JP4023997B2 - 薄膜磁界センサ - Google Patents

薄膜磁界センサ Download PDF

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Publication number
JP4023997B2
JP4023997B2 JP2000367822A JP2000367822A JP4023997B2 JP 4023997 B2 JP4023997 B2 JP 4023997B2 JP 2000367822 A JP2000367822 A JP 2000367822A JP 2000367822 A JP2000367822 A JP 2000367822A JP 4023997 B2 JP4023997 B2 JP 4023997B2
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JP
Japan
Prior art keywords
thin film
gap
terminal
soft magnetic
magnetic field
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP2000367822A
Other languages
English (en)
Japanese (ja)
Other versions
JP2002131407A (ja
JP2002131407A5 (enrdf_load_stackoverflow
Inventor
伸聖 小林
健 矢野
繁弘 大沼
健 増本
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
THE FOUDATION: THE RESEARCH INSTITUTE FOR ELECTRIC AND MAGNETIC MATERIALS
Original Assignee
THE FOUDATION: THE RESEARCH INSTITUTE FOR ELECTRIC AND MAGNETIC MATERIALS
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority to JP2000367822A priority Critical patent/JP4023997B2/ja
Application filed by THE FOUDATION: THE RESEARCH INSTITUTE FOR ELECTRIC AND MAGNETIC MATERIALS filed Critical THE FOUDATION: THE RESEARCH INSTITUTE FOR ELECTRIC AND MAGNETIC MATERIALS
Priority to CNB018032648A priority patent/CN100403048C/zh
Priority to AT01978911T priority patent/ATE434192T1/de
Priority to TW090126413A priority patent/TW550394B/zh
Priority to PCT/JP2001/009385 priority patent/WO2002037131A1/ja
Priority to DE60139017T priority patent/DE60139017D1/de
Priority to EP01978911A priority patent/EP1329735B1/en
Priority to KR1020027008326A priority patent/KR100687513B1/ko
Publication of JP2002131407A publication Critical patent/JP2002131407A/ja
Priority to US10/225,794 priority patent/US6642714B2/en
Publication of JP2002131407A5 publication Critical patent/JP2002131407A5/ja
Application granted granted Critical
Publication of JP4023997B2 publication Critical patent/JP4023997B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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  • Measuring Magnetic Variables (AREA)
  • Magnetic Heads (AREA)
  • Hall/Mr Elements (AREA)
JP2000367822A 2000-10-26 2000-10-26 薄膜磁界センサ Expired - Fee Related JP4023997B2 (ja)

Priority Applications (9)

Application Number Priority Date Filing Date Title
JP2000367822A JP4023997B2 (ja) 2000-10-26 2000-10-26 薄膜磁界センサ
KR1020027008326A KR100687513B1 (ko) 2000-10-26 2001-10-25 박막자계센서
TW090126413A TW550394B (en) 2000-10-26 2001-10-25 Thin-film magnetic field sensor
PCT/JP2001/009385 WO2002037131A1 (fr) 2000-10-26 2001-10-25 Capteur de champ magnetique a couche mince
DE60139017T DE60139017D1 (de) 2000-10-26 2001-10-25 Dünnfilm-magnetfeldsensor
EP01978911A EP1329735B1 (en) 2000-10-26 2001-10-25 Thin-film magnetic field sensor
CNB018032648A CN100403048C (zh) 2000-10-26 2001-10-25 薄膜磁传感器
AT01978911T ATE434192T1 (de) 2000-10-26 2001-10-25 Dünnfilm-magnetfeldsensor
US10/225,794 US6642714B2 (en) 2000-10-26 2002-08-22 Thin-film magnetic field sensor

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2000367822A JP4023997B2 (ja) 2000-10-26 2000-10-26 薄膜磁界センサ

Publications (3)

Publication Number Publication Date
JP2002131407A JP2002131407A (ja) 2002-05-09
JP2002131407A5 JP2002131407A5 (enrdf_load_stackoverflow) 2005-03-17
JP4023997B2 true JP4023997B2 (ja) 2007-12-19

Family

ID=18838177

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2000367822A Expired - Fee Related JP4023997B2 (ja) 2000-10-26 2000-10-26 薄膜磁界センサ

Country Status (1)

Country Link
JP (1) JP4023997B2 (enrdf_load_stackoverflow)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104508501A (zh) * 2012-05-11 2015-04-08 公立大学法人大阪市立大学 功率因数计测装置

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4334914B2 (ja) * 2003-05-28 2009-09-30 財団法人電気磁気材料研究所 薄膜磁気センサ
JP4323220B2 (ja) * 2003-05-28 2009-09-02 財団法人電気磁気材料研究所 薄膜磁気センサ及びその製造方法
JP2008209224A (ja) * 2007-02-26 2008-09-11 Daido Steel Co Ltd 磁気センサ
CN103558467B (zh) * 2013-10-29 2015-08-26 中国南方电网有限责任公司超高压输电公司 一种容性设备参数的计算方法
CN104808158A (zh) * 2015-05-07 2015-07-29 李川 一种飞磁探测器
CN107037381A (zh) * 2015-12-29 2017-08-11 爱盛科技股份有限公司 磁场感测装置及其感测方法
JP2018151332A (ja) * 2017-03-14 2018-09-27 大同特殊鋼株式会社 薄膜磁気センサ

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3466470B2 (ja) * 1998-03-18 2003-11-10 財団法人電気磁気材料研究所 薄膜磁気抵抗素子
JP2000180207A (ja) * 1998-12-16 2000-06-30 Yazaki Corp 磁気センサ

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104508501A (zh) * 2012-05-11 2015-04-08 公立大学法人大阪市立大学 功率因数计测装置
US10120001B2 (en) 2012-05-11 2018-11-06 Osaka City University Power factor measurement device

Also Published As

Publication number Publication date
JP2002131407A (ja) 2002-05-09

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