JP2022541987A - Pogo pin for ultra high current - Google Patents

Abstract

An object of the present invention is to improve electrical characteristics of pogo pins without sacrificing physical characteristics, or to improve physical characteristics without sacrificing electrical characteristics. A pogo pin according to the present invention includes a spring that elastically supports a probe and an outer cylinder that guides the slide of the probe. a large-diameter portion integrally connected to the small-diameter portion and having an outer diameter larger than that of the small-diameter portion; a plurality of brushes extending from the large-diameter portion and slidable while elastically contacting an inner peripheral surface of the outer cylinder; , wherein the probe is formed by processing a flat plate material. [Selection drawing] Fig. 6

Description

The present invention relates to pogo pins that allow transmission of very high currents.

In a conventional general pogo pin, when the tip of the probe supported by the spring is pressed, the probe falls slightly depending on its instability, and a part of the probe comes into contact with the outer cylinder. and the outer cylinder. For example, when probes (upper probe and lower probe) are configured at both upper and lower ends of a pogo pin, the electrical path consists of upper probe - outer cylinder - lower probe. contact between is possible. As a result, the contact impedance of conventional pogo pins has a large variation, and the contact impedance has to be relatively large.

In order to solve these problems, deformed pogo pins and connecting pins with various structures are being researched, and physical properties such as stroke, spring force, degree of integration (miniaturization), durability, and stability are being investigated. There is a need to develop pogo pins that have electrical properties such as ultra-high current or ultra-low impedance while maintaining or improving .

Although the problems and problems of the prior art have been described above, recognition of such problems and problems is not obvious to those who have ordinary knowledge in the technical field of the present invention.

The present invention has been made in view of the above problems, and an object of the present invention is to improve the electrical characteristics of the pogo pin without sacrificing the physical characteristics, or to improve the electrical characteristics of the pogo pin. To provide a pogo pin capable of improving physical characteristics without sacrificing characteristics.

Another object of the present invention is to provide a pogo pin with a simpler manufacturing process and a reduced manufacturing cost.

A pogo pin according to one embodiment of the present invention includes a spring 30 for elastically supporting a probe and an outer cylinder 40 for guiding the slide of the probe. A large-diameter portion extending to have an outer diameter larger than that of the small-diameter portion and positioned inside the outer cylinder 40; , and a plurality of brushes that extend from the cylindrical coupling portion and are slidable while elastically contacting the inner peripheral surface of the outer cylinder 40 .

In the pogo pin, the probe 10 and the sleeve 20 are both formed by processing a flat plate material, and the sleeve 20 is formed by processing a flat plate material thinner than the probe 10. obtain.

In the pogo pin, the sleeve is formed by processing a flat plate material. It may originate from one side plane of the material.

In the pogo pin, a hook portion 21a is provided at the lower portion of the cylindrical coupling portion of the sleeve and is partially punched and bent inward. 12 can be prevented from being detached from the sleeve 20 .

In the pogo pin, the probe may be formed by cutting a cylindrical material, and the sleeve may be formed by processing a flat plate material.

In the pogo pin, the probe extends from the small diameter portion on the opposite side of the large diameter portion, has a larger outer diameter than the small diameter portion, and further comprises a head portion located outside the outer cylinder 40, The upper surface of the head portion is provided with a contact portion 14' in which an arrangement of sharp protrusions is formed by cutting for contact with the outside.

In the pogo pin, a first circular trench E1 cut inward along the circumference is provided in the large diameter portion of the probe, and a first circular trench E1 is bent inward along the circumference in the cylindrical connecting portion of the sleeve. and two circular trenches E2, wherein the second circular trench E2 is seated in the first circular trench E1, thereby fixing the probe and the sleeve to each other.

In the pogo pin, a constricted portion 23 is formed above the cylindrical coupling portion 21 of the sleeve 20. The constricted portion 23 causes the other end of the large-diameter portion 12 of the probe 10 to move toward the above-mentioned position when the pogo pin is extended. Detachment to the outside of the sleeve 20 can be prevented.

A pogo pin according to one embodiment of the present invention includes a spring 60 that elastically supports a probe 50 and an outer cylinder 70 that guides the slide of the probe 50. The probe 50 includes a small diameter portion 51, A large-diameter portion 52 extending from the small-diameter portion 51 and having an outer diameter larger than that of the small-diameter portion 51, and a plurality of brushes 53 extending from the large-diameter portion 52 and slidable while elastically contacting the inner peripheral surface of the outer cylinder 40. , and the probe 50 is characterized by being formed by processing a flat plate material.

In the pogo pin, the contact surface of the brush 53 that is in elastic contact with the inner peripheral surface of the outer cylinder 40 may originate from one side plane of the flat plate member, not the cut surface of the flat plate member.

In the pogo pin, the flat plate material is processed so that the thickness t2 of the brush 53 of the probe 50 is thinner than the thickness t1 of the small diameter portion 51 and the large diameter portion 52 .

In the pogo pin, the brush 53 is formed integrally with the free end of the kentilever 53a, which extends in the longitudinal direction on the circumference of the large diameter portion 52, and the inner peripheral surface of the outer cylinder 40. A sliding contact portion 53b that makes elastic contact may be provided.

In the pogo pin, the slide contact portion 53 a may have a bent portion that contacts the inner peripheral surface of the outer cylinder 70 .

In the pogo pin, the outer cylinder 70 is also formed by processing a flat plate material, and the outer cylinder 70 has a circular projection that is pushed inward from the circumference of the outer cylinder 70 to form a circular protrusion. The probe 50 is prevented from being detached to the outside of the outer cylinder 70 by hooking the first stepped portion A1 between the large diameter portion 52 and the small diameter portion 51. can be done.

In the pogo pin, the outer cylinder 70 has a first cylindrical part 71 that guides the large diameter part 52 with the circular protrusion B of the outer cylinder 70 as a boundary and provides an inner peripheral surface on which the brush 53 slides. , and a second cylindrical portion 72 that is coupled to the first cylindrical portion 71 and formed at one or both ends of the outer cylinder 70 , wherein the inner diameters of the first cylindrical portion 71 and the second cylindrical portion 72 are are the same.

In the pogo pin, the probe 50 further includes a contact portion 54 extending from the small diameter portion 51 after forming the second stepped portion A2. and one end of the spring 60 may be supported by the second stepped portion A2.

According to one embodiment of the present invention, the range of elastic deformation of the brush is increased, allowing the use of brushes having a shorter length, and the use of the brush allows the pogo pins to be more flexible without significantly increasing the length of the pogo pins. There is an effect that the electrical characteristics of the can be improved.

According to one embodiment of the present invention, caulking, which is required in the conventional manufacturing process of pogo pins, is not required, thereby reducing the defect rate and significantly reducing the manufacturing cost.

According to one embodiment of the present invention, the structure allows passage of the spring into the interior of the probe, which has the effect of allowing longer spring lengths and longer spring strokes.

1 is a perspective view showing an appearance of a pogo pin for ultra-high current according to a first embodiment of the present invention; FIG. 1 is an exploded perspective view of a pogo pin for ultra-high current according to a first embodiment of the present invention; FIG. 1 is a vertical sectional view of a pogo pin for ultra-high current according to a first embodiment of the present invention; FIG. FIG. 10 is a perspective view showing the structure of the ultra-high current pogo pin according to the second embodiment of the present invention, showing the appearance thereof; FIG. 3 is an exploded perspective view showing the structure of a pogo pin for ultra-high current according to a second embodiment of the present invention; FIG. 2 is a cross-sectional view showing the structure of a pogo pin for ultra-high current according to a second embodiment of the present invention; FIG. 5 is a perspective view showing the appearance of a modification of the pogo pin for ultra-high current according to the first embodiment of the present invention; FIG. 5 is an exploded perspective view showing a modification of the ultra-high current pogo pin according to the first embodiment of the present invention; FIG. 5 is a vertical cross-sectional view of a modification of the ultra-high current pogo pin according to the first embodiment of the present invention;

Embodiments of the present invention will be described in detail with reference to the accompanying drawings so that those skilled in the art can easily implement the present invention. This invention may, however, be embodied in many different forms and is not limited to the embodiments set forth herein. In order to clearly explain the present invention in the drawings, parts not related to the description are omitted, and similar names and reference numerals are used for similar parts throughout the specification.

1 to 3 are a pogo pin for ultra-high current according to a first embodiment of the present invention. FIG. 1 is a perspective view showing the appearance, FIG. 2 is an exploded perspective view, and FIG. 3 is a longitudinal sectional view.

A pogo pin according to the first embodiment of the present invention includes a probe 10, a sleeve 20, a spring 30 and a barrel 40. As shown in FIG. The probe 10, the sleeve 20 and the outer cylinder 40, excluding the spring 30, are manufactured by processing a flat plate material.

The outer cylinder 40 incorporates a coil-type spring 30 that elastically supports the probe 10, guides the probe 10 to slide, and guides the spring 30 when the spring 30 is compressed and expanded. The first embodiment of the present invention shows having the probe 10 in one direction, so that the probe 10 is partially exposed to the outside in one direction (upper side) of the barrel, and depending on the situation, the exposed portion is variable. The other direction (downward) of the outer cylinder is closed as the disk portion 41 on the bottom surface, but in the outer cylinder manufactured by processing the flat plate material, the disk portion 41 are physically connected to each other, and on the opposite side to which the disk portion 41 is connected, the hook 42 extending from the disk portion 41 is bent to the hook groove H provided at the lower end of the cylindrical portion 43, and is stable. The disc portion 41 is fixed to the cylindrical portion 43 by being attached.

For example, when the pogo pin is used in a socket, the probe 10 of the pogo pin, specifically the contact portion 14 of the probe 10, is for contacting the terminals of the semiconductor device, and the outer cylinder 40 including the disk portion 41 is The lower end is for direct contact or soldering contact with the pads of the PCB. Moreover, the outer wall of the outer cylinder 40 may come into contact with other contact portions as necessary.

While the first embodiment of the present invention is shown having probes 10 in one direction, other embodiments may have probes 10 in both directions, ie, on both longitudinal sides of the pogo pin. At this time, the shape of the contact portion 14 of the probe 10 may be applied in various shapes such as a crown shape, a cone shape, and a cylindrical shape, depending on the purpose of use, that is, the object to be contacted.

The probe 10 has a substantially cylindrical shape with steps, and each of the small diameter portion 11 and the large diameter portion 12 has a cylindrical shape. The large-diameter portion 12 of the probe 10 is integrally connected to the small-diameter portion 11 , has a larger outer diameter than the small-diameter portion 11 , and is positioned inside the outer cylinder 40 . When viewed from the small-diameter portion 11 , a contact portion 14 is formed extending from the small-diameter portion 11 on the opposite side of the direction in which the large-diameter portion 12 extends.

The probe 10 forms a stepped portion A1 between the small diameter portion 11 and the large diameter portion 12, the outer diameter of the spring 30 is larger than the inner diameter of the small diameter portion 11 and smaller than the inner diameter of the large diameter portion 12, and the spring 30 is large. It passes through the diameter portion 12 and is supported by the lower end of the small diameter portion 11 . The large diameter portion 12 of the probe 10 is used for the guide function of the probe 10 and at the same time has a structure that allows the passage of the spring 30, resulting in a longer spring 30 length and a longer spring stroke. to enable. This allows longer strokes compared to the length of the pogo pins.

The sleeve 20 is one of the most important features of the present invention. and a plurality of brushes 22 extending from the cylindrical coupling portion 21 and slidable while elastically contacting the inner peripheral surface of the outer cylinder 40 .

A narrowed portion 23 is formed above the cylindrical coupling portion 21, and the narrowed portion 23 is bent at approximately 90° with respect to the lengthwise direction of the sleeve so as to wrap the stepped portion A1 of the probe 10 and pogo pin. prevents the large diameter portion 12 of the probe 10 from being detached to the outside of the sleeve 20 when the .

字状にパンチングされ、スリーブ２０の長さ方向においてブラシ２２が構成される側からパンチングされない辺を有する。したがって、引っ掛かり部２１ａの自由端はスリーブ２０の上方に向けて内側に折り曲げられるが、プローブ１０とスリーブ２０の組み立て時、引っ掛かり部２１ａは、プローブ１０の大径部１２がスリーブ２０の円筒状結合部２１内に進入するのを容易にしながらも、組み立て後、ポゴピンの使用段階で引っ掛かり部２１ａは、ポゴピンの圧縮時にプローブ１０の大径部１２の一端（下端）が、スリーブ２０の外側に離脱されるのを防止する。 At the lower end of the cylindrical coupling portion 21 of the sleeve 20, there is a catch portion 21a that is partly punched and bent inward.

The sleeve 20 is punched in a letter shape and has a side that is not punched from the side where the brush 22 is formed in the longitudinal direction of the sleeve 20 . Therefore, the free end of the hook portion 21 a is bent inward toward the upper side of the sleeve 20 . While facilitating entry into the portion 21, the hook portion 21a prevents one end (lower end) of the large-diameter portion 12 of the probe 10 from detaching to the outside of the sleeve 20 when the pogo pin is compressed during use of the pogo pin after assembly. prevent it from being done.

After assembly, the probe 10 and the sleeve 20 are integrated, and can perform reciprocating motion in the vertical direction together while being supported by the spring 30 .

The brushes 22 extend from the cylindrical connecting portion 21, and a plurality of brushes, for example 10 brushes, are erected at equal intervals on the circumference of the lower end of the cylindrical connecting portion 21. As shown in FIG. There is a space between adjacent brushes, the fixed ends of the brushes are connected to the cylindrical connecting portion 21, and the free ends of the brushes or portions including the vicinity of the free ends are in elastic contact with the inner peripheral surface of the outer cylinder 40. ing.

The probe 10, the sleeve 20, and the like are all formed by processing a flat plate material. The contact surface of the brush 22, which is in elastic contact with the inner peripheral surface of the outer cylinder 40, originates from one side plane of the flat plate material, which is not the cut surface of the flat plate material. This makes it easier to reduce the thickness of the kentile when the brush acts as a kentile.

The sleeve 20 is formed by processing a flat plate material thinner than the probe 10 , and the thickness of the sleeve 20 is selected to be thinner than the thickness of the probe 10 . Due to the thickness of the sleeve, which is thinner than the probe, the folded portion of the sleeve constriction 23 may have a smaller radius of curvature. As a result, the stepped portion A2 formed between the cylindrical portion 43 and the inlet portion 44 of the outer cylinder 40 allows the probe and the sleeve to be securely integrated, thereby making it easier to detach to the outside. prevent with certainty.

And the thinner sleeve 20 increases the range of elastic deformation of the brush 22, thereby allowing the use of brushes with shorter lengths, thereby increasing the length of the pogo pins without or significantly. Instead, the use of brushes can improve the electrical properties of the pogo pins.

Prior to inserting the sleeve 20 into the barrel 40, the brushes 22 of the sleeve 20 must be folded outward. In doing so, the brushes 22 are capable of the required elastic contact with the barrel 40 after assembly. However, if the elastic deformation range is below the required level, there is a problem that plastic deformation and failure of the sleeve 20 may occur after assembly.

For example, if the thickness of the sleeve 20 is reduced by a factor of 2, the range of elastic deformation of the brush increases by a factor of eight. Assuming that the same range of elastic deformation is achieved without reducing the thickness of the sleeve 20, the length of the brush must be greatly increased, and the extra space to ensure the free reciprocating movement of the probe up and down must be considered. Then, there is a problem that the length of the pogo pin is too long. According to a first embodiment of the present invention, by employing a sleeve assembled with the probe separately from the probe, it facilitates the use of a sleeve thinner than the probe and without increasing the length of the pogo pin, or The use of the brush has the effect of improving the electrical characteristics of the pogo pins without significantly increasing them.

4 to 6 show the structure of a pogo pin for ultra-high current according to a second embodiment of the present invention. FIG. 4 is a perspective view showing the appearance, FIG. 5 is an exploded perspective view, and FIG. It is a sectional view.

For the sake of convenience, FIGS. 4 to 6 describe the configuration in which probes are provided at both ends of the pogo pin, but it is obvious that the configuration in which the probes are provided at only one end of the pogo pin while having the same features is also included in the scope of the present invention. . In the description of the second embodiment, portions similar in structure to those of the first embodiment may be omitted, and the configuration of the first embodiment may be borrowed.

The pogo pin according to the second embodiment of the present invention includes two probes 50, a spring 60 and an outer cylinder 70 positioned at both ends, respectively. manufactured.

The outer cylinder 70 incorporates a coil-type spring 60 that elastically supports the probe 10, guides the probe 10 to slide, and guides the spring 60 when the spring 60 is compressed and expanded. After assembly, the barrel 70 guides the probe and spring during compression and expansion of the pogo pins while preventing the probe 50 from detaching from the barrel 70 beyond a defined range despite the elastic force of the spring 60. .

The outer cylinder 70 includes a first cylindrical portion 71 that guides the large-diameter portion 52 of the probe 50 with the circular protrusion B as a boundary and provides an inner peripheral surface on which the brush 53 of the probe 50 slides; a second cylindrical portion 72 coupled with 71 and formed at one end or both ends of the outer cylinder 70 (the illustrated embodiment).

The outer cylinder 70 is also formed by processing a flat plate material, and the outer cylinder 70 has circular protrusions B which are pushed inward from the circumference of one side or both sides of the outer cylinder 70 to form circular protrusions. However, the probe 50 is prevented from being detached from the outer cylinder 70 by engaging the first stepped portion A1 between the large diameter portion 52 and the small diameter portion 51 of the probe 50 .

However, it is unique that the inner diameters of the first cylindrical portion 71 and the second cylindrical portion 72 are the same in the second embodiment of the present invention. As a result, the distance between the small diameter portion 51 and the second cylindrical portion 72 of the probe 50 is considerably larger than the distance between the large diameter portion 52 and the first cylindrical portion 71 of the probe 50, which at first glance seems strange. Although visible, the above features have the advantage of making the pogo pin assembly process easier.

In the conventional pogo pin manufacturing process, after the probe is positioned in the outer cylinder while resisting the elastic force of the spring, the tip of the outer cylinder is tightened to prevent the probe from being detached from the outer cylinder. (calcing) is required. Caulking is done only in the assembly process, separate from the manufacturing of each part, and it is performed while controlling the elastic force of the spring. Because it requires precision work, the process is difficult and the process cost is high. very big.

However, according to the present invention, since the inner diameter of the second outer cylinder portion 72 is the same as the inner diameter of the first cylindrical portion 71, when the probe and the outer cylinder are assembled, the large-diameter portion 52 of the probe 50 is positioned at the entrance of the outer cylinder. It is easy to enter the second outer cylinder part 72 (the brush enters the second outer cylinder part in a state of being narrowed or not narrowed), and the circular protrusion B is made of a flat plate material. It is easy to enter the inside of the outer cylinder because the user can get over the outer cylinder while lightly spreading the outer cylinder. Therefore, caulking, which is required in the manufacturing process of conventional pogo pins, is not required, thereby reducing the defect rate and significantly reducing the manufacturing cost.

At one point of the outer cylinder, a stop projection D is formed, which is partly punched and extends from the outer cylinder, the free end of which protrudes outward and is curved. To prevent a pogo pin from being detached from a socket body during manufacturing after being seated in a hole of the socket body when mounting a. A conventional socket body (housing) requires two housings, an upper housing and a lower housing. After housing the pogo pins on one side, the two housings must be joined together. Advantageously, the housing can accommodate the pogo pins.

The probe 50 includes a small diameter portion 51 having an outer diameter smaller than that of the large diameter portion 52, a large diameter portion 52 integrally connected to the small diameter portion 51 and having an outer diameter larger than that of the small diameter portion 51, and an electric contact with the outside. and a plurality of brushes 53 extending from the large-diameter portion 52 and slidable while making elastic contact with the inner peripheral surface of the outer cylinder 40 . Larger diameter portion 52 plays a major role in guiding the probe by the barrel in an upright position.

The probe 50 is also formed by processing a flat plate material, and the probe 50 has a first step between a small-diameter portion 51 extending into and out of the outer cylinder and a large-diameter portion 52 reciprocating up and down inside the outer cylinder. Form part A1. As described above, the first stepped portion A1 is hooked on the circular protrusion B of the outer cylinder to prevent the probe 50 from being detached. The contact portion 54 extends from the small diameter portion 51 after forming the second stepped portion A2. As shown in FIG. One end is supported by the second stepped portion A2. The shape of the contact portion 54 of the probe 50 may be applied to various shapes such as a crown shape, a cone shape, and a cylindrical shape, depending on the purpose of use, that is, the object to be contacted.

The insertion of the spring is allowed through the small-diameter portion 51, the large-diameter portion 52, and the inner space of the brush 53, which are processed and formed from a flat plate material. Able to provide strokes.

The brush 53 may be extended after having a step (third step A3) as shown on the circumference of the large diameter portion 52, or may be extended without a step. A plurality of brushes 53 are erected along the circumference of the large-diameter portion 52. The brushes 53 are provided at the free ends of the kentilevers 53a, which extend in the longitudinal direction from the circumference of the large-diameter portion 52. and a sliding contact portion 53b that is integrally formed and that can slide in a state of elastic contact with the inner peripheral surface of the outer cylinder 40 .

The slide contact portion 53a is bent toward the inner peripheral surface of the outer cylinder 70 in a clamp shape or a semicircular shape, and has a bent portion that contacts the inner peripheral surface. It is angled toward the center so that it can be inserted into the outer cylinder more easily.

The contact surface (contact surface of the contact portion) of the brush 53 elastically contacting the inner peripheral surface of the outer cylinder 40 is derived from one side plane of the flat plate member, which is not the cut surface of the flat plate member. This makes it easy to reduce the thickness of the Kentilever.

According to the present invention, the probe 50 is characterized in that the thickness t2 of the brush 53 is made thinner than the thickness t1 of the small-diameter portion 51 and the large-diameter portion 52 by processing the flat metal material. The point of change in thickness may be chosen at the tip of the large diameter portion 52 or at the entrance of the brush 53, or exactly between the two, but in either case, it is within the range described above. Preferably, the thickness t1 is set to be thicker including the third stepped portion A3.

The small diameter portion 51, the large diameter portion 52, and the brush 53 are all integrally formed, and although they are not joined together after the production of the flat plate material, they have different thicknesses as described above. In addition, the portion corresponding to the brush can be processed to be thinner by a press process or the like in the probe manufacturing process.

Whereas in the first embodiment a sleeve separate from the probe is used to achieve a thinner thickness, in the second embodiment the brush is integrally constructed with the probe and has a thinner thickness.

A thinner brush increases the range of its elastic deformation, which allows the use of brushes having a shorter length, thereby reducing the length of the pogo pins without increasing or significantly increasing the length of the brush. By using , there is an effect of improving the electrical characteristics of the pogo pins, and the detailed description of this is referred to the related description of the first embodiment. For example, a 25% reduction in thickness increases the range of elastic deformation by a factor of approximately 2.37.

In the following, the method of manufacturing the pogo pin will be briefly considered, but the process of manufacturing the probe of the second embodiment will be examined, and other parts, such as the parts of the first embodiment and the outer cylinder of the second embodiment, will be made in this manner. It may be implemented by analogy easily through a simple explanation.

First, by punching a sheet-like flat metal plate material using a mold based on the developed view of the probe, a flat plate-like intermediate material that is taken in the shape of a predetermined developed view is produced.

Then, as described above, the portion forming the brush is crimped in the pressing process to further reduce its thickness, and punching is performed again using the same mold, so that the outer frame line is expanded in the pressing process described above. The shape of the intermediate material can be trimmed, and such a second pressing step may be omitted. Then, a sliding contact portion and a stepped portion (which may be formed in a subsequent rolling process) can be formed by a coining process. A probe having the shape shown in can be manufactured. Such steps (processes) may be accomplished by progressive stamping.

7 and 8 show modifications of the ultra-high current pogo pin according to the first embodiment of the present invention. FIG. 7 is a perspective view showing the appearance, FIG. 8 is an exploded perspective view, and FIG. It is a vertical sectional view.

Since the modified example of the present invention is similar to the pogo pin according to the first embodiment, a detailed description of the same or similar parts will be largely omitted. A modified pogo pin includes probe 10 ′, sleeve 20 ′, spring 30 and barrel 40 . The sleeve 20' and the outer cylinder 40, excluding the spring 30 and the probe 10', are manufactured by processing a flat plate material.

When the pogo pin is used in a socket, the probe 10' of the pogo pin, specifically the contact portion 14' of the probe 10', is for contacting terminals of a semiconductor device.

The probe 10' is formed by cutting a cylindrical material, and has a substantially cylindrical shape with steps. In the probe 10', each of the small diameter portion 11', the head portion 13' and the large diameter portion 12' also has a substantially cylindrical shape, and the large diameter portion 12' of the probe 10' is integrally connected to the small diameter portion 11', It has an outer diameter larger than that of the small diameter portion 11 ′ and is located inside the outer cylinder 40 . When viewed from the small-diameter portion 11', a head portion 13' is formed to extend from the small-diameter portion 11' on the side opposite to the direction in which the large-diameter portion 12' extends. The upper surface of the head portion 13' is provided with a contact portion 14' formed by cutting an array of pointed protrusions for contact with the outside. The pointed protrusions are two-dimensionally arranged, and the protrusions may be arranged by forming V-shaped grooves in a grid pattern by cutting.

Since the lower end of the large-diameter portion 12' of the probe 10' has a conical shape, the upper end of the spring 30 can be stably supported. By reducing the outer diameter of the spring 30 from the middle portion to the upper end, it is possible to reduce interference between the probe and the spring when assembling the probe and the spring, and to enable smoother assembly. .

The large diameter portion 12' of the probe 10' is provided with a first circular trench E1 cut circumferentially inwards, and the cylindrical coupling portion 21' of the sleeve 20' is circumferentially inwardly cut. A second circular trench E2 is provided which is folded into the . The second circular trench E2 is seated in the first circular trench E1, thereby fixing the probe 10' and the sleeve 20' to each other. That is, after assembly, the probe 10' and the sleeve 20' are integrated and can integrally perform reciprocating motion in the vertical direction while being supported by the spring 30. FIG.

Claims (22)

A pogo pin for ultra-high current with a built-in spring that elastically supports a probe and an outer cylinder that guides the slide of the probe,
The probe is
a small diameter portion;
a large-diameter portion integrally connected to the small-diameter portion, having an outer diameter larger than that of the small-diameter portion, and located inside the outer cylinder;
a cylindrical coupling portion that wraps around the large diameter portion of the probe and is coupled and fixed to the large diameter portion;
A pogo pin for ultra-high current, comprising a sleeve extending from the cylindrical coupling portion and having a plurality of brushes slidable while elastically contacting an inner peripheral surface of the outer cylinder. Both the probe and the sleeve are formed by processing a flat plate material,
2. The ultra-high current pogo pin according to claim 1, wherein the sleeve is formed by processing a flat plate material thinner than the probe. The sleeve is formed by processing a flat plate material,
2. The method according to claim 1, wherein the contact surface of the brush that is in elastic contact with the inner peripheral surface of the outer cylinder is derived from one side plane of the flat plate member, which is not a cut surface of the flat plate member. ultra-high current pogo pins. At the lower end of the cylindrical coupling portion of the sleeve, there is provided a catch part that is partially punched and bent inward. 4. The pogo pin for ultra-high current according to claim 2 or 3, wherein the pogo pin for ultra-high current is prevented from being detached. a constricted portion is formed above the cylindrical coupling portion of the sleeve,
5. The ultra-high current pogo pin according to claim 4, wherein the constricted portion prevents the other end of the large diameter portion of the probe from being pulled out of the sleeve when the pogo pin is expanded. A pogo pin for ultra-high current with a built-in spring that elastically supports a probe and an outer cylinder that guides the slide of the probe,
The probe is
a small diameter portion;
a large-diameter portion 52 integrally connected to the small-diameter portion and having an outer diameter larger than that of the small-diameter portion;
a plurality of brushes extending from the large-diameter portion and slidable while elastically contacting the inner peripheral surface of the outer cylinder;
A pogo pin for ultra-high current, wherein the probe is formed by processing a flat plate material. 7. The contact surface of the brush that is in elastic contact with the inner peripheral surface of the outer cylinder is derived from one side plane of the flat plate member, not the cut surface of the flat plate member. ultra-high current pogo pins. In the probe,
7. The ultra-high current pogo pin according to claim 6, wherein the flat plate material is processed so that the thickness of the brush is thinner than the thicknesses of the small diameter portion and the large diameter portion. The brush
A kentilever extending long in the longitudinal direction on the circumference of the large-diameter portion, and a sliding contact portion integrally formed with the free end of the kentilever and elastically contacting the inner peripheral surface of the outer cylinder. The ultra high current pogo pin according to claim 6. The ultra-high current pogo pin according to claim 9, wherein the slide contact portion has a bent portion that contacts the inner peripheral surface of the outer cylinder. The outer cylinder is also formed by processing a flat plate material,
The outer cylinder is provided with a circular projection that is pushed inward from the circumference of the outer cylinder to form a circular projection, and a first stepped portion between the large diameter portion and the small diameter portion is caught. 7. The ultra-high current pogo pin according to claim 6, wherein the probe is prevented from being detached outside the outer cylinder. The outer cylinder is bounded by the circular protrusion of the outer cylinder,
A first cylindrical portion that guides the large-diameter portion and provides an inner peripheral surface on which the brush slides; 2 cylindrical portions;
12. The ultra-high current pogo pin according to claim 11, wherein the inner diameters of the first cylindrical portion and the second cylindrical portion are the same. The probe is
a contact portion extending after forming a second stepped portion from the small diameter portion, wherein the inner diameter of the contact portion is smaller than the inner diameter of the small diameter portion, and one end of the spring is supported by the second stepped portion. The pogo pin for ultra-high current according to claim 6, characterized in that the pogo pin for ultra-high current is 7. The stop projection according to claim 6, wherein a portion of the stop projection is punched at one point of the outer cylinder and the free end of the stop projection extends from the outer cylinder and is curved outward. Pogo pin for ultra high current. The probe is formed by cutting a cylindrical material,
2. The ultra-high current pogo pin according to claim 1, wherein the sleeve is formed by processing a flat plate material. The probe further comprises a head portion extending from the small diameter portion on the opposite side of the large diameter portion, having an outer diameter larger than that of the small diameter portion, and located outside the outer cylinder,
16. The ultra-high current pogo pin as set forth in claim 15, wherein the top surface of the head portion is provided with a contact portion formed by cutting an array of sharp projections for contact with the outside. a first circular trench cut inward along the circumference of the large diameter portion of the probe;
a second circular trench folded inwardly along a circumference of the cylindrical coupling portion of the sleeve;
2. The pogo pin for ultra-high current as claimed in claim 1, wherein the second circular trench is seated in the first circular trench so that the probe and the sleeve are fixed to each other. A pogo pin for ultra-high current, which includes a spring for elastically supporting a probe and an outer cylinder for guiding the slide of the probe,
a cylindrical coupling portion that wraps around a portion of the probe and is coupled and fixed with the portion;
A pogo pin for ultra-high current, comprising a sleeve extending from the cylindrical coupling portion and having a plurality of brushes slidable while elastically contacting an inner peripheral surface of the outer cylinder. The portion of the probe is located inside the outer cylinder,
The ultra-high current pogo pin according to claim 1, wherein the portion is cylindrical. a first circular trench cut inward along the circumference of the portion of the probe;
a second circular trench folded inwardly along a circumference of the cylindrical coupling portion of the sleeve;
2. The pogo pin for ultra-high current as claimed in claim 1, wherein the second circular trench is seated in the first circular trench so that the probe and the sleeve are fixed to each other. The sleeve is formed by processing a flat plate material,
2. The method according to claim 1, wherein the contact surface of the brush that is in elastic contact with the inner peripheral surface of the outer cylinder is derived from one side plane of the flat plate member, which is not a cut surface of the flat plate member. ultra-high current pogo pins. a head portion located outside the outer cylinder on the opposite side of the portion of the probe,
2. The ultra-high current pogo pin according to claim 1, wherein the top surface of the head portion is provided with a contact portion formed by cutting an array of sharp projections for contact with the outside.

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