JP2546611Y2 - Ｉｃ試験装置 - Google Patents

Ｉｃ試験装置

Info

Publication number
JP2546611Y2
JP2546611Y2 JP1990110347U JP11034790U JP2546611Y2 JP 2546611 Y2 JP2546611 Y2 JP 2546611Y2 JP 1990110347 U JP1990110347 U JP 1990110347U JP 11034790 U JP11034790 U JP 11034790U JP 2546611 Y2 JP2546611 Y2 JP 2546611Y2
Authority
JP
Japan
Prior art keywords
rail
movable rail
movable
input
lead
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP1990110347U
Other languages
English (en)
Japanese (ja)
Other versions
JPH0467340U (enExample
Inventor
晋一 平野
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Advantest Corp
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Priority to JP1990110347U priority Critical patent/JP2546611Y2/ja
Publication of JPH0467340U publication Critical patent/JPH0467340U/ja
Application granted granted Critical
Publication of JP2546611Y2 publication Critical patent/JP2546611Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Length Measuring Devices With Unspecified Measuring Means (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Lead Frames For Integrated Circuits (AREA)
JP1990110347U 1990-10-22 1990-10-22 Ｉｃ試験装置 Expired - Lifetime JP2546611Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1990110347U JP2546611Y2 (ja) 1990-10-22 1990-10-22 Ｉｃ試験装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1990110347U JP2546611Y2 (ja) 1990-10-22 1990-10-22 Ｉｃ試験装置

Publications (2)

Publication Number Publication Date
JPH0467340U JPH0467340U (enExample) 1992-06-15
JP2546611Y2 true JP2546611Y2 (ja) 1997-09-03

Family

ID=31857668

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1990110347U Expired - Lifetime JP2546611Y2 (ja) 1990-10-22 1990-10-22 Ｉｃ試験装置

Country Status (1)

Country Link
JP (1) JP2546611Y2 (enExample)

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57149745A (en) * 1981-03-11 1982-09-16 Tokyo Seimitsu Co Ltd Selector for semiconductor element, etc.
JPH0238456Y2 (enExample) * 1985-12-19 1990-10-17
JPS62167486A (ja) * 1986-01-13 1987-07-23 Shimadzu Corp Ｃａｎ型ｉｃ用自動検査装置
JPS6454334U (enExample) * 1987-09-30 1989-04-04
JPH0167580U (enExample) * 1987-10-26 1989-05-01
JPH0743051Y2 (ja) * 1988-06-30 1995-10-04 株式会社アドバンテスト Ｉｃ分離装置

Also Published As

Publication number Publication date
JPH0467340U (enExample) 1992-06-15

Similar Documents

Publication Publication Date Title
US4468165A (en) Apparatus for transporting sorted stacked matter
DE3731589C2 (enExample)
EP2253390A1 (de) Verfahren und Vorrichtung zur Sortierung von Postsendungen
DE102020206748A1 (de) Vorrichtung zum befüllen und verpacken von kapseln in flaschen
JP2546611Y2 (ja) Ｉｃ試験装置
DE4413967A1 (de) Sortiereinrichtung
EP3678792B1 (de) Vorrichtung und verfahren zum ausschleusen von in einer direktdruckmaschine fehlerhaft bedruckten behältern
DE202009010875U1 (de) Transportvorrichtung für eine Waage
US6968750B2 (en) Rod sampling
JPH0425331A (ja) 引張りコイルスプリングの自動組付け装置
JPH08252543A (ja) 混載型の部品供給装置
EP1062058B1 (de) Sortieranlage für flache postgüter
JPH0115199Y2 (enExample)
CN223444612U (zh) 一种无人供件系统
EP2105215B1 (de) Verfahren und Anordnung zum Synchronisieren der Verteilinformation eines Sortiergutes mit der Information über ein mit diesem Sortiergut bestücktes Sorterelement
JPS6044409A (ja) 半導体装置の移送装置
JP2545650Y2 (ja) Ｉｃ試験装置
EP1714916B1 (en) Device for recirculating containers at a baggage inspection apparatus
JPS6338163Y2 (enExample)
DE60003239T2 (de) ZUBEHöR FüR MüNZVERARBEITUNGSVORRICHTUNG
JPS62296525A (ja) 電子装置の製造装置
JPS6345827A (ja) テストヘツド部
EP0194319B1 (en) Apparatus for transferring electronic parts
DE19915915A1 (de) Transportsystem für Sortierteile mit einer Verifizierungskaskade für letztere
JP2607423B2 (ja) 電子部品の自動検査装置