JP2519621Y2 - 半導体素子用測定装置 - Google Patents

半導体素子用測定装置

Info

Publication number
JP2519621Y2
JP2519621Y2 JP9758987U JP9758987U JP2519621Y2 JP 2519621 Y2 JP2519621 Y2 JP 2519621Y2 JP 9758987 U JP9758987 U JP 9758987U JP 9758987 U JP9758987 U JP 9758987U JP 2519621 Y2 JP2519621 Y2 JP 2519621Y2
Authority
JP
Japan
Prior art keywords
contact piece
base
holding
semiconductor element
insulating base
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP9758987U
Other languages
English (en)
Japanese (ja)
Other versions
JPS642177U (enrdf_load_stackoverflow
Inventor
克二 川口
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP9758987U priority Critical patent/JP2519621Y2/ja
Publication of JPS642177U publication Critical patent/JPS642177U/ja
Application granted granted Critical
Publication of JP2519621Y2 publication Critical patent/JP2519621Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Connecting Device With Holders (AREA)
JP9758987U 1987-06-24 1987-06-24 半導体素子用測定装置 Expired - Lifetime JP2519621Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP9758987U JP2519621Y2 (ja) 1987-06-24 1987-06-24 半導体素子用測定装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP9758987U JP2519621Y2 (ja) 1987-06-24 1987-06-24 半導体素子用測定装置

Publications (2)

Publication Number Publication Date
JPS642177U JPS642177U (enrdf_load_stackoverflow) 1989-01-09
JP2519621Y2 true JP2519621Y2 (ja) 1996-12-11

Family

ID=30964687

Family Applications (1)

Application Number Title Priority Date Filing Date
JP9758987U Expired - Lifetime JP2519621Y2 (ja) 1987-06-24 1987-06-24 半導体素子用測定装置

Country Status (1)

Country Link
JP (1) JP2519621Y2 (enrdf_load_stackoverflow)

Also Published As

Publication number Publication date
JPS642177U (enrdf_load_stackoverflow) 1989-01-09

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