JP4105284B2 - Vacuum deposition system - Google Patents

Vacuum deposition system Download PDF

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Publication number
JP4105284B2
JP4105284B2 JP12451798A JP12451798A JP4105284B2 JP 4105284 B2 JP4105284 B2 JP 4105284B2 JP 12451798 A JP12451798 A JP 12451798A JP 12451798 A JP12451798 A JP 12451798A JP 4105284 B2 JP4105284 B2 JP 4105284B2
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Japan
Prior art keywords
vacuum film
film forming
plasma
side wall
forming chamber
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP12451798A
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Japanese (ja)
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JPH11315372A (en
Inventor
勝 田中
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Sumitomo Heavy Industries Ltd
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Sumitomo Heavy Industries Ltd
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Publication date
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Priority to JP12451798A priority Critical patent/JP4105284B2/en
Publication of JPH11315372A publication Critical patent/JPH11315372A/en
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Description

【0001】
【発明の属する技術分野】
本発明は、真空成膜装置に関する。さらに詳しくは、パーティクルの飛散を防止するように改良された真空成膜装置に関する。
【0002】
【従来の技術】
一般にプラズマを利用した真空成膜装置として、イオンプレーティング装置やプラズマCVD装置が知られている。そして、イオンプレーティング装置として、例えばアーク放電型プラズマ源である圧力勾配型プラズマ銃あるいはHCDプラズマ銃を用いた装置が知られている。このようなイオンプレーティング装置では、プラズマ源(プラズマビーム発生器)を備えており、真空成膜室中に配置されたハース(陽極)とプラズマ源との間でプラズマビームを生成して、ハース上に載置された蒸着材料を加熱蒸発させている。そして、蒸着材料からの蒸発金属粒子はプラズマビームによってイオン化され、このイオン粒子が負電圧の基板表面に付着して、基板上に膜が形成される。
【0003】
図3を参照して、この種のイオンプレーティング装置について概略説明を行う。このイオンプレーティング装置は、気密性の真空成膜室1を備えており、この真空成膜室1にはガイド筒2を介してプラズマ源(例えば、圧力勾配型プラズマ銃)10が取付けられている。ガイド筒2の外側にはプラズマビームガイド用ステアリングコイル3が配設されている。
【0004】
真空成膜室1内には被処理物体としての基板Bが搬送装置4に支持されて配置されるようになっており、基板Bには負バイアス用の直流電源が接続される。基板Bに対向して真空成膜室1の底面にはハース(陽極)5が配置される。
【0005】
上記のイオンプレーティング装置では、プラズマ源が放電すると、プラズマビームPが生成され、このプラズマビームPはステアリングコイル3にガイドされてハース5に到達する。
ハース5にプラズマビームが与えられると、ハース5に収納された蒸着材料がジュール加熱されて蒸発する。この蒸発金属粒子はプラズマビームPによってイオン化されて、負電圧が印加された基板Bの表面に付着し、基板B上に膜が形成される。
【0006】
なお、プラズマCVD装置では、真空成膜室内が排気されると共に、原料ガス導入口より原料ガスが導入され、プラズマ源よりプラズマビームを発生して陽極に導き、プラズマにより基板に膜が形成されるが、真空成膜室やプラズマ源の構成は実質同一である。
【0007】
【発明が解決しようとする課題】
前記真空成膜装置では、真空成膜室1内で上方に向けて蒸発金属粒子が飛んで、基板Bだけでなく真空成膜室1の側壁表面にも堆積し、その付着物が側壁から剥れて飛散するとパーティクルの原因となって成膜品質を低下させる。また、真空成膜室1の側壁に堆積した付着物を取除くのは多大な労力を必要とし、しかも、操業効率を低下させることになる。
そこで、真空成膜室1の側壁内面に防着板11を設けて、直接、真空成膜室1の側壁内面に付着物が堆積しない様にしている装置もあるが、しかし、付着物は防着板11に堆積し、その付着物が防着板11から剥れて飛散するとパーティクルの原因となって成膜品質を低下させてしまう。
ところで、真空成膜室1の側壁や防着板11へ堆積した付着物の飛散の原因としては、1)膜応力によるもの、2)付着力を越える膜厚となり重くなって落下すること、3)加熱、冷却の繰り返しによる付着力の低下、4)防着板等の熱歪によるもの等が考えられる。とくに、真空成膜室1の側壁のプラズマビーム通過孔の上方は高温になり、加熱、冷却との温度差が大きくなって付着物の飛散が多くなっていた。
【0008】
本発明は、かかる事情に鑑み、真空成膜室の側壁のプラズマビーム通過孔から出る熱を遮断して、前記プラズマビーム通過孔の上方への付着物の飛散を防止し、成膜品質の高い真空成膜装置を提供することを目的とする。
【0009】
【課題を解決するための手段】
請求項1の真空成膜装置は、真空成膜室の側壁に、プラズマ源が取付けられ、該プラズマ源から発生するプラズマビームを前記真空成膜室の底面上の陽極に導き被処理物体表面に膜を形成する真空成膜装置であって、前記真空成膜室の側壁のプラズマビーム通過孔の直近上方に熱シールド板が取付けられていることを特徴とする。
【0010】
請求項1の発明によれば、熱シールド板によって、プラズマビーム通過孔からの熱を遮断して、その上方の側壁や防着板に与える熱量を少なくする。そのため、加熱・冷却の熱サイクルの繰返しや、側壁および防着板の熱による歪が少なくなって、付着物の飛散を防止することができる。
【0011】
【発明の実施の形態】
つぎに、本発明の実施形態を図面に基づき説明する。
図1は本発明の一実施形態に係わる真空成膜装置の縦断面図、図2は図1のII線矢視図である。
【0012】
図1〜2に示す真空成膜装置における、真空成膜室1、ガイド筒2、ステアリングコイル3、搬送装置4、ハース(陽極)5、プラズマ源10などは、図3の従来装置と実質同様である。
本実施形態の真空成膜装置では、つぎの点に特徴がある。すなわち、真空成膜室1の側壁1aおよび防着板11を取付けている場合はその防着板11に、前記ガイド筒2の取付側端部の開口に合わせたプラズマビーム通過孔13が形成されており、その直近上方に熱シールド板12が取付けられている。
この熱シールド板12は、平板状の板で、真空成膜室1の内寸法よりやや短い幅を有している。また、材質は、ステンレス鋼、アルミニウム、銅などの金属が耐熱性があり、ガスを発生しない等の理由で好ましい。
本実施形態では、熱シールド板12によって、プラズマビーム通過孔13からの熱を遮断して、その上方の側壁1aや防着板11に与える熱量を少なくすることができる。そのため、加熱・冷却の熱サイクルの繰返しや、側壁1aおよび防着板11の熱による歪が少なくなって、付着物の飛散を極力防止することができる。よって、成膜品質を高くすることができる。
【0013】
【発明の効果】
請求項1の真空成膜装置によれば、熱シールド板により熱を遮断して、加熱・冷却の熱サイクルの繰返しや、側壁および防着板の熱による歪を少なくして、付着物の飛散を防止し、成膜品質を高くすることができる。
【図面の簡単な説明】
【図1】本発明の一実施形態に係わる真空成膜装置の縦断面図である。
【図2】図1のII−II線矢視図である。
【図3】従来の真空成膜装置の縦断面図である。
【符号の説明】
1 真空成膜室
11 防着板
12 熱シールド板
[0001]
BACKGROUND OF THE INVENTION
The present invention relates to a vacuum film forming apparatus. More specifically, the present invention relates to a vacuum film forming apparatus improved to prevent scattering of particles.
[0002]
[Prior art]
In general, an ion plating apparatus and a plasma CVD apparatus are known as vacuum film forming apparatuses using plasma. As an ion plating apparatus, for example, an apparatus using a pressure gradient plasma gun or an HCD plasma gun, which is an arc discharge plasma source, is known. Such an ion plating apparatus includes a plasma source (plasma beam generator), and generates a plasma beam between a hearth (anode) disposed in a vacuum film forming chamber and the plasma source, thereby generating a hearth. The vapor deposition material placed on top is heated and evaporated. The evaporated metal particles from the vapor deposition material are ionized by the plasma beam, and the ion particles adhere to the negative-voltage substrate surface to form a film on the substrate.
[0003]
With reference to FIG. 3, this kind of ion plating apparatus will be schematically described. The ion plating apparatus includes an airtight vacuum film forming chamber 1, and a plasma source (for example, a pressure gradient plasma gun) 10 is attached to the vacuum film forming chamber 1 through a guide tube 2. Yes. A plasma beam guide steering coil 3 is disposed outside the guide tube 2.
[0004]
A substrate B as an object to be processed is arranged in the vacuum film forming chamber 1 while being supported by the transfer device 4, and a DC power supply for negative bias is connected to the substrate B. A hearth (anode) 5 is disposed on the bottom surface of the vacuum film formation chamber 1 so as to face the substrate B.
[0005]
In the above ion plating apparatus, when the plasma source is discharged, a plasma beam P is generated, and this plasma beam P is guided by the steering coil 3 and reaches the hearth 5.
When a plasma beam is applied to the hearth 5, the vapor deposition material stored in the hearth 5 is Joule-heated and evaporates. The evaporated metal particles are ionized by the plasma beam P, adhere to the surface of the substrate B to which a negative voltage is applied, and a film is formed on the substrate B.
[0006]
In the plasma CVD apparatus, the vacuum film formation chamber is evacuated and a source gas is introduced from a source gas introduction port, a plasma beam is generated from a plasma source and guided to the anode, and a film is formed on the substrate by the plasma. However, the configurations of the vacuum film forming chamber and the plasma source are substantially the same.
[0007]
[Problems to be solved by the invention]
In the vacuum film forming apparatus, the evaporated metal particles fly upward in the vacuum film forming chamber 1 and deposit not only on the substrate B but also on the side wall surface of the vacuum film forming chamber 1, and the adhering matter is peeled off from the side wall. If it is scattered, it causes particles and deteriorates the film formation quality. Further, removing the deposits deposited on the side wall of the vacuum film formation chamber 1 requires a great deal of labor, and further reduces the operation efficiency.
Therefore, there is an apparatus in which a deposition plate 11 is provided on the inner surface of the side wall of the vacuum film forming chamber 1 so that the deposit does not directly deposit on the inner surface of the side wall of the vacuum film forming chamber 1. If the deposits are deposited on the deposition plate 11 and the adhering matter peels off from the deposition plate 11 and scatters, it causes particles and degrades the film formation quality.
By the way, the cause of the scattering of the deposits deposited on the side wall of the vacuum film forming chamber 1 and the deposition preventing plate 11 is 1) due to the film stress, 2) the film thickness exceeding the adhesion force and falling heavy. (1) Decrease in adhesive force due to repeated heating and cooling, (4) Possible due to thermal strain such as adhesion prevention plate. In particular, the temperature above the plasma beam passage hole on the side wall of the vacuum film forming chamber 1 is high, and the temperature difference between heating and cooling becomes large, and the scattered matter increases.
[0008]
In view of such circumstances, the present invention cuts off the heat emitted from the plasma beam passage hole on the side wall of the vacuum film formation chamber, prevents the deposits from scattering above the plasma beam passage hole, and has high film formation quality. An object is to provide a vacuum film forming apparatus.
[0009]
[Means for Solving the Problems]
In the vacuum film forming apparatus according to claim 1, a plasma source is attached to a side wall of the vacuum film forming chamber, and a plasma beam generated from the plasma source is guided to the anode on the bottom surface of the vacuum film forming chamber and is applied to the surface of the object to be processed. A vacuum film forming apparatus for forming a film, wherein a heat shield plate is attached immediately above a plasma beam passage hole on a side wall of the vacuum film forming chamber.
[0010]
According to the first aspect of the present invention, the heat shield plate cuts off the heat from the plasma beam passage hole, thereby reducing the amount of heat applied to the side wall and the deposition preventing plate. Therefore, repetition of heating / cooling thermal cycle and distortion due to heat of the side wall and the deposition preventing plate are reduced, and scattering of deposits can be prevented.
[0011]
DETAILED DESCRIPTION OF THE INVENTION
Next, an embodiment of the present invention will be described with reference to the drawings.
FIG. 1 is a longitudinal sectional view of a vacuum film forming apparatus according to an embodiment of the present invention, and FIG. 2 is a view taken along the line II in FIG.
[0012]
The vacuum film forming chamber 1, the guide tube 2, the steering coil 3, the transfer device 4, the hearth (anode) 5, the plasma source 10 and the like in the vacuum film forming apparatus shown in FIGS. It is.
The vacuum film forming apparatus of this embodiment is characterized by the following points. That is, when the side wall 1a of the vacuum film formation chamber 1 and the deposition plate 11 are attached, a plasma beam passage hole 13 is formed in the deposition plate 11 so as to match the opening at the mounting side end of the guide tube 2. The heat shield plate 12 is attached immediately above.
The heat shield plate 12 is a flat plate and has a width slightly shorter than the internal dimensions of the vacuum film formation chamber 1. The material is preferably a metal such as stainless steel, aluminum or copper because it has heat resistance and does not generate gas.
In the present embodiment, the heat shield plate 12 can block the heat from the plasma beam passage hole 13 and reduce the amount of heat applied to the side wall 1a and the deposition preventing plate 11 thereabove. Therefore, repeated heating / cooling heat cycles and distortion due to heat of the side wall 1a and the deposition preventing plate 11 are reduced, and scattering of deposits can be prevented as much as possible. Therefore, the film formation quality can be increased.
[0013]
【The invention's effect】
According to the vacuum film-forming apparatus of claim 1, the heat is shielded by the heat shield plate, and the repeated heat / cooling heat cycle and the distortion caused by the heat of the side wall and the deposition plate are reduced, and the scattered matter is scattered. Can be prevented, and the film formation quality can be improved.
[Brief description of the drawings]
FIG. 1 is a longitudinal sectional view of a vacuum film forming apparatus according to an embodiment of the present invention.
2 is a view taken along the line II-II in FIG.
FIG. 3 is a longitudinal sectional view of a conventional vacuum film forming apparatus.
[Explanation of symbols]
DESCRIPTION OF SYMBOLS 1 Vacuum film-forming chamber 11 Depositing plate 12 Heat shield plate

Claims (1)

真空成膜室の側壁に、プラズマ源が取付けられ、該プラズマ源から発生するプラズマビームを前記真空成膜室の底面上の陽極に導き被処理物体表面に膜を形成する真空成膜装置であって、
前記真空成膜室の側壁のプラズマビーム通過孔の直近上方に熱シールド板が取付けられている
ことを特徴とする真空成膜装置。
A vacuum film forming apparatus in which a plasma source is attached to a side wall of a vacuum film forming chamber and a plasma beam generated from the plasma source is guided to an anode on the bottom surface of the vacuum film forming chamber to form a film on the surface of an object to be processed. And
A vacuum film forming apparatus, characterized in that a heat shield plate is attached immediately above the plasma beam passage hole on the side wall of the vacuum film forming chamber.
JP12451798A 1998-05-07 1998-05-07 Vacuum deposition system Expired - Fee Related JP4105284B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP12451798A JP4105284B2 (en) 1998-05-07 1998-05-07 Vacuum deposition system

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP12451798A JP4105284B2 (en) 1998-05-07 1998-05-07 Vacuum deposition system

Publications (2)

Publication Number Publication Date
JPH11315372A JPH11315372A (en) 1999-11-16
JP4105284B2 true JP4105284B2 (en) 2008-06-25

Family

ID=14887447

Family Applications (1)

Application Number Title Priority Date Filing Date
JP12451798A Expired - Fee Related JP4105284B2 (en) 1998-05-07 1998-05-07 Vacuum deposition system

Country Status (1)

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Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5951532B2 (en) * 2013-03-12 2016-07-13 住友重機械工業株式会社 Deposition equipment
JP6075814B2 (en) * 2016-03-31 2017-02-08 住友重機械工業株式会社 Film forming apparatus and film forming apparatus chamber

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JPH11315372A (en) 1999-11-16

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