JP3945940B2 - 試料研磨方法及び試料研磨装置 - Google Patents
試料研磨方法及び試料研磨装置 Download PDFInfo
- Publication number
- JP3945940B2 JP3945940B2 JP15573699A JP15573699A JP3945940B2 JP 3945940 B2 JP3945940 B2 JP 3945940B2 JP 15573699 A JP15573699 A JP 15573699A JP 15573699 A JP15573699 A JP 15573699A JP 3945940 B2 JP3945940 B2 JP 3945940B2
- Authority
- JP
- Japan
- Prior art keywords
- polishing
- dressing
- sample
- dress
- head
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 238000005498 polishing Methods 0.000 title claims description 352
- 238000000034 method Methods 0.000 title claims description 24
- 238000003825 pressing Methods 0.000 claims description 33
- 229910003460 diamond Inorganic materials 0.000 claims description 22
- 239000010432 diamond Substances 0.000 claims description 22
- 239000002002 slurry Substances 0.000 claims description 14
- 239000002245 particle Substances 0.000 claims description 9
- 239000000758 substrate Substances 0.000 claims description 8
- 235000019592 roughness Nutrition 0.000 claims description 4
- 239000000126 substance Substances 0.000 description 8
- 239000000463 material Substances 0.000 description 7
- 238000011084 recovery Methods 0.000 description 6
- 239000004065 semiconductor Substances 0.000 description 6
- 229920005989 resin Polymers 0.000 description 5
- 239000011347 resin Substances 0.000 description 5
- 230000007423 decrease Effects 0.000 description 4
- 238000010586 diagram Methods 0.000 description 4
- 239000000376 reactant Substances 0.000 description 4
- 230000000694 effects Effects 0.000 description 3
- 239000002184 metal Substances 0.000 description 3
- 239000004925 Acrylic resin Substances 0.000 description 2
- 229920000178 Acrylic resin Polymers 0.000 description 2
- 230000002093 peripheral effect Effects 0.000 description 2
- 229920005749 polyurethane resin Polymers 0.000 description 2
- 230000002123 temporal effect Effects 0.000 description 2
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 239000003795 chemical substances by application Substances 0.000 description 1
- 239000012459 cleaning agent Substances 0.000 description 1
- 239000004020 conductor Substances 0.000 description 1
- 230000003247 decreasing effect Effects 0.000 description 1
- 230000006866 deterioration Effects 0.000 description 1
- 238000004070 electrodeposition Methods 0.000 description 1
- 239000012212 insulator Substances 0.000 description 1
- 238000003475 lamination Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000007517 polishing process Methods 0.000 description 1
- 230000002265 prevention Effects 0.000 description 1
- 238000004886 process control Methods 0.000 description 1
- 230000007261 regionalization Effects 0.000 description 1
- 238000007788 roughening Methods 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- 230000003746 surface roughness Effects 0.000 description 1
- 238000005406 washing Methods 0.000 description 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 1
Images
Landscapes
- Grinding-Machine Dressing And Accessory Apparatuses (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP15573699A JP3945940B2 (ja) | 1999-06-02 | 1999-06-02 | 試料研磨方法及び試料研磨装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP15573699A JP3945940B2 (ja) | 1999-06-02 | 1999-06-02 | 試料研磨方法及び試料研磨装置 |
Publications (3)
Publication Number | Publication Date |
---|---|
JP2000343406A JP2000343406A (ja) | 2000-12-12 |
JP2000343406A5 JP2000343406A5 (enrdf_load_stackoverflow) | 2005-11-24 |
JP3945940B2 true JP3945940B2 (ja) | 2007-07-18 |
Family
ID=15612333
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP15573699A Expired - Fee Related JP3945940B2 (ja) | 1999-06-02 | 1999-06-02 | 試料研磨方法及び試料研磨装置 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JP3945940B2 (enrdf_load_stackoverflow) |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4072810B2 (ja) * | 2001-01-19 | 2008-04-09 | 株式会社荏原製作所 | ドレッシング装置および該ドレッシング装置を備えたポリッシング装置 |
JP5390750B2 (ja) * | 2007-03-30 | 2014-01-15 | ラムバス・インコーポレーテッド | 研磨装置、および研磨パッド再生処理方法 |
JP5444596B2 (ja) * | 2007-08-31 | 2014-03-19 | 富士通セミコンダクター株式会社 | 半導体装置の製造方法 |
KR100930390B1 (ko) * | 2008-03-27 | 2009-12-08 | 주식회사 하이닉스반도체 | 화학기계적연마 장비 |
CN110744450B (zh) * | 2019-10-21 | 2021-11-26 | 西安奕斯伟材料科技有限公司 | 一种抛光垫的修整器及修整方法 |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0631945U (ja) * | 1992-09-25 | 1994-04-26 | シチズン時計株式会社 | 研磨定盤修正用工具 |
JPH091457A (ja) * | 1995-06-19 | 1997-01-07 | Sony Corp | ホイールドレッサ |
JP3360488B2 (ja) * | 1995-06-20 | 2002-12-24 | ソニー株式会社 | 研磨装置およびこれを用いた研磨方法 |
JP3482321B2 (ja) * | 1996-10-15 | 2003-12-22 | 新日本製鐵株式会社 | 半導体基板用研磨布のドレッサーおよびその製造方法 |
JP3660448B2 (ja) * | 1996-11-13 | 2005-06-15 | 株式会社日立製作所 | 半導体装置の製造方法及び製造装置 |
-
1999
- 1999-06-02 JP JP15573699A patent/JP3945940B2/ja not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
JP2000343406A (ja) | 2000-12-12 |
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