JPS6431067A - Apparatus for testing semiconductor - Google Patents
Apparatus for testing semiconductorInfo
- Publication number
- JPS6431067A JPS6431067A JP18794987A JP18794987A JPS6431067A JP S6431067 A JPS6431067 A JP S6431067A JP 18794987 A JP18794987 A JP 18794987A JP 18794987 A JP18794987 A JP 18794987A JP S6431067 A JPS6431067 A JP S6431067A
- Authority
- JP
- Japan
- Prior art keywords
- rotary disc
- shift
- timing rotary
- timing
- abnormality
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
PURPOSE:To stop operation when abnormality is generated in an apparatus and to immediately inform the abnormality due to the shift of a timing rotary disc, by forming the detection groove for detecting the shift of the rotary disc to the timing rotary disc. CONSTITUTION:A detection groove 4 for detecting the shift of a timing rotary disc 1 is formed to the timing rotary disc 1. An alarm generator 14 informs abnormality when detects the shift of the timing rotary disc 1. A sequence circuit 15 is controlled so as to stop not only the rotation of the timing rotary disc 1 but also a test. That is, when the timing rotary disc 1 is normal, the detection groove 4 and the sensor 5 coincide to emit no alarm and, when shift is generated, the detection groove 4 and the sensor 5 become non-coincidence to emit an alarm and a test apparatus is stopped. By this method, the shift of the timing rotary disc of the apparatus can be detected automatically within a short time and abnormality can be immediately informed.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP18794987A JPS6431067A (en) | 1987-07-27 | 1987-07-27 | Apparatus for testing semiconductor |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP18794987A JPS6431067A (en) | 1987-07-27 | 1987-07-27 | Apparatus for testing semiconductor |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS6431067A true JPS6431067A (en) | 1989-02-01 |
Family
ID=16214987
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP18794987A Pending JPS6431067A (en) | 1987-07-27 | 1987-07-27 | Apparatus for testing semiconductor |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6431067A (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE19854657B4 (en) * | 1997-11-26 | 2007-01-18 | Techno Polymer Co., Ltd. | Use of a synthetic resin for the production of lamps |
| TWI579951B (en) * | 2015-11-17 | 2017-04-21 | 京元電子股份有限公司 | Turn-over device of semiconductor element and testing apparatus thereof |
-
1987
- 1987-07-27 JP JP18794987A patent/JPS6431067A/en active Pending
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE19854657B4 (en) * | 1997-11-26 | 2007-01-18 | Techno Polymer Co., Ltd. | Use of a synthetic resin for the production of lamps |
| TWI579951B (en) * | 2015-11-17 | 2017-04-21 | 京元電子股份有限公司 | Turn-over device of semiconductor element and testing apparatus thereof |
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