JP2564985Y2 - 大型基板検査用顕微鏡 - Google Patents
大型基板検査用顕微鏡Info
- Publication number
- JP2564985Y2 JP2564985Y2 JP1990107700U JP10770090U JP2564985Y2 JP 2564985 Y2 JP2564985 Y2 JP 2564985Y2 JP 1990107700 U JP1990107700 U JP 1990107700U JP 10770090 U JP10770090 U JP 10770090U JP 2564985 Y2 JP2564985 Y2 JP 2564985Y2
- Authority
- JP
- Japan
- Prior art keywords
- stage
- base frame
- microscope
- large substrate
- inclined surface
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Landscapes
- Sampling And Sample Adjustment (AREA)
- Microscoopes, Condenser (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1990107700U JP2564985Y2 (ja) | 1990-10-15 | 1990-10-15 | 大型基板検査用顕微鏡 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1990107700U JP2564985Y2 (ja) | 1990-10-15 | 1990-10-15 | 大型基板検査用顕微鏡 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH0463412U JPH0463412U (enrdf_load_stackoverflow) | 1992-05-29 |
JP2564985Y2 true JP2564985Y2 (ja) | 1998-03-11 |
Family
ID=31854344
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP1990107700U Expired - Lifetime JP2564985Y2 (ja) | 1990-10-15 | 1990-10-15 | 大型基板検査用顕微鏡 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JP2564985Y2 (enrdf_load_stackoverflow) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CH687425A5 (de) * | 1992-12-24 | 1996-11-29 | Anschuetz & Co Gmbh | Mikroskop. |
JP4693581B2 (ja) * | 2005-10-11 | 2011-06-01 | 株式会社日立ハイテクノロジーズ | 基板検査装置及び基板検査方法 |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6312945A (ja) * | 1986-07-03 | 1988-01-20 | Toshiba Corp | スクリ−ン検査装置 |
JPH0731121B2 (ja) * | 1987-11-26 | 1995-04-10 | 東京エレクトロン株式会社 | 監視検査装置 |
JPH01167817A (ja) * | 1987-12-24 | 1989-07-03 | Mitsubishi Electric Corp | 光学式顕微鏡 |
-
1990
- 1990-10-15 JP JP1990107700U patent/JP2564985Y2/ja not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
JPH0463412U (enrdf_load_stackoverflow) | 1992-05-29 |
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