JP2546611Y2 - Ｉｃ試験装置 - Google Patents

Ｉｃ試験装置

Info

Publication number
JP2546611Y2
JP2546611Y2 JP1990110347U JP11034790U JP2546611Y2 JP 2546611 Y2 JP2546611 Y2 JP 2546611Y2 JP 1990110347 U JP1990110347 U JP 1990110347U JP 11034790 U JP11034790 U JP 11034790U JP 2546611 Y2 JP2546611 Y2 JP 2546611Y2
Authority
JP
Japan
Prior art keywords
rail
movable rail
movable
input
lead
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP1990110347U
Other languages
English (en)
Japanese (ja)
Other versions
JPH0467340U (enExample
Inventor
晋一 平野
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Advantest Corp
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Priority to JP1990110347U priority Critical patent/JP2546611Y2/ja
Publication of JPH0467340U publication Critical patent/JPH0467340U/ja
Application granted granted Critical
Publication of JP2546611Y2 publication Critical patent/JP2546611Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Lead Frames For Integrated Circuits (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
JP1990110347U 1990-10-22 1990-10-22 Ｉｃ試験装置 Expired - Lifetime JP2546611Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1990110347U JP2546611Y2 (ja) 1990-10-22 1990-10-22 Ｉｃ試験装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1990110347U JP2546611Y2 (ja) 1990-10-22 1990-10-22 Ｉｃ試験装置

Publications (2)

Publication Number Publication Date
JPH0467340U JPH0467340U (enExample) 1992-06-15
JP2546611Y2 true JP2546611Y2 (ja) 1997-09-03

Family

ID=31857668

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1990110347U Expired - Lifetime JP2546611Y2 (ja) 1990-10-22 1990-10-22 Ｉｃ試験装置

Country Status (1)

Country Link
JP (1) JP2546611Y2 (enExample)

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57149745A (en) * 1981-03-11 1982-09-16 Tokyo Seimitsu Co Ltd Selector for semiconductor element, etc.
JPH0238456Y2 (enExample) * 1985-12-19 1990-10-17
JPS62167486A (ja) * 1986-01-13 1987-07-23 Shimadzu Corp Ｃａｎ型ｉｃ用自動検査装置
JPS6454334U (enExample) * 1987-09-30 1989-04-04
JPH0167580U (enExample) * 1987-10-26 1989-05-01
JPH0743051Y2 (ja) * 1988-06-30 1995-10-04 株式会社アドバンテスト Ｉｃ分離装置

Also Published As

Publication number Publication date
JPH0467340U (enExample) 1992-06-15

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