JPH0496078U - - Google Patents

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Publication number
JPH0496078U
JPH0496078U JP432591U JP432591U JPH0496078U JP H0496078 U JPH0496078 U JP H0496078U JP 432591 U JP432591 U JP 432591U JP 432591 U JP432591 U JP 432591U JP H0496078 U JPH0496078 U JP H0496078U
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP432591U
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Japanese (ja)
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JP2584414Y2 (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
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Priority to JP432591U priority Critical patent/JP2584414Y2/ja
Publication of JPH0496078U publication Critical patent/JPH0496078U/ja
Application granted granted Critical
Publication of JP2584414Y2 publication Critical patent/JP2584414Y2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Landscapes

  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
JP432591U 1991-01-17 1991-01-17 半導体素子用試験装置 Expired - Fee Related JP2584414Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP432591U JP2584414Y2 (ja) 1991-01-17 1991-01-17 半導体素子用試験装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP432591U JP2584414Y2 (ja) 1991-01-17 1991-01-17 半導体素子用試験装置

Publications (2)

Publication Number Publication Date
JPH0496078U true JPH0496078U (enrdf_load_stackoverflow) 1992-08-20
JP2584414Y2 JP2584414Y2 (ja) 1998-11-05

Family

ID=31734015

Family Applications (1)

Application Number Title Priority Date Filing Date
JP432591U Expired - Fee Related JP2584414Y2 (ja) 1991-01-17 1991-01-17 半導体素子用試験装置

Country Status (1)

Country Link
JP (1) JP2584414Y2 (enrdf_load_stackoverflow)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105170476A (zh) * 2014-06-23 2015-12-23 泰克元有限公司 测试分选机
CN114200275A (zh) * 2020-08-31 2022-03-18 株洲中车时代半导体有限公司 一种碳化硅mosfet器件高温栅偏试验方法及系统

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105170476A (zh) * 2014-06-23 2015-12-23 泰克元有限公司 测试分选机
JP2016008969A (ja) * 2014-06-23 2016-01-18 テクウィング カンパニー リミテッドＴｅｃｈｗｉｎｇ Ｃｏ．， Ｌｔｄ． テストハンドラー
CN114200275A (zh) * 2020-08-31 2022-03-18 株洲中车时代半导体有限公司 一种碳化硅mosfet器件高温栅偏试验方法及系统
CN114200275B (zh) * 2020-08-31 2024-05-14 株洲中车时代半导体有限公司 一种碳化硅mosfet器件高温栅偏试验方法及系统

Also Published As

Publication number Publication date
JP2584414Y2 (ja) 1998-11-05

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