JP4054306B2 - 化学的機械研磨装置用のスラリー分配装置および該スラリー分配装置を用いる方法 - Google Patents
化学的機械研磨装置用のスラリー分配装置および該スラリー分配装置を用いる方法 Download PDFInfo
- Publication number
- JP4054306B2 JP4054306B2 JP2003526634A JP2003526634A JP4054306B2 JP 4054306 B2 JP4054306 B2 JP 4054306B2 JP 2003526634 A JP2003526634 A JP 2003526634A JP 2003526634 A JP2003526634 A JP 2003526634A JP 4054306 B2 JP4054306 B2 JP 4054306B2
- Authority
- JP
- Japan
- Prior art keywords
- polishing
- polishing surface
- slurry
- dispensing device
- substrate
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 238000005498 polishing Methods 0.000 title claims description 349
- 239000002002 slurry Substances 0.000 title claims description 149
- 239000000126 substance Substances 0.000 title claims description 65
- 238000000034 method Methods 0.000 title description 32
- 239000000758 substrate Substances 0.000 claims description 66
- 238000009826 distribution Methods 0.000 claims description 48
- 238000007517 polishing process Methods 0.000 claims description 26
- 239000006227 byproduct Substances 0.000 claims description 24
- 239000000463 material Substances 0.000 claims description 24
- 125000006850 spacer group Chemical group 0.000 claims description 23
- 239000012530 fluid Substances 0.000 claims description 19
- 238000004140 cleaning Methods 0.000 claims description 14
- 238000009825 accumulation Methods 0.000 claims description 7
- 230000007246 mechanism Effects 0.000 claims description 7
- 230000005484 gravity Effects 0.000 claims description 4
- 238000005406 washing Methods 0.000 claims description 2
- 230000008569 process Effects 0.000 description 11
- 239000004065 semiconductor Substances 0.000 description 11
- 239000007787 solid Substances 0.000 description 6
- 229920000642 polymer Polymers 0.000 description 5
- 238000012545 processing Methods 0.000 description 5
- 235000012431 wafers Nutrition 0.000 description 5
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 5
- 239000006061 abrasive grain Substances 0.000 description 4
- 239000012141 concentrate Substances 0.000 description 4
- 239000007788 liquid Substances 0.000 description 4
- 238000009828 non-uniform distribution Methods 0.000 description 4
- -1 polyethylene terephthalate Polymers 0.000 description 4
- 238000009827 uniform distribution Methods 0.000 description 4
- 238000011144 upstream manufacturing Methods 0.000 description 4
- 239000002699 waste material Substances 0.000 description 4
- 238000013459 approach Methods 0.000 description 3
- 238000004519 manufacturing process Methods 0.000 description 3
- 238000012986 modification Methods 0.000 description 3
- 230000004048 modification Effects 0.000 description 3
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 2
- 239000004693 Polybenzimidazole Substances 0.000 description 2
- 239000004642 Polyimide Substances 0.000 description 2
- 239000004734 Polyphenylene sulfide Substances 0.000 description 2
- 239000000919 ceramic Substances 0.000 description 2
- 238000011109 contamination Methods 0.000 description 2
- 229910052802 copper Inorganic materials 0.000 description 2
- 239000010949 copper Substances 0.000 description 2
- 230000007547 defect Effects 0.000 description 2
- 239000003814 drug Substances 0.000 description 2
- 229940079593 drug Drugs 0.000 description 2
- 239000011521 glass Substances 0.000 description 2
- 238000005259 measurement Methods 0.000 description 2
- 239000002245 particle Substances 0.000 description 2
- 230000002093 peripheral effect Effects 0.000 description 2
- 229920001643 poly(ether ketone) Polymers 0.000 description 2
- 229920002480 polybenzimidazole Polymers 0.000 description 2
- 229920000728 polyester Polymers 0.000 description 2
- 229920000139 polyethylene terephthalate Polymers 0.000 description 2
- 239000005020 polyethylene terephthalate Substances 0.000 description 2
- 229920001721 polyimide Polymers 0.000 description 2
- 229920006254 polymer film Polymers 0.000 description 2
- 229920000069 polyphenylene sulfide Polymers 0.000 description 2
- 229920001343 polytetrafluoroethylene Polymers 0.000 description 2
- 239000004810 polytetrafluoroethylene Substances 0.000 description 2
- 241000784732 Lycaena phlaeas Species 0.000 description 1
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 1
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 description 1
- 239000011248 coating agent Substances 0.000 description 1
- 238000000576 coating method Methods 0.000 description 1
- 239000008119 colloidal silica Substances 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 230000008021 deposition Effects 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 239000002920 hazardous waste Substances 0.000 description 1
- 230000006872 improvement Effects 0.000 description 1
- 238000005065 mining Methods 0.000 description 1
- 230000000877 morphologic effect Effects 0.000 description 1
- 239000007800 oxidant agent Substances 0.000 description 1
- 239000002861 polymer material Substances 0.000 description 1
- 229920002635 polyurethane Polymers 0.000 description 1
- 239000004814 polyurethane Substances 0.000 description 1
- 239000000047 product Substances 0.000 description 1
Images
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/04—Lapping machines or devices; Accessories designed for working plane surfaces
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B57/00—Devices for feeding, applying, grading or recovering grinding, polishing or lapping agents
- B24B57/02—Devices for feeding, applying, grading or recovering grinding, polishing or lapping agents for feeding of fluid, sprayed, pulverised, or liquefied grinding, polishing or lapping agents
Landscapes
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
- Grinding-Machine Dressing And Accessory Apparatuses (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US32311701P | 2001-09-10 | 2001-09-10 | |
| US10/234,780 US6887132B2 (en) | 2001-09-10 | 2002-09-03 | Slurry distributor for chemical mechanical polishing apparatus and method of using the same |
| PCT/US2002/028787 WO2003022519A2 (en) | 2001-09-10 | 2002-09-09 | Slurry distributor for chemical mechanical polishing apparatus and method of using the same |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2005501753A JP2005501753A (ja) | 2005-01-20 |
| JP2005501753A5 JP2005501753A5 (https=) | 2006-01-05 |
| JP4054306B2 true JP4054306B2 (ja) | 2008-02-27 |
Family
ID=26928275
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2003526634A Expired - Fee Related JP4054306B2 (ja) | 2001-09-10 | 2002-09-09 | 化学的機械研磨装置用のスラリー分配装置および該スラリー分配装置を用いる方法 |
Country Status (4)
| Country | Link |
|---|---|
| US (2) | US6887132B2 (https=) |
| JP (1) | JP4054306B2 (https=) |
| AU (1) | AU2002326867A1 (https=) |
| WO (1) | WO2003022519A2 (https=) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR20200016184A (ko) | 2018-08-06 | 2020-02-14 | 가부시키가이샤 에바라 세이사꾸쇼 | 연마 장치 및 연마 방법 |
| US11642755B2 (en) | 2018-08-06 | 2023-05-09 | Ebara Corporation | Apparatus for polishing and method for polishing |
| TWI806353B (zh) * | 2016-06-24 | 2023-06-21 | 美商應用材料股份有限公司 | 用於化學機械拋光的漿體分佈設備 |
Families Citing this family (42)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7255637B2 (en) * | 2000-09-08 | 2007-08-14 | Applied Materials, Inc. | Carrier head vibration damping |
| US7086933B2 (en) * | 2002-04-22 | 2006-08-08 | Applied Materials, Inc. | Flexible polishing fluid delivery system |
| US20040214508A1 (en) * | 2002-06-28 | 2004-10-28 | Lam Research Corporation | Apparatus and method for controlling film thickness in a chemical mechanical planarization system |
| US6884152B2 (en) | 2003-02-11 | 2005-04-26 | Micron Technology, Inc. | Apparatuses and methods for conditioning polishing pads used in polishing micro-device workpieces |
| US6939210B2 (en) * | 2003-05-02 | 2005-09-06 | Applied Materials, Inc. | Slurry delivery arm |
| US7108497B2 (en) * | 2004-01-12 | 2006-09-19 | Omnimold, Llc | Interchangeable blow mold parison closing apparatus |
| JP2005271151A (ja) * | 2004-03-25 | 2005-10-06 | Toshiba Corp | 研磨装置及び研磨方法 |
| JP2006147773A (ja) * | 2004-11-18 | 2006-06-08 | Ebara Corp | 研磨装置および研磨方法 |
| US20070032180A1 (en) * | 2005-08-08 | 2007-02-08 | Taiwan Semiconductor Manufacturing Co., Ltd. | Slurry residence time enhancement system |
| US20070131562A1 (en) * | 2005-12-08 | 2007-06-14 | Applied Materials, Inc. | Method and apparatus for planarizing a substrate with low fluid consumption |
| US20070181442A1 (en) * | 2006-02-03 | 2007-08-09 | Applied Materials, Inc. | Method and apparatus for foam removal in an electrochemical mechanical substrate polishing process |
| JP4901301B2 (ja) * | 2006-05-23 | 2012-03-21 | 株式会社東芝 | 研磨方法及び半導体装置の製造方法 |
| US7452264B2 (en) * | 2006-06-27 | 2008-11-18 | Applied Materials, Inc. | Pad cleaning method |
| JP5080769B2 (ja) * | 2006-09-15 | 2012-11-21 | 株式会社東京精密 | 研磨方法及び研磨装置 |
| JP2008279539A (ja) * | 2007-05-10 | 2008-11-20 | Nomura Micro Sci Co Ltd | 研磨液の回収方法、及び研磨液の回収装置 |
| WO2012082126A1 (en) * | 2010-12-16 | 2012-06-21 | Araca, Inc. | Method and device for the injection of cmp slurry |
| US8197306B2 (en) | 2008-10-31 | 2012-06-12 | Araca, Inc. | Method and device for the injection of CMP slurry |
| US8845395B2 (en) * | 2008-10-31 | 2014-09-30 | Araca Inc. | Method and device for the injection of CMP slurry |
| KR101067608B1 (ko) * | 2009-03-30 | 2011-09-27 | 다이닛뽕스크린 세이조오 가부시키가이샤 | 기판처리장치 및 기판처리방법 |
| CN103648738B (zh) | 2010-12-30 | 2017-04-26 | 美国石膏公司 | 浆料分配器、系统及其使用方法 |
| US10076853B2 (en) | 2010-12-30 | 2018-09-18 | United States Gypsum Company | Slurry distributor, system, and method for using same |
| WO2012092534A1 (en) | 2010-12-30 | 2012-07-05 | United States Gypsum Company | Slurry distribution system and method |
| US9999989B2 (en) * | 2010-12-30 | 2018-06-19 | United States Gypsum Company | Slurry distributor with a profiling mechanism, system, and method for using same |
| US9296124B2 (en) | 2010-12-30 | 2016-03-29 | United States Gypsum Company | Slurry distributor with a wiping mechanism, system, and method for using same |
| AR088520A1 (es) | 2011-10-24 | 2014-06-18 | United States Gypsum Co | Distribuidor de lechada, sistema y metodo para su uso |
| CN103857499B (zh) | 2011-10-24 | 2016-12-14 | 美国石膏公司 | 用于浆料分配的多腿排出靴 |
| WO2013063080A2 (en) | 2011-10-24 | 2013-05-02 | United States Gypsum Company | Multi-piece mold and method of making slurry distributor |
| JP6139188B2 (ja) * | 2013-03-12 | 2017-05-31 | 株式会社荏原製作所 | 研磨装置および研磨方法 |
| US10059033B2 (en) | 2014-02-18 | 2018-08-28 | United States Gypsum Company | Cementitious slurry mixing and dispensing system with pulser assembly and method for using same |
| JP6468147B2 (ja) * | 2015-02-05 | 2019-02-13 | 東京エレクトロン株式会社 | 研磨装置、塗布膜形成装置、塗布膜形成方法及び記憶媒体 |
| WO2016125408A1 (ja) * | 2015-02-05 | 2016-08-11 | 東京エレクトロン株式会社 | 研磨装置、塗布膜形成装置、塗布膜形成方法、記憶媒体、パターン形成方法及びパターン形成装置 |
| JP2019029562A (ja) * | 2017-08-01 | 2019-02-21 | 株式会社荏原製作所 | 基板処理装置 |
| CN109562505A (zh) * | 2018-10-24 | 2019-04-02 | 长江存储科技有限责任公司 | 具有刮擦固定装置的化学机械抛光设备 |
| TWI885783B (zh) | 2019-02-20 | 2025-06-01 | 美商應用材料股份有限公司 | 化學機械拋光裝置及化學機械拋光方法 |
| TWI912098B (zh) | 2019-08-13 | 2026-01-11 | 美商應用材料股份有限公司 | 化學機械研磨系統 |
| US11897079B2 (en) | 2019-08-13 | 2024-02-13 | Applied Materials, Inc. | Low-temperature metal CMP for minimizing dishing and corrosion, and improving pad asperity |
| KR102835295B1 (ko) * | 2020-03-06 | 2025-07-18 | 가부시키가이샤 에바라 세이사꾸쇼 | 연마 장치, 처리 시스템 및 연마 방법 |
| JP7492854B2 (ja) * | 2020-05-11 | 2024-05-30 | 株式会社荏原製作所 | 研磨装置及び研磨方法 |
| JP2022151237A (ja) * | 2021-03-26 | 2022-10-07 | 株式会社東京精密 | Cmp装置 |
| KR102880334B1 (ko) * | 2021-11-26 | 2025-10-31 | 삼성전자주식회사 | 웨이퍼 연마 장치 및 이를 이용한 반도체 장치의 제조 방법 |
| WO2024049719A2 (en) * | 2022-08-29 | 2024-03-07 | Rajeev Bajaj | Advanced fluid delivery |
| US12521840B2 (en) * | 2024-03-07 | 2026-01-13 | Wolfspeed, Inc. | Two component chemical mechanical polishing |
Family Cites Families (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP3010572B2 (ja) * | 1994-09-29 | 2000-02-21 | 株式会社東京精密 | ウェーハエッジの加工装置 |
| KR970018240A (ko) * | 1995-09-08 | 1997-04-30 | 모리시다 요이치 | 반도체 기판의 연마방법 및 그 장치 |
| US5709593A (en) | 1995-10-27 | 1998-01-20 | Applied Materials, Inc. | Apparatus and method for distribution of slurry in a chemical mechanical polishing system |
| US5645682A (en) * | 1996-05-28 | 1997-07-08 | Micron Technology, Inc. | Apparatus and method for conditioning a planarizing substrate used in chemical-mechanical planarization of semiconductor wafers |
| US6139406A (en) | 1997-06-24 | 2000-10-31 | Applied Materials, Inc. | Combined slurry dispenser and rinse arm and method of operation |
| US5997392A (en) | 1997-07-22 | 1999-12-07 | International Business Machines Corporation | Slurry injection technique for chemical-mechanical polishing |
| JPH11114811A (ja) * | 1997-10-15 | 1999-04-27 | Ebara Corp | ポリッシング装置のスラリ供給装置 |
| US6429131B2 (en) | 1999-03-18 | 2002-08-06 | Infineon Technologies Ag | CMP uniformity |
| US6283840B1 (en) | 1999-08-03 | 2001-09-04 | Applied Materials, Inc. | Cleaning and slurry distribution system assembly for use in chemical mechanical polishing apparatus |
| US6284092B1 (en) | 1999-08-06 | 2001-09-04 | International Business Machines Corporation | CMP slurry atomization slurry dispense system |
| US6468134B1 (en) | 2000-06-30 | 2002-10-22 | Lam Research Corporation | Method and apparatus for slurry distribution |
| US6641468B2 (en) * | 2002-03-05 | 2003-11-04 | Promos Technologies Inc | Slurry distributor |
-
2002
- 2002-09-03 US US10/234,780 patent/US6887132B2/en not_active Expired - Fee Related
- 2002-09-09 AU AU2002326867A patent/AU2002326867A1/en not_active Abandoned
- 2002-09-09 WO PCT/US2002/028787 patent/WO2003022519A2/en not_active Ceased
- 2002-09-09 JP JP2003526634A patent/JP4054306B2/ja not_active Expired - Fee Related
-
2005
- 2005-01-25 US US11/043,531 patent/US20050130566A1/en not_active Abandoned
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI806353B (zh) * | 2016-06-24 | 2023-06-21 | 美商應用材料股份有限公司 | 用於化學機械拋光的漿體分佈設備 |
| US11986926B2 (en) | 2016-06-24 | 2024-05-21 | Applied Materials, Inc. | Slurry distribution device for chemical mechanical polishing |
| KR20200016184A (ko) | 2018-08-06 | 2020-02-14 | 가부시키가이샤 에바라 세이사꾸쇼 | 연마 장치 및 연마 방법 |
| US11465256B2 (en) | 2018-08-06 | 2022-10-11 | Ebara Corporation | Apparatus for polishing and method for polishing |
| US11642755B2 (en) | 2018-08-06 | 2023-05-09 | Ebara Corporation | Apparatus for polishing and method for polishing |
Also Published As
| Publication number | Publication date |
|---|---|
| WO2003022519A9 (en) | 2004-04-29 |
| US20030068959A1 (en) | 2003-04-10 |
| US6887132B2 (en) | 2005-05-03 |
| WO2003022519A2 (en) | 2003-03-20 |
| US20050130566A1 (en) | 2005-06-16 |
| JP2005501753A (ja) | 2005-01-20 |
| AU2002326867A1 (en) | 2003-03-24 |
| WO2003022519A3 (en) | 2004-01-22 |
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