JP2025511052A - ピエゾエレクトリックオンインシュレータ(poi)基板およびピエゾエレクトリックオンインシュレータ(poi)基板を製造するための方法 - Google Patents
ピエゾエレクトリックオンインシュレータ(poi)基板およびピエゾエレクトリックオンインシュレータ(poi)基板を製造するための方法 Download PDFInfo
- Publication number
- JP2025511052A JP2025511052A JP2024557703A JP2024557703A JP2025511052A JP 2025511052 A JP2025511052 A JP 2025511052A JP 2024557703 A JP2024557703 A JP 2024557703A JP 2024557703 A JP2024557703 A JP 2024557703A JP 2025511052 A JP2025511052 A JP 2025511052A
- Authority
- JP
- Japan
- Prior art keywords
- layer
- substrate
- piezoelectric
- poi
- trapping
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Images
Classifications
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N30/00—Piezoelectric or electrostrictive devices
- H10N30/704—Piezoelectric or electrostrictive devices based on piezoelectric or electrostrictive films or coatings
- H10N30/706—Piezoelectric or electrostrictive devices based on piezoelectric or electrostrictive films or coatings characterised by the underlying bases, e.g. substrates
- H10N30/708—Intermediate layers, e.g. barrier, adhesion or growth control buffer layers
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H9/00—Networks comprising electromechanical or electro-acoustic elements; Electromechanical resonators
- H03H9/02—Details
- H03H9/02535—Details of surface acoustic wave devices
- H03H9/02818—Means for compensation or elimination of undesirable effects
- H03H9/02952—Means for compensation or elimination of undesirable effects of parasitic capacitance
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H3/00—Apparatus or processes specially adapted for the manufacture of impedance networks, resonating circuits, resonators
- H03H3/007—Apparatus or processes specially adapted for the manufacture of impedance networks, resonating circuits, resonators for the manufacture of electromechanical resonators or networks
- H03H3/08—Apparatus or processes specially adapted for the manufacture of impedance networks, resonating circuits, resonators for the manufacture of electromechanical resonators or networks for the manufacture of resonators or networks using surface acoustic waves
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H9/00—Networks comprising electromechanical or electro-acoustic elements; Electromechanical resonators
- H03H9/02—Details
- H03H9/02535—Details of surface acoustic wave devices
- H03H9/02543—Characteristics of substrate, e.g. cutting angles
- H03H9/02559—Characteristics of substrate, e.g. cutting angles of lithium niobate or lithium-tantalate substrates
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H9/00—Networks comprising electromechanical or electro-acoustic elements; Electromechanical resonators
- H03H9/02—Details
- H03H9/02535—Details of surface acoustic wave devices
- H03H9/02543—Characteristics of substrate, e.g. cutting angles
- H03H9/02574—Characteristics of substrate, e.g. cutting angles of combined substrates, multilayered substrates, piezoelectrical layers on not-piezoelectrical substrate
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N30/00—Piezoelectric or electrostrictive devices
- H10N30/01—Manufacture or treatment
- H10N30/07—Forming of piezoelectric or electrostrictive parts or bodies on an electrical element or another base
- H10N30/072—Forming of piezoelectric or electrostrictive parts or bodies on an electrical element or another base by laminating or bonding of piezoelectric or electrostrictive bodies
- H10N30/073—Forming of piezoelectric or electrostrictive parts or bodies on an electrical element or another base by laminating or bonding of piezoelectric or electrostrictive bodies by fusion of metals or by adhesives
Landscapes
- Physics & Mathematics (AREA)
- Acoustics & Sound (AREA)
- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Chemical & Material Sciences (AREA)
- Materials Engineering (AREA)
- Surface Acoustic Wave Elements And Circuit Networks Thereof (AREA)
- Piezo-Electric Or Mechanical Vibrators, Or Delay Or Filter Circuits (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| FR2202900A FR3134238B1 (fr) | 2022-03-30 | 2022-03-30 | Substrat piézoélectrique sur isolant (POI) et procédé de fabrication d’un substrat piézoélectrique sur isolant (POI) |
| FR2202900 | 2022-03-30 | ||
| PCT/EP2023/058282 WO2023187050A1 (fr) | 2022-03-30 | 2023-03-30 | Substrat piézoélectrique sur isolant (poi) et procédé de fabrication d'un substrat piézoélectrique sur isolant (poi) |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2025511052A true JP2025511052A (ja) | 2025-04-15 |
| JP2025511052A5 JP2025511052A5 (https=) | 2026-03-24 |
Family
ID=82385323
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2024557703A Pending JP2025511052A (ja) | 2022-03-30 | 2023-03-30 | ピエゾエレクトリックオンインシュレータ(poi)基板およびピエゾエレクトリックオンインシュレータ(poi)基板を製造するための方法 |
Country Status (8)
| Country | Link |
|---|---|
| US (1) | US20250211199A1 (https=) |
| EP (1) | EP4500583A1 (https=) |
| JP (1) | JP2025511052A (https=) |
| KR (1) | KR20240169041A (https=) |
| CN (1) | CN119173996A (https=) |
| FR (1) | FR3134238B1 (https=) |
| TW (1) | TW202404134A (https=) |
| WO (1) | WO2023187050A1 (https=) |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US9768056B2 (en) * | 2013-10-31 | 2017-09-19 | Sunedison Semiconductor Limited (Uen201334164H) | Method of manufacturing high resistivity SOI wafers with charge trapping layers based on terminated Si deposition |
| FR3053532B1 (fr) * | 2016-06-30 | 2018-11-16 | Soitec | Structure hybride pour dispositif a ondes acoustiques de surface |
-
2022
- 2022-03-30 FR FR2202900A patent/FR3134238B1/fr active Active
-
2023
- 2023-03-30 CN CN202380039083.2A patent/CN119173996A/zh active Pending
- 2023-03-30 TW TW112112149A patent/TW202404134A/zh unknown
- 2023-03-30 EP EP23715527.0A patent/EP4500583A1/fr active Pending
- 2023-03-30 JP JP2024557703A patent/JP2025511052A/ja active Pending
- 2023-03-30 US US18/852,209 patent/US20250211199A1/en active Pending
- 2023-03-30 KR KR1020247035694A patent/KR20240169041A/ko active Pending
- 2023-03-30 WO PCT/EP2023/058282 patent/WO2023187050A1/fr not_active Ceased
Also Published As
| Publication number | Publication date |
|---|---|
| US20250211199A1 (en) | 2025-06-26 |
| TW202404134A (zh) | 2024-01-16 |
| FR3134238B1 (fr) | 2024-08-23 |
| FR3134238A1 (fr) | 2023-10-06 |
| WO2023187050A1 (fr) | 2023-10-05 |
| KR20240169041A (ko) | 2024-12-02 |
| CN119173996A (zh) | 2024-12-20 |
| EP4500583A1 (fr) | 2025-02-05 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20260313 |
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| A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20260313 |