JP4067201B2 - Ｃｔ装置用ｘ線検出器 - Google Patents
Ｃｔ装置用ｘ線検出器 Download PDFInfo
- Publication number
- JP4067201B2 JP4067201B2 JP31831998A JP31831998A JP4067201B2 JP 4067201 B2 JP4067201 B2 JP 4067201B2 JP 31831998 A JP31831998 A JP 31831998A JP 31831998 A JP31831998 A JP 31831998A JP 4067201 B2 JP4067201 B2 JP 4067201B2
- Authority
- JP
- Japan
- Prior art keywords
- scintillator
- collimator
- ray
- channel
- array
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 238000005192 partition Methods 0.000 claims description 37
- 238000001514 detection method Methods 0.000 claims description 33
- 238000006243 chemical reaction Methods 0.000 claims description 4
- 239000000758 substrate Substances 0.000 claims description 2
- 238000000034 method Methods 0.000 description 7
- 239000000463 material Substances 0.000 description 6
- 238000010521 absorption reaction Methods 0.000 description 4
- 238000005259 measurement Methods 0.000 description 4
- 238000003491 array Methods 0.000 description 3
- 239000000853 adhesive Substances 0.000 description 2
- 230000001070 adhesive effect Effects 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- ZOKXTWBITQBERF-UHFFFAOYSA-N Molybdenum Chemical compound [Mo] ZOKXTWBITQBERF-UHFFFAOYSA-N 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- 239000011248 coating agent Substances 0.000 description 1
- 238000000576 coating method Methods 0.000 description 1
- 230000006866 deterioration Effects 0.000 description 1
- 230000006698 induction Effects 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 229910052750 molybdenum Inorganic materials 0.000 description 1
- 239000011733 molybdenum Substances 0.000 description 1
- MGRWKWACZDFZJT-UHFFFAOYSA-N molybdenum tungsten Chemical compound [Mo].[W] MGRWKWACZDFZJT-UHFFFAOYSA-N 0.000 description 1
- 238000007747 plating Methods 0.000 description 1
- 238000003672 processing method Methods 0.000 description 1
- 239000011347 resin Substances 0.000 description 1
- 229920005989 resin Polymers 0.000 description 1
- 238000000926 separation method Methods 0.000 description 1
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 description 1
- 229910052721 tungsten Inorganic materials 0.000 description 1
- 239000010937 tungsten Substances 0.000 description 1
Images
Landscapes
- Measurement Of Radiation (AREA)
- Apparatus For Radiation Diagnosis (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP31831998A JP4067201B2 (ja) | 1998-10-22 | 1998-10-22 | Ｃｔ装置用ｘ線検出器 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP31831998A JP4067201B2 (ja) | 1998-10-22 | 1998-10-22 | Ｃｔ装置用ｘ線検出器 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2000131445A JP2000131445A (ja) | 2000-05-12 |
| JP2000131445A5 JP2000131445A5 (OSRAM) | 2005-12-08 |
| JP4067201B2 true JP4067201B2 (ja) | 2008-03-26 |
Family
ID=18097874
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP31831998A Expired - Fee Related JP4067201B2 (ja) | 1998-10-22 | 1998-10-22 | Ｃｔ装置用ｘ線検出器 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP4067201B2 (OSRAM) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2002071819A (ja) * | 2000-08-31 | 2002-03-12 | Toshiba Corp | 検出器ユニット、ｘ線コンピュータ断層撮影装置及びｘ線コンピュータ断層撮影装置の製造方法 |
| US7177387B2 (en) * | 2003-11-29 | 2007-02-13 | General Electric Company | Self-aligning scintillator-collimator assembly |
-
1998
- 1998-10-22 JP JP31831998A patent/JP4067201B2/ja not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| JP2000131445A (ja) | 2000-05-12 |
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