JP2023537295A - 放射光検出方法、検出装置及びレーザ走査顕微鏡 - Google Patents

放射光検出方法、検出装置及びレーザ走査顕微鏡 Download PDF

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JP2023537295A
JP2023537295A JP2023506011A JP2023506011A JP2023537295A JP 2023537295 A JP2023537295 A JP 2023537295A JP 2023506011 A JP2023506011 A JP 2023506011A JP 2023506011 A JP2023506011 A JP 2023506011A JP 2023537295 A JP2023537295 A JP 2023537295A
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pixel
matrix sensor
pixels
spectral
detection device
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Japanese (ja)
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JP2023537295A5 (https=
Inventor
ダニエル シュウェット
ティエモ アンハット
ピーター シャハト
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Carl Zeiss Microscopy GmbH
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Carl Zeiss Microscopy GmbH
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    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0052—Optical details of the image generation
    • G02B21/0076—Optical details of the image generation arrangements using fluorescence or luminescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G01N21/645—Specially adapted constructive features of fluorimeters
    • G01N21/6456—Spatial resolved fluorescence measurements; Imaging
    • G01N21/6458—Fluorescence microscopy
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/027—Control of working procedures of a spectrometer; Failure detection; Bandwidth calculation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/12—Generating the spectrum; Monochromators
    • G01J3/18—Generating the spectrum; Monochromators using diffraction elements, e.g. grating
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J3/2823—Imaging spectrometer
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0032—Optical details of illumination, e.g. light-sources, pinholes, beam splitters, slits, fibers
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/008—Details of detection or image processing, including general computer control
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J3/2803—Investigating the spectrum using photoelectric array detector
    • G01J2003/2813—2D-array
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J3/44—Raman spectrometry; Scattering spectrometry ; Fluorescence spectrometry
    • G01J3/4406—Fluorescence spectrometry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G01N2021/6417—Spectrofluorimetric devices
    • G01N2021/6423—Spectral mapping, video display
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G01N21/6408—Fluorescence; Phosphorescence with measurement of decay time, time resolved fluorescence

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Optics & Photonics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • General Engineering & Computer Science (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Microscoopes, Condenser (AREA)
JP2023506011A 2020-07-30 2021-07-29 放射光検出方法、検出装置及びレーザ走査顕微鏡 Pending JP2023537295A (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
DE102020120190.7 2020-07-30
DE102020120190.7A DE102020120190A1 (de) 2020-07-30 2020-07-30 Verfahren zum detektieren von emissionslicht, detektionsvorrichtung und laser-scanning-mikroskop
PCT/EP2021/071269 WO2022023474A1 (de) 2020-07-30 2021-07-29 Verfahren zum detektieren von emissionslicht, detektionsvorrichtung und laserscanning-mikroskop

Publications (2)

Publication Number Publication Date
JP2023537295A true JP2023537295A (ja) 2023-08-31
JP2023537295A5 JP2023537295A5 (https=) 2024-07-01

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JP2023506011A Pending JP2023537295A (ja) 2020-07-30 2021-07-29 放射光検出方法、検出装置及びレーザ走査顕微鏡

Country Status (6)

Country Link
US (1) US11921274B2 (https=)
EP (1) EP4189358B1 (https=)
JP (1) JP2023537295A (https=)
CN (1) CN116249891A (https=)
DE (1) DE102020120190A1 (https=)
WO (1) WO2022023474A1 (https=)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7402313B2 (ja) * 2020-03-27 2023-12-20 ギガフォトン株式会社 センサ劣化判定方法
DE102023100926A1 (de) 2023-01-17 2024-07-18 Carl Zeiss Microscopy Gmbh Mikroskop
DE102023209080A1 (de) 2023-09-19 2025-03-20 Carl Zeiss Microscopy Gmbh Multimodales Scanmikroskop und Verfahren zu dessen Betrieb
EP4718138A1 (en) * 2024-09-25 2026-04-01 Leica Microsystems CMS GmbH Detection arrangement, cascaded detection arrangement, and optical scanning microscope

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20190258041A1 (en) * 2016-10-17 2019-08-22 Carl Zeiss Microscopy Gmbh Optical Group For Detection Light for a Microscope, Method for Microscopy, and Microscope
US20200003551A1 (en) * 2010-10-15 2020-01-02 Bioaxial Sas Method and Device for Superresolution Optical Measurement using Singular Optics

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE10127284A1 (de) * 2001-06-05 2002-12-12 Zeiss Carl Jena Gmbh Autofokussiereinrichtung für ein optisches Gerät
DE10339312A1 (de) * 2003-08-27 2005-03-31 Leica Microsystems Heidelberg Gmbh Verfahren zur Trennung von Fluoreszenzspektren von in einer Probe vorhandenen Farbstoffen
JP6253266B2 (ja) 2013-06-11 2017-12-27 オリンパス株式会社 共焦点画像生成装置
DE102014111167A1 (de) 2014-08-06 2016-02-11 Carl Zeiss Microscopy Gmbh Hochauflösende Scanning-Mikroskopie mit der Unterscheidung mindestens zweier Wellenlängenbereiche
DE102016120308A1 (de) * 2016-10-25 2018-04-26 Carl Zeiss Microscopy Gmbh Optische Anordnung, Multispot-Scanning-Mikroskop und Verfahren zum Betreiben eines Mikroskops
DE102017113683A1 (de) 2017-06-21 2018-12-27 Carl Zeiss Microscopy Gmbh Hochauflösende Scanning-Mikroskopie mit der Unterscheidung mindestens zweier Wellenlängenbereiche
EP3460520B1 (en) * 2017-09-25 2023-07-19 Hexagon Technology Center GmbH Multi-beam laser scanner
IT201800001891A1 (it) * 2018-01-25 2019-07-25 Fondazione St Italiano Tecnologia Metodo di imaging risolto nel tempo ad alta risoluzione spaziale.

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20200003551A1 (en) * 2010-10-15 2020-01-02 Bioaxial Sas Method and Device for Superresolution Optical Measurement using Singular Optics
US20190258041A1 (en) * 2016-10-17 2019-08-22 Carl Zeiss Microscopy Gmbh Optical Group For Detection Light for a Microscope, Method for Microscopy, and Microscope
JP2019532360A (ja) * 2016-10-17 2019-11-07 カール ツァイス マイクロスコピー ゲーエムベーハーＣａｒｌ Ｚｅｉｓｓ Ｍｉｃｒｏｓｃｏｐｙ Ｇｍｂｈ 顕微鏡の検出光のための光学グループ、顕微鏡法のための方法、及び顕微鏡

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Publication number Publication date
DE102020120190A1 (de) 2022-02-03
US20230258916A1 (en) 2023-08-17
US11921274B2 (en) 2024-03-05
WO2022023474A1 (de) 2022-02-03
EP4189358A1 (de) 2023-06-07
CN116249891A (zh) 2023-06-09
EP4189358B1 (de) 2024-07-10

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