test | inspection apparatus of this Embodiment. It is a flowchart in the line | wire leak test | inspection mode in operation | movement of the test | inspection apparatus of this Embodiment.

  DESCRIPTION OF SYMBOLS 1 ... Liquid crystal panel as a display body, 2 ... Inspection apparatus, 12 ... TFT as switching element, 13r ... R common electrode line, 13g ... G common electrode line, 13b ... B common electrode line, 14r ... R common electrode inspection line , 14 g... G common electrode inspection line, 14 b... B common electrode inspection line, 22... Drive unit constituting AC voltage application means, 23... Measurement part as current detection means, 213 A. 213C ... source probe, 213D ... R common electrode probe, 213E ... G common electrode probe, 213F ... B common electrode probe, 214 ... probe control means as source connection switching means, 242 ... driving voltage constituting AC voltage application means Control means, S ... source line, Sr ... R source line, Sg ... G source line, Sb ... B source line, G ... gate line, PE ... image Electrode.

Claims (4)

A drive substrate and a counter substrate facing each other;
An electro-optic material encapsulated between the drive substrate and the counter substrate;
A plurality of source lines and a plurality of gate lines provided on the driving substrate and orthogonal to each other;
A plurality of pixel electrodes provided in the vicinity of intersections of the plurality of source lines and the plurality of gate lines, and applying an electric charge output to the source lines to the electro-optic material;
A switching element that is connected to the gate line, the source line, and the pixel electrode, and switches a charge application state from the source line to the pixel electrode in accordance with a gate signal input from the gate line;
A plurality of common electrode lines provided on the counter substrate and connected to the pixel electrodes;
Dividing the plurality of common electrode lines into two or more phases, and connecting a plurality of common electrode inspection lines for connecting the common electrode lines of each phase;
The display body characterized by comprising. The display body according to claim 1,
The source line includes an R source line to which a red source signal is input, a G source line to which a green source signal is input, and a B source line to which a blue source signal is input.
The common electrode line includes an R common electrode line, a G common electrode line, and a B common electrode line, which are respectively provided corresponding to the color source lines.
The display body, wherein the common electrode inspection line connects R common electrode lines, G common electrode lines, and B common electrode lines. A driving substrate and a counter substrate facing each other, an electro-optical material sealed between the driving substrate and the counter substrate, a plurality of source lines and a plurality of gate lines provided on the driving substrate and orthogonal to each other; A plurality of pixel electrodes provided in the vicinity of intersections of the plurality of source lines and the plurality of gate lines and applying an electric charge output to the source lines to the electro-optic material; the gate lines; the source lines; And a switching element that is connected to the pixel electrode and switches a charge application state from the source line to the pixel electrode in accordance with a gate signal input from the gate line, and is provided on the counter substrate, A plurality of common electrode lines connected to the pixel electrode and a plurality of the common electrode lines are divided into two or more phases, and the common electrode lines of each phase Each An inspection apparatus for inspecting the leak defects in the display body which is provided with a plurality of common electrodes test line for connecting the,
A gate probe connected to the gate inspection terminal, in contact with a plurality of the gate lines, and collectively short-circuiting the contacted gate lines,
A source probe connected to a plurality of the source lines and short-circuiting the contacted source lines together and connected to a source inspection terminal;
A plurality of common electrode probes connected to each common electrode inspection line and connected to a common electrode inspection terminal;
Source connection switching means for switching the connection state between the source probe and the source line to at least one of disconnection and connection;
Among the common electrode inspection terminals, AC voltage application means for applying an AC voltage to the common electrode inspection terminals other than the inspection target,
Current detection means for detecting a leakage current flowing through the common electrode inspection terminal to be inspected;
An inspection apparatus comprising: A driving substrate and a counter substrate facing each other, an electro-optical material sealed between the driving substrate and the counter substrate, a plurality of source lines and a plurality of gate lines provided on the driving substrate and orthogonal to each other; A plurality of pixel electrodes provided in the vicinity of intersections of the plurality of source lines and the plurality of gate lines and applying an electric charge output to the source lines to the electro-optic material; the gate lines; the source lines; And a switching element that is connected to the pixel electrode and switches a charge application state from the source line to the pixel electrode in accordance with a gate signal input from the gate line, and is provided on the counter substrate, A plurality of common electrode lines connected to the pixel electrode and a plurality of the common electrode lines are divided into two or more phases, and the common electrode lines of each phase Each An inspection method for inspecting the leak defects in the display body which is provided with a plurality of common electrodes test line for connecting the,
A gate probe connected to a gate inspection terminal is brought into contact with a plurality of the gate lines, and the plurality of contacted gate lines are collectively short-circuited,
A source probe connected to a source inspection terminal is separated from a plurality of the source lines to open each source line,
Connect the common electrode probe connected to the common electrode inspection terminal to each common electrode inspection line,
Among the common electrode inspection terminals, an AC voltage is applied to a common electrode inspection terminal other than the inspection target,
An inspection method, comprising: detecting a leak current flowing through the common electrode inspection terminal to be inspected.

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