JP2023039081A5 - - Google Patents

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Publication number
JP2023039081A5
JP2023039081A5 JP2021146056A JP2021146056A JP2023039081A5 JP 2023039081 A5 JP2023039081 A5 JP 2023039081A5 JP 2021146056 A JP2021146056 A JP 2021146056A JP 2021146056 A JP2021146056 A JP 2021146056A JP 2023039081 A5 JP2023039081 A5 JP 2023039081A5
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JP
Japan
Prior art keywords
forming
gas
titanium silicide
silicide film
film
Prior art date
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Application number
JP2021146056A
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English (en)
Japanese (ja)
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JP2023039081A (ja
JP7756520B2 (ja
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Publication date
Application filed filed Critical
Priority to JP2021146056A priority Critical patent/JP7756520B2/ja
Priority claimed from JP2021146056A external-priority patent/JP7756520B2/ja
Priority to US17/822,472 priority patent/US20230076867A1/en
Priority to KR1020220107442A priority patent/KR20230036972A/ko
Publication of JP2023039081A publication Critical patent/JP2023039081A/ja
Publication of JP2023039081A5 publication Critical patent/JP2023039081A5/ja
Application granted granted Critical
Publication of JP7756520B2 publication Critical patent/JP7756520B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

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JP2021146056A 2021-09-08 2021-09-08 成膜方法、半導体装置の製造方法、および成膜装置 Active JP7756520B2 (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2021146056A JP7756520B2 (ja) 2021-09-08 2021-09-08 成膜方法、半導体装置の製造方法、および成膜装置
US17/822,472 US20230076867A1 (en) 2021-09-08 2022-08-26 Film forming method, method of manufacturing semiconductor device, and film forming apparatus
KR1020220107442A KR20230036972A (ko) 2021-09-08 2022-08-26 성막 방법, 반도체 장치의 제조 방법 및 성막 장치

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2021146056A JP7756520B2 (ja) 2021-09-08 2021-09-08 成膜方法、半導体装置の製造方法、および成膜装置

Publications (3)

Publication Number Publication Date
JP2023039081A JP2023039081A (ja) 2023-03-20
JP2023039081A5 true JP2023039081A5 (enExample) 2024-03-18
JP7756520B2 JP7756520B2 (ja) 2025-10-20

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ID=85386120

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2021146056A Active JP7756520B2 (ja) 2021-09-08 2021-09-08 成膜方法、半導体装置の製造方法、および成膜装置

Country Status (3)

Country Link
US (1) US20230076867A1 (enExample)
JP (1) JP7756520B2 (enExample)
KR (1) KR20230036972A (enExample)

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100269328B1 (ko) * 1997-12-31 2000-10-16 윤종용 원자층 증착 공정을 이용하는 도전층 형성방법
KR100538806B1 (ko) 2003-02-21 2005-12-26 주식회사 하이닉스반도체 에피택셜 c49상의 티타늄실리사이드막을 갖는 반도체소자 및 그 제조 방법
JP6147693B2 (ja) 2014-03-31 2017-06-14 株式会社日立国際電気 半導体装置の製造方法、基板処理装置、およびプログラム
US10468264B2 (en) 2016-07-04 2019-11-05 Samsung Electronics Co., Ltd. Method of fabricating semiconductor device
KR102320047B1 (ko) 2017-07-05 2021-11-01 삼성전자주식회사 집적회로 소자 및 그 제조 방법

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