JP2001073115A - Carbon sputtering device - Google Patents
Carbon sputtering deviceInfo
- Publication number
- JP2001073115A JP2001073115A JP24919099A JP24919099A JP2001073115A JP 2001073115 A JP2001073115 A JP 2001073115A JP 24919099 A JP24919099 A JP 24919099A JP 24919099 A JP24919099 A JP 24919099A JP 2001073115 A JP2001073115 A JP 2001073115A
- Authority
- JP
- Japan
- Prior art keywords
- target
- carbon
- earth shield
- sputtering
- substrate
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Abstract
Description
【0001】[0001]
【発明の属する技術分野】本発明は、カーボン系のター
ゲットを使用して基板にカーボン薄膜を形成するスパッ
タリング装置に関する。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a sputtering apparatus for forming a carbon thin film on a substrate using a carbon-based target.
【0002】[0002]
【従来の技術】従来、この種の薄膜を形成する装置とし
て、図1に示すような真空ポンプにより真空排気された
真空処理室a内に、基板bと、カソードc上に取り付け
たカーボンの板状のターゲットdとを対向させて設け、
該カソードcに電力を投入して室壁などの適当なアノー
ドとの間でプラズマ放電を発生させ、該プラズマ中で生
成するイオンを該ターゲットdに入射させてこれをスパ
ッタし、該基板bにカーボンの薄膜(DLC:ダイヤモ
ンドライクカーボン)を形成するものが知られている。
該ターゲットd以外がスパッタされることを防止するた
めにその周囲をステンレス製のアースシールドeで覆
い、スパッタされた粒子が拡散しないように前方周囲を
ステンレス製の筒型の防着板fで囲んでいる。2. Description of the Related Art Conventionally, as a device for forming this kind of thin film, a substrate b and a carbon plate mounted on a cathode c are placed in a vacuum processing chamber a evacuated by a vacuum pump as shown in FIG. A target d in the shape of
A power is supplied to the cathode c to generate a plasma discharge between the cathode c and an appropriate anode such as a chamber wall. Ions generated in the plasma are made incident on the target d to be sputtered, and the target b is sputtered. What forms a carbon thin film (DLC: diamond-like carbon) is known.
In order to prevent the target other than the target d from being sputtered, the periphery thereof is covered with a stainless steel earth shield e, and the front periphery is surrounded by a stainless steel cylindrical anti-blocking plate f so that sputtered particles are not diffused. In.
【0003】[0003]
【発明が解決しようとする課題】上記したカーボンスパ
ッタリング装置では、長時間スパッタリングを続けてい
ると、ターゲットdの表面にノジュール(ブリスタ)が
発生し、そのために異常放電を生じたり成膜速度が低下
するなどの弊害をもたらす不都合があった。In the above-described carbon sputtering apparatus, if sputtering is continued for a long time, nodules (blisters) are generated on the surface of the target d, thereby causing abnormal discharge or reducing the film forming rate. There was an inconvenience of causing adverse effects such as doing so.
【0004】本発明は、ノジュールの発生を抑制してカ
ーボンのスパッタリングに伴う異常放電や成膜速度の低
下を防止し、長時間のカーボンスパッタリングを可能に
することを目的とするものである。An object of the present invention is to suppress the generation of nodules to prevent abnormal discharge and a reduction in film forming rate due to carbon sputtering, thereby enabling long-time carbon sputtering.
【0005】[0005]
【課題を解決するための手段】本発明では、真空処理室
内に基板と対向させたカソード上にカーボン又はカーボ
ンとシリコンの複合材のターゲットを設け、該ターゲッ
トの周囲をアースシールドで覆うと共に該ターゲットの
前方周囲を防着板で囲み、該ターゲットの前方に発生す
るプラズマにより該ターゲットをスパッタして該基板に
カーボン薄膜を形成する装置に於いて、該アースシール
ド及び防着板の開口縁部及び屈曲部を丸形に形成すると
共に該アースシールド及び防着板にアルミニウムやアル
ミ合金、アルミナ等の表面凹凸の大きなコーティング層
を形成することにより、上記の目的を達成するようにし
た。該丸形の曲率は0.3mm以上に形成することが好
ましく、該コーティング層は溶射法により形成してもよ
い。According to the present invention, a target made of carbon or a composite material of carbon and silicon is provided on a cathode facing a substrate in a vacuum processing chamber. In a device for forming a carbon thin film on the substrate by sputtering the target by plasma generated in front of the target and surrounding the front periphery of the target with a deposition-preventing plate, the opening edges of the earth shield and the deposition-preventing plate and The above object is achieved by forming the bent portion in a round shape and forming a coating layer having a large surface irregularity such as aluminum, an aluminum alloy, and alumina on the earth shield and the shield plate. Preferably, the curvature of the round shape is 0.3 mm or more, and the coating layer may be formed by thermal spraying.
【0006】[0006]
【発明の実施の形態】本発明の実施の形態を図2に基づ
き説明すると、同図の符号1は真空ポンプにより真空排
気された真空処理室、2は該真空処理室1内に固定の或
いは移動自在の基板保持装置に保持して設けられた基板
を示し、該基板1と対向して設けたマグネトロンカソー
ドなどのカソード3上に板状のカーボン又はカーボンと
シリコンの複合材(SiCX)のターゲット4をボンデ
ィングして設けた。該ターゲット4の周囲は、ターゲッ
ト4以外のスパッタを防止するためのステンレス製の環
状のアースシールド5で覆い、該基板1以外の方向へス
パッタ粒子が拡散することを防止するために該ターゲッ
ト4の前方周囲をステンレス製の筒型の防着板6で覆っ
た。該防着板6は外板6aとその内側に沿わせた多孔金
属板6bとで構成し、その間にチムニー16を形成させ
た。DESCRIPTION OF THE PREFERRED EMBODIMENTS An embodiment of the present invention will be described with reference to FIG. 2. In FIG. 2, reference numeral 1 denotes a vacuum processing chamber evacuated by a vacuum pump, and 2 denotes a vacuum processing chamber fixed or FIG. 2 shows a substrate held by a movable substrate holding device, and a plate-like carbon or a composite material of carbon and silicon (SiC X ) is formed on a cathode 3 such as a magnetron cathode provided opposite to the substrate 1. The target 4 was provided by bonding. The periphery of the target 4 is covered with an annular earth shield 5 made of stainless steel for preventing spatters other than the target 4, and the target 4 is prevented from diffusing in a direction other than the substrate 1 by sputtering. The front periphery was covered with a stainless steel cylindrical anti-adhesion plate 6. The deposition-preventing plate 6 was composed of an outer plate 6a and a perforated metal plate 6b along the inside thereof, and a chimney 16 was formed therebetween.
【0007】こうした構成は従来のものと同様で、該カ
ソード3に例えばDC電源から負電圧を印加してアース
電位の室壁との間で放電させ、そのプラズマを該ターゲ
ット4の前方へ該カソード3の磁界により収束させる
と、該プラズマ中で発生したイオンがターゲット4へ入
射してこれをスパッタし、スパッタされたカーボン粒子
が基板2の表面に薄膜状に付着するが、スパッタ時間が
長時間に達すると該ターゲット4上にノジュール(ブリ
スタ)が発生して前記した不都合を生ずるようになる。
このノジュールが発生する原因は、スパッタされたカー
ボン粒子の一部がアースシールド5や防着板6にも付着
してカーボン膜を形成し、このカーボン膜は絶縁性があ
るために帯電し、少しでもこのカーボン膜が遊離すると
そこに電荷が集中して流れ込んで異常放電を生じ、異常
放電のためにカーボン膜が剥離してターゲット4方向へ
飛び、これが基になってノジュールが形成されてしまう
ことが分かった。Such a structure is the same as that of the prior art, in which a negative voltage is applied to the cathode 3 from, for example, a DC power source to cause discharge between the cathode 3 and the chamber wall at the ground potential, and the plasma is forwarded to the cathode 4 in front of the target 4. When converged by the magnetic field of 3, the ions generated in the plasma enter the target 4 and sputter it, and the sputtered carbon particles adhere to the surface of the substrate 2 in a thin film. Is reached, nodules (blisters) are generated on the target 4 to cause the above-mentioned inconvenience.
This nodule is generated because a part of the sputtered carbon particles adheres to the earth shield 5 and the deposition-preventing plate 6 to form a carbon film. However, when this carbon film is released, charges concentrate and flow into it, causing abnormal discharge. The abnormal discharge causes the carbon film to peel off and fly in the direction of the target 4, resulting in the formation of nodules. I understood.
【0008】本発明では、この解明された原因を除くた
め、該アースシールド5、防着板6を構成する外板6a
及び多孔金属板6bの各開口縁部7、8及び屈曲部9、
10を角部のない丸形13、14に形成すると共にこれ
らアースシールド5、防着板6の外板6a及び多孔金属
板6bにアルミニウム、アルミ合金、アルミナ等の表面
の凹凸の大きなコーティング層11、12を溶射法によ
り形成した。各開口縁部7、8は、図2の部分拡大図に
見られるように、丸味を持たせて削り、屈曲部9、10
は湾曲させて成形するようにし、これらの丸形は曲率半
径0.3mm以上の曲率とすることが好ましい。この丸
形に形成することで、そこに付着するカーボン膜のスト
レスが小さくなり、更にカーボン膜の付着性が良いアル
ミニウム等のコーティング層が形成されているため、そ
の付着面から容易に剥離しないようになる。そのため異
常放電が少なくなってターゲット4の表面に付着するカ
ーボン膜も少なくなり、ターゲット4上のノジュールの
発生も少なくなるので、ノジュールによるスパッタ面積
の減少も殆どなく、成膜速度の低下も殆どなくなる。In the present invention, in order to eliminate the clarified cause, the outer plate 6a constituting the earth shield 5 and the shield plate 6 is provided.
And each opening edge 7, 8 and bent portion 9, of the perforated metal plate 6b,
10 is formed into round shapes 13 and 14 having no corners, and the earth shield 5, the outer plate 6a of the deposition-preventing plate 6 and the perforated metal plate 6b are coated with a coating layer 11 having a large unevenness on the surface of aluminum, aluminum alloy, alumina or the like. , 12 were formed by thermal spraying. As shown in the partial enlarged view of FIG. 2, each of the opening edges 7 and 8 is rounded and cut, and the bent portions 9 and 10 are bent.
Are preferably formed by bending, and these round shapes preferably have a curvature radius of 0.3 mm or more. By forming this round shape, the stress of the carbon film attached thereto is reduced, and a coating layer of aluminum or the like having a good adhesion of the carbon film is formed, so that it is not easily peeled off from the attached surface. become. Therefore, abnormal discharge is reduced, the carbon film adhered to the surface of the target 4 is also reduced, and the generation of nodules on the target 4 is also reduced. Therefore, the sputtering area is hardly reduced by the nodules, and the film forming speed is hardly reduced. .
【0009】図2に示す構成のカーボンスパッタ装置に
於いて、アルミ溶射処理をアースシールド及び防着板に
施し、DCマグネトロンスパッタ法により長時間のスパ
ッタリングを行い、異常放電の回数を測定した結果は図
3の曲線Aの如くであり、曲線Bで示した図1に示す従
来の開口部及び屈曲部が角形ものよりも大幅にその回数
が減少した。また、この長時間のスパッタリングを終え
たときのターゲット表面の状態は、図4(a)で示す如
くで、ノジュールCは僅かにしか発生していない。図4
(b)は比較のための図1の従来のもののターゲットの
表面状態で、大量のノジュールの発生が見られる。尚、
この場合、カーボンターゲット4には2W/cm2の電
力を投入し、成膜ガスにはアルゴンガスを使用し、真空
処理室1内の圧力を2.7×10-1Paとした。In the carbon sputtering apparatus having the structure shown in FIG. 2, the aluminum spraying treatment was applied to the earth shield and the deposition-preventing plate, the sputtering was performed for a long time by DC magnetron sputtering, and the number of times of abnormal discharge was measured. As shown by the curve A in FIG. 3, the number of times the conventional openings and bent portions shown by the curve B in FIG. Further, the state of the target surface after the prolonged sputtering is as shown in FIG. 4A, and nodules C are slightly generated. FIG.
(B) shows the surface state of the target of the conventional example of FIG. 1 for comparison, in which a large amount of nodules is generated. still,
In this case, a power of 2 W / cm 2 was applied to the carbon target 4, an argon gas was used as a film forming gas, and the pressure in the vacuum processing chamber 1 was set to 2.7 × 10 −1 Pa.
【0010】以上の実施例では、基板2が上方でターゲ
ット4を下方に配置したが、その逆に配置しても良く、
基板2及びターゲット4を垂直に配置しても良い。In the above embodiment, the target 2 is disposed below the substrate 2 and the target 4 is disposed below.
The substrate 2 and the target 4 may be arranged vertically.
【0011】[0011]
【発明の効果】以上のように本発明によるときは、カー
ボン又はカーボンとシリコンの複合材のターゲットの周
囲をアースシールドで覆い、その前方周囲を防着板で囲
んだカーボンスパッタ装置において、該アースシールド
及び防着板の開口縁部及び屈曲部を丸形に形成し且つこ
れらにアルミニウム溶射層等の表面凹凸の大きいコーテ
ィング層を形成したので、ノジュールの発生が抑制され
カーボンのスパッタリングに伴う異常放電や成膜速度の
低下が防止され、長時間に亘るカーボンスパッタを行
え、生産性が向上する等の効果がある。As described above, according to the present invention, in a carbon sputtering apparatus in which the periphery of a target made of carbon or a composite material of carbon and silicon is covered with an earth shield and the front periphery thereof is surrounded by a deposition-preventing plate. Since the opening edge and the bent portion of the shield and the attachment plate are formed in a round shape, and a coating layer having a large surface irregularity such as an aluminum sprayed layer is formed thereon, generation of nodules is suppressed, and abnormal discharge caused by carbon sputtering. In addition, there is an effect that a reduction in the film formation rate is prevented, carbon sputtering can be performed for a long time, and productivity is improved.
【図1】従来のカーボンスパッタ装置の截断側面図FIG. 1 is a cross-sectional side view of a conventional carbon sputtering apparatus.
【図2】本発明の実施の形態を示す截断側面図FIG. 2 is a cutaway side view showing an embodiment of the present invention.
【図3】異常放電回数の測定図FIG. 3 is a measurement diagram of the number of abnormal discharges
【図4】ターゲットの表面状態図FIG. 4 is a surface state diagram of a target.
1 真空処理室、2 基板、3 カソード、4 ターゲ
ット、5 アースシールド、6 防着板、7・8 開口
縁部、9・10 屈曲部、11・12 コーティング
層、13・14 丸形、1 vacuum processing chamber, 2 substrates, 3 cathodes, 4 targets, 5 earth shields, 6 deposition plates, 7.8 opening edges, 9/10 bends, 11/12 coating layers, 13.14 round shapes,
─────────────────────────────────────────────────────
────────────────────────────────────────────────── ───
【手続補正書】[Procedure amendment]
【提出日】平成11年9月9日(1999.9.9)[Submission date] September 9, 1999 (September 9, 1999)
【手続補正1】[Procedure amendment 1]
【補正対象書類名】明細書[Document name to be amended] Statement
【補正対象項目名】0005[Correction target item name] 0005
【補正方法】変更[Correction method] Change
【補正内容】[Correction contents]
【0005】[0005]
【課題を解決するための手段】本発明では、真空処理室
内に基板と対向させたカソード上にカーボン又はカーボ
ンとシリコンの複合材のターゲットを設け、該ターゲッ
トの周囲をアースシールドで覆うと共に該ターゲットの
前方周囲を防着板で囲み、該ターゲットの前方に発生す
るプラズマにより該ターゲットをスパッタして該基板に
カーボン薄膜を形成する装置に於いて、該アースシール
ド及び防着板の開口縁部及び屈曲部を丸形に形成すると
共に該アースシールド及び防着板に表面凹凸の大きなコ
ーティング層を形成することにより、上記の目的を達成
するようにした。該丸形の曲率は0.3mm以上に形成
することが好ましく、該コーティング層は溶射法により
形成してもよい。According to the present invention, a target made of carbon or a composite material of carbon and silicon is provided on a cathode facing a substrate in a vacuum processing chamber. In a device for forming a carbon thin film on the substrate by sputtering the target by plasma generated in front of the target and surrounding the front periphery of the target with a deposition-preventing plate, the opening edges of the earth shield and the deposition-preventing plate and by forming a large coating layer on the front surface irregularities on the earth shield and the deposition preventing plate so as to form a bend in the round, and so as to achieve the above object. Preferably, the curvature of the round shape is 0.3 mm or more, and the coating layer may be formed by thermal spraying.
───────────────────────────────────────────────────── フロントページの続き (72)発明者 石川 道夫 千葉県山武郡山武町横田523 日本真空技 術株式会社千葉超材料研究所内 Fターム(参考) 4K029 BA34 CA05 DA10 DC05 DC12 DC15 DC20 DC39 4K031 AA04 AA08 AB07 CB37 CB39 CB43 ────────────────────────────────────────────────── ─── Continuing from the front page (72) Inventor Michio Ishikawa 523 Yokota, Yamatake-cho, Yamatake-gun, Chiba Prefecture Japan Vacuum Engineering Co., Ltd. Chiba Super Materials Laboratory F-term (reference) 4K029 BA34 CA05 DA10 DC05 DC12 DC15 DC20 DC39 4K031 AA04 AA08 AB07 CB37 CB39 CB43
Claims (3)
上にカーボン又はカーボンとシリコンの複合材のターゲ
ットを設け、該ターゲットの周囲をアースシールドで覆
うと共に該ターゲットの前方周囲を防着板で囲み、該タ
ーゲットの前方に発生するプラズマにより該ターゲット
をスパッタして該基板にカーボン薄膜を形成する装置に
於いて、該アースシールド及び防着板の開口縁部及び屈
曲部を丸形に形成すると共に該アースシールド及び防着
板に表面凹凸の大きなコーティング層を形成したことを
特徴とするカーボンスパッタ装置。1. A target made of carbon or a composite material of carbon and silicon is provided on a cathode opposed to a substrate in a vacuum processing chamber, the periphery of the target is covered with an earth shield, and the front periphery of the target is covered with a deposition preventing plate. In an apparatus for forming a carbon thin film on the substrate by sputtering the target with plasma generated in front of the target and surrounding the target, the opening edges and the bent portions of the earth shield and the deposition preventing plate are formed in a round shape. And a coating layer having a large surface unevenness formed on the earth shield and the deposition-preventing plate.
成したことを特徴とする請求項1に記載のカーボンスパ
ッタ装置。2. The carbon sputtering apparatus according to claim 1, wherein the radius of curvature of the round shape is 0.3 mm or more.
であることを特徴とする請求項1または2に記載のカー
ボンスパッタ装置。3. The carbon sputtering apparatus according to claim 1, wherein the coating layer is a layer formed by a thermal spraying method.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP24919099A JP4233702B2 (en) | 1999-09-02 | 1999-09-02 | Carbon sputtering equipment |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP24919099A JP4233702B2 (en) | 1999-09-02 | 1999-09-02 | Carbon sputtering equipment |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2001073115A true JP2001073115A (en) | 2001-03-21 |
JP4233702B2 JP4233702B2 (en) | 2009-03-04 |
Family
ID=17189248
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP24919099A Expired - Lifetime JP4233702B2 (en) | 1999-09-02 | 1999-09-02 | Carbon sputtering equipment |
Country Status (1)
Country | Link |
---|---|
JP (1) | JP4233702B2 (en) |
Cited By (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100591433B1 (en) | 2004-12-29 | 2006-06-22 | 동부일렉트로닉스 주식회사 | Shield for tin sputtering process and coating method thereof |
WO2007032166A1 (en) * | 2005-09-16 | 2007-03-22 | Asahi Glass Company, Limited | Deposition preventing plate for film forming apparatus, and film forming apparatus |
JP2009062579A (en) * | 2007-09-06 | 2009-03-26 | Fuji Electric Systems Co Ltd | Film deposition system |
KR100909564B1 (en) * | 2005-12-23 | 2009-07-27 | 주식회사 삼양사 | Sputtering deposition apparatus |
CN103834921A (en) * | 2014-02-28 | 2014-06-04 | 上海和辉光电有限公司 | Evaporation source check plate structure |
KR101430660B1 (en) * | 2012-08-24 | 2014-08-18 | 주식회사 에스에프에이 | Apparatus to sputter |
US9194038B2 (en) | 2009-12-28 | 2015-11-24 | Canon Anelva Corporation | Thin film forming apparatus, thin film forming method, and shield component |
KR20180131497A (en) * | 2017-05-31 | 2018-12-10 | 가부시키가이샤 알박 | Sputtering apparatus |
JP2019052359A (en) * | 2017-09-15 | 2019-04-04 | 株式会社アルバック | Sputtering device, and thin film production method |
US20190144990A1 (en) * | 2017-11-16 | 2019-05-16 | Oliver James Groves | Device For Sputtering A Material Onto A Surface Of A Substrate While Moving |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR102315980B1 (en) * | 2019-12-16 | 2021-10-21 | 주식회사 에프티시스템 | Deposition apparatus for pollution prevention |
-
1999
- 1999-09-02 JP JP24919099A patent/JP4233702B2/en not_active Expired - Lifetime
Cited By (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100591433B1 (en) | 2004-12-29 | 2006-06-22 | 동부일렉트로닉스 주식회사 | Shield for tin sputtering process and coating method thereof |
WO2007032166A1 (en) * | 2005-09-16 | 2007-03-22 | Asahi Glass Company, Limited | Deposition preventing plate for film forming apparatus, and film forming apparatus |
KR100909564B1 (en) * | 2005-12-23 | 2009-07-27 | 주식회사 삼양사 | Sputtering deposition apparatus |
JP2009062579A (en) * | 2007-09-06 | 2009-03-26 | Fuji Electric Systems Co Ltd | Film deposition system |
US9194038B2 (en) | 2009-12-28 | 2015-11-24 | Canon Anelva Corporation | Thin film forming apparatus, thin film forming method, and shield component |
KR101430660B1 (en) * | 2012-08-24 | 2014-08-18 | 주식회사 에스에프에이 | Apparatus to sputter |
CN103834921A (en) * | 2014-02-28 | 2014-06-04 | 上海和辉光电有限公司 | Evaporation source check plate structure |
CN103834921B (en) * | 2014-02-28 | 2016-05-18 | 上海和辉光电有限公司 | A kind of evaporation source baffle arrangement |
KR20180131497A (en) * | 2017-05-31 | 2018-12-10 | 가부시키가이샤 알박 | Sputtering apparatus |
JP2018204061A (en) * | 2017-05-31 | 2018-12-27 | 株式会社アルバック | Sputtering apparatus |
KR102471178B1 (en) | 2017-05-31 | 2022-11-25 | 가부시키가이샤 알박 | Sputtering apparatus |
JP2019052359A (en) * | 2017-09-15 | 2019-04-04 | 株式会社アルバック | Sputtering device, and thin film production method |
US20190144990A1 (en) * | 2017-11-16 | 2019-05-16 | Oliver James Groves | Device For Sputtering A Material Onto A Surface Of A Substrate While Moving |
Also Published As
Publication number | Publication date |
---|---|
JP4233702B2 (en) | 2009-03-04 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JP5362112B2 (en) | Sputter deposition apparatus and deposition preventing member | |
JP2001073115A (en) | Carbon sputtering device | |
US20060289304A1 (en) | Sputtering target with slow-sputter layer under target material | |
JPH09272965A (en) | Parts for vacuum film forming device, vacuum film forming device using the same, target and backing plate | |
EP0845545A1 (en) | Coated deposition chamber equipment | |
JP2004285471A (en) | Design of hardware feature to facilitate arc-spray coating application and function | |
JP2720755B2 (en) | Ti target material for magnetron sputtering | |
JP2008025031A (en) | Cooled dark space shield for multi-cathode | |
TW201145358A (en) | Thin film forming apparatus, thin film forming method, and shield component | |
CN108779548B (en) | Film forming apparatus and platen ring | |
US5013419A (en) | Coating apparatus | |
JPS60120515A (en) | Thin film forming device | |
JPH09176840A (en) | Vacuum coating apparatus | |
JPS63162861A (en) | Thin film deposition device | |
US3779891A (en) | Triode sputtering apparatus | |
JPH1030174A (en) | Sputtering device and method for working backing plate used for the same device | |
TWI801632B (en) | Process kits for plasma processing chambers, process kits for rfpvd chambers, and pvd chambers | |
JP2004285445A (en) | Sputtering method and apparatus | |
JPH06306596A (en) | Si target material for magnetron sputtering | |
JP2008007837A (en) | Sputtering film deposition system and sputtering film deposition method | |
JP3224488B2 (en) | Method of forming hard carbon film | |
JPH02236277A (en) | Sputtering method | |
JPH027870Y2 (en) | ||
JP2008144214A (en) | Film deposition apparatus | |
JP2607727Y2 (en) | Cathode sputtering equipment |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20051021 |
|
A521 | Written amendment |
Free format text: JAPANESE INTERMEDIATE CODE: A821 Effective date: 20070518 |
|
RD02 | Notification of acceptance of power of attorney |
Free format text: JAPANESE INTERMEDIATE CODE: A7422 Effective date: 20070518 |
|
A977 | Report on retrieval |
Free format text: JAPANESE INTERMEDIATE CODE: A971007 Effective date: 20080515 |
|
A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20080520 |
|
A521 | Written amendment |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20080709 |
|
A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20080812 |
|
A521 | Written amendment |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20081006 |
|
TRDD | Decision of grant or rejection written | ||
A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 Effective date: 20081118 |
|
A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 |
|
A61 | First payment of annual fees (during grant procedure) |
Free format text: JAPANESE INTERMEDIATE CODE: A61 Effective date: 20081210 |
|
FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20111219 Year of fee payment: 3 |
|
R150 | Certificate of patent or registration of utility model |
Free format text: JAPANESE INTERMEDIATE CODE: R150 Ref document number: 4233702 Country of ref document: JP Free format text: JAPANESE INTERMEDIATE CODE: R150 |
|
FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20121219 Year of fee payment: 4 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20161219 Year of fee payment: 8 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
EXPY | Cancellation because of completion of term |