JP3175930U7 - - Google Patents

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Publication number
JP3175930U7
JP3175930U7 JP2012001491U JP2012001491U JP3175930U7 JP 3175930 U7 JP3175930 U7 JP 3175930U7 JP 2012001491 U JP2012001491 U JP 2012001491U JP 2012001491 U JP2012001491 U JP 2012001491U JP 3175930 U7 JP3175930 U7 JP 3175930U7
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JP
Japan
Prior art keywords
product
ray
continuous
packaged product
inspection
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Expired - Lifetime
Application number
JP2012001491U
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English (en)
Japanese (ja)
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JP3175930U (ja
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Priority to JP2012001491U priority Critical patent/JP3175930U/ja
Priority claimed from JP2012001491U external-priority patent/JP3175930U/ja
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Publication of JP3175930U7 publication Critical patent/JP3175930U7/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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JP2012001491U 2012-03-16 2012-03-16 Ｘ線検査装置 Expired - Lifetime JP3175930U (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2012001491U JP3175930U (ja) 2012-03-16 2012-03-16 Ｘ線検査装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2012001491U JP3175930U (ja) 2012-03-16 2012-03-16 Ｘ線検査装置

Publications (2)

Publication Number Publication Date
JP3175930U JP3175930U (ja) 2012-06-07
JP3175930U7 true JP3175930U7 (enrdf_load_stackoverflow) 2015-01-29

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ID=48002930

Family Applications (1)

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JP2012001491U Expired - Lifetime JP3175930U (ja) 2012-03-16 2012-03-16 Ｘ線検査装置

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JP (1) JP3175930U (enrdf_load_stackoverflow)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2014061461A1 (ja) * 2012-10-17 2014-04-24 株式会社システムスクエア 包装体の検査装置
JP6224434B2 (ja) * 2013-09-26 2017-11-01 株式会社イシダ Ｘ線検査装置
JP5720028B1 (ja) * 2013-10-03 2015-05-20 株式会社 システムスクエア 包装体の検査装置
JP6318037B2 (ja) * 2014-07-23 2018-04-25 シブヤパッケージングシステム株式会社 包装袋の検査方法および包装袋の検査装置
JP6688582B2 (ja) * 2015-10-02 2020-04-28 大森機械工業株式会社 異物検査装置

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3943099B2 (ja) * 2003-06-09 2007-07-11 アンリツ産機システム株式会社 Ｘ線検査装置
JP5199633B2 (ja) * 2007-10-02 2013-05-15 アンリツ産機システム株式会社 Ｘ線質量測定装置
JP2011173609A (ja) * 2010-02-24 2011-09-08 Mitsuhashi Seisakusho:Kk 小袋投入装置

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