JP4056205B2 - ポリッシング装置および方法 - Google Patents
ポリッシング装置および方法 Download PDFInfo
- Publication number
- JP4056205B2 JP4056205B2 JP2000259152A JP2000259152A JP4056205B2 JP 4056205 B2 JP4056205 B2 JP 4056205B2 JP 2000259152 A JP2000259152 A JP 2000259152A JP 2000259152 A JP2000259152 A JP 2000259152A JP 4056205 B2 JP4056205 B2 JP 4056205B2
- Authority
- JP
- Japan
- Prior art keywords
- polishing
- pressure
- top ring
- fluid
- fluid pressure
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 238000005498 polishing Methods 0.000 title claims description 259
- 238000000034 method Methods 0.000 title claims description 16
- 239000012530 fluid Substances 0.000 claims description 197
- 238000003825 pressing Methods 0.000 claims description 91
- 230000002093 peripheral effect Effects 0.000 claims description 63
- 239000012528 membrane Substances 0.000 claims description 46
- 230000007246 mechanism Effects 0.000 claims description 16
- 235000012431 wafers Nutrition 0.000 description 183
- 239000004065 semiconductor Substances 0.000 description 108
- 239000004744 fabric Substances 0.000 description 34
- 238000009826 distribution Methods 0.000 description 16
- 239000007788 liquid Substances 0.000 description 15
- 238000004891 communication Methods 0.000 description 14
- 238000010586 diagram Methods 0.000 description 14
- 239000000463 material Substances 0.000 description 12
- 229920001971 elastomer Polymers 0.000 description 9
- 230000009471 action Effects 0.000 description 8
- 239000000919 ceramic Substances 0.000 description 8
- 229920005989 resin Polymers 0.000 description 6
- 239000011347 resin Substances 0.000 description 6
- 239000006061 abrasive grain Substances 0.000 description 5
- 230000001276 controlling effect Effects 0.000 description 5
- 238000012937 correction Methods 0.000 description 5
- 230000008859 change Effects 0.000 description 4
- 238000004140 cleaning Methods 0.000 description 4
- 230000003247 decreasing effect Effects 0.000 description 4
- 230000033001 locomotion Effects 0.000 description 4
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 4
- 239000011230 binding agent Substances 0.000 description 3
- 230000000694 effects Effects 0.000 description 3
- 239000010410 layer Substances 0.000 description 3
- 229910052751 metal Inorganic materials 0.000 description 3
- 239000002184 metal Substances 0.000 description 3
- 238000007789 sealing Methods 0.000 description 3
- 239000004696 Poly ether ether ketone Substances 0.000 description 2
- 239000004734 Polyphenylene sulfide Substances 0.000 description 2
- 229910000963 austenitic stainless steel Inorganic materials 0.000 description 2
- 230000005540 biological transmission Effects 0.000 description 2
- 229910000420 cerium oxide Inorganic materials 0.000 description 2
- 230000002079 cooperative effect Effects 0.000 description 2
- BMMGVYCKOGBVEV-UHFFFAOYSA-N oxo(oxoceriooxy)cerium Chemical compound [Ce]=O.O=[Ce]=O BMMGVYCKOGBVEV-UHFFFAOYSA-N 0.000 description 2
- 229920002530 polyetherether ketone Polymers 0.000 description 2
- 229920000069 polyphenylene sulfide Polymers 0.000 description 2
- 239000011148 porous material Substances 0.000 description 2
- 238000001179 sorption measurement Methods 0.000 description 2
- 229920002943 EPDM rubber Polymers 0.000 description 1
- 229920000181 Ethylene propylene rubber Polymers 0.000 description 1
- YCKRFDGAMUMZLT-UHFFFAOYSA-N Fluorine atom Chemical compound [F] YCKRFDGAMUMZLT-UHFFFAOYSA-N 0.000 description 1
- 229920005830 Polyurethane Foam Polymers 0.000 description 1
- 238000010521 absorption reaction Methods 0.000 description 1
- UQZIWOQVLUASCR-UHFFFAOYSA-N alumane;titanium Chemical compound [AlH3].[Ti] UQZIWOQVLUASCR-UHFFFAOYSA-N 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 230000007797 corrosion Effects 0.000 description 1
- 238000005260 corrosion Methods 0.000 description 1
- 230000007812 deficiency Effects 0.000 description 1
- 230000001419 dependent effect Effects 0.000 description 1
- 230000008021 deposition Effects 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 239000013013 elastic material Substances 0.000 description 1
- 239000003822 epoxy resin Substances 0.000 description 1
- 239000000835 fiber Substances 0.000 description 1
- 229910052731 fluorine Inorganic materials 0.000 description 1
- 239000011737 fluorine Substances 0.000 description 1
- 238000003384 imaging method Methods 0.000 description 1
- 230000006872 improvement Effects 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 239000004745 nonwoven fabric Substances 0.000 description 1
- 239000002245 particle Substances 0.000 description 1
- 238000000206 photolithography Methods 0.000 description 1
- 229920000647 polyepoxide Polymers 0.000 description 1
- 229920002635 polyurethane Polymers 0.000 description 1
- 239000004814 polyurethane Substances 0.000 description 1
- 239000011496 polyurethane foam Substances 0.000 description 1
- 230000008569 process Effects 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 238000011160 research Methods 0.000 description 1
- 229920002379 silicone rubber Polymers 0.000 description 1
- 239000002356 single layer Substances 0.000 description 1
- 229920002803 thermoplastic polyurethane Polymers 0.000 description 1
Images
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/27—Work carriers
- B24B37/30—Work carriers for single side lapping of plane surfaces
- B24B37/32—Retaining rings
Landscapes
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2000259152A JP4056205B2 (ja) | 1999-10-15 | 2000-08-29 | ポリッシング装置および方法 |
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP11-294503 | 1999-10-15 | ||
| JP29450399 | 1999-10-15 | ||
| JP2000259152A JP4056205B2 (ja) | 1999-10-15 | 2000-08-29 | ポリッシング装置および方法 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2001179605A JP2001179605A (ja) | 2001-07-03 |
| JP2001179605A5 JP2001179605A5 (enExample) | 2004-12-24 |
| JP4056205B2 true JP4056205B2 (ja) | 2008-03-05 |
Family
ID=26559865
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2000259152A Expired - Fee Related JP4056205B2 (ja) | 1999-10-15 | 2000-08-29 | ポリッシング装置および方法 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP4056205B2 (enExample) |
Families Citing this family (15)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2003311593A (ja) * | 2002-02-20 | 2003-11-05 | Ebara Corp | ポリッシング装置 |
| JP4597634B2 (ja) * | 2004-11-01 | 2010-12-15 | 株式会社荏原製作所 | トップリング、基板の研磨装置及び研磨方法 |
| EP2838110B1 (en) | 2004-11-01 | 2016-04-27 | Ebara Corporation | Polishing apparatus |
| JP2008093810A (ja) * | 2006-10-16 | 2008-04-24 | Shin Etsu Handotai Co Ltd | リテーナリング及び研磨ヘッド並びに研磨装置 |
| JP2009194134A (ja) | 2008-02-14 | 2009-08-27 | Ebara Corp | 研磨方法及び研磨装置 |
| JP5377873B2 (ja) * | 2008-03-18 | 2013-12-25 | 株式会社東京精密 | ウェーハ研磨装置及び該研磨装置を用いたウェーハ研磨方法 |
| US8192248B2 (en) * | 2008-05-30 | 2012-06-05 | Memc Electronic Materials, Inc. | Semiconductor wafer polishing apparatus and method of polishing |
| TWI639485B (zh) | 2012-01-31 | 2018-11-01 | 日商荏原製作所股份有限公司 | Substrate holding device, polishing device, and polishing method |
| JP5964064B2 (ja) * | 2012-01-31 | 2016-08-03 | 株式会社荏原製作所 | 基板保持装置、研磨装置、および研磨方法 |
| JP5922965B2 (ja) * | 2012-03-29 | 2016-05-24 | 株式会社荏原製作所 | 基板保持装置、研磨装置、および研磨方法 |
| US9566687B2 (en) * | 2014-10-13 | 2017-02-14 | Sunedison Semiconductor Limited (Uen201334164H) | Center flex single side polishing head having recess and cap |
| JP2016165792A (ja) * | 2015-03-05 | 2016-09-15 | ミクロ技研株式会社 | 研磨ヘッド及び研磨処理装置 |
| JP2017064894A (ja) * | 2015-10-02 | 2017-04-06 | ミクロ技研株式会社 | 研磨ヘッド及び研磨処理装置 |
| KR102459834B1 (ko) * | 2017-11-22 | 2022-10-28 | 주식회사 케이씨텍 | 캐리어 및 이를 포함하는 화학 기계적 연마 장치 |
| JP7662324B2 (ja) * | 2020-10-30 | 2025-04-15 | 株式会社荏原製作所 | 基板を保持するためのヘッドおよび基板処理装置 |
-
2000
- 2000-08-29 JP JP2000259152A patent/JP4056205B2/ja not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| JP2001179605A (ja) | 2001-07-03 |
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