JP3806973B2 - 光電変換器の暗電流補正装置 - Google Patents

光電変換器の暗電流補正装置 Download PDF

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Publication number
JP3806973B2
JP3806973B2 JP16418496A JP16418496A JP3806973B2 JP 3806973 B2 JP3806973 B2 JP 3806973B2 JP 16418496 A JP16418496 A JP 16418496A JP 16418496 A JP16418496 A JP 16418496A JP 3806973 B2 JP3806973 B2 JP 3806973B2
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Japan
Prior art keywords
dark current
correction
pixel
photoelectric converter
pixels
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Expired - Lifetime
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JP16418496A
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English (en)
Japanese (ja)
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JPH1013749A5 (enExample
JPH1013749A (ja
Inventor
英彦 青柳
重之 内山
省三 山野
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Nikon Corp
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Nikon Corp
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Priority to JP16418496A priority Critical patent/JP3806973B2/ja
Publication of JPH1013749A publication Critical patent/JPH1013749A/ja
Publication of JPH1013749A5 publication Critical patent/JPH1013749A5/ja
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Publication of JP3806973B2 publication Critical patent/JP3806973B2/ja
Anticipated expiration legal-status Critical
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  • Focusing (AREA)
  • Automatic Focus Adjustment (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
JP16418496A 1996-06-25 1996-06-25 光電変換器の暗電流補正装置 Expired - Lifetime JP3806973B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP16418496A JP3806973B2 (ja) 1996-06-25 1996-06-25 光電変換器の暗電流補正装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP16418496A JP3806973B2 (ja) 1996-06-25 1996-06-25 光電変換器の暗電流補正装置

Publications (3)

Publication Number Publication Date
JPH1013749A JPH1013749A (ja) 1998-01-16
JPH1013749A5 JPH1013749A5 (enExample) 2004-11-25
JP3806973B2 true JP3806973B2 (ja) 2006-08-09

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JP16418496A Expired - Lifetime JP3806973B2 (ja) 1996-06-25 1996-06-25 光電変換器の暗電流補正装置

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JP (1) JP3806973B2 (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2010125609A1 (ja) * 2009-04-30 2010-11-04 株式会社島津製作所 光または放射線撮像装置

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2803082B1 (fr) * 1999-12-28 2002-03-22 Trixell Sas Procede de compensation en temperature de la sensibilite d'un detecteur d'image
JP2003015022A (ja) * 2001-06-29 2003-01-15 Canon Inc 測距装置、測距方法、及び制御プログラム
US7372484B2 (en) * 2003-06-26 2008-05-13 Micron Technology, Inc. Method and apparatus for reducing effects of dark current and defective pixels in an imaging device
JP4534715B2 (ja) * 2004-10-22 2010-09-01 株式会社ニコン 撮像装置および画像処理プログラム
JP4789245B2 (ja) * 2006-01-13 2011-10-12 株式会社日立メディコ Ｘ線画像診断装置
WO2010109539A1 (ja) * 2009-03-27 2010-09-30 株式会社島津製作所 撮像装置
JP5413280B2 (ja) * 2010-04-05 2014-02-12 株式会社島津製作所 撮像装置
WO2015072006A1 (ja) * 2013-11-15 2015-05-21 富士通株式会社 赤外線検知装置

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2010125609A1 (ja) * 2009-04-30 2010-11-04 株式会社島津製作所 光または放射線撮像装置

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Publication number Publication date
JPH1013749A (ja) 1998-01-16

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