JP2584414Y2 - 半導体素子用試験装置 - Google Patents

半導体素子用試験装置

Info

Publication number
JP2584414Y2
JP2584414Y2 JP432591U JP432591U JP2584414Y2 JP 2584414 Y2 JP2584414 Y2 JP 2584414Y2 JP 432591 U JP432591 U JP 432591U JP 432591 U JP432591 U JP 432591U JP 2584414 Y2 JP2584414 Y2 JP 2584414Y2
Authority
JP
Japan
Prior art keywords
socket
contact
test
temperature
tray
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP432591U
Other languages
English (en)
Japanese (ja)
Other versions
JPH0496078U (enrdf_load_stackoverflow
Inventor
伸一 橋詰
Original Assignee
日本インター株式会社
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 日本インター株式会社 filed Critical 日本インター株式会社
Priority to JP432591U priority Critical patent/JP2584414Y2/ja
Publication of JPH0496078U publication Critical patent/JPH0496078U/ja
Application granted granted Critical
Publication of JP2584414Y2 publication Critical patent/JP2584414Y2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Landscapes

  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
JP432591U 1991-01-17 1991-01-17 半導体素子用試験装置 Expired - Fee Related JP2584414Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP432591U JP2584414Y2 (ja) 1991-01-17 1991-01-17 半導体素子用試験装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP432591U JP2584414Y2 (ja) 1991-01-17 1991-01-17 半導体素子用試験装置

Publications (2)

Publication Number Publication Date
JPH0496078U JPH0496078U (enrdf_load_stackoverflow) 1992-08-20
JP2584414Y2 true JP2584414Y2 (ja) 1998-11-05

Family

ID=31734015

Family Applications (1)

Application Number Title Priority Date Filing Date
JP432591U Expired - Fee Related JP2584414Y2 (ja) 1991-01-17 1991-01-17 半導体素子用試験装置

Country Status (1)

Country Link
JP (1) JP2584414Y2 (enrdf_load_stackoverflow)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR102123052B1 (ko) * 2014-06-23 2020-06-15 (주)테크윙 테스트핸들러
CN114200275B (zh) * 2020-08-31 2024-05-14 株洲中车时代半导体有限公司 一种碳化硅mosfet器件高温栅偏试验方法及系统

Also Published As

Publication number Publication date
JPH0496078U (enrdf_load_stackoverflow) 1992-08-20

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