JP3882806B2 - エッチング方法 - Google Patents
エッチング方法 Download PDFInfo
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- JP3882806B2 JP3882806B2 JP2003368221A JP2003368221A JP3882806B2 JP 3882806 B2 JP3882806 B2 JP 3882806B2 JP 2003368221 A JP2003368221 A JP 2003368221A JP 2003368221 A JP2003368221 A JP 2003368221A JP 3882806 B2 JP3882806 B2 JP 3882806B2
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- JP
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- Prior art keywords
- etching
- etching method
- substrate
- processing fluid
- light
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 238000005530 etching Methods 0.000 title claims description 125
- 238000000034 method Methods 0.000 title claims description 47
- 239000012530 fluid Substances 0.000 claims description 67
- 239000000758 substrate Substances 0.000 claims description 52
- 238000010438 heat treatment Methods 0.000 claims description 12
- 238000006243 chemical reaction Methods 0.000 claims description 6
- 239000000126 substance Substances 0.000 claims description 5
- 230000010355 oscillation Effects 0.000 claims description 4
- 238000000059 patterning Methods 0.000 claims 2
- 239000010410 layer Substances 0.000 description 46
- 230000003287 optical effect Effects 0.000 description 8
- 239000007788 liquid Substances 0.000 description 7
- 239000004065 semiconductor Substances 0.000 description 7
- CURLTUGMZLYLDI-UHFFFAOYSA-N Carbon dioxide Chemical compound O=C=O CURLTUGMZLYLDI-UHFFFAOYSA-N 0.000 description 6
- 239000007789 gas Substances 0.000 description 5
- KRHYYFGTRYWZRS-UHFFFAOYSA-N Fluorane Chemical compound F KRHYYFGTRYWZRS-UHFFFAOYSA-N 0.000 description 4
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 4
- 230000007423 decrease Effects 0.000 description 4
- 230000000694 effects Effects 0.000 description 4
- 239000010703 silicon Substances 0.000 description 4
- 229910052710 silicon Inorganic materials 0.000 description 4
- OKKJLVBELUTLKV-UHFFFAOYSA-N Methanol Chemical compound OC OKKJLVBELUTLKV-UHFFFAOYSA-N 0.000 description 3
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 3
- 229910002092 carbon dioxide Inorganic materials 0.000 description 3
- 239000001569 carbon dioxide Substances 0.000 description 3
- 230000001678 irradiating effect Effects 0.000 description 3
- VLKZOEOYAKHREP-UHFFFAOYSA-N n-Hexane Chemical compound CCCCCC VLKZOEOYAKHREP-UHFFFAOYSA-N 0.000 description 3
- 239000002344 surface layer Substances 0.000 description 3
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 2
- 229910052782 aluminium Inorganic materials 0.000 description 2
- 239000003990 capacitor Substances 0.000 description 2
- 230000002542 deteriorative effect Effects 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 238000001035 drying Methods 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 230000005855 radiation Effects 0.000 description 2
- 229910052814 silicon oxide Inorganic materials 0.000 description 2
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Chemical compound O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 2
- PXGOKWXKJXAPGV-UHFFFAOYSA-N Fluorine Chemical compound FF PXGOKWXKJXAPGV-UHFFFAOYSA-N 0.000 description 1
- 229910004298 SiO 2 Inorganic materials 0.000 description 1
- 238000010521 absorption reaction Methods 0.000 description 1
- 230000004888 barrier function Effects 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- MZJUGRUTVANEDW-UHFFFAOYSA-N bromine fluoride Chemical compound BrF MZJUGRUTVANEDW-UHFFFAOYSA-N 0.000 description 1
- WUKWITHWXAAZEY-UHFFFAOYSA-L calcium difluoride Chemical compound [F-].[F-].[Ca+2] WUKWITHWXAAZEY-UHFFFAOYSA-L 0.000 description 1
- 239000007795 chemical reaction product Substances 0.000 description 1
- 238000004140 cleaning Methods 0.000 description 1
- 230000007797 corrosion Effects 0.000 description 1
- 238000005260 corrosion Methods 0.000 description 1
- 230000006378 damage Effects 0.000 description 1
- 230000000593 degrading effect Effects 0.000 description 1
- 230000006866 deterioration Effects 0.000 description 1
- 238000009826 distribution Methods 0.000 description 1
- 229910052731 fluorine Inorganic materials 0.000 description 1
- 239000011737 fluorine Substances 0.000 description 1
- 239000010436 fluorite Substances 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 239000012535 impurity Substances 0.000 description 1
- 239000000203 mixture Substances 0.000 description 1
- TVMXDCGIABBOFY-UHFFFAOYSA-N octane Chemical compound CCCCCCCC TVMXDCGIABBOFY-UHFFFAOYSA-N 0.000 description 1
- 239000013307 optical fiber Substances 0.000 description 1
- 239000010453 quartz Substances 0.000 description 1
- 230000003685 thermal hair damage Effects 0.000 description 1
- 239000012808 vapor phase Substances 0.000 description 1
- 230000008016 vaporization Effects 0.000 description 1
- IGELFKKMDLGCJO-UHFFFAOYSA-N xenon difluoride Chemical compound F[Xe]F IGELFKKMDLGCJO-UHFFFAOYSA-N 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B81—MICROSTRUCTURAL TECHNOLOGY
- B81C—PROCESSES OR APPARATUS SPECIALLY ADAPTED FOR THE MANUFACTURE OR TREATMENT OF MICROSTRUCTURAL DEVICES OR SYSTEMS
- B81C1/00—Manufacture or treatment of devices or systems in or on a substrate
- B81C1/00015—Manufacture or treatment of devices or systems in or on a substrate for manufacturing microsystems
- B81C1/00023—Manufacture or treatment of devices or systems in or on a substrate for manufacturing microsystems without movable or flexible elements
- B81C1/00047—Cavities
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B81—MICROSTRUCTURAL TECHNOLOGY
- B81C—PROCESSES OR APPARATUS SPECIALLY ADAPTED FOR THE MANUFACTURE OR TREATMENT OF MICROSTRUCTURAL DEVICES OR SYSTEMS
- B81C1/00—Manufacture or treatment of devices or systems in or on a substrate
- B81C1/00436—Shaping materials, i.e. techniques for structuring the substrate or the layers on the substrate
- B81C1/00444—Surface micromachining, i.e. structuring layers on the substrate
- B81C1/00468—Releasing structures
- B81C1/00476—Releasing structures removing a sacrificial layer
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
- H01L21/306—Chemical or electrical treatment, e.g. electrolytic etching
- H01L21/3065—Plasma etching; Reactive-ion etching
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/31—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to form insulating layers thereon, e.g. for masking or by using photolithographic techniques; After treatment of these layers; Selection of materials for these layers
- H01L21/3105—After-treatment
- H01L21/311—Etching the insulating layers by chemical or physical means
- H01L21/31105—Etching inorganic layers
- H01L21/31111—Etching inorganic layers by chemical means
- H01L21/31116—Etching inorganic layers by chemical means by dry-etching
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B81—MICROSTRUCTURAL TECHNOLOGY
- B81C—PROCESSES OR APPARATUS SPECIALLY ADAPTED FOR THE MANUFACTURE OR TREATMENT OF MICROSTRUCTURAL DEVICES OR SYSTEMS
- B81C2201/00—Manufacture or treatment of microstructural devices or systems
- B81C2201/01—Manufacture or treatment of microstructural devices or systems in or on a substrate
- B81C2201/0101—Shaping material; Structuring the bulk substrate or layers on the substrate; Film patterning
- B81C2201/0128—Processes for removing material
- B81C2201/013—Etching
- B81C2201/0135—Controlling etch progression
- B81C2201/0142—Processes for controlling etch progression not provided for in B81C2201/0136 - B81C2201/014
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B81—MICROSTRUCTURAL TECHNOLOGY
- B81C—PROCESSES OR APPARATUS SPECIALLY ADAPTED FOR THE MANUFACTURE OR TREATMENT OF MICROSTRUCTURAL DEVICES OR SYSTEMS
- B81C2201/00—Manufacture or treatment of microstructural devices or systems
- B81C2201/11—Treatments for avoiding stiction of elastic or moving parts of MEMS
- B81C2201/117—Using supercritical fluid, e.g. carbon dioxide, for removing sacrificial layers
Landscapes
- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Power Engineering (AREA)
- Computer Hardware Design (AREA)
- General Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Plasma & Fusion (AREA)
- Chemical Kinetics & Catalysis (AREA)
- General Chemical & Material Sciences (AREA)
- Inorganic Chemistry (AREA)
- Analytical Chemistry (AREA)
- Micromachines (AREA)
- Drying Of Semiconductors (AREA)
- Weting (AREA)
Description
図1は、本発明のエッチング方法に用いられる処理装置の一例を示す概略構成図である。この処理装置は、エッチングが行われる処理室11を有している。この処理室11内には、被処理物となる基板Sが収納可能であると共に、内部を所定の温度に保持可能である。また、処理室11に収納された基板Sの表面(エッチング対象となる面)に対向する位置には、基板Sに対して照射される照射光(例えば、レーザ光やランプ光)hを透過する光学窓12が設けられている。この光学窓12は、公知に用いられている合成石英や蛍石などが好適に用いられる。
次に、このような構成の処理装置を用いたエッチング方法の第1実施形態を、図2のフローチャートに基づき、図1を参照しつつ説明する。ここでは、基板Sの表面側において、微細なエッチング開口から選択的に犠牲層をエッチング除去する場合を想定してエッチング方法の実施形態を説明する。
次に、第2実施形態のエッチング方法を説明する。本第2実施形態のエッチング方法は、マスクパターンを介して基板Sの選択された箇所のみに照射光hを照射する方法であり、一連の工程手順は図2のフローチャトを用いて説明した第1実施形態の工程手順と同様であることとする。
Claims (5)
- 基板上に犠牲層をパターン形成し、当該犠牲層を覆う状態で設けた構造体層をパターニングすることにより当該犠牲層に達するエッチング開口を有する構造体を形成した後、当該エッチング開口から前記犠牲層を選択的にエッチング除去してなる中空部を形成するエッチング方法において、
エッチング反応種を含有する処理流体に前記基板上に前記構造体を形成してなる被処理物を晒した状態で、マスクパターンを介して当該被処理物における前記構造体のエッチング開口から離れた前記中空部位置の表面のみを光照射によって断続的に加熱することにより、当該被処理物近傍における前記処理流体を断続的に加熱して膨張、収縮させると共に、
前記被処理物に対して前記処理流体を流動させた状態を保つ
ことを特徴とするエッチング方法。 - 請求項1記載のエッチング方法において、
前記処理流体は、超臨界状態の物質にエッチング反応種を含有させてなる
ことを特徴とするエッチング方法。 - 請求項1記載のエッチング方法において、
前記光照射は、ランプ光またはレーザ光のパルス発振によってなされる
ことを特徴とするエッチング方法。 - 請求項3記載のエッチング方法において、
前記光照射は、照射時間100n秒以下のパルス発振によってなされる
ことを特徴とするエッチング方法。 - 請求項1記載のエッチング方法において、
前記被処理物の表面に照射される光は、紫外光である
ことを特徴とするエッチング方法。
Priority Applications (6)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2003368221A JP3882806B2 (ja) | 2003-10-29 | 2003-10-29 | エッチング方法 |
DE102004052461A DE102004052461A1 (de) | 2003-10-29 | 2004-10-28 | Ätzverfahren |
KR1020040086654A KR20050040795A (ko) | 2003-10-29 | 2004-10-28 | 에칭 방법 |
TW093133027A TWI283887B (en) | 2003-10-29 | 2004-10-29 | Etching process |
CNB2004101037584A CN1331729C (zh) | 2003-10-29 | 2004-10-29 | 蚀刻方法 |
US10/977,302 US20050112887A1 (en) | 2003-10-29 | 2004-10-29 | Etching process |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2003368221A JP3882806B2 (ja) | 2003-10-29 | 2003-10-29 | エッチング方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2005136013A JP2005136013A (ja) | 2005-05-26 |
JP3882806B2 true JP3882806B2 (ja) | 2007-02-21 |
Family
ID=34543770
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2003368221A Expired - Fee Related JP3882806B2 (ja) | 2003-10-29 | 2003-10-29 | エッチング方法 |
Country Status (6)
Country | Link |
---|---|
US (1) | US20050112887A1 (ja) |
JP (1) | JP3882806B2 (ja) |
KR (1) | KR20050040795A (ja) |
CN (1) | CN1331729C (ja) |
DE (1) | DE102004052461A1 (ja) |
TW (1) | TWI283887B (ja) |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI406333B (zh) * | 2005-11-18 | 2013-08-21 | Mitsubishi Gas Chemical Co | Wet etching method and wet etching device |
US8084367B2 (en) | 2006-05-24 | 2011-12-27 | Samsung Electronics Co., Ltd | Etching, cleaning and drying methods using supercritical fluid and chamber systems using these methods |
JP2009149959A (ja) * | 2007-12-21 | 2009-07-09 | Ulvac Japan Ltd | エッチング装置、エッチング方法 |
DE102010000666A1 (de) | 2010-01-05 | 2011-07-07 | Robert Bosch GmbH, 70469 | Bauelement mit einer mikromechanischen Mikrofonstruktur und Verfahren zu dessen Herstellung |
KR102311732B1 (ko) * | 2018-07-23 | 2021-10-13 | 세메스 주식회사 | 기판 처리 장치 및 기판 처리 방법 |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TW371775B (en) * | 1995-04-28 | 1999-10-11 | Siemens Ag | Method for the selective removal of silicon dioxide |
GB9616225D0 (en) * | 1996-08-01 | 1996-09-11 | Surface Tech Sys Ltd | Method of surface treatment of semiconductor substrates |
WO1998032163A1 (en) * | 1997-01-22 | 1998-07-23 | California Institute Of Technology | Gas phase silicon etching with bromine trifluoride |
DE19941042A1 (de) * | 1999-08-28 | 2001-03-15 | Bosch Gmbh Robert | Verfahren zur Herstellung oberflächenmikromechanischer Strukturen durch Ätzung mit einem dampfförmigen, flußsäurehaltigen Ätzmedium |
WO2002079080A1 (fr) * | 2001-03-29 | 2002-10-10 | Kabushiki Kaisha Toyota Chuo Kenkyusho | Dispositif et procede de production d'une structure a base de silicium |
US6919158B2 (en) * | 2001-08-03 | 2005-07-19 | Fuji Photo Film Co., Ltd. | Conductive pattern material and method for forming conductive pattern |
US20040118812A1 (en) * | 2002-08-09 | 2004-06-24 | Watkins James J. | Etch method using supercritical fluids |
-
2003
- 2003-10-29 JP JP2003368221A patent/JP3882806B2/ja not_active Expired - Fee Related
-
2004
- 2004-10-28 DE DE102004052461A patent/DE102004052461A1/de not_active Withdrawn
- 2004-10-28 KR KR1020040086654A patent/KR20050040795A/ko not_active Application Discontinuation
- 2004-10-29 US US10/977,302 patent/US20050112887A1/en not_active Abandoned
- 2004-10-29 CN CNB2004101037584A patent/CN1331729C/zh not_active Expired - Fee Related
- 2004-10-29 TW TW093133027A patent/TWI283887B/zh not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
TWI283887B (en) | 2007-07-11 |
KR20050040795A (ko) | 2005-05-03 |
CN1644483A (zh) | 2005-07-27 |
US20050112887A1 (en) | 2005-05-26 |
CN1331729C (zh) | 2007-08-15 |
TW200527481A (en) | 2005-08-16 |
DE102004052461A1 (de) | 2005-06-02 |
JP2005136013A (ja) | 2005-05-26 |
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