JP2732355B2 - Manufacturing method of high strength and high conductivity copper alloy material for electronic equipment - Google Patents

Manufacturing method of high strength and high conductivity copper alloy material for electronic equipment

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Publication number
JP2732355B2
JP2732355B2 JP6075424A JP7542494A JP2732355B2 JP 2732355 B2 JP2732355 B2 JP 2732355B2 JP 6075424 A JP6075424 A JP 6075424A JP 7542494 A JP7542494 A JP 7542494A JP 2732355 B2 JP2732355 B2 JP 2732355B2
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JP
Japan
Prior art keywords
temperature
strength
copper alloy
aging
weight ratio
Prior art date
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Expired - Fee Related
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JP6075424A
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Japanese (ja)
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JPH07258805A (en
Inventor
広信 沢渡
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NITSUKO KINZOKU KK
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NITSUKO KINZOKU KK
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Priority to JP6075424A priority Critical patent/JP2732355B2/en
Priority to KR1019950003411A priority patent/KR0160342B1/en
Publication of JPH07258805A publication Critical patent/JPH07258805A/en
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Publication of JP2732355B2 publication Critical patent/JP2732355B2/en
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Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【産業上の利用分野】この発明は、トランジスタや集積
回路(IC)等のような半導体機器のリ−ド材として好
適な、高い強度や電気伝導性等に加えて優れたエッチン
グ性及び曲げ加工性をも備えた電子機器用高力高導電性
銅合金材の製造方法に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a semiconductor device such as a transistor or an integrated circuit (IC), which is suitable for use as a lead material and has excellent etching properties and bending in addition to high strength and electric conductivity. The present invention relates to a method for producing a high-strength and high-conductivity copper alloy material for electronic equipment having a property.

【0002】[0002]

【従来技術とその課題】近年のICパッケ−ジの動向は
“軽薄短小化”に象徴されてきたが、最近、表面パッケ
−ジの普及によってその傾向は益々促進され、更にIC
チップの高機能化に伴う多ピン化及び低発熱化も同時に
進んでいる。一方、ICパッケ−ジの形態に係る具体的
な変遷過程を見ると、従来はDIPに代表されるピン挿
入型パッケ−ジが多用されてきたが、実装密度向上を目
的とした“表面実装”が主流になるにつれてSOJ,S
OP,QFP等の表面実装型への移行が進んでいる。そ
して、最近では、多ピン化に伴ってリ−ドピッチを縮小
したファインピッチQFPが増加し、更にTSOP,T
QFP等に代表される薄板化が進行している。
2. Description of the Related Art In recent years, the trend of IC packages has been symbolized by "miniaturization and lightness". Recently, however, the trend has been further promoted by the spread of surface packages.
At the same time, the increase in the number of pins and the reduction in heat generation accompanying the enhancement of the functions of the chip are also progressing. On the other hand, looking at a specific transition process relating to the form of an IC package, a pin insertion type package represented by DIP has been frequently used in the past. Becomes more mainstream, SOJ, S
The shift to surface mount types such as OP and QFP is progressing. Recently, fine pitch QFPs, in which the lead pitch has been reduced, have increased with the increase in the number of pins.
Thinning such as QFP is progressing.

【0003】ところで、多ピン,狭ピッチのフレ−ムの
大半はエッチング加工により作られるのが一般的である
が、このエッチング加工では狙いとする板厚方向への食
刻のみならず板幅方向へのサイドエッチも起こることか
ら、リ−ド幅やリ−ド間隔に関する加工精度の観点から
素材板厚は薄いほど加工上有利となる。また、パッケ−
ジの薄肉化要求からもリ−ドフレ−ム材を薄くする必要
があり、そのため最近では板厚が0.15mmから0.125 mm、
更には0.10mmへと薄くなる傾向を示している。
[0003] By the way, most of the multi-pin, narrow-pitch frames are generally formed by etching. In this etching, not only the etching in the target thickness direction but also the plate width direction is performed. Since side etching also occurs, the thinner the material plate is, the more advantageous in processing from the viewpoint of processing accuracy with respect to the lead width and the lead interval. Also, the package
It is also necessary to reduce the thickness of the lead frame material from the demand for thinner parts, so recently the plate thickness has been reduced from 0.15 mm to 0.125 mm,
Furthermore, it shows a tendency to become thinner to 0.10 mm.

【0004】しかし、このようなリ−ドフレ−ムの薄板
化やリ−ドの狭小化はリ−ド強度を低下させ、アセンブ
リ−工程中やデバイス実装時におけるリ−ドの変形を引
き起こす。そこで、このような問題を解決するためには
使用されるリ−ドフレ−ム材料の強度をできるだけ向上
させる必要がある。また、ICの高集積化や多ピン化が
進むと、これに伴い消費電力も大きくなってチップから
発生する熱の放散対策が無視できない重要な問題とな
る。
[0004] However, such thinning of the lead frame and narrowing of the lead lower the lead strength and cause deformation of the lead during the assembly process and device mounting. Therefore, in order to solve such a problem, it is necessary to improve the strength of the lead frame material used as much as possible. Further, as the integration of ICs and the number of pins increase, power consumption increases, and measures to dissipate heat generated from chips become an important problem that cannot be ignored.

【0005】このように、半導体機器のリ−ドフレ−ム
材には一般に次のような多岐多用な特性が要求されてい
る。 a) リ−ドが容易に変形することがない機械的強度を有
すること, b) リ−ドフレ−ムのパタ−ン形成に必要な優れたエッ
チング性及びプレス加工性を有すること, c) チップの発熱に対して効率良く熱放散させるための
高い熱伝導率を有すること, d) 電気的特性に優れていること, e) デバイス実装時における半田付け性に優れ、かつ半
田接合部の信頼性が高いこと, f) ボンディングのためのAgメッキ性に優れること, g) 加熱工程で表面が酸化することのない優れた耐酸化
性を有していること, h) 繰り返し曲げ性に優れていること, i) 価格が安価であること。
As described above, the lead frame material of semiconductor equipment is generally required to have the following various characteristics. a) The lead must have mechanical strength so that it is not easily deformed. b) It shall have the excellent etching and press workability required for forming the lead frame pattern. c) Chips High thermal conductivity to efficiently dissipate the heat generated by the device, d) excellent electrical characteristics, e) excellent solderability when mounting devices, and reliability of solder joints F) Ag plating for bonding, g) Excellent oxidation resistance without oxidizing the surface during the heating process, h) Excellent repetitive bendability I) The price is low.

【0006】しかしながら、これら各種の要求特性に対
し、従来より使用されてきたリン青銅等の銅合金や42
アロイ(42wt%Ni-Fe)には何れも一長一短があり、前記
特性の全てを満足し得るものはなかった。特に、リ−ド
の多ピン化,小型化の進展に伴って形状の複雑化やピン
の狭小化が進み、リ−ドフレ−ム材料に一層良好な強
度,エッチング性及び曲げ加工性が求められていること
を考慮すれば、上記従来材はこれらの点で十分な性能を
有しているとは言い難かった。
However, in response to these various required characteristics, copper alloys such as phosphor bronze and the like which have been used in the past have been used.
All alloys (42 wt% Ni-Fe) had advantages and disadvantages, and none could satisfy all of the above characteristics. In particular, with the increase in the number of pins and miniaturization of leads, the complexity of the shape and the narrowing of the pins have progressed, and lead frames have been required to have better strength, etching properties and bending workability. In view of the above, it has been difficult to say that the conventional material has sufficient performance in these respects.

【0007】このようなことから、本発明が目的とした
のは、半導体機器のリ−ドフレ−ム材等として要求され
る前記各特性の何れをも満たす材料、特にビッカ−ス硬
さで約200以上の強度(引張強度で65kgf/mm2
上)を有すると共に50%IACS(42アロイの約15倍
程度)以上の導電率を示し、かつ曲げ加工性及びエッチ
ング性にも十分に優れた金属材料の安定提供手段を確立
することである。
Accordingly, an object of the present invention is to provide a material which satisfies all of the above-mentioned characteristics required as a lead frame material or the like of a semiconductor device, in particular, has a Vickers hardness of about 10%. A metal that has a strength of 200 or more (65 kgf / mm 2 or more in tensile strength), a conductivity of 50% IACS (about 15 times that of 42 alloy), and is sufficiently excellent in bending workability and etching properties. The purpose is to establish a means for providing stable materials.

【0008】[0008]

【課題を解決するための手段】本発明者等は、上記目的
を達成すべく鋭意検討を行ったところ、まず次のような
結論に達した。即ち、元々熱伝導度で42アロイをはる
かに上回る銅をベ−スとした銅合金は熱放散性において
他のリ−ドフレ−ム材料に比べ非常に有利である上、電
気的特性,Agめっき性,半田付け性,耐酸化性,延性等
の面でも比較的良好な特性を確保することができる。従
って、これらの特性を損なうことなく薄板化に対応可能
な強度と繰り返し曲げ性,エッチング性等を付与して従
来の銅合金の持つ欠点を改良できれば、半導体機器のリ
−ドフレ−ム材や導電性ばね材等として優れた材料を実
現できると考えられる。
Means for Solving the Problems The present inventors have conducted intensive studies in order to achieve the above object, and have reached the following conclusion. That is, a copper alloy based on copper, which originally has a thermal conductivity far exceeding 42 alloy, is very advantageous in heat dissipation as compared with other lead frame materials, and has electrical characteristics and Ag plating. Relatively good characteristics can be ensured also in terms of properties, solderability, oxidation resistance, ductility and the like. Therefore, if the strength which can cope with thinning, the repetitive bending property, the etching property and the like can be added without impairing these characteristics to improve the drawbacks of the conventional copper alloy, the lead frame material and the conductive property of semiconductor equipment can be improved. It is considered that an excellent material can be realized as the elastic spring material or the like.

【0009】そこで、固溶型銅合金に比べ導電率を低下
させずに高強度化が可能な、析出型銅合金の一つである
Cu−Cr−Zr合金に着目して研究を行った結果、「Cu−Cr
−Zr合金にTi及びFeを添加するか、 更にはZn,Sn,In,
Mn,P,MgあるいはSiのの1種又は2種以上をも添加す
ると共に、 それら各成分の含有量割合を厳密に調整した
銅合金を素材とし、 その溶体化処理条件を規制して結晶
粒径を制御した上で、更に特定条件での冷間加工,時
効,最終冷間加工及び最終焼鈍を施すと、 強度,導電
率,曲げ加工性,ばね特性,Agめっき性,半田接合部の
信頼性等の諸性質が一段と改善された材料を得ることが
できる」という知見を得ることができた。
[0009] Therefore, it is one of the precipitation-type copper alloys capable of increasing the strength without lowering the conductivity as compared with the solid-solution-type copper alloy.
As a result of conducting research focusing on Cu-Cr-Zr alloys,
-Add Ti and Fe to Zr alloy, or add Zn, Sn, In,
One or more of Mn, P, Mg and Si are added, and a copper alloy is used as a material, in which the content ratio of each component is strictly adjusted. After controlling the diameter and further performing cold working, aging, final cold working and final annealing under specific conditions, the strength, conductivity, bending workability, spring characteristics, Ag plating properties, solder joint reliability, It is possible to obtain a material with further improved properties such as properties. "

【0010】本発明は、上記知見事項等を基にしてなさ
れたもので、 「Cr:0.05〜0.40%(以降、 成分割合を表す%は重量割
合とする),Zr:0.03〜0.25%, Fe:0.10〜1.80%,
Ti:0.10〜0.80% を含むか、 あるいは更に Zn:0.05〜2.0 %,Sn,In,Mn,P,Mg及びSiの1種以
上:総量で0.01〜1% のうちの1種又は2種以上を含有すると共に、 “0.10%
≦Ti≦0.60%”ではFe/Ti重量比が0.66〜2.6 を満足
し、 また“0.60%<Ti≦0.80%”ではFe/Ti重量比が1.
1 〜2.6 を満足していて残部がCu及び不可避的不純物か
ら成る銅合金の素材に、 1) 950℃未満の温度での溶体化処理, 2) 50〜90%の加工度での冷間加工, 3) 300〜580℃の温度での時効処理, 4) 16〜83%の加工度での冷間加工, 5) 350〜700℃の温度での焼鈍, なる処理をこの順に順次施すことによって、 強度,導電
率,曲げ加工性及び半田接合部の信頼性等の諸性質を高
いレベルでバランスさせた電子機器用高力高導電性銅合
金材を安定して製造できるようにした点」に大きな特徴
を有している。
The present invention has been made on the basis of the above findings and the like. "Cr: 0.05 to 0.40% (hereinafter,% representing the component ratio is a weight ratio), Zr: 0.03 to 0.25%, Fe : 0.10 to 1.80%,
Ti: 0.10 to 0.80%, or Zn: 0.05 to 2.0%, one or more of Sn, In, Mn, P, Mg, and Si: one or more of 0.01 to 1% in total amount And “0.10%
≦ Ti ≦ 0.60% ”, the Fe / Ti weight ratio satisfies 0.66 to 2.6, and“ 0.60% <Ti ≦ 0.80% ”, the Fe / Ti weight ratio is 1.
For copper alloy material that satisfies 1-2.6 and the remainder consists of Cu and unavoidable impurities, 1) solution treatment at a temperature of less than 950 ° C, 2) cold working at a working ratio of 50-90% , 3) aging treatment at a temperature of 300 to 580 ° C, 4) cold working at a working ratio of 16 to 83%, 5) annealing at a temperature of 350 to 700 ° C. The strength, conductivity, bending workability, and reliability of solder joints have been balanced at a high level to enable stable production of high-strength, high-conductivity copper alloy materials for electronic equipment. " It has great features.

【0011】次に、本発明において銅合金素材の成分組
成及び処理条件を前記の如くに数値限定した理由を、そ
の作用と共に詳述する。 A) 成分組成 (a) Cr Cr,Zr,Ti及びFe等を含む本発明に係る銅合金におい
て、Crは合金の溶体化処理に次ぐ時効処理によって母相
中に析出し、その強度及び電気伝導性を向上させる作用
を発揮するが、Cr含有量が0.05%未満では前記作用によ
る所望の効果が得られない。一方、Cr含有量が0.30%付
近を超えると溶体化処理後にも未溶解Crが母相中に残留
するようになり、更にCr含有量が0.40%を超えると粗大
介在物として存在するようになって(圧延垂直断面をエ
ッチングした時にヒゲバリ状粗大介在物として現れ
る)、合金のエッチング性及び繰り返し曲げ性を劣化す
る。従って、Cr含有量は0.05〜0.40%と定めた。
Next, the reason why the component composition of the copper alloy material and the processing conditions in the present invention are numerically limited as described above will be described in detail together with the operation thereof. A) Component composition (a) Cr In the copper alloy according to the present invention containing Cr, Zr, Ti, Fe, etc., Cr precipitates in the parent phase by aging treatment following solution treatment of the alloy, and its strength and electric conductivity Although the effect of improving the properties is exhibited, if the Cr content is less than 0.05%, the desired effect by the above-mentioned effect cannot be obtained. On the other hand, if the Cr content exceeds about 0.30%, undissolved Cr will remain in the matrix even after solution treatment, and if the Cr content exceeds 0.40%, it will be present as coarse inclusions. (Appears as bald-burr-like coarse inclusions when the rolled vertical cross section is etched), thereby deteriorating the alloy's etching properties and repeated bending properties. Therefore, the Cr content was determined to be 0.05 to 0.40%.

【0012】(b) Zr 本発明に係る銅合金において、Zrは時効処理によりCuと
化合物を形成して母相中に析出しこれを強化する作用を
発揮するが、Zr含有量が0.03%未満では前記作用による
所望の効果が得られず、一方、0.25%を超えて含有させ
ると溶体化処理後にも未溶解Zrが母相中に残留し電気伝
導度及び曲げ加工性を低下させることから、Zr含有量は
0.03〜0.25%と定めた。
(B) Zr In the copper alloy according to the present invention, Zr forms a compound with Cu by aging treatment and precipitates in the matrix to exert an effect of strengthening it, but the Zr content is less than 0.03%. In the above, the desired effect due to the above-mentioned action cannot be obtained.On the other hand, if the content exceeds 0.25%, undissolved Zr remains in the mother phase even after the solution treatment, thereby lowering the electrical conductivity and bending workability. Zr content is
0.03 to 0.25%.

【0013】(c) Ti及びFe 本発明に係る銅合金において、Ti及びFeは合金を時効処
理した時に母相中にTiとFeの金属間化合物を形成し、そ
の結果として合金強度を更に向上させる作用を発揮する
が、これらの含有量がそれぞれ0.01%未満では前記作用
による所望の効果が得られない。一方、Ti含有量が0.80
%を超えたり、Fe含有量が1.80%を超える場合には、Ti
とFeを主成分とする未溶解介在物が5μm以上の大きさ
となってエッチング性を著しく阻害する。ここで、注目
すべきは、合金の強度と電気伝導性に及ぼすTi含有量,
Fe含有量の影響であり、合金の強度と電気伝導性はTiと
Feの含有量の和が一定であってもFe/Ti重量比により大
きく変化するという点である。即ち、「0.10%≦Ti≦0.
60%」の範囲ではFe/Ti重量比が0.66未満である場合
に、また「0.60%<Ti≦0.80%」の範囲ではFe/Ti重量
比が1.1 未満であると何れも電気伝導性は著しく低下す
る。これに対し、合金の強度は「0.10%≦Ti≦0.80%」
の全Ti含有量範囲においてFe/Ti重量比がが2.6 を超え
ると減少する。つまり、Fe/Ti重量比に関して電気伝導
性と強度は相反する関係にあり、両者を高位にバランス
させる最適なFe/Ti重量比は、「0.10%≦Ti≦0.60%」
では0.66〜2.6 に、また「0.60%<Ti≦0.80%」では1.
1 〜2.6 ということになる。以上のことを踏まえて、合
金の強度,電気伝導性及びエッチング性を満足させるべ
くTi含有量は0.10〜0.80%、Fe含有量は0.10〜1.8 %と
それぞれ定め、かつ「0.10%≦Ti≦0.60%」ではFe/Ti
重量比を0.66〜2.6 に、また「0.60%<Ti≦0.80%」で
はFe/Ti重量比を1.1 〜2.6 にそれぞれ限定した。
(C) Ti and Fe In the copper alloy according to the present invention, Ti and Fe form an intermetallic compound of Ti and Fe in the mother phase when the alloy is aged, and as a result, the alloy strength is further improved. However, if their contents are less than 0.01%, the desired effects cannot be obtained. On the other hand, the Ti content is 0.80
% Or the Fe content exceeds 1.80%,
In addition, undissolved inclusions containing Fe as a main component have a size of 5 μm or more, and significantly impair the etching property. It should be noted here that the Ti content, which affects the strength and electrical conductivity of the alloy,
The effect of the Fe content is that the strength and electrical conductivity of the alloy are
The point is that even if the sum of the Fe contents is constant, it greatly changes depending on the Fe / Ti weight ratio. That is, “0.10% ≦ Ti ≦ 0.
In the range of “60%”, when the Fe / Ti weight ratio is less than 0.66, and in the range of “0.60% <Ti ≦ 0.80%”, when the Fe / Ti weight ratio is less than 1.1, the electric conductivity is remarkable. descend. On the other hand, the strength of the alloy is “0.10% ≦ Ti ≦ 0.80%”
Decreases when the Fe / Ti weight ratio exceeds 2.6 in the entire Ti content range. In other words, the electrical conductivity and the strength are in a contradictory relationship with respect to the Fe / Ti weight ratio, and the optimal Fe / Ti weight ratio that balances the two is "0.10% ≦ Ti ≦ 0.60%”.
For 0.66% to 2.6%, and for 0.60% <Ti ≦ 0.80%, 1.
1 to 2.6. Based on the above, the Ti content is set to 0.10 to 0.80% and the Fe content is set to 0.10 to 1.8% to satisfy the strength, electric conductivity and etching property of the alloy, respectively, and "0.10% ≦ Ti ≦ 0.60 % ”Is Fe / Ti
The weight ratio was limited to 0.66 to 2.6, and in "0.60% <Ti ≦ 0.80%", the Fe / Ti weight ratio was limited to 1.1 to 2.6.

【0014】(d) Zn 本発明に係る合金においてZnは半田の耐熱剥離性を向上
させる作用を発揮し、そのため必要に応じて含有せしめ
られる成分であるが、その含有量が0.05%以下では前記
作用による所望の効果が得られず、一方、2.0 %を超え
て含有させると導電率の低下を招くことから、Zn含有量
は0.05〜2.0 %と定めた。
(D) Zn In the alloy according to the present invention, Zn exerts an effect of improving the heat-resistant peeling property of the solder, and is therefore a component that can be added if necessary. The desired effect due to the action cannot be obtained. On the other hand, if the content exceeds 2.0%, the conductivity will be reduced. Therefore, the Zn content is determined to be 0.05 to 2.0%.

【0015】(e) Sn,In,Mn,P,Mg及びSi 本発明に係る合金において、Sn,In,Mn,P,Mg及びSi
は何れも合金の導電率を大きく低下させずに主として固
溶強化により強度を向上させる作用を発揮するため、必
要に応じてこれらの1種又は2種以上が添加されるが、
それらの含有量が総量で0.01%未満であると前記作用に
よる所望の効果が得られない。一方、これらの含有量が
総量で1.0 %を超えると合金の導電率及び曲げ加工性が
劣化するようになる。従って、Sn,In,Mn,P,Mgある
いはSiの含有量は総量で0.01〜1%と定めた。
(E) Sn, In, Mn, P, Mg and Si In the alloy according to the present invention, Sn, In, Mn, P, Mg and Si
In any case, one or two or more of these are added as necessary to exert the effect of improving strength mainly by solid solution strengthening without significantly lowering the conductivity of the alloy.
If their contents are less than 0.01% in total, the desired effects due to the above effects cannot be obtained. On the other hand, when their contents exceed 1.0% in total, the conductivity and bending workability of the alloy deteriorate. Therefore, the content of Sn, In, Mn, P, Mg or Si is determined to be 0.01 to 1% in total.

【0016】B) 処理条件 (a) 溶体化処理 溶体化処理は、Cr,Zr,Ti及びFeを母相中に強制固溶さ
せてその後の時効により母相上に析出させ高い強度と導
電率を確保する工程であり、基本的には溶体化処理温度
の高い方がCr,Zr,Ti及びFeの固溶量が増加するので時
効による析出強化が大になると期待されるものである。
しかし、溶体化温度が高すぎると結晶粒が粗大化して曲
げ加工性が劣化するという問題が生じる。しかるに、本
発明に係る組成の合金について種々調査したところ、溶
体化温度が950℃未満では平均結晶粒径が60μm未
満の整粒組織となって最終的に十分満足できる曲げ加工
性を確保できるのに対して、溶体化温度が950℃以上
になると70μm以上の粗大粒を一部に含む2次再結晶
となって曲げ加工性を著しく劣化させることが明らかと
なった。そのため、本発明では溶体化を950℃未満で
実施することと定めた。なお、本発明に係る組成の合金
では溶体化処理時の冷却速度が速いほど高強度が得られ
やすいので、溶体化後の冷却は具体的には水冷とするこ
とが望ましい。
B) Treatment Conditions (a) Solution Treatment The solution treatment involves forcibly forming a solid solution of Cr, Zr, Ti, and Fe in the matrix, and then precipitating on the matrix by aging to obtain high strength and conductivity. Basically, it is expected that the higher the solution treatment temperature, the higher the solid solution amount of Cr, Zr, Ti and Fe, and therefore the greater the precipitation strengthening by aging.
However, when the solution temperature is too high, there is a problem that the crystal grains become coarse and the bending workability deteriorates. However, when various investigations were made on the alloy having the composition according to the present invention, it was found that when the solution temperature was lower than 950 ° C., the average crystal grain size was less than 60 μm, and finally a sufficiently satisfactory bending workability could be secured. On the other hand, when the solution temperature was 950 ° C. or higher, it was clarified that secondary recrystallization partially including coarse particles of 70 μm or more and the bending workability was significantly deteriorated. Therefore, in the present invention, it is determined that the solution treatment is performed at less than 950 ° C. In addition, in the alloy having the composition according to the present invention, the higher the cooling rate during the solution treatment, the higher the strength is easily obtained. Therefore, specifically, the cooling after the solution treatment is desirably water-cooled.

【0017】(b) 冷間加工(1回目) 溶体化処理後に冷間加工を行う理由は、高強度化を図る
ために“加工硬化”と“時効工程での析出物の析出速
度”をより促進させることにある。そして、この冷間加
工の加工度を50〜90%と限定したのは、加工度が5
0%未満では冷間加工によって得られる上記効果が不十
分であって65kgf/mm2 以上の引張強度が得られず、一
方、90%を超える加工度にすると曲げ加工性が劣化す
るためである。
(B) Cold work (first time) The reason why cold work is performed after the solution treatment is that the "work hardening" and the "precipitation rate of precipitates in the aging process" are made in order to increase the strength. Is to promote it. The reason why the cold working ratio is limited to 50 to 90% is that the cold working ratio is 5 to 90%.
If it is less than 0%, the above effects obtained by cold working are insufficient, and a tensile strength of 65 kgf / mm 2 or more cannot be obtained. On the other hand, if the working degree exceeds 90%, bending workability is deteriorated. .

【0018】(c) 時効処理 時効処理は材料の強度及び導電性を向上させるために不
可欠の工程であるが、時効条件が最適化されていないと
所望の強度及び導電率が得られない。即ち、時効温度が
300℃未満であると析出反応が殆ど促進されないので
所望の時効処理効果を確保できず、一方、時効温度が5
80℃を超えると軟化が進行して強度低下を招くことか
ら、本発明では時効処理温度を300〜580℃と限定
した。
(C) Aging treatment The aging treatment is an indispensable step for improving the strength and conductivity of the material. However, if the aging conditions are not optimized, desired strength and conductivity cannot be obtained. That is, if the aging temperature is lower than 300 ° C., the precipitation reaction is hardly promoted, so that the desired aging treatment effect cannot be secured.
If the temperature exceeds 80 ° C., the softening proceeds and the strength is reduced. Therefore, in the present invention, the aging treatment temperature is limited to 300 to 580 ° C.

【0019】なお、上記時効処理は“等温焼鈍(等温時
効)”あるいは“高温から低温に温度を2回以上連続し
て変化させる焼鈍(多段時効)”の何れによって実施し
ても差支えはないが、示差走査熱量分析測定より本発明
に係る合金の析出温度領域は320〜440℃及び50
0〜580℃であることから、このデ−タを基礎にして
時効条件を以下のように定めるのが良い。イ ) 等温時効を施す場合 等温時効の場合は時効処理温度を350〜580℃に設
定するのが良い。これは、350℃未満では最低12時
間以上の時効時間が必要となるために現場操業上におい
て実際的でなく、一方、580℃を超えると析出物の粗
大化による軟化が進行して強度の低下が生じるためであ
る。ロ ) 多段時効を施す場合 多段時効の場合は、導電率をある程度回復させるために
初段時効は高温とされ、また析出の駆動力を2段目以降
にも残すべく時効時間を短くする。しかも、2段目の時
効温度を初段時効温度より低温にすることにより析出物
サイズ及び分布を細かく制御し、更なる時効硬化の促進
を狙う。なお、この場合も時効処理温度が300℃未満
の温度では析出反応が殆ど進行しないで析出物サイズ及
び分布の制御に長時間を要するので現場操業上実際的で
なく、一方、580℃を超える高温で時効すると軟化に
よる強度の低下が発生するので、時効処理温度を300
〜580℃に設定するのが良い。
The above-mentioned aging treatment can be carried out by any of "isothermal annealing (isothermal aging)" and "annealing in which the temperature is continuously changed from high temperature to low temperature two or more times (multi-stage aging)". The precipitation temperature range of the alloy according to the present invention was 320 to 440 ° C. and 50
Since the temperature is from 0 to 580 ° C., the aging condition is preferably determined as follows based on this data. B) Isothermal aging In the case of isothermal aging, the aging treatment temperature is preferably set to 350 to 580 ° C. This is not practical for on-site operation because an aging time of at least 12 hours or more is required at a temperature lower than 350 ° C. On the other hand, at a temperature exceeding 580 ° C., the softening due to coarsening of the precipitate proceeds and the strength decreases. Is caused. B) In the case of multi-stage aging In the case of multi-stage aging, the first-stage aging is performed at a high temperature in order to recover the conductivity to some extent, and the aging time is shortened so that the driving force for precipitation remains in the second and subsequent stages. In addition, the size and distribution of the precipitates are finely controlled by lowering the aging temperature of the second stage from the aging temperature of the first stage, and the aim is to further promote the age hardening. In this case, too, when the aging treatment temperature is lower than 300 ° C., the precipitation reaction hardly proceeds and it takes a long time to control the size and distribution of the precipitates, which is not practical for on-site operation. When aging is performed, the strength is reduced due to softening.
The temperature is preferably set to 580 ° C.

【0020】(d) 冷間圧延(2回目) 時効処理後の冷間加工は、加工硬化と析出物の微細化に
より更に著しい強度上昇が確保されるために実施する。
しかし、この際の加工度が16%未満では引張強度で6
5kgf/mm2 以上の高強度を得ることができず、一方、8
3%を超える加工度を与えた場合には曲げ加工性が劣化
する。
(D) Cold rolling (second time) The cold working after the aging treatment is carried out in order to secure a further remarkable increase in strength due to work hardening and miniaturization of precipitates.
However, if the working ratio is less than 16%, the tensile strength is 6%.
High strength of 5 kgf / mm 2 or more could not be obtained, while 8
If a working ratio of more than 3% is given, bending workability deteriorates.

【0021】(e) 歪取り焼鈍 最終冷間加工の後、ばね性を向上させると共に延性を回
復させるために350〜700℃の温度で歪取り焼鈍が
施される。なお、この際の焼鈍温度が350℃未満であ
ると十分なばね性と延性を得るために長時間を要するた
め現場操業上において実際的ではなく、一方、700℃
を超える温度域では析出物の再溶解が著しくなり、焼鈍
時間を0.1 〜1秒の精度で制御しない限り強度及び導電
率が著しく低下するためやはり実際的でなくなる。
(E) Strain relief annealing After the final cold working, strain relief annealing is performed at a temperature of 350 to 700 ° C. in order to improve the spring property and restore the ductility. If the annealing temperature at this time is lower than 350 ° C., it takes a long time to obtain a sufficient spring property and ductility, so that it is not practical in the field operation.
In a temperature region exceeding the above range, the re-dissolution of the precipitate becomes remarkable, and unless the annealing time is controlled with an accuracy of 0.1 to 1 second, the strength and the electric conductivity are remarkably reduced, so that it is not practical.

【0022】なお、上記製造条件の規定は本発明に係る
“溶体化処理以降の工程”に関してのものであり、それ
以前の工程における条件は任意のもので構わない。即
ち、例え本発明で規定する処理(溶体化処理→冷間加工
→時効処理→冷間加工→焼鈍)の前に実施される溶体化
処理,熱間加工,中間焼鈍,冷間加工等の条件について
は何ら規定する必要はない。
It should be noted that the above-mentioned production conditions relate to the "steps after the solution treatment" according to the present invention, and the conditions in the steps before the steps may be arbitrary. That is, even if conditions such as solution treatment, hot working, intermediate annealing, cold working, etc. are performed before the treatment (solution treatment → cold working → aging treatment → cold working → annealing) specified in the present invention. Does not need to be specified at all.

【0023】続いて、本発明の効果を実施例によって更
に具体的に説明する。
Next, the effects of the present invention will be described more specifically with reference to examples.

【実施例】電気銅を原料として高周波溶解炉で表1及び
表2に示す各種成分組成の銅合金を1200℃で溶製
し、インゴットに鋳造した。そして、このインゴットを
面削した後、950℃に1時間加熱し、熱間圧延によっ
て8mm厚の板材とした。
EXAMPLES Copper alloys having various component compositions shown in Tables 1 and 2 were melted at 1200 ° C. in a high frequency melting furnace using electrolytic copper as a raw material, and cast into ingots. Then, the ingot was chamfered, heated at 950 ° C. for 1 hour, and hot-rolled to obtain a sheet material having a thickness of 8 mm.

【0024】[0024]

【表1】 [Table 1]

【0025】[0025]

【表2】 [Table 2]

【0026】次に、この熱延板に表3及び表4に示す条
件の溶体化処理,冷間圧延,時効処理,最終冷間圧延及
び歪取り焼鈍を順次施し、 0.125mmの板とした。
Next, the hot-rolled sheet was subjected to a solution treatment, a cold rolling, an aging treatment, a final cold rolling, and a strain relief annealing under the conditions shown in Tables 3 and 4 in that order to obtain a 0.125 mm plate.

【0027】[0027]

【表3】 [Table 3]

【0028】[0028]

【表4】 [Table 4]

【0029】次いで、得られたこれら各板材につき、結
晶粒度(平均結晶粒径)を調査すると共に、リ−ドフレ
−ム材としての評価項目として“引張強度", "伸び", "
電気伝導性", "繰り返し曲げ性", "半田付け性", "半田
耐熱剥離性", "Agめっき性"及び "エッチング性" を調
べた。
Next, the grain size (average crystal grain size) of each of the obtained sheet materials was examined, and "tensile strength", "elongation" and "elongation" were evaluated as evaluation items as a lead frame material.
"Electrical conductivity", "Repeated bending property", "Soldering property", "Solder heat resistance peeling property", "Ag plating property" and "Etching property" were examined.

【0030】ここで、“引張強度" と "伸び" は引張試
験によって測定し、 "電気伝導性"は導電率(%IACS) に
より評価した。なお、引張強度と導電率の評価基準は、
引張強度については65kgf/mm2 以上を可とし、導電率
については50%IACS以上を可とした。"繰り返し曲げ
性" は、「(曲げ半径)/(板厚)=1」の曲げ条件で
同一方向の90度繰り返し曲げ試験を行い、往復を1回
と数える方法で破断するまでの回数を数えて評価した。
なお、繰り返し曲げ性の評価基準は、曲げ回数4回以上
を可(○)とし、曲げ回数4回未満を否(×)とした。
Here, "tensile strength" and "elongation" were measured by a tensile test, and "electric conductivity" was evaluated by electrical conductivity (% IACS). The evaluation criteria for tensile strength and conductivity are as follows:
The tensile strength was 65 kgf / mm 2 or more, and the conductivity was 50% IACS or more. "Repeatable bendability" is defined as the number of times to break by performing a 90 ° repetitive bending test in the same direction under the bending condition of “(bending radius) / (plate thickness) = 1” and counting back and forth once. Was evaluated.
In addition, the evaluation criteria of the repetitive bendability were evaluated as acceptable (o) when the number of times of bending was 4 or more, and as negative (x) when the number of times of bending was less than 4 times.

【0031】"半田濡れ性" は、ソルダ−チェッカ−を
用いメニスコグラフによる表面張力法でゼロクロス時間
を測定して評価した。なお、半田は 60%Sn-40%Pbを用
い、半田浴槽温度は230±5℃に設定したが、この
時、ゼロクロス時間が1秒未満を可(○)とし、1秒以
上を否(×)と評価した。"半田耐熱剥離性" は、試料
に約5μm厚の 90%Sn-10%Pb半田メッキを施してから1
50℃の大気中で1000時間まで保持し、この間10
0時間毎に取り出して「(曲げ半径)/(板厚)=1」
の曲げ条件で90度曲げを往復一回行い、曲げ部のめっ
き剥離の有無を調べて評価した。なお、半田耐熱剥離性
の評価基準は、剥離開始時間が500時間を超える場合
は可(○)とし、500時間以下を否(×)とした。
"Solder wettability" was evaluated by measuring the zero-cross time by a surface tension method using a meniscograph using a solder checker. The solder used was 60% Sn-40% Pb, and the temperature of the solder bath was set at 230 ± 5 ° C. At this time, the zero-crossing time was allowed to be less than 1 second (○), and the zero-crossing time was not allowed to be more than 1 second (× ). "Solder heat peelability" is measured by applying 90% Sn-10% Pb solder plating of about 5μm thickness to the sample.
Hold in air at 50 ° C for up to 1000 hours,
Take out every 0 hours, "(bending radius) / (plate thickness) = 1"
Under the above bending conditions, 90-degree bending was performed once in a reciprocating manner, and the presence or absence of plating peeling at the bent portion was examined and evaluated. The evaluation criteria for the solder heat-peelability were acceptable (可) when the peeling start time exceeded 500 hours, and negative (x) when the peeling time was 500 hours or less.

【0032】"銀めっき性" は、試料表面に厚さ約5μ
mの銀めっきを施し、この試料を大気中にて350℃で
3分間加熱した後、銀めっき表面の膨れの有無を観察し
て評価した。なお、銀めっき性の評価基準は、膨れの発
生しなかった場合を可(○)とし、膨れが発生した場合
を否(×)とした。そして、 "エッチング性" は試料を
塩化第二鉄でエッチングして最大介在物サイズを走査型
電子顕微鏡で測定する方法で評価した。なお、エッチン
グ性の評価基準は、最大介在物サイズが1μm未満を良
好(◎),1μm以上5μm未満を可(○),5μm以
上を否(×)とした。これらの評価結果を、表5及び表
6に示す。
"Silver plating property" means that the surface of the sample has a thickness of about 5 μm.
m, and the sample was heated in the air at 350 ° C. for 3 minutes, and then evaluated by observing the presence or absence of swelling on the surface of the silver plating. In addition, the evaluation criteria of the silver plating property were evaluated as acceptable (○) when no blistering occurred, and as negative (x) when blistering occurred. The "etching property" was evaluated by etching the sample with ferric chloride and measuring the maximum inclusion size with a scanning electron microscope. The evaluation criteria of the etching property were as follows: good (◎) when the maximum inclusion size was less than 1 μm, acceptable (○) when 1 μm or more and less than 5 μm, and bad (×) when 5 μm or more. Tables 5 and 6 show the results of these evaluations.

【0033】[0033]

【表5】 [Table 5]

【0034】[0034]

【表6】 [Table 6]

【0035】さて、表5及び表6に示される結果からは
次のことが明らかである。即ち、本発明の規定条件を満
たす試験番号1〜26では、得られる板材は何れも65kg
f/mm2 以上の引張強度,50%IACS以上の導電性を有
し、更に繰り返し曲げ性,半田付け性,半田耐熱剥離
性,Agめっき性及びエッチング性の全てに優れているこ
とが分かる。
The following is clear from the results shown in Tables 5 and 6. That is, in Test Nos. 1 to 26 satisfying the specified conditions of the present invention, the obtained plate materials are all 65 kg.
It can be seen that it has a tensile strength of f / mm 2 or more and a conductivity of 50% IACS or more, and is excellent in all of the repetitive bending property, soldering property, solder heat peeling property, Ag plating property and etching property.

【0036】これに対して、比較例27はCr含有量が本発
明で規定する上限値を超えているために得られる板材中
の介在物が5μm以上と粗大化しており、エッチング性
及び繰り返し曲げ性を劣化している。比較例29は、Zr含
有量が本発明で規定する上限値を超えているために得ら
れる板材の繰り返し曲げ性が劣っている。また、比較例
28,30及び32は、Cr,ZrあるいはFeの含有量が本発明で
規定する下限値未満であるために得られる板材の強度が
65kgf/mm2 に達していない。
On the other hand, in Comparative Example 27, since the Cr content exceeded the upper limit specified in the present invention, the inclusions in the obtained plate material were coarsened to 5 μm or more, and the etching property and the repeated bending Has deteriorated. In Comparative Example 29, since the Zr content exceeded the upper limit specified in the present invention, the obtained sheet material was inferior in repeated bending property. Also, a comparative example
In Nos. 28, 30 and 32, since the content of Cr, Zr or Fe is less than the lower limit specified in the present invention, the strength of the obtained plate does not reach 65 kgf / mm 2 .

【0037】比較例31は、Ti及びFeの各含有量が本発明
で規定する上限値を超えているために得られる板材の伝
導率が50%IACS未満に減少し、更に繰り返し曲げ性,
Agめっき性及びエッチング性が劣化している。比較例3
3,36及び38は、Fe/Ti重量比が本発明で規定する下限
値未満であるために得られる板材の伝導率が50%IACS
未満に低下しており、一方、比較例34,35及び37はFe/
Ti重量比が本発明で規定する上限値を上回っているので
得られる板材の強度が65kgf/mm2 未満と低い。
In Comparative Example 31, since the respective contents of Ti and Fe exceeded the upper limits specified in the present invention, the conductivity of the obtained plate material was reduced to less than 50% IACS.
Ag plating property and etching property are deteriorated. Comparative Example 3
3, 36 and 38 show that the conductivity of the plate material obtained because the Fe / Ti weight ratio is less than the lower limit specified in the present invention is 50% IACS.
, While Comparative Examples 34, 35 and 37 have Fe /
Since the Ti weight ratio exceeds the upper limit specified in the present invention, the strength of the obtained plate material is as low as less than 65 kgf / mm 2 .

【0038】また、比較例39は、Zn含有量が本発明で規
定する上限値を上回っているので得られる板材の導電率
が低くなっている。これに対して、比較例40〜43はZn含
有量が本発明で規定する下限値を下回っているか含有さ
れていないため、他の成分の影響はあるものの得られる
板材の半田耐熱剥離時間が500時間以下と劣った結果
となっている。比較例41〜47は、Sn,In,Mn,P,Mg及
びSiの総量が本発明で規定する上限値を上回っており、
得られる板材の導電率が低下している。
In Comparative Example 39, since the Zn content exceeded the upper limit specified in the present invention, the conductivity of the obtained plate material was low. On the other hand, in Comparative Examples 40 to 43, since the Zn content is lower than the lower limit specified in the present invention or is not contained, the soldering heat-peeling time of the obtained plate material is 500 despite the influence of other components. The result was inferior to less than an hour. In Comparative Examples 41 to 47, the total amount of Sn, In, Mn, P, Mg, and Si exceeded the upper limit specified in the present invention,
The conductivity of the obtained plate material is reduced.

【0039】そして、比較例48,49及び52は溶体化処理
温度が上限を超え結晶粒が粗大化したために得られる板
材の繰り返し曲げ性が劣化している。比較例50は、1回
目冷間圧延の加工度が本発明で規定する上限値を超えて
いて得られる板材の繰り返し曲げ性が劣化している。比
較例51では、1回目冷間圧延の加工度が本発明で規定す
る下限値を下回ったために得られる板材の強度の低下が
見られると同時に、2回目冷間圧延の加工度が上限値を
超えているため得られる板材は繰り返し曲げ性が劣化し
ている。比較例53及び54は、時効温度が本発明で規定す
る上限値を超えているため板材の軟化が進行し、得られ
る板材の強度が低下している。比較例55は、焼鈍温度が
700℃を超えているため再溶解が極度に進行し、得ら
れる板材の強度及び導電率が共に低下している。
In Comparative Examples 48, 49 and 52, since the solution treatment temperature exceeded the upper limit and the crystal grains became coarse, the repetitive bendability of the obtained sheet material was deteriorated. In Comparative Example 50, the workability of the first cold rolling exceeds the upper limit specified in the present invention, and the obtained sheet material has deteriorated repetitive bendability. In Comparative Example 51, a reduction in the strength of the obtained sheet material was observed because the working ratio of the first cold rolling was below the lower limit specified in the present invention, and at the same time, the working ratio of the second cold rolling was the upper limit. Because of the excess, the obtained plate material has repeatedly deteriorated bendability. In Comparative Examples 53 and 54, since the aging temperature exceeds the upper limit specified in the present invention, the softening of the sheet material progresses, and the strength of the obtained sheet material is reduced. In Comparative Example 55, since the annealing temperature was higher than 700 ° C., the re-melting was extremely advanced, and both the strength and the electrical conductivity of the obtained plate material were reduced.

【0040】[0040]

【効果の総括】以上に説明した如く、この発明によれ
ば、引張強度,伸び,電気伝導性,曲げ加工性,エッチ
ング性,Agめっき性,半田付け性及び半田耐熱剥離性が
高く、表面特性や信頼性にも優れた“リ−ドフレ−ム材
等の電子機器用として好適な高力高導電性銅合金材”を
安定して製造することが可能となり、電子機器の性能向
上に大きく寄与し得るなど、産業上極めて有用な効果が
もたらされる。
[Summary of effects] As described above, according to the present invention, the tensile strength, elongation, electrical conductivity, bending workability, etching properties, Ag plating properties, solderability and solder heat-resistant peeling properties are high, and the surface properties are high. High reliability and high reliability "High-strength, high-conductivity copper alloy material suitable for electronic devices such as lead frame materials" can be manufactured stably, greatly contributing to the improvement of the performance of electronic devices. And industrially very useful effects.

───────────────────────────────────────────────────── フロントページの続き (51)Int.Cl.6 識別記号 庁内整理番号 FI 技術表示箇所 C22F 1/00 630 8719−4K C22F 1/00 630K 661 8719−4K 661A 683 8719−4K 683 684 8719−4K 684C 685 8719−4K 685Z 686 8719−4K 686Z 691 8719−4K 691B 8719−4K 691C 694 8719−4K 694A ──────────────────────────────────────────────────の Continuation of front page (51) Int.Cl. 6 Identification code Agency reference number FI Technical display location C22F 1/00 630 8719-4K C22F 1/00 630K 661 8719-4K 661A 683 8719-4K 683 684 8719 -4K 684C 685 8719-4K 685Z 686 8719-4K 686Z 691 8719-4K 691B 8719-4K 691C 694 8719-4K 694A

Claims (4)

(57)【特許請求の範囲】(57) [Claims] 【請求項1】 重量割合にて Cr:0.05〜0.40%, Zr:0.03〜0.25%, Fe:0.
10〜1.80%,Ti:0.10〜0.80%を含有すると共に、「0.
10%≦Ti≦0.60%」ではFe/Ti重量比が0.66〜2.6 を満
足し、また「0.60%<Ti≦0.80%」ではFe/Ti重量比が
1.1 〜2.6 を満足していて残部がCu及び不可避的不純物
から成る銅合金の素材に、 1) 950℃未満の温度での溶体化処理, 2) 50〜90%の加工度での冷間加工, 3) 300〜580℃の温度での時効処理, 4) 16〜83%の加工度での冷間加工, 5) 350〜700℃の温度での焼鈍, なる処理をこの順に順次施すことを特徴とする、電子機
器用高力高導電性銅合金材の製造方法。
(1) Cr: 0.05 to 0.40%, Zr: 0.03 to 0.25%, Fe: 0.
10-1.80%, Ti: 0.10-0.80%, and "0.
In 10% ≦ Ti ≦ 0.60% ”, the Fe / Ti weight ratio satisfies 0.66 to 2.6, and in“ 0.60% <Ti ≦ 0.80% ”, the Fe / Ti weight ratio is
For copper alloy material that satisfies 1.1-2.6 and the remainder consists of Cu and unavoidable impurities, 1) solution treatment at a temperature of less than 950 ° C, 2) cold working at a working ratio of 50-90% , 3) aging treatment at a temperature of 300 to 580 ° C, 4) cold working at a working ratio of 16 to 83%, 5) annealing at a temperature of 350 to 700 ° C, and so on. A method for producing a high-strength, high-conductivity copper alloy material for electronic equipment, which is characterized by the following.
【請求項2】 重量割合にて Cr:0.05〜0.40%, Zr:0.03〜0.25%, Fe:0.
10〜1.80%,Ti:0.10〜0.80%, Zn:0.05〜2.0 % を含有すると共に、「0.10%≦Ti≦0.60%」ではFe/Ti
重量比が0.66〜2.6 を満足し、また「0.60%<Ti≦0.80
%」ではFe/Ti重量比が1.1 〜2.6 を満足していて残部
がCu及び不可避的不純物から成る銅合金の素材に、 1) 950℃未満の温度での溶体化処理, 2) 50〜90%の加工度での冷間加工, 3) 300〜580℃の温度での時効処理, 4) 16〜83%の加工度での冷間加工, 5) 350〜700℃の温度での焼鈍, なる処理をこの順に順次施すことを特徴とする、電子機
器用高力高導電性銅合金材の製造方法。
2. Cr: 0.05 to 0.40%, Zr: 0.03 to 0.25%, Fe: 0.
10 to 1.80%, Ti: 0.10 to 0.80%, Zn: 0.05 to 2.0%, and “0.10% ≦ Ti ≦ 0.60%”, Fe / Ti
The weight ratio satisfies 0.66 to 2.6, and “0.60% <Ti ≦ 0.80
%), The Fe / Ti weight ratio satisfies 1.1 to 2.6 and the balance is Cu and unavoidable impurities. 1) Solution treatment at a temperature lower than 950 ° C, 2) 50 to 90% %) Aging at a temperature of 300 to 580 ° C, 4) Cold working at a degree of working of 16 to 83%, 5) Annealing at a temperature of 350 to 700 ° C, A method for producing a high-strength and high-conductivity copper alloy material for electronic equipment, characterized by sequentially performing the following processes in this order.
【請求項3】 重量割合にて Cr:0.05〜0.40%, Zr:0.03〜0.25%, Fe:0.
10〜1.80%,Ti:0.10〜0.80%を含み、更にSn,In,M
n,P,Mg及びSiの1種以上:総量で0.01〜1% を含有すると共に、「0.10%≦Ti≦0.60%」ではFe/Ti
重量比が0.66〜2.6 を満足し、また「0.60%<Ti≦0.80
%」ではFe/Ti重量比が1.1 〜2.6 を満足していて残部
がCu及び不可避的不純物から成る銅合金の素材に、 1) 950℃未満の温度での溶体化処理, 2) 50〜90%の加工度での冷間加工, 3) 300〜580℃の温度での時効処理, 4) 16〜83%の加工度での冷間加工, 5) 350〜700℃の温度での焼鈍, なる処理をこの順に順次施すことを特徴とする、電子機
器用高力高導電性銅合金材の製造方法。
(3) Cr: 0.05 to 0.40%, Zr: 0.03 to 0.25%, Fe: 0.
10 to 1.80%, including Ti: 0.10 to 0.80%, Sn, In, M
At least one of n, P, Mg, and Si: contains 0.01 to 1% in total amount and Fe / Ti in "0.10% ≦ Ti ≦ 0.60%”.
The weight ratio satisfies 0.66 to 2.6, and “0.60% <Ti ≦ 0.80
%), The Fe / Ti weight ratio satisfies 1.1 to 2.6 and the balance is Cu and unavoidable impurities. 1) Solution treatment at a temperature lower than 950 ° C, 2) 50 to 90% %) Aging at a temperature of 300 to 580 ° C, 4) Cold working at a degree of working of 16 to 83%, 5) Annealing at a temperature of 350 to 700 ° C, A method for producing a high-strength and high-conductivity copper alloy material for electronic equipment, characterized by sequentially performing the following processes in this order.
【請求項4】 重量割合にて Cr:0.05〜0.40%, Zr:0.03〜0.25%, Fe:0.
10〜1.80%,Ti:0.10〜0.80%, Zn:0.05〜2.0 %
を含み、更にSn,In,Mn,P,Mg及びSiの1種以上:総
量で0.01〜1%を含有すると共に、「0.10%≦Ti≦0.60
%」ではFe/Ti重量比が0.66〜2.6 を満足し、また「0.
60%<Ti≦0.80%」ではFe/Ti重量比が1.1 〜2.6 を満
足していて残部がCu及び不可避的不純物から成る銅合金
の素材に、 1) 950℃未満の温度での溶体化処理, 2) 50%以上90%以下の加工度での冷間加工, 3) 300〜580℃の温度での時効処理, 4) 16〜83%の加工度での冷間加工, 5) 350〜700℃の温度での焼鈍, なる処理をこの順に順次施すことを特徴とする、電子機
器用高力高導電性銅合金材の製造方法。
(4) Cr: 0.05 to 0.40%, Zr: 0.03 to 0.25%, Fe: 0.
10 to 1.80%, Ti: 0.10 to 0.80%, Zn: 0.05 to 2.0%
And one or more of Sn, In, Mn, P, Mg and Si: 0.01-1% in total, and "0.10% ≦ Ti ≦ 0.60
%, The Fe / Ti weight ratio satisfies 0.66 to 2.6, and "0.
For 60% <Ti ≦ 0.80%, the Fe / Ti weight ratio satisfies 1.1 to 2.6 and the balance is copper alloy material consisting of Cu and unavoidable impurities. 1) Solution treatment at a temperature lower than 950 ° C , 2) Cold working at a working ratio of 50% or more and 90% or less, 3) Aging treatment at a temperature of 300-580 ° C, 4) Cold working at a working ratio of 16-83%, 5) 350- A method for producing a high-strength, high-conductivity copper alloy material for electronic equipment, characterized by sequentially performing annealing at a temperature of 700 ° C. in this order.
JP6075424A 1994-03-22 1994-03-22 Manufacturing method of high strength and high conductivity copper alloy material for electronic equipment Expired - Fee Related JP2732355B2 (en)

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US6344171B1 (en) 1999-08-25 2002-02-05 Kobe Steel, Ltd. Copper alloy for electrical or electronic parts
CN100338244C (en) * 2003-12-12 2007-09-19 中国科学院金属研究所 Copper, iron and chrome ternary copper base alloy
JP5426936B2 (en) * 2009-06-18 2014-02-26 株式会社Shカッパープロダクツ Copper alloy manufacturing method and copper alloy
JP5590990B2 (en) * 2010-06-30 2014-09-17 株式会社Shカッパープロダクツ Copper alloy
CN110066939B (en) * 2018-01-22 2020-09-18 中国科学院金属研究所 High-strength high-conductivity copper-chromium-zirconium alloy and low-temperature deformation preparation method thereof
CN114807672B (en) * 2022-03-23 2023-09-08 中南大学 Cu-Zn-Cr-Zr-Fe-Si alloy and method for producing same
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