JP2501049Y2 - 検査装置 - Google Patents
検査装置Info
- Publication number
- JP2501049Y2 JP2501049Y2 JP11898186U JP11898186U JP2501049Y2 JP 2501049 Y2 JP2501049 Y2 JP 2501049Y2 JP 11898186 U JP11898186 U JP 11898186U JP 11898186 U JP11898186 U JP 11898186U JP 2501049 Y2 JP2501049 Y2 JP 2501049Y2
- Authority
- JP
- Japan
- Prior art keywords
- circuit
- integrated machine
- power supply
- output
- signal
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 238000007689 inspection Methods 0.000 title claims description 12
- 230000002159 abnormal effect Effects 0.000 description 11
- 238000010586 diagram Methods 0.000 description 5
- 230000005856 abnormality Effects 0.000 description 4
- 230000010355 oscillation Effects 0.000 description 4
- 230000005540 biological transmission Effects 0.000 description 2
- 230000000007 visual effect Effects 0.000 description 2
- 230000001934 delay Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000008030 elimination Effects 0.000 description 1
- 238000003379 elimination reaction Methods 0.000 description 1
- 230000007257 malfunction Effects 0.000 description 1
- 238000000034 method Methods 0.000 description 1
Landscapes
- Testing Electric Properties And Detecting Electric Faults (AREA)
- Tests Of Electronic Circuits (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP11898186U JP2501049Y2 (ja) | 1986-08-02 | 1986-08-02 | 検査装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP11898186U JP2501049Y2 (ja) | 1986-08-02 | 1986-08-02 | 検査装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS6329289U JPS6329289U (enrdf_load_stackoverflow) | 1988-02-26 |
| JP2501049Y2 true JP2501049Y2 (ja) | 1996-06-12 |
Family
ID=31005940
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP11898186U Expired - Lifetime JP2501049Y2 (ja) | 1986-08-02 | 1986-08-02 | 検査装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP2501049Y2 (enrdf_load_stackoverflow) |
-
1986
- 1986-08-02 JP JP11898186U patent/JP2501049Y2/ja not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| JPS6329289U (enrdf_load_stackoverflow) | 1988-02-26 |
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