JP3175930U - Ｘ線検査装置 - Google Patents

Ｘ線検査装置 Download PDF

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Publication number
JP3175930U
JP3175930U JP2012001491U JP2012001491U JP3175930U JP 3175930 U JP3175930 U JP 3175930U JP 2012001491 U JP2012001491 U JP 2012001491U JP 2012001491 U JP2012001491 U JP 2012001491U JP 3175930 U JP3175930 U JP 3175930U
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Japan
Prior art keywords
ray
seal
bag
seal portion
inspection apparatus
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Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
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JP2012001491U
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English (en)
Japanese (ja)
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JP3175930U7 (enrdf_load_stackoverflow
Inventor
興二 片山
一幸 杉本
弘樹 武下
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Ishida Co Ltd
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Ishida Co Ltd
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Priority to JP2012001491U priority Critical patent/JP3175930U/ja
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Publication of JP3175930U7 publication Critical patent/JP3175930U7/ja
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JP2012001491U 2012-03-16 2012-03-16 Ｘ線検査装置 Expired - Lifetime JP3175930U (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2012001491U JP3175930U (ja) 2012-03-16 2012-03-16 Ｘ線検査装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2012001491U JP3175930U (ja) 2012-03-16 2012-03-16 Ｘ線検査装置

Publications (2)

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JP3175930U true JP3175930U (ja) 2012-06-07
JP3175930U7 JP3175930U7 (enrdf_load_stackoverflow) 2015-01-29

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JP2012001491U Expired - Lifetime JP3175930U (ja) 2012-03-16 2012-03-16 Ｘ線検査装置

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Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2014061461A1 (ja) * 2012-10-17 2014-04-24 株式会社システムスクエア 包装体の検査装置
WO2015049765A1 (ja) * 2013-10-03 2015-04-09 株式会社システムスクエア 包装体の検査装置
JP2015087371A (ja) * 2013-09-26 2015-05-07 株式会社イシダ Ｘ線検査装置
JP2016024132A (ja) * 2014-07-23 2016-02-08 株式会社ファブリカトヤマ 包装袋の検査方法および包装袋の検査装置
JP2017067716A (ja) * 2015-10-02 2017-04-06 大森機械工業株式会社 異物検査装置

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3943099B2 (ja) * 2003-06-09 2007-07-11 アンリツ産機システム株式会社 Ｘ線検査装置
JP2009085876A (ja) * 2007-10-02 2009-04-23 Anritsu Sanki System Co Ltd Ｘ線質量測定装置
JP2011173609A (ja) * 2010-02-24 2011-09-08 Mitsuhashi Seisakusho:Kk 小袋投入装置

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3943099B2 (ja) * 2003-06-09 2007-07-11 アンリツ産機システム株式会社 Ｘ線検査装置
JP2009085876A (ja) * 2007-10-02 2009-04-23 Anritsu Sanki System Co Ltd Ｘ線質量測定装置
JP2011173609A (ja) * 2010-02-24 2011-09-08 Mitsuhashi Seisakusho:Kk 小袋投入装置

Cited By (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP2887056B1 (en) 2012-10-17 2018-07-11 System Square Inc. Apparatus for inspecting packaging body
CN104737003A (zh) * 2012-10-17 2015-06-24 世高株式会社 包装体的检查装置
WO2014061461A1 (ja) * 2012-10-17 2014-04-24 株式会社システムスクエア 包装体の検査装置
JPWO2014061461A1 (ja) * 2012-10-17 2016-09-05 株式会社 システムスクエア 包装体の検査装置
US9541499B2 (en) 2012-10-17 2017-01-10 System Square Inc. Package inspection system
JP2015087371A (ja) * 2013-09-26 2015-05-07 株式会社イシダ Ｘ線検査装置
WO2015049765A1 (ja) * 2013-10-03 2015-04-09 株式会社システムスクエア 包装体の検査装置
JP5720028B1 (ja) * 2013-10-03 2015-05-20 株式会社 システムスクエア 包装体の検査装置
CN104718447A (zh) * 2013-10-03 2015-06-17 世高株式会社 包装体的检查装置
EP3045897B1 (en) 2013-10-03 2019-07-03 System Square Inc. Package inspection device
CN104718447B (zh) * 2013-10-03 2017-07-28 世高株式会社 包装体的检查装置
US9733384B2 (en) 2013-10-03 2017-08-15 System Square Inc. Package inspection system
JP2016024132A (ja) * 2014-07-23 2016-02-08 株式会社ファブリカトヤマ 包装袋の検査方法および包装袋の検査装置
JP2017067716A (ja) * 2015-10-02 2017-04-06 大森機械工業株式会社 異物検査装置

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