JPS5364084A - System spectometer - Google Patents

System spectometer

Info

Publication number
JPS5364084A
JPS5364084A JP13837376A JP13837376A JPS5364084A JP S5364084 A JPS5364084 A JP S5364084A JP 13837376 A JP13837376 A JP 13837376A JP 13837376 A JP13837376 A JP 13837376A JP S5364084 A JPS5364084 A JP S5364084A
Authority
JP
Japan
Prior art keywords
spectometer
test piece
spectoroscopy
zeroorder
detect
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP13837376A
Other languages
Japanese (ja)
Other versions
JPS5534894B2 (en
Inventor
Takeo Murakoshi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP13837376A priority Critical patent/JPS5364084A/en
Publication of JPS5364084A publication Critical patent/JPS5364084A/en
Publication of JPS5534894B2 publication Critical patent/JPS5534894B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00Features of devices classified in G01N21/00
    • G01N2201/04Batch operation; multisample devices
    • G01N2201/0415Carrusel, sequential

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Automatic Analysis And Handling Materials Therefor (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Spectrometry And Color Measurement (AREA)

Abstract

PURPOSE:To detect an abnormal test piece with an improved reliability by detecting the zeroorder light from the test piece in the spectoroscopy.
JP13837376A 1976-11-19 1976-11-19 System spectometer Granted JPS5364084A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP13837376A JPS5364084A (en) 1976-11-19 1976-11-19 System spectometer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP13837376A JPS5364084A (en) 1976-11-19 1976-11-19 System spectometer

Publications (2)

Publication Number Publication Date
JPS5364084A true JPS5364084A (en) 1978-06-08
JPS5534894B2 JPS5534894B2 (en) 1980-09-10

Family

ID=15220408

Family Applications (1)

Application Number Title Priority Date Filing Date
JP13837376A Granted JPS5364084A (en) 1976-11-19 1976-11-19 System spectometer

Country Status (1)

Country Link
JP (1) JPS5364084A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5960323A (en) * 1982-09-30 1984-04-06 Toshiba Corp Photometric device
JPS59107223A (en) * 1982-12-10 1984-06-21 Toshiba Corp Spectrochemical analyzer

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5960323A (en) * 1982-09-30 1984-04-06 Toshiba Corp Photometric device
JPH0331217B2 (en) * 1982-09-30 1991-05-02 Tokyo Shibaura Electric Co
JPS59107223A (en) * 1982-12-10 1984-06-21 Toshiba Corp Spectrochemical analyzer

Also Published As

Publication number Publication date
JPS5534894B2 (en) 1980-09-10

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