JP2025511052A - ピエゾエレクトリックオンインシュレータ(poi)基板およびピエゾエレクトリックオンインシュレータ(poi)基板を製造するための方法 - Google Patents

ピエゾエレクトリックオンインシュレータ(poi)基板およびピエゾエレクトリックオンインシュレータ(poi)基板を製造するための方法 Download PDF

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Publication number
JP2025511052A
JP2025511052A JP2024557703A JP2024557703A JP2025511052A JP 2025511052 A JP2025511052 A JP 2025511052A JP 2024557703 A JP2024557703 A JP 2024557703A JP 2024557703 A JP2024557703 A JP 2024557703A JP 2025511052 A JP2025511052 A JP 2025511052A
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JP
Japan
Prior art keywords
layer
substrate
piezoelectric
poi
trapping
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
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JP2024557703A
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English (en)
Japanese (ja)
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JP2025511052A5 (https=
Inventor
ラファエル カウルミローネ,
フレデリック アリベール,
イザベル ベルトラン,
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Soitec SA
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Soitec SA
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Publication date
Application filed by Soitec SA filed Critical Soitec SA
Publication of JP2025511052A publication Critical patent/JP2025511052A/ja
Publication of JP2025511052A5 publication Critical patent/JP2025511052A5/ja
Pending legal-status Critical Current

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    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10NELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N30/00Piezoelectric or electrostrictive devices
    • H10N30/704Piezoelectric or electrostrictive devices based on piezoelectric or electrostrictive films or coatings
    • H10N30/706Piezoelectric or electrostrictive devices based on piezoelectric or electrostrictive films or coatings characterised by the underlying bases, e.g. substrates
    • H10N30/708Intermediate layers, e.g. barrier, adhesion or growth control buffer layers
    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03HIMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
    • H03H9/00Networks comprising electromechanical or electro-acoustic elements; Electromechanical resonators
    • H03H9/02Details
    • H03H9/02535Details of surface acoustic wave devices
    • H03H9/02818Means for compensation or elimination of undesirable effects
    • H03H9/02952Means for compensation or elimination of undesirable effects of parasitic capacitance
    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03HIMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
    • H03H3/00Apparatus or processes specially adapted for the manufacture of impedance networks, resonating circuits, resonators
    • H03H3/007Apparatus or processes specially adapted for the manufacture of impedance networks, resonating circuits, resonators for the manufacture of electromechanical resonators or networks
    • H03H3/08Apparatus or processes specially adapted for the manufacture of impedance networks, resonating circuits, resonators for the manufacture of electromechanical resonators or networks for the manufacture of resonators or networks using surface acoustic waves
    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03HIMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
    • H03H9/00Networks comprising electromechanical or electro-acoustic elements; Electromechanical resonators
    • H03H9/02Details
    • H03H9/02535Details of surface acoustic wave devices
    • H03H9/02543Characteristics of substrate, e.g. cutting angles
    • H03H9/02559Characteristics of substrate, e.g. cutting angles of lithium niobate or lithium-tantalate substrates
    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03HIMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
    • H03H9/00Networks comprising electromechanical or electro-acoustic elements; Electromechanical resonators
    • H03H9/02Details
    • H03H9/02535Details of surface acoustic wave devices
    • H03H9/02543Characteristics of substrate, e.g. cutting angles
    • H03H9/02574Characteristics of substrate, e.g. cutting angles of combined substrates, multilayered substrates, piezoelectrical layers on not-piezoelectrical substrate
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10NELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N30/00Piezoelectric or electrostrictive devices
    • H10N30/01Manufacture or treatment
    • H10N30/07Forming of piezoelectric or electrostrictive parts or bodies on an electrical element or another base
    • H10N30/072Forming of piezoelectric or electrostrictive parts or bodies on an electrical element or another base by laminating or bonding of piezoelectric or electrostrictive bodies
    • H10N30/073Forming of piezoelectric or electrostrictive parts or bodies on an electrical element or another base by laminating or bonding of piezoelectric or electrostrictive bodies by fusion of metals or by adhesives

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  • Physics & Mathematics (AREA)
  • Acoustics & Sound (AREA)
  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Chemical & Material Sciences (AREA)
  • Materials Engineering (AREA)
  • Surface Acoustic Wave Elements And Circuit Networks Thereof (AREA)
  • Piezo-Electric Or Mechanical Vibrators, Or Delay Or Filter Circuits (AREA)
JP2024557703A 2022-03-30 2023-03-30 ピエゾエレクトリックオンインシュレータ(poi)基板およびピエゾエレクトリックオンインシュレータ(poi)基板を製造するための方法 Pending JP2025511052A (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
FR2202900A FR3134238B1 (fr) 2022-03-30 2022-03-30 Substrat piézoélectrique sur isolant (POI) et procédé de fabrication d’un substrat piézoélectrique sur isolant (POI)
FR2202900 2022-03-30
PCT/EP2023/058282 WO2023187050A1 (fr) 2022-03-30 2023-03-30 Substrat piézoélectrique sur isolant (poi) et procédé de fabrication d'un substrat piézoélectrique sur isolant (poi)

Publications (2)

Publication Number Publication Date
JP2025511052A true JP2025511052A (ja) 2025-04-15
JP2025511052A5 JP2025511052A5 (https=) 2026-03-24

Family

ID=82385323

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2024557703A Pending JP2025511052A (ja) 2022-03-30 2023-03-30 ピエゾエレクトリックオンインシュレータ(poi)基板およびピエゾエレクトリックオンインシュレータ(poi)基板を製造するための方法

Country Status (8)

Country Link
US (1) US20250211199A1 (https=)
EP (1) EP4500583A1 (https=)
JP (1) JP2025511052A (https=)
KR (1) KR20240169041A (https=)
CN (1) CN119173996A (https=)
FR (1) FR3134238B1 (https=)
TW (1) TW202404134A (https=)
WO (1) WO2023187050A1 (https=)

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9768056B2 (en) * 2013-10-31 2017-09-19 Sunedison Semiconductor Limited (Uen201334164H) Method of manufacturing high resistivity SOI wafers with charge trapping layers based on terminated Si deposition
FR3053532B1 (fr) * 2016-06-30 2018-11-16 Soitec Structure hybride pour dispositif a ondes acoustiques de surface

Also Published As

Publication number Publication date
US20250211199A1 (en) 2025-06-26
TW202404134A (zh) 2024-01-16
FR3134238B1 (fr) 2024-08-23
FR3134238A1 (fr) 2023-10-06
WO2023187050A1 (fr) 2023-10-05
KR20240169041A (ko) 2024-12-02
CN119173996A (zh) 2024-12-20
EP4500583A1 (fr) 2025-02-05

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