JP3142391B2 - 自動ワイヤボンダ用放電電極 - Google Patents

自動ワイヤボンダ用放電電極

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Publication number
JP3142391B2
JP3142391B2 JP04262222A JP26222292A JP3142391B2 JP 3142391 B2 JP3142391 B2 JP 3142391B2 JP 04262222 A JP04262222 A JP 04262222A JP 26222292 A JP26222292 A JP 26222292A JP 3142391 B2 JP3142391 B2 JP 3142391B2
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Japan
Prior art keywords
discharge electrode
sample
ball
automatic wire
wire bonder
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Expired - Fee Related
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JPH06112263A (ja
Inventor
一光 板橋
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Tanaka Denshi Kogyo KK
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Tanaka Denshi Kogyo KK
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    • H01L2224/02Bonding areas; Manufacturing methods related thereto
    • H01L2224/04Structure, shape, material or disposition of the bonding areas prior to the connecting process
    • H01L2224/05Structure, shape, material or disposition of the bonding areas prior to the connecting process of an individual bonding area
    • H01L2224/0554External layer
    • H01L2224/05599Material
    • H01L2224/056Material with a principal constituent of the material being a metal or a metalloid, e.g. boron [B], silicon [Si], germanium [Ge], arsenic [As], antimony [Sb], tellurium [Te] and polonium [Po], and alloys thereof
    • H01L2224/05663Material with a principal constituent of the material being a metal or a metalloid, e.g. boron [B], silicon [Si], germanium [Ge], arsenic [As], antimony [Sb], tellurium [Te] and polonium [Po], and alloys thereof the principal constituent melting at a temperature of greater than 1550°C
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    • H01L2224/85009Pre-treatment of the connector or the bonding area
    • H01L2224/8503Reshaping, e.g. forming the ball or the wedge of the wire connector
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  • Engineering & Computer Science (AREA)
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  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Wire Bonding (AREA)

Description

【発明の詳細な説明】
【0001】
【産業上の利用分野】本発明は、半導体素子のチップ電
極と、外部リードとを接続するために用いられる自動ワ
イヤボンダに関し、さらに詳しくは、前記ワイヤボンダ
におけるボール形成用の放電電極に関する。
【0002】
【従来の技術】従来から図1に示すように、例えばキャ
ピラリー1aの先端に垂下せしめたAu線2の先端を,
放電電極1bの先端ヘッド部1b’からの放電により溶
融させてボール2’を形成し、このボール2’をチップ
上のAl又はAl合金からなる電極に圧着・切断してバ
ンプ電極を形成するバンプ接続法や、前記ボール2’を
チップ電極に圧着,接合せしめた後、ループ状に外部リ
ードまで導いて該外部リードに圧着・切断することによ
り、チップ電極と外部リードを接続させるワイヤボンデ
ィング法が知られている。
【0003】また、この種ボンディング法に用いるに有
用な自動ワイヤボンダ1として、W−Y,W−La等の
高融点金属に少量の不純物を添加して放電電極1bを形
成したものが知られている(特開平1−256134
号)。
【0004】
【発明が解決しようとする課題】しかし乍ら上記従来の
ワイヤボンダでは、W−Y,W−Laが酸化し易く、放
電電極表面に酸化被膜を形成してしまうことから放電が
不安定なものになり、形成されるボール径にばらつきが
生じる結果、ボンディング後の接続強度が低くなる不具
合があった。
【0005】本発明はこのような従来事情に鑑みてなさ
れたものであり、その目的とするところは、放電電極か
らの放電をより安定性あるものとして、ボール形成時に
おけるボール径のばらつきを低減させることにある。
【0006】
【課題を解決するための手段】以上の目的を達成するた
めに本発明は、半導体素子のボンディング時において安
定した径のボンディングボールを自動ワイヤボンダによ
り形成するための放電電極であって、該放電電極が溶解
鋳造工程を経て得られたものであり、その組成が、Pt
またはPt合金であることを特徴とする。
【0007】また、後述の理由から、上記放電電極にお
けるPt合金の組成が、Ir1〜35wt%,Pd1〜
30wt%,Au1〜20wt%,Ni1〜25wt
%,W1〜10wt%,Ru1〜15wt%の中から何
れか1種または2種以上を含有し、残部Pt65wt%
以上であることもよい。
【0008】
【作用】上記の構成によれば、Ptまたは、Ir,P
d,Au,Ni,W,Ruを添加してなるPt合金は、
酸化しても400℃程度で蒸発してしまうので、放電時
に高温(約3000℃程度)になる放電電極表面には酸
化膜が形成されず、該電極からの放電が安定したものと
なる。よって、ボール径のばらつきを極めて小範囲なも
のとし、ボンディング後の接続強度を改善できる。
【0009】また、放電電極は放電時に高温になること
から、Pt合金を形成する添加元素に高融点なもの、即
ち、Ir,Pd,Au,Ni,W,Ruを選んだ。
【0010】しかし乍ら、上記各元素各々の添加量が、
35wt%(Ir),30wt%(Pd),20wt%(A
u),25wt%(Ni),10wt%(W),15wt%
(Ru)を越えると偏析が生じ、Pt合金が不均一なも
のになるので好ましくない。
【0011】従って、Ir,Pd,Au,Ni,W,R
uの添加量を上記の範囲に各々設定した。
【0012】
【実施例】以下、具体的な実施例と比較例について説明
する。純度99.9%以上のPtに、Ir,Pd,A
u,Ni,W,Ruを表1中に示す含有率に基づき添加
して溶解鋳造し、各試料とした。
【0013】表1中の試料No.1は純度99.9%の
Ptに何も添加しない本発明実施品、試料No.2〜1
3はIr,Pd,Au,Ni,W,Ruの中から1種を
添加し、残部Ptが65wt%以上である本発明実施品、
試料NO.14は前記添加元素の中からIrとNiを選
んで所定量を添加した本発明実施品である。
【0014】また、表1中の試料No.15はIrの添
加量が35wt%を越える比較品、試料No.16はPd
の添加量が30wt%を越える比較品、試料No.17は
Auの添加量が20wt%を越える比較品、試料No.1
8はNiの添加量が25wt%を越える比較品、試料N
o.19はWの添加量が10wt%を越える比較品、試料
No.20はRuの添加量が15wt%を越える比較品で
ある。試料No.21はW−Y合金からなる比較品であ
る。
【0015】上記のようにして作製した各試料を用い
て、図1に示すような放電電極1b及びそのヘッド部1
b’を成形するをもって自動ワイヤボンダ1を構成し
た。そうして、一般に使用されるAuワイヤ(φ25μ
m)を用いて、放電時間4msに固定してボール径6
2.5μmになるよう放電電流を調整し、各々5万回放
電後に、ボールを10個作製した際のボール径の平均値
と標準偏差を測定した。これらの結果も表1中に示す。
【0016】
【表1】
【0017】而して、試料No.1の測定結果から、高
純度のPtからなる放電電極を用いたボンダを使用すれ
ば、ボール径のばらつきを極めて小範囲なものとし得る
ことが確認できた。また、試料NO.2〜14の測定結
果から、各添加元素(Ir,Pd,Au,Ni,W,R
u)の中からを1種または2種以上を所定量添加し、且
つ残部Ptを65wt%としてなる放電電極を用いたボン
ダを使用すれば、試料No.1同様、ボール径のばらつ
きを極めて小範囲なものとし得ることが確認できた。
【0018】さらに、試料No.15〜20の測定結果
から、前記各添加元素の含有量が設定範囲を越える場合
は、上記本発明実施品に比して、ボール径のばらつきが
極めて大きいことが確認できた。同様に、試料No.2
1の測定結果から、W−Y合金からなる放電電極を用い
た場合も、ボール径のばらつきが極めて大きいことが確
認できた。
【0019】尚、本実施例においては放電電極1bとヘ
ッド部1b’を一体成形物として両者を上記各試料で成
形したが、これら両者を別体物としてヘッド部1b’の
み上記各試料で成形することも可能であり、この場合に
おいても、上述と同様の測定結果,効果が得られること
はいうまでもない。
【0020】
【発明の効果】本発明は以上説明したように、Pt、ま
たは、Ir,Pd,Au,Ni,W,Ruを所定量添加
したPt合金からなる放電電極を用いることで、ボール
成形時におけるボール径のばらつきを極めて小範囲なも
のとし得た。
【0021】従って、ボンディング後におけるボールと
チップ電極の接合強度を著しく改善して、ワイヤボンデ
ィング法及びバンプ接続法に用いるに極めて有用な自動
ワイヤボンダ並びにその放電電極を提供できた。
【図面の簡単な説明】
【図1】一般的な自動ワイヤボンダの要部を表す拡大
図。

Claims (2)

    (57)【特許請求の範囲】
  1. 【請求項1】 半導体素子のボンディング時において安
    定した径のボンディングボールを自動ワイヤボンダによ
    り形成するための放電電極であって、該放電電極が溶解
    鋳造工程を経て得られたものであり、その組成が、Pt
    またはPt合金であることを特徴とする自動ワイヤボン
    ダ用放電電極。
  2. 【請求項2】 上記Pt合金が、Ir:1〜35wt
    %,Pd:1〜30wt%,Au:1〜20wt%,N
    i:1〜25wt%,W:1〜10wt%,Ru:1〜
    15wt%の中から何れか1種または2種以上を含有
    し、残部Pt65wt%以上であることを特徴とする請
    求項1記載の自動ワイヤボンダ用放電電極。
JP04262222A 1992-09-30 1992-09-30 自動ワイヤボンダ用放電電極 Expired - Fee Related JP3142391B2 (ja)

Priority Applications (1)

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2013220646A (ja) * 2012-04-19 2013-10-28 Rational Shokai:Kk 手帳カバー

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2013220646A (ja) * 2012-04-19 2013-10-28 Rational Shokai:Kk 手帳カバー

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JPH06112263A (ja) 1994-04-22

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