JPS57149745A - Selector for semiconductor element, etc. - Google Patents

Abstract

PURPOSE:To improve the working ratio of the machine by a method wherein the existence of a plurality of the elements between a measuring section and a stopper is detected, a measuring piece lever contacted with the leads of the elements is kept under an idle condition, the stopper is opened and all elements are received. CONSTITUTION:The elements 2 are supplied into the groove of a chute 1 through the entering of the leads 3 and tare falling, separate cam is forwarded at every one piece by the alternate up-and-down movement of the stoppers 4, 5 through the lever through the revolution of a cam shaft, and stopped temporarily by the stopper 6, and a measuring piece 7 forwards and backs to the leads 3. With the measuring piece 7, a nose is wide, and contact needles 7a, 7c correct the positions of the leads 3 or the attitudes of the elements 2, and accurately oppose them to the contact needles 7a, 7c. Light emitting elements 8 and light receiving elements 9 are arranged between an interval between the stoppers 5, 6, abnormal signals are emitted when there are a plurality of the elements, a stopper 15 is projected through a solenoid 17, the revolution of the lever 11 is limited, the advance of the measuring piece 7 is stopped, the stopper 6 is opened, and all the elements between the interval A are discharged, and received into a reexamining box. According to this constitution, measurement can be continued without stopping the machine.