JP2642459B2 - Ultrasonic inspection image processing equipment - Google Patents

Description

DETAILED DESCRIPTION OF THE INVENTION [Object of the Invention] (Industrial application field) The present invention relates to an ultrasonic inspection image processing apparatus for displaying image data relating to a defective portion generated in an object.

2. Description of the Related Art It is well known that an ultrasonic flaw detector detects a defective portion such as a cavity generated in metal and displays the defective portion on a display. The image display of the defect portion includes the reflected wave intensity of the ultrasonic wave radiated from the ultrasonic probe to the defect portion, the distance from the ultrasonic emission point to the defect portion, and the ultrasonic wave in a predetermined coordinate system. By making the position of the probe known, image processing of each data is performed, and a defective portion is displayed as an image. In the case of such a conventional ultrasonic inspection image processing apparatus,
An image of the depth of the defective portion from the surface of the object to be inspected can be displayed on the object to be inspected when the object to be inspected has a simple shape such as a flat plate. When the surface of the object to be inspected has a curved surface shape, it is necessary to calculate the curved surface in advance and store the shape as image data in the ultrasonic inspection image processing apparatus in advance.

Next, an example in which a defective portion of the inspection object is displayed as an image will be described. First, a case where the shape of the inspection object is a flat plate like a steel plate will be described with reference to FIGS. 7 to 9. First, the position of the ultrasonic probe 1 is determined by setting a reference point on the inspection object 2 as shown in FIG. 7 and by using coordinate points (x, y) from the reference point. The irradiation direction of the ultrasonic wave from the ultrasonic probe 1 and the incident angle φ of the ultrasonic wave are obtained when the object 2 is irradiated with the ultrasonic wave as shown in FIG.
The distance L from the ultrasonic probe 1 to the defect part 3 is also determined by the speed of the ultrasonic wave to be irradiated and the defect part 3 as shown in FIG.
From the time it takes for the reflected wave to return. From the respective values thus obtained, the reflection point (X, Y,
Z) is found. The reflection points (X, Y, Z) represent the contour of the defective portion 3 by manually or automatically moving the ultrasonic probe 1 along the flaw detection surface of the inspection object 2 (the surface of the inspection object). Data. By performing image processing on the thus obtained contour data with a computer, a defect image 4 of the defect portion 3 is displayed as shown in FIG. The defect image 4 shown in FIG. 9 represents a position on a plane, and the depth of the defect portion 3 from the inspection surface of the inspection object 2 is determined by the ultrasonic flaw detector 1 and the defect portion 3. The shortest distance of the distance L to is detected.

Next, a case where the surface of the inspection object 2 has a curved surface will be described with reference to FIG. 10 and FIG. First, when the ultrasonic probe 1 is manually or automatically moved along the flaw detection curved surface 5 of the test object 2, as shown in FIG. 10, the distance L between the defect 3 and the ultrasonic probe 1, and Reflection points (X, Y, Z) are sequentially obtained according to the direction of ultrasonic irradiation. The data representing the contour of the defective portion 3 is image-processed by the reflection points (X, Y, Z), and the defective portion 3 is displayed as a defect image 4 as shown in FIG. On the other hand, the flaw detection curved surface 5 of the inspection object 2 is calculated in advance and image data of the shape of the flaw detection curved surface 5 is stored in a computer. Then, in order to know the depth of the defect portion 3 from the flaw detection curved surface 5 of the inspection object 2, the defect image 4 is first displayed, and then, as shown in FIG. The shape image 6 is matched with the defect image 4.

(Problems to be Solved by the Invention) However, as described above, in the conventional ultrasonic flaw detection image processing apparatus, unless the shape of the flaw detection surface, particularly the curved shape of the flaw detection surface is known in advance, FIGS. As shown in the figure, even if the defective portion 3 is located at the same coordinate position in two dimensions, the depth D which is the most important element of the defective portion 3 cannot be known.

The present invention has been made in order to solve the above-mentioned problem, and even if the surface of the object to be inspected has an arbitrary curved surface shape, the defective portion can be displayed simultaneously with the surface of the object to be inspected, It is an object of the present invention to provide an ultrasonic flaw detection image processing apparatus capable of accurately detecting whether or not the object is at a depth.

[Configuration of the invention]

(Means for Solving the Problems) In order to achieve the above object, the present invention irradiates ultrasonic waves into the object to be inspected while moving along the surface of the object to receive reflected waves from a defective portion. An ultrasonic probe that outputs a reflected wave signal corresponding to the reflected wave, and a reference set in advance on the surface of the object to be inspected when the ultrasonic probe moves along the surface of the object to be inspected. A position detector that outputs a position signal indicating the relative position of the ultrasonic probe viewed from a point, and a defect reflection signal corresponding to the shape of the defect portion according to a reflected wave signal output from the ultrasonic probe. An ultrasonic flaw detector to be output, and image processing for forming shape image data according to the surface shape of the inspection object in response to the position signal and forming defect image data in accordance with the shape of the defect portion in response to the defect reflection signal Based on the shape image data and defect image data And an image display for displaying images of the defective portion and the shape of the inspection object.

(Operation) In the ultrasonic inspection image processing apparatus having the above configuration, the ultrasonic probe is moved along the surface of the object to be inspected while irradiating the ultrasonic wave to the object to be inspected. The apparatus outputs a position signal indicating a relative position of the ultrasonic emission point as viewed from a reference point preset on the surface of the inspection object when the ultrasonic emission point moves along the surface shape of the inspection object. . On the other hand, the ultrasonic flaw detector detects the defect reflection corresponding to the shape of the defect based on the reflected wave signal output from the ultrasonic probe in response to the reflected wave from the defect as the ultrasonic probe moves. Output a signal. The image processor forms shape image data along the surface of the inspection object based on the position signal and forms defect image data based on the defect reflection signal, and detects a defective portion based on the shape image data and the defect image data. And the shape of the test object are displayed on the image display.

(Example) Hereinafter, an example of the present invention will be described with reference to the drawings. FIG. 1 is an embodiment showing a configuration of an ultrasonic flaw detection image processing apparatus, and shows a state in which ultrasonic waves are irradiated from an ultrasonic probe 1 to a defect portion 3 in an object 2 to be inspected. The ultrasonic probe 1 is attached to one end of a position detector 7 constituted by a support member. A magnet 8 is attached to the other end of the position detector 7, and the magnet 8 is fixed to an arbitrary position on the device under test 2. The position of the magnet 8 serves as a reference point when the ultrasonic probe 1 moves along the flaw detection curved surface 5 of the test object 2. FIG. 1 shows the position detector 7 in a simplified manner. A potentiometer is attached to a rotatable shaft support of the position detector 7, and the ultrasonic probe 1 is used as a reference point. When moving along the flaw detection curved surface 5, the potentiometer emits the coordinates (x, y, and x) of the ultrasonic emission point E (FIG. 4) of the ultrasonic probe 1 indicating the relative position from the reference point. z) and the irradiation direction of the ultrasonic wave determined by the inclination of the ultrasonic probe 1 is output, and this irradiation direction and the coordinates (x, y, z) of the launch point are given to the signal processor 9. Further, an ultrasonic flaw detector 10 is connected to the ultrasonic probe 1. When the ultrasonic flaw detector 1 moves along the curved surface 5 for flaw detection, the ultrasonic flaw detector 10 is connected to the ultrasonic flaw detector 10. The distance L measured according to the reflection time reflected from the reflection point R (FIG. 4) and the reflection intensity A when receiving the reflected wave are measured.
The distance L and the reflection intensity A are given to the signal processor 9. Thus, the ultrasonic probe 1, the position detector 7, and the magnet 8 constitute the ultrasonic flaw detector 11. Note that the irradiation direction and the firing point coordinate values (x, y, z) are output through a signal line 12 from the magnet 8, but the magnet 8 is attached to the position detector 7 in addition to the magnet. This is where signal lines and the like are collected so as to transmit the signals of the potentiometers.

The distance L from the ultrasonic probe 10 received by the signal processor 9;
The reflection intensity A, the coordinates (x, y, z) of the launching point from the position detector 7 and the irradiation direction are converted into digital signals by the signal processor 9 and then supplied to the computer 13. The computer 13 forms defect image data representing the contour of the defect portion 3 based on the received digital signals, and forms shape image data along the inspection surface 5 of the inspection object 2. The formed defect image data and shape image data are transmitted to the display 14 and simultaneously display the defect image 4 of the defect portion 3 and the shape image 6 of the inspection object 2.

Next, the operation of the ultrasonic flaw detection image processing apparatus configured as described above will be described with reference to FIGS. First, as shown in FIG. 3, the ultrasonic flaw detector 11 is placed on the flaw detection curved surface 5, the magnet 8 is fixed to the inspection object 2, and the ultrasonic probe 1 irradiates ultrasonic waves along the flaw detection curved face 5. While moving automatically or manually. Then, as shown in FIG. 4, a part of the ultrasonic wave irradiated from the ultrasonic probe 1 to the inspection object 2 is irradiated to the defective portion 3.

FIG. 2 shows the processing sequence of the computer 13. In this processing sequence, first in step S1, the signal processor 9 is set.
Receives flaw detection data from The flaw detection data includes the firing point coordinate values (x, y, z) of the contact point where the ultrasonic wave emitting point is in contact with the flaw detection curved surface 5 of the test object 2, and the ultrasonic probe 1 is in contact with the flaw detection curved surface 5. The irradiation direction of the ultrasonic wave, which is determined from the inclination of the ultrasonic wave, is (x ', y', z '), the distance L from the ultrasonic wave emission point to the defect portion 3, and the ultrasonic wave reflection intensity A.

In step S2, the firing point coordinate values (x,
y, z). That is, the firing point coordinate values (x, y, z) representing the shape of the flaw detection curved surface 5 are stored.

In step S3, it is determined whether or not the reflection intensity A is larger than a predetermined threshold. If the reflection intensity A is smaller than the threshold, the process returns to step S1. That is, it is determined that the reflected wave is not from the defective portion 3, and the next flaw detection data is received. If the reflection intensity A is larger than the threshold, the process proceeds to step S4.

In step S4, the reflection point coordinate values (X, Y, Z) are calculated based on the launch point coordinate value (x, y, z), the ultrasonic irradiation direction = (x ', y', z '), and the distance L. It is determined by the following equation.

X = x + Lx ′ Y = y + Ly ′ Z = z + Lz ′ The reflection point coordinate values (X, Y, Z) are stored as coordinate values indicating a part of the contour of the defect portion 3.

In step S5, it is determined whether the flaw detection is completed. If the flaw detection is to be continued, the process proceeds to step S1 to receive the next flaw detection data. By repeating the processing from step S1 to step S5 to sequentially process the flaw detection data in this manner, in step S2, the inspection object 2 is determined based on the firing point coordinate values (x, y, z).
Of the flaw detection curved surface 5 is formed. In step S4, defect image data corresponding to the contour of the defective portion 3 is formed based on the reflection point coordinate values (X, Y, Z). Then, if the flaw detection is completed in step S5, the process proceeds to step S6.

In step S6, the shape image data is arranged. That is,
Since the ultrasonic probe 1 moves irregularly on the inspection surface 5 of the inspection object 2, the same firing point coordinate value (x, y, z) is obtained by passing the same inspection surface 5 many times. Duplicate saved. Therefore, the firing point coordinate values (x, y, z) are rearranged to delete overlapping ones, and the shape image data of the flaw detection curved surface 5 is arranged.

In step S7, the reflection point coordinate values (X,
(Y, Z) is rearranged to delete the duplicated one, and the defective image data of the defective portion 3 is arranged.

A step S8 specifies a display range of the shape image data and the defect image data. That is, when the cross section of y = yo is displayed as shown in FIG. 3 and FIG. 4 in the firing point coordinate value (x, y, z), the value of y in the arranged shape image data is
Shape image data in the range of yo = Δy to yo + Δy is selected. Similarly, the defect image data of Y = yo is selected from the defect image data represented by the reflection point coordinate values (X, Y, Z). The reason for having the width Δy is to avoid a discontinuous state when the shape image data is plotted.

In step S9, the arranged shape image data and defect image data are simultaneously displayed on the display 14 as the shape image 6 and the defect image 4, respectively. This displayed state is shown in FIG. 5, and shows how deep the defective portion 3 is from the inspection surface 5 of the inspection object 2.

In the above embodiment, the cross section of y = yo is taken, and the shape image 6 and the defect image 4 are displayed in two dimensions. However, by forming the shape image data and the defect image data by three-dimensional coordinates, FIG. As shown in FIG. 7, the shape image 6 and the defect image 4 can be displayed in a three-dimensional manner.

In the above embodiment, the coordinates of the firing point (x, y, z) and the coordinates of the reflection point (X, Y, Z) are stored, and the shape image data and the defect image data are arranged. 6 and the defect image 4 were displayed on the display 14, but without storing the firing point coordinate values (x, y, z) and the reflection point coordinate values (X, Y, Z), and also the shape image data and the defect image data. Without rearranging the coordinates, the launch point coordinate values (x, y, z) and the reflection point coordinate values (X, Y, Z) can be sequentially plotted on the display 14.

Furthermore, if the ultrasonic inspection image processing apparatus of the present invention is used by previously forming the shape image data as in the related art, a function of correcting the predetermined shape image data is provided. And the image display can be made more accurate.

〔The invention's effect〕

As described above, the ultrasonic inspection image processing apparatus according to the present invention moves the ultrasonic probe along the surface of the object to be inspected, while moving the ultrasonic probe from the reference point preset on the surface of the object to be inspected. The relative position of the probe is detected, and a defect reflection signal is formed in accordance with the reflected wave from the defective portion received by the ultrasonic probe, and the defect reflection signal is formed based on the surface shape of the inspection object based on the position signal. Since the defect image data according to the shape of the defect portion is formed based on the shape image data and the defect reflection signal, the curved surface shape is set in advance as image data regardless of the curved shape of the surface of the inspection object. The defect portion can be displayed simultaneously with the surface shape of the inspection object, and the depth of the defect portion from the surface of the inspection object can be accurately detected.

[Brief description of the drawings]

FIG. 1 is a block diagram showing an ultrasonic flaw detection image processing apparatus of the present invention, FIG. 2 is a flowchart showing the operation of the ultrasonic flaw detection image processing apparatus, and FIG. FIG. 4 is a perspective view showing a state, FIG. 4 is a cross-sectional view shown by the yo component in FIG. 3, FIG. 5 is an explanatory view showing a state in which a shape image and a defect image are displayed on a display, and FIG. FIG. 7 to FIG. 9 are explanatory diagrams showing a conventional flaw detection order in the case where the inspection object is a flat plate, and FIGS. 10 to 12 are illustrations of the inspection object. FIG. 13 and FIG. 14 are explanatory diagrams showing a conventional flaw detection order when the surface has a curved surface shape, and FIG. 13 and FIG. DESCRIPTION OF SYMBOLS 1 ... Ultrasonic probe, 2 ... Inspection object, 3 ... Defect part, 4 ... Defect image, 5 ... Curved surface, 6 ... Shape image, 7
...... Position detector, 8 ... Magnet, 11 ... Ultrasonic flaw detector.

Continued on the front page (72) Inventor Yasuhiro Shimizu 2-4 Suehirocho, Tsurumi-ku, Yokohama, Kanagawa Prefecture Inside the Toshiba Keihin Plant (72) Inventor Kuniharu Uchida 2-4, Suehirocho, Tsurumi-ku, Yokohama-shi, Kanagawa Corporation Inside Toshiba Keihin Works (56) References JP-A-61-57853 (JP, A)

Claims (1)

(57) [Claims] An ultrasonic probe which irradiates an ultrasonic wave into the object to be inspected while moving along the surface of the object to be inspected, receives a reflected wave from a defective portion, and outputs a reflected wave signal corresponding to the reflected wave. And a relative position of the ultrasonic probe when viewed from a reference point preset on the surface of the device under test when the ultrasonic probe moves along the surface of the device under test. A position detector that outputs a position signal representing the following: an ultrasonic flaw detector that outputs a defect reflection signal corresponding to the shape of the defect portion according to a reflected wave signal output from the ultrasonic probe; An image processor that receives a signal to form shape image data according to the surface shape of the object to be inspected, and that receives the defect reflection signal to form defect image data according to the shape of the defective portion; Based on the data and the defective image data. An image display device for displaying an image of the inflected portion and the shape of the object to be inspected.