JP2024502460A - インライン型薄膜太陽光発電モジュールに適した被覆鋼板およびその製造方法 - Google Patents
インライン型薄膜太陽光発電モジュールに適した被覆鋼板およびその製造方法 Download PDFInfo
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- JP2024502460A JP2024502460A JP2023541363A JP2023541363A JP2024502460A JP 2024502460 A JP2024502460 A JP 2024502460A JP 2023541363 A JP2023541363 A JP 2023541363A JP 2023541363 A JP2023541363 A JP 2023541363A JP 2024502460 A JP2024502460 A JP 2024502460A
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- layer
- coated steel
- steel sheet
- base layer
- laser scribing
- Prior art date
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- Granted
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- 229910000831 Steel Inorganic materials 0.000 title claims abstract description 200
- 239000010959 steel Substances 0.000 title claims abstract description 200
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- 238000010248 power generation Methods 0.000 title description 6
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- 229910052802 copper Inorganic materials 0.000 claims abstract description 17
- 229910052737 gold Inorganic materials 0.000 claims abstract description 8
- 229910052709 silver Inorganic materials 0.000 claims abstract description 7
- 229910052787 antimony Inorganic materials 0.000 claims abstract description 5
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- 239000010410 layer Substances 0.000 claims description 225
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- 229910052697 platinum Inorganic materials 0.000 claims 1
- 230000008569 process Effects 0.000 abstract description 23
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 abstract description 18
- 239000000377 silicon dioxide Substances 0.000 abstract description 8
- 235000012239 silicon dioxide Nutrition 0.000 abstract description 8
- 238000010586 diagram Methods 0.000 abstract description 7
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- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 abstract description 4
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- 238000000926 separation method Methods 0.000 description 4
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- 239000010936 titanium Substances 0.000 description 4
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- 229910052783 alkali metal Inorganic materials 0.000 description 3
- 150000001340 alkali metals Chemical class 0.000 description 3
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- -1 iron (Fe) ions Chemical class 0.000 description 2
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- LPXPTNMVRIOKMN-UHFFFAOYSA-M sodium nitrite Chemical compound [Na+].[O-]N=O LPXPTNMVRIOKMN-UHFFFAOYSA-M 0.000 description 2
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- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 1
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- DGAQECJNVWCQMB-PUAWFVPOSA-M Ilexoside XXIX Chemical compound C[C@@H]1CC[C@@]2(CC[C@@]3(C(=CC[C@H]4[C@]3(CC[C@@H]5[C@@]4(CC[C@@H](C5(C)C)OS(=O)(=O)[O-])C)C)[C@@H]2[C@]1(C)O)C)C(=O)O[C@H]6[C@@H]([C@H]([C@@H]([C@H](O6)CO)O)O)O.[Na+] DGAQECJNVWCQMB-PUAWFVPOSA-M 0.000 description 1
- BUGBHKTXTAQXES-UHFFFAOYSA-N Selenium Chemical compound [Se] BUGBHKTXTAQXES-UHFFFAOYSA-N 0.000 description 1
- NINIDFKCEFEMDL-UHFFFAOYSA-N Sulfur Chemical compound [S] NINIDFKCEFEMDL-UHFFFAOYSA-N 0.000 description 1
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- PBCFLUZVCVVTBY-UHFFFAOYSA-N tantalum pentoxide Inorganic materials O=[Ta](=O)O[Ta](=O)=O PBCFLUZVCVVTBY-UHFFFAOYSA-N 0.000 description 1
- XSOKHXFFCGXDJZ-UHFFFAOYSA-N telluride(2-) Chemical compound [Te-2] XSOKHXFFCGXDJZ-UHFFFAOYSA-N 0.000 description 1
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Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/0248—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies
- H01L31/036—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies characterised by their crystalline structure or particular orientation of the crystalline planes
- H01L31/0392—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies characterised by their crystalline structure or particular orientation of the crystalline planes including thin films deposited on metallic or insulating substrates ; characterised by specific substrate materials or substrate features or by the presence of intermediate layers, e.g. barrier layers, on the substrate
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/02—Pretreatment of the material to be coated
- C23C14/021—Cleaning or etching treatments
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/02—Pretreatment of the material to be coated
- C23C14/021—Cleaning or etching treatments
- C23C14/022—Cleaning or etching treatments by means of bombardment with energetic particles or radiation
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/02—Pretreatment of the material to be coated
- C23C14/024—Deposition of sublayers, e.g. to promote adhesion of the coating
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/06—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the coating material
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/06—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the coating material
- C23C14/0641—Nitrides
- C23C14/0652—Silicon nitride
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/06—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the coating material
- C23C14/08—Oxides
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/06—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the coating material
- C23C14/08—Oxides
- C23C14/083—Oxides of refractory metals or yttrium
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/06—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the coating material
- C23C14/10—Glass or silica
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/06—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the coating material
- C23C14/14—Metallic material, boron or silicon
- C23C14/16—Metallic material, boron or silicon on metallic substrates or on substrates of boron or silicon
-
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Abstract
Description
現在、一般的な太陽電池モジュールは:結晶ケイ素ベースの単結晶および多結晶太陽光発電モジュール、並びにセレン化銅インジウムガリウム(CIGS)、テルル化カジウム(cadium)(CdTe)、アモルファスケイ素(a-Si)などの薄膜太陽光発電モジュール、並びに化合物半導体薄膜太陽電池、色素増感太陽電池、ペロブスカイト太陽電池、および有機薄膜太陽電池などの他の新たに開発された太陽電池を含む。近年、技術における進歩、および建物一体型太陽光発電、モバイル太陽光発電輸送などのさまざまな用途の拡大に伴い、市場は、太陽光発電モジュールのサービス性能について、軽重量、高強度、高靭性、柔軟性、および耐久性などの、さまざまな新しい要件を提示している。
金属基板表面上の既存の絶縁膜システムがインライン型薄膜太陽光発電モジュールに適応できないという問題を解決するために、本発明は、鋼基板および該鋼基板の表面上の複合絶縁層を含む、インライン型薄膜太陽光発電モジュールに適した被覆鋼板を提供する。該複合絶縁層は、絶縁ベース層およびレーザースクライビングバッファー層を含む。該絶縁ベース層の一方の側は、該鋼基板であり、他方の側は、該レーザースクライビングバッファー層である。該レーザースクライビングバッファー層は、以下の成分:
SixNy(式中、0.75≦x:y≦1);および
Si1-x’(R)x’Oy’(式中、Rは、Sb、Au、Cu、Sn、およびAgから選択される少なくとも1つの元素であり、0<x’≦0.05、1.9≦y’≦2)
の少なくとも1つを含有する。
0から100℃での熱膨張係数が(10から11)×10-6/℃であり;
100から315℃での熱膨張係数が(10.5から11)×10-6/℃であり;および
315から650℃での熱膨張係数が(11から11.5)×10-6/℃である
を満足する。
鋼基板の表面を前処理すること;並びに
該鋼基板の該表面上に絶縁ベース層およびレーザースクライビングバッファー層を堆積させること
を含む、被覆鋼板を製造する方法を提供する。
S1:鋼基板の表面を前処理すること;並びに
S2:引き続き、絶縁ベース層、レーザースクライビングバッファー層、およびバックコンタクト層を、該鋼基板の該表面上に堆積させること
を含む。
本発明は、鋼基板の表面に良好な接着を形成し、良好な耐薬品性、高温耐性、優れた絶縁性能、および適当な表面粗さを示し得る、膜システムの組合せ、およびその製造方法を提供する。鋼基板の表面上に連続的で均一で緻密な複合絶縁層を形成することによって、インライン型薄膜太陽光発電モジュール用の被覆鋼板の表面が、適当な粗さ、安定した耐熱性、およびさまざまな化学媒体に対する良好な耐性を有することを確保することができる。単層膜システムは、被覆プロセス中に貫通ピンホールを有する傾向があり、これは、絶縁層の絶縁機能を損なう。複合絶縁層を使用することによって、単層膜システムと関連するピンホールの問題を防ぐことができ、すなわち薄膜の絶縁特性を保つことができる。本発明によって提供される被覆鋼板を製造する方法は、インライン型薄膜太陽光発電モジュールの生産中に実施するレーザースクライビング直列接続手順とよく調和しており、これは、インライン型薄膜太陽光発電モジュールの生産要件を満たすことにおいて大きな実用上の意義を有する。
本発明の実施様式は、以下の特定の実施態様によって以下に例示し、当業者は容易に、本説明における開示に基づいて本発明の他の利点および効果を理解することができる。本発明の説明は、好ましい実施態様と組み合わせて提示するが、本発明の特徴が、特定の実施態様に限定されることを意味するものではない。逆に、本発明を実施様式と組み合わせて提示する目的は、本発明の特許請求の範囲から導き出し得る他の選択または修飾をカバーすることである。本発明の深い理解を提供するために、以下の説明は、多くの特定の詳細を含有するであろう。しかしながら、本発明はまた、これらの詳細を使用することなく実施することもできる。さらに、本発明の焦点の混乱または不明瞭化を避けるために、いくつかの特定の詳細が、説明において省略され得る。矛盾しない限り、本発明における実施態様および実施態様における特徴を、互いに組み合わせることができることに、留意すべきである。
◎:グリッドにおいて分離が何ら観察されず、切り口が完全に滑らかであることを示す。
○:切り口の交点で複合絶縁層のわずかな分離があり、グリッド面積の約5%に影響を及ぼすことを示す。
△:切り口のエッジおよび交点で複合絶縁層のわずかな分離があり、グリッド領域の約5~15%に影響を及ぼすことを示す。
×:グリッドの切り口のエッジおよび一部で帯状複合絶縁層の明らかな帯様剥離があり、グリッド面積の15%超に影響を及ぼすことを示す。
◎:降伏電圧が≧250Vであり、測定した抵抗が≧250MΩであることを示す;
○:降伏電圧が≧100Vであり、測定した抵抗が≧100MΩであることを示す;
△:降伏電圧が≧50Vであり、測定した抵抗が≧50MΩであることを示す;
×:降伏電圧が<50Vであり、複合絶縁層に、絶縁不良をもたらす表面欠陥または損傷があることを示す。
◎:試験前後で目視で観察した複合絶縁層において著しい変化が何らなく;SEM観察は、表面亀裂が何らない、複合絶縁層の滑らかで均一な表面を示すことを示す。
○:試験前後で目視で観察した複合絶縁層において著しい変化が何らなく;SEM観察は、領域の5%未満に影響を及ぼす、少量の表面亀裂を有する、複合絶縁層の滑らかで均一な表面を示すことを示す。
△:試験前後で目視で観察した複合絶縁層において著しい変化が何らなく;SEM観察は、領域の約5~15%に影響を及ぼす、一定量の表面亀裂を有する、複合絶縁層の滑らかで均一な表面を示すことを示す。
×:目視で観察した複合絶縁層の剥離があり;SEM観察は、複合絶縁層における顕著なしわおよび亀裂を示すことを示す。
◎:欠陥/m2≦2を示す;
○:2<欠陥/m2≦5を示す;
△:5<欠陥/m2≦10を示す;および
×:欠陥/m2>10を示す。
レーザースクライビング試験を、バックコンタクト層で被覆した鋼帯に対して実施する。ガラス基板上でスクライビングのためにガラスを通過するレーザーの方法とは異なり、レーザーは、バックコンタクト層で被覆した側上で直接スクライビングを実施し、これが、スクライビングエッジでの揮発性不純物の蓄積または背面電極下の絶縁層への損傷を避ける。
◎:レーザーP1スクライビング後、スクライビングエッジの突起(ダメージクレーター)の高さが≦30nmであり、絶縁ベース層の厚さの損失が≦30nmであることを示す;
○:レーザーP1スクライビング後、スクライビングエッジの突起(ダメージクレーター)の高さが30nmより大きく50nm以下であり、絶縁ベース層の厚さの損失が30nmより大きく50nm以下であることを示す;
△:レーザーP1スクライビング後、スクライビングエッジの突起(ダメージクレーター)の高さが50nmより大きく100nm以下であり、絶縁ベース層の厚さの損失が50nmより大きく100nm以下であることを示す;および
×:レーザーP1スクライビング後、スクライビングエッジの突起(ダメージクレーター)の高さが100nmより大きく、絶縁ベース層の厚さの損失が100nmより大きいか、または絶縁ベース層が完全に貫通されていることを示す。
Claims (18)
- 鋼基板および該鋼基板の表面上の複合絶縁層を含む、インライン型薄膜太陽光発電モジュールに適した被覆鋼板であって、ここで、
該複合絶縁層は、絶縁ベース層およびレーザースクライビングバッファー層を含み;該絶縁ベース層の一方の側は、該鋼基板であり、他方の側は、該レーザースクライビングバッファー層であり;並びに
該レーザースクライビングバッファー層は、以下の成分:
SixNy(式中、0.75≦x:y≦1);および
Si1-x’(R)x’Oy’(式中、Rは、Sb、Au、Cu、Sn、およびAgから選択される少なくとも1つの元素であり、0<x’≦0.05、1.9≦y’≦2)
の少なくとも1つを含有する、被覆鋼板。 - SixNyにおいて、0.75<x:y<0.90である、請求項1に記載の被覆鋼板。
- レーザースクライビングバッファー層の厚さが50から1000nmである、請求項1に記載の被覆鋼板。
- レーザースクライビングバッファー層の厚さが100から500nmである、請求項3に記載の被覆鋼板。
- 絶縁ベース層が、以下の成分:SiO2-m、HfO2-m、Si(Hf)O2-m、およびTa2O5-2m(式中、0≦m≦0.05)の少なくとも1つを含有する、請求項1に記載の被覆鋼板。
- 絶縁ベース層が、以下の成分:SiO2-m、HfO2、Si(Hf)O2、およびTa2O5(式中、0≦m≦0.05)の少なくとも1つから構成されている、請求項5に記載の被覆鋼板。
- 絶縁ベース層が単層構造または多層構造である、請求項1に記載の被覆鋼板。
- 絶縁ベース層の合計の厚さが0.1から9μmである、請求項7に記載の被覆鋼板。
- 絶縁ベース層の合計の厚さが0.25から6μmである、請求項8に記載の被覆鋼板。
- 鋼基板の0から100℃での熱膨張係数が(10から11)×10-6/℃であり;
鋼基板の100から315℃での熱膨張係数が(10.5から11)×10-6/℃であり;および
鋼基板の315から650℃での熱膨張係数が(11から11.5)×10-6/℃である、
請求項1に記載の被覆鋼板。 - 鋼基板が、5から180μmの厚さを有する帯状箔鋼コイルである、請求項10に記載の被覆鋼板。
- 帯状箔鋼コイルの厚さが15から50μmである、請求項11に記載の被覆鋼板。
- 鋼基板が、0.3から2.0mmの厚さを有するシート様硬板である、請求項10に記載の被覆鋼板。
- シート様硬板の厚さが0.4から1.0mmである、請求項13に記載の被覆鋼板。
- 鋼基板の表面粗さを表す、プロファイルの算術平均偏差Raが0.3μmより小さく、鋼基板の表面粗さを表す、プロファイルの最大高さRzが1μmより小さい、請求項10に記載の被覆鋼板。
- Ra<0.07μm、および/またはRz<0.3μmである、請求項15に記載の被覆鋼板。
- 複合絶縁層が、その表面上に金属下部電極を堆積させることによって形成されるバックコンタクト層を有し;
該バックコンタクト層の材料が、以下:MoまたはMo合金、CuまたはCu/C複合材料、AlまたはAl合金、Ag、Au、およびPtの少なくとも1つを含み;並びに
該バックコンタクト層の厚さが、20nmから2μmである、
請求項1に記載の被覆鋼板。 - 以下の工程:
鋼基板の表面を前処理すること;並びに
該鋼基板の該表面上に絶縁ベース層およびレーザースクライビングバッファー層を堆積させること
を含む、請求項1~17のいずれかに記載の被覆鋼板を製造する方法。
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