KR102622471B1 - Pogo Pin For Super High Current - Google Patents

Abstract

The pogo pin according to the present invention is a pogo pin for ultra-high current that includes a spring 30 for elastically supporting the probe and an outer cylinder 40 that guides the sliding of the probe, and wraps a portion of the probe to form the portion of the probe. It is characterized by comprising a cylindrical coupling part fixed by coupling with a sleeve extending from the cylindrical coupling part and having a plurality of brushes that can slide while elastically contacting the inner peripheral surface of the outer cylinder 40.

Description

Pogo Pin For Super High Current}

The present invention relates to a pogo pin that enables transmission of ultra-high currents.

In the conventional conventional pogo pin, when the tip of the probe supported by the spring is pressed, the probe falls slightly depending on its instability, and a part of the probe comes into contact with the external cylinder, and this contact causes the probe and the external cylinder to fall. It forms an electrical path between the two. For example, when probes (upper probe and lower probe) are configured at both upper and lower ends of a pogo pin, the electrical path consists of the upper probe - outer tube - lower probe, depending on the collapse of the probe, between the probe and the outer tube. Since contact is possible, in the conventional pogo pin, the dispersion of contact impedance is large and the contact impedance is inevitably relatively large, making transmission of ultra-high current difficult.

To solve this problem, modified pogo pins or connection pins of various structures are being studied, and while maintaining or improving physical characteristics such as stroke, spring force, integration (miniaturization), durability, and stability, The development of pogo pins with electrical properties is necessary.

Although the problems and problems of the prior art have been described above, awareness of these problems and problems is not obvious to those skilled in the art.

The purpose of the present invention is to provide a pogo pin that can have better electrical properties without sacrificing the physical properties of the pogo pin, or that can improve the physical properties without sacrificing the electrical properties.

Another object of the present invention is to provide a pogo pin that has a simpler manufacturing process and can reduce manufacturing costs.

The pogo pin according to one aspect of the present invention is a pogo pin that includes a spring 30 that elastically supports a probe and has an outer cylinder 40 that guides the sliding of the probe. The probe has a small diameter portion and a small diameter portion. A large diameter part extends from the neck and has an outer diameter larger than the small diameter part and is located inside the outer cylinder 40, and includes a cylindrical coupling part that surrounds the large diameter part of the probe and is coupled to and fixed to the large diameter part, and a cylindrical coupling part from the cylindrical coupling part. It is characterized by comprising a sleeve extending and having a plurality of brushes that can slide while elastically contacting the inner peripheral surface of the outer cylinder 40.

The pogo pin according to one aspect of the present invention is a pogo pin for ultra-high current that includes a spring 30 for elastically supporting the probe and an outer cylinder 40 that guides the sliding of the probe, and includes a portion of the probe ( A cylindrical coupling portion that surrounds the large diameter portion and is fixed by coupling with the portion, and a sleeve extending from the cylindrical coupling portion and having a plurality of brushes that are slidable while elastically contacting the inner peripheral surface of the outer cylinder 40. It is characterized by

In the pogo pin described above, both the probe 10 and the sleeve 20 are formed by processing a flat material, and the sleeve 20 is formed by processing a flat material thinner than the probe 10. It could be.

In the pogo pin described above, the sleeve is formed by processing a flat material, and the contact surface of the brush elastically contacting the inner peripheral surface of the outer cylinder 40 originates from one side of the flat material rather than the cut surface of the flat material. It may be.

In the pogo pin described above, the lower end of the cylindrical coupling portion of the sleeve is provided with a locking protrusion (21a) partially punched and bent inward, and the locking protrusion (21a) is used to support the probe (10) when the pogo pin is compressed. It is possible to prevent one end of the large diameter portion 12 from deviating to the outside of the sleeve 20.

In the pogo pin described above, the probe may be formed by cutting a cylindrical material, and the sleeve may be formed by processing a flat material.

In the pogo pin described above, the probe further includes a head portion that extends from the small diameter portion opposite the large diameter portion, has an outer diameter larger than the small diameter portion, and is located outside the outer cylinder 40, and the upper surface of the head portion has an outer diameter. A contact portion 14' in which an array of sharp protrusions is formed by cutting may be provided for contact with.

In the pogo pin described above, the large diameter portion of the probe is provided with a first circular trench (E1) cut inward along the circumference, and the cylindrical coupling portion of the sleeve is provided with a second circular trench (E1) bent inward along the circumference. E2), and the probe and the sleeve can be fixed to each other by seating the second circular trench (E2) in the first circular trench (E1).

In the pogo pin described above, a recessed portion 23 is formed above the cylindrical engaging portion 21 of the sleeve 20, and the retracted portion 23 is used to support the probe 10 when the pogo pin is extended. It is possible to prevent the other end of the large diameter portion 12 from deviating to the outside of the sleeve 20.

The pogo pin according to one aspect of the present invention is a pogo pin including a spring 60 that elastically supports the probe 50 and an outer cylinder 70 that guides the sliding of the probe 50. 50) is a small diameter portion 51; a large diameter portion (52) extending from the small diameter portion (51) and having an outer diameter larger than the small diameter portion (51); It is configured to include a plurality of brushes (53) extending from the large diameter portion (52) and sliding while elastically contacting the inner peripheral surface of the outer cylinder (40), wherein the probe (50) is formed by processing a flat material. do.

In the pogo pin described above, the contact surface of the brush 53 elastically contacting the inner peripheral surface of the outer cylinder 40 may originate from one side of the flat material rather than the cut surface of the flat material.

In the pogo pin described above, the flat material is processed so that in the probe 50, the thickness t2 of the brush 53 is thinner than the thickness t1 of the small diameter portion 51 and the large diameter portion 52. It is characterized by being

In the pogo pin described above, the brush 53 is integrally formed with a cantilever 53a extending longitudinally on the circumference of the large diameter portion 52 and a free end of the cantilever 53a. A sliding contact portion 53b that elastically contacts the inner peripheral surface of the outer cylinder 40 may be provided.

In the pogo pin described above, the sliding contact portion 53a may have a bent portion that contacts the inner peripheral surface of the outer cylinder 7.

In the pogo pin described above, the outer cylinder 70 is also formed by processing a flat material, and the outer cylinder 70 is provided with a circular protrusion B that is press-fitted inward on the circumference of the outer cylinder 70 to form a circular protrusion. It is provided so that the first step portion (A1) between the large diameter portion 52 and the small diameter portion 51 is caught, thereby preventing the probe 50 from being separated from the outer cylinder 70. You can.

In the pogo pin described above, the outer cylinder 70 guides the large diameter portion 52 with the circular protrusion B of the outer cylinder 70 as a boundary and provides an inner peripheral surface on which the brush 53 slides. It is provided with a first cylindrical part 71 and a second cylindrical part 72 coupled to the first cylindrical part 71 and formed on one or both ends of the outer cylinder 70, wherein the first cylindrical part ( 71) and the inner diameter of the second cylindrical portion 72 are the same.

In the pogo pin described above, the probe 50 further has a contact portion 54 extending from the small diameter portion 51 after forming a second step portion A2, and the inner diameter of the contact portion 54 is Because the inner diameter of the small diameter portion 51 is smaller, one end of the spring 60 can be supported by the second step portion A2.

According to one aspect of the present invention, it is possible to increase the elastic deformation range of the brush, enable the use of a brush with a shorter length, and improve the electrical characteristics of the pogo pin by using the brush without significantly increasing the length of the pogo pin. There is a possible effect.

According to one aspect of the present invention, caulking, which was required in the conventional pogo pin manufacturing process, is not required, thereby lowering the defect rate and significantly reducing manufacturing costs.

According to one aspect of the present invention, since the structure allows the passage of the spring into the interior of the probe, it has the effect of enabling a longer spring length and a longer spring stroke.

1 to 3 show a pogo pin for ultra-high current according to a first embodiment of the present invention, where FIG. 1 is a perspective view showing the exterior, FIG. 2 is an exploded perspective view, and FIG. 3 is a vertical cross-sectional view.
Figures 4 to 6 show the structure of a pogo pin for ultra-high current according to a second embodiment of the present invention, where Figure 4 is a perspective view showing the exterior, Figure 5 is an exploded perspective view, and Figure 6 is a cross-sectional view.
Figures 7 and 8 show a modified example of the pogo pin for ultra-high current according to the first embodiment of the present invention. Figure 7 is a perspective view showing the appearance, Figure 8 is an exploded perspective view, and Figure 9 is a vertical cross-sectional view. .
Figure 10 is a diagram showing the application of the separator 80 according to an embodiment of the present invention. Figure 10(a) shows the separator 80 coupled to the head of the probe, and Figure 10(b) shows the separator 80 coupled to the head of the probe. This diagram shows that the separator 80 is separated from the head portion of the probe.

With reference to the attached drawings, embodiments of the present invention will be described in detail so that those skilled in the art can easily implement the present invention. However, the present invention may be implemented in many different forms and is not limited to the embodiments described herein. In order to clearly explain the present invention in the drawings, parts not related to the description are omitted, and similar names and reference numerals are used for similar parts throughout the specification.

1 to 3 show a pogo pin for ultra-high current according to a first embodiment of the present invention, where FIG. 1 is a perspective view showing the exterior, FIG. 2 is an exploded perspective view, and FIG. 3 is a vertical cross-sectional view.

The pogo pin according to the first embodiment of the present invention includes a probe 10, a sleeve 20, a spring 30, and an outer cylinder 40. The probe 10, sleeve 20, and outer cylinder 40, excluding the spring 30, are manufactured by processing a flat material.

The outer cylinder 40 contains a coiled spring 30 that elastically supports the probe 10, guides the sliding of the probe 10, and guides the spring 30 when the spring 30 is compressed and extended. The first embodiment of the present invention illustrates having the probe 10 in one direction. Accordingly, the probe 10 is partially exposed to the outside in one direction (upward) of the outer cylinder and the exposed portion varies depending on the situation. . The other direction (downward) of the outer cylinder is blocked by a disk portion 41 on the bottom. In an outer cylinder manufactured by processing a flat material, a disk portion 41 is attached to the cylindrical portion 43 on one lower side of the cylindrical portion 43 of the outer cylinder. is physically connected, and on the other side where the disk portion 41 is connected, the hook 42 extending from the disk portion 41 is seated in a bent state in the hook groove (H) provided at the bottom of the cylindrical portion 43. By doing so, the disk portion 41 is fixed to the cylindrical portion 43.

For example, when a pogo pin is used in a socket, the probe 10 of the pogo pin, specifically the contact portion 14 of the probe 10, is for contacting the terminal of the semiconductor device, and the outer cylinder including the disk portion 41 The bottom of (40) is for contacting the pad of the PCB directly or by soldering. Additionally, if necessary, the outer wall of the outer cylinder 40 may come into contact with other contact parts.

The first embodiment of the present invention illustrates having the probe 10 in one direction, and in another embodiment, the probe 10 may be provided in both directions of the pogo pin, that is, on both sides of the longitudinal direction. At this time, depending on the purpose of use, that is, the other party of the contact, the shape of the contact portion 14 in the probe 10 may be applied in various shapes such as a crown shape, a cone shape, and a cylindrical shape.

The probe 10 has a substantially cylindrical shape with steps, and each of the small diameter portion 11 and the large diameter portion 12 has a cylindrical shape. The large diameter portion 12 of the probe 10 is integrally connected to the small diameter portion 11 and has an outer diameter larger than the small diameter portion 11 and is located inside the outer cylinder 40. When viewed from the small diameter portion 11, a contact portion 14 is formed extending from the small diameter portion 11 on the opposite side of the direction in which the large diameter portion 12 extends.

The probe 10 forms a step portion A1 between the small diameter portion 11 and the large diameter portion 12, and the outer diameter of the spring 30 is larger than the inner diameter of the small diameter portion 11 and the inner diameter of the large diameter portion 12. The spring 30 passes through the large diameter portion 12 and is supported by the lower end of the small diameter portion 11. The large diameter portion 12 of the probe 10 is used for the guide function of the probe 10 and has a structure that allows the spring 30 to pass through, resulting in a longer length of the spring 30 and a longer stroke of the spring. makes possible. Accordingly, a longer stroke is possible compared to the length of the pogo pin.

The sleeve 20 is one of the most important features of the present invention, and includes a cylindrical coupling portion 21 that surrounds the large diameter portion 12 of the probe 10, is coupled and fixed to the large diameter portion 12, and has a substantially cylindrical shape; It extends from this cylindrical coupling portion 21 and is provided with a plurality of brushes 22 that can slide while elastically contacting the inner peripheral surface of the outer cylinder 40.

A recessed portion 23 is formed above the cylindrical coupling portion 21, and the retracted portion 23 is bent approximately 90 degrees with respect to the longitudinal direction of the sleeve to surround the stepped portion A1 of the probe 10. It prevents the large diameter portion 12 of the probe 10 from being separated from the outside of the sleeve 20 when the pogo pin is extended.

The lower end of the cylindrical coupling portion 21 of the sleeve 20 is provided with a locking protrusion 21a that is partially punched and bent inward, and is punched in an approximately 'ㄷ' shape, in the longitudinal direction of the sleeve 20. The brush 22 has a non-punched side on the configured side. Therefore, the free end of the locking jaw (21a) points upward and is bent inward of the sleeve (20). When the probe (10) and the sleeve (20) are assembled, the locking jaw (21a) is positioned at the large diameter portion of the probe (10). While making it easy for (12) to enter the cylindrical engaging portion 21 of the sleeve 20, in the use stage of the pogo pin after assembly, the locking protrusion 21a is formed on the large diameter portion of the probe 10 when the pogo pin is compressed ( Prevents one end (lower end) of 12) from coming off the outside of the sleeve 20.

After assembly, the probe 10 and the sleeve 20 are integrated and can perform a reciprocating movement in the up and down directions while supported by the spring 30.

The brush 22 extends from the cylindrical engaging portion 21, and a plurality of brushes 22, for example, 10 brushes, are installed at equal intervals on the lower circumference of the cylindrical engaging portion 21. There is a space between neighboring brushes, the fixed end of the brush is coupled to the cylindrical engaging portion 21, and the free end of the brush or a portion including the vicinity of the free end is in elastic contact with the inner peripheral surface of the outer cylinder 40.

The probe 10 and the sleeve 20 are all formed by processing a flat material. The contact surface of the brush 22 that elastically contacts the inner peripheral surface of the outer cylinder 40 originates from one side of the flat material, not the cut surface of the flat material. Accordingly, when the brush acts as a cantilever, it is easy to reduce the thickness of the cantilever.

The sleeve 20 is formed by processing a flat material thinner than the probe 10, and the thickness of the sleeve 20 is selected to be thinner than the thickness of the probe 10. Due to the thickness of the sleeve being thinner than the probe, the bent portion of the recessed portion 23 of the sleeve may have a smaller radius of curvature, and accordingly, the curved portion formed between the cylindrical portion 43 and the inlet portion 44 of the outer cylinder 40 By allowing the integrated probe and sleeve to be more securely caught in the step portion (A2), escape to the outside is more reliably prevented.

In addition, the thinner sleeve 20 increases the elastic deformation range of the brush 22, thereby enabling the use of a brush with a shorter length, without increasing or significantly increasing the length of the pogo pin. However, the electrical characteristics of the pogo pin can be improved by using a brush.

Before inserting the sleeve 20 into the outer cylinder 40, the brush 22 of the sleeve 20 must be bent outward. Only then can the brush 22 make the required elastic contact with the outer cylinder 40 after assembly. However, if the elastic deformation range is below the required level, there is a problem that plastic deformation and defects of the sleeve 20 may occur after assembly.

For example, if the thickness of the sleeve 20 is reduced by 1/2, the elastic deformation range of the brush increases by 8 times. Assuming that the same elastic deformation range is to be achieved without thinning the thickness of the sleeve 20, the length of the brush must be significantly increased, and taking into account the clearance that ensures free up and down movement of the probe, the length of the pogo pin becomes too long. There is a problem of throwing it away. According to the first embodiment of the present invention, by employing a sleeve that is assembled with the probe separately from the probe, it is easy to use a sleeve that is thinner than the probe, and further, the pogo pin can be made by using a brush without increasing or significantly increasing the length of the pogo pin. It has the effect of improving the electrical characteristics of.

Figures 4 to 6 show the structure of a pogo pin for ultra-high current according to a second embodiment of the present invention, where Figure 4 is a perspective view showing the exterior, Figure 5 is an exploded perspective view, and Figure 6 is a cross-sectional view.

4 to 6 illustrate a form in which the probe is located at both ends of the pogo pin for convenience, but it is obvious that a form having the same characteristics but located only at one end of the pogo pin is also included in the scope of the present invention. In the description of the second embodiment, parts similar to the structure of the first embodiment may be omitted and the structure of the first embodiment may be borrowed.

The pogo pin according to the second embodiment of the present invention includes two probes 50, a spring 60, and an external cylinder 70 located at both ends, and, excluding the spring 60, it includes two probes ( 50) and the outer cylinder are manufactured by processing flat materials.

The outer cylinder 70 has a built-in coiled spring 60 that elastically supports the probe 10, guides the sliding of the probe 10, and guides the spring 60 when the spring 60 is compressed and extended. After assembly, the outer cylinder 70 prevents the probe 50 from deviating from the outer cylinder 70 beyond a predetermined range despite the elastic force of the spring 60 and guides the probe and spring during compression and extension of the pogo pin.

The outer cylinder 70 includes a first cylindrical portion 71 that guides the large diameter portion 52 of the probe 50 around the circular protrusion B and provides an inner peripheral surface along which the brush 53 of the probe 50 slides. , and includes a second cylindrical portion 72 coupled to the first cylindrical portion 71 and formed on one end or both ends of the outer cylinder 70 (illustrated embodiment).

The outer cylinder 70 is also formed by processing a flat material, and the outer cylinder 70 is provided with a circular protrusion (B) that is press-fitted inward from the circumference on one or both sides of the outer cylinder 70 to form a circular protrusion. By causing the first step portion A1 between the large diameter portion 52 and the small diameter portion 51 of (50) to engage, the probe 50 is prevented from being separated from the outer cylinder 70.

However, uniquely, in the second embodiment of the present invention, the inner diameters of the first cylindrical portion 71 and the second cylindrical portion 72 are the same. Accordingly, compared to the gap between the large diameter part 52 and the first cylindrical part 71 of the probe 50, the gap between the small diameter part 51 and the second cylindrical part 72 of the probe 50 is considerable, so at first glance, Although it may seem strange, the above-mentioned feature has the advantage of making the assembly process of the pogo pin easier.

In the conventional pogo pin manufacturing process, caulking is required to prevent the probe from falling out of the outer cylinder by placing the probe inside the outer cylinder while resisting the elastic force of the spring and then retracting the end of the outer cylinder. Caulking can only be performed during the assembly process, separately from the manufacturing of each part, and can be performed while controlling the elastic force of the spring. As it requires precise work, the process difficulty is high and the process cost is very high.

However, according to the present invention, since the inner diameter of the second outer cylinder 72 is the same as the inner diameter of the first cylindrical portion 71, when the probe and the outer cylinder are assembled, the large diameter portion 52 of the probe 50 is connected to the second outer cylinder at the beginning of the outer cylinder. It is easy to enter (72) (the brush enters the second outer cylinder with or without retraction), and when it meets the circular protrusion (B), it can be crossed by slightly opening the outer cylinder made of flat material, so that the inside of the outer cylinder is Since it is easy to enter, caulking, which was required in the conventional pogo pin manufacturing process, is not necessary, which has the effect of lowering the defect rate and significantly reducing manufacturing costs.

At one point of the external cylinder, a stop protrusion (D) is formed, which is partially punched and extended from the external cylinder, and the free end is protruding and curved outward. The stop protrusion (D) can be used to mount a pogo pin on the socket body (housing), etc. After being seated in the hole of the socket body, the pogo pin is prevented from being separated from the socket body during the manufacturing process. Conventional socket bodies (housings) require two housings, an upper housing and a lower housing, and it is necessary to accommodate the pogo pins on one side and then combine the two housings. However, by using the stop protrusion (D), the pogo pins can be accommodated in a single housing. There is an advantage to being able to do this.

The probe 50 includes a small diameter portion 51 whose outer diameter is smaller than the large diameter portion 52, a large diameter portion 52 integrally connected to the small diameter portion 51 and having an outer diameter larger than the small diameter portion 51, and an external and It is configured to include a contact portion 53 for electrical contact, and a plurality of brushes 53 that extend from the large diameter portion 52 and can slide while elastically contacting the inner peripheral surface of the outer cylinder 40. The large diameter portion 52 plays a major role in guiding the probe by the external tube in an upright state.

The probe 50 is also formed by processing a flat material, and the probe 50 has a first step portion (A1) between a small diameter portion 51 that enters and exits from the outside of the outer cylinder and a large diameter portion 52 that reciprocates up and down inside the outer cylinder. forms. As described above, the first step A1 is caught on the circular protrusion B of the outer cylinder to prevent the probe 50 from being separated. In addition, it has a contact portion 54 extending from the small diameter portion 51 after forming the second step portion A2. As shown in FIG. 6, the inner diameter of the contact portion 54 is smaller than the inner diameter of the small diameter portion 51. , one end of the spring 60 is supported by the second step portion A2. And, depending on the purpose of use, that is, the other party of the contact, the shape of the contact portion 54 in the probe 50 may be applied in various shapes such as a crown shape, a cone shape, and a cylindrical shape.

It allows the insertion of the spring through the inner space of the small diameter part 51, the large diameter part 52, and the brush 53 formed by processing from a flat material, thereby making it possible to easily construct a spring of sufficient length and providing sufficient stroke. can do.

The brush 53 may be extended with a step (third step A3) as shown on the circumference of the large diameter portion 52 or may be extended without a step. A plurality of brushes 53 are installed along the circumference of the large-diameter portion 52, and are integrated with a cantilever 53a extending longitudinally on the circumference of the large-diameter portion 52 and a free end of the cantilever 53a. and is provided with a sliding contact portion 53b capable of sliding while elastically contacting the inner peripheral surface of the outer cylinder 40.

The sliding contact portion (53a) is bent toward the inner peripheral surface of the outer cylinder (7) in a square shape or a semicircular shape and has a bent portion that contacts the inner peripheral surface. The end of the sliding contact portion (53a) can be more easily inserted into the outer cylinder during assembly. It is angled towards the center so that it can be used.

In addition, the contact surface (contact surface of the contact portion) of the brush 53 that elastically contacts the inner peripheral surface of the outer cylinder 40 originates from one side of the flat material, not the cutting surface of the flat material. Accordingly, it is easy to reduce the thickness of the cantilever.

According to the present invention, the probe 50 is characterized in that a flat metal material is processed so that the thickness t2 of the brush 53 is thinner than the thickness t1 of the small diameter portion 51 and the large diameter portion 52. The point at which the thickness varies may be selected at the end of the large diameter portion 52, at the beginning of the brush 53, or exactly between the two, but in either case, it is assumed to be within the above range. Preferably, it is preferred to have a thicker thickness (t1) including the third step portion (A3).

The small diameter portion 51, the large diameter portion 52, and the brush 53 are all integrated and are not combined after manufacturing the flat material, but their thicknesses are varied as described above. For this purpose, they are pressed during the manufacturing process of the probe. The part where the brush will be formed can be processed to become thinner through processes, etc.

In the first embodiment, a sleeve separate from the probe was used to achieve a thinner thickness, but in the second embodiment, the brush was integrated with the probe to have a thinner thickness.

A thinner brush increases the elastic deformation range and thus allows the use of a brush with a shorter length. Accordingly, the use of a brush improves the electrical characteristics of the pogo pin without increasing or significantly increasing the length of the pogo pin. There is an effect of improving, and the related description of the first embodiment is used for specific explanation. For example, if the thickness is reduced by 25%, the elastic deformation range increases by approximately 2.37 times.

Hereinafter, we will briefly look at the manufacturing method of the pogo pin and the process of manufacturing the probe of the second embodiment, and other parts, such as the parts of the first embodiment and the external cylinder of the second embodiment, can be easily inferred through this description. It could be implemented.

First, a sheet-shaped metal flat material is punched using a mold based on the development diagram of the probe to create a flat intermediate material cut out according to the predetermined development diagram.

In addition, as described above, the part where the brush will be formed is compressed through the press process to make the thickness thinner, and the shape of the intermediate material whose outline is expanded through the press process can be refined by punching again using the same mold. The second press process may be omitted. In addition, the sliding contact part and the step part bent by the coining process (which can also be formed by a subsequent rolling process) can be formed, and then rolled into a cylindrical shape by the rolling process, as shown in FIGS. 5 and 6. Probes of any shape can be manufactured. These processes can be performed by progress stamping.

Figures 7 and 8 show a modified example of the pogo pin for ultra-high current according to the first embodiment of the present invention. Figure 7 is a perspective view showing the appearance, Figure 8 is an exploded perspective view, and Figure 9 is a vertical cross-sectional view. .

Since the modified example of the present invention is similar to the pogo pin according to the first embodiment, detailed description of the same or similar parts is largely omitted. The pogo pin according to the modified example includes a probe (10'), a sleeve (20'), a spring (30), and an outer cylinder (40). The sleeve 20' and the outer cylinder 40, excluding the spring 30 and the probe 10', are manufactured by processing a flat material.

When a pogo pin is used in a socket, the probe 10' of the pogo pin, specifically the contact portion 14' of the probe 10', is intended to contact the terminal of the semiconductor device.

The probe 10' is formed by cutting a cylindrical material and has a substantially cylindrical shape with steps. Each of the small diameter portion 11', head portion 13', and large diameter portion 12' of the probe 10' also has a substantially cylindrical shape, and the large diameter portion 12' of the probe 10' is small. It is integrally connected to the neck portion 11' and has an outer diameter larger than the small diameter portion 11' and is located inside the outer cylinder 40. When viewed from the small diameter portion 11', a head portion 13' is formed extending from the small diameter portion 11' on the opposite side of the direction in which the large diameter portion 12' extends. The upper surface of the head portion 13' is provided with a contact portion 14' formed by cutting an array of sharp protrusions for contact with the outside. The sharp protrusions are arranged in two dimensions, and the arrangement of the protrusions can be formed by forming V-shaped grooves in a lattice shape through cutting.

The lower end of the large diameter portion 12' of the probe 10' has a conical shape, so that the upper end of the spring 30 can be stably supported. By making the outer diameter of the spring 30 smaller from the middle to the top, interference between the probe and the spring can be reduced when assembling the probe and the spring, and more smooth assembly can be possible.

The large diameter portion 12' of the probe 10' has a first circular trench E1 cut inward along the circumference, and the cylindrical coupling portion 21' of the sleeve 20' has a first circular trench E1 cut inward along the circumference. It is provided with a bent second circular trench (E2). By seating the second circular trench E2 in the first circular trench E1, the probe 10' and the sleeve 20' are fixed to each other. That is, after assembly, the probe 10' and the sleeve 20' are integrated and can make a reciprocating movement in the up and down directions while being supported by the spring 30.

Figure 10 is a diagram showing the application of the separator 80 according to an embodiment of the present invention. Figure 10(a) shows the separator 80 coupled to the head of the probe, and Figure 10(b) shows the separator 80 coupled to the head of the probe. This diagram shows that the separator 80 is separated from the head portion of the probe.

The separator 80 is fitted and coupled to the upper part of the probe, and specifically, is fitted and coupled to the side of the head portion 13'. Protrusions 13a, which are circular and serrated in cross-section, are formed along the circumference of the cylindrical head. At the teeth of each protrusion 13a, the gentle slope faces outward and the steep slope faces inward.

The separator 80 first contacts the outside by exposing the contact portion 14' for contact with the outside upward from the head portion, and is composed of a cylinder with electrical insulation properties. Due to the configuration of the separator 80, insulation between neighboring probes is ensured while electrical contact with the outside is not interrupted.

10, 10': Probe 20, 20': Sleeve
30: Spring 40: External cylinder
50: probe 60: spring
70: External cylinder 80: Separator

Claims (6)

In the pogo pin for ultra-high current, which has a spring (30) for elastically supporting the probe and an outer cylinder (40) that guides the sliding of the probe,
A cylindrical coupling part that surrounds a part of the probe and is fixed by coupling with the part, and a sleeve extending from the cylindrical coupling part and having a plurality of brushes that can slide while elastically contacting the inner peripheral surface of the outer cylinder 40. It is characterized by being
The sleeve is formed by processing a flat material,
The contact surface of the brush that elastically contacts the inner peripheral surface of the outer cylinder 40 originates from one side of the flat material, not the cut surface of the flat material,
Pogo pin for ultra-high current. In claim 1,
The portion of the probe is located inside the outer cylinder 40,
The portion is cylindrical,
Pogo pin for ultra-high current. In claim 1,
The portion of the probe is provided with a first circular trench (E1) cut inward along the circumference,
The cylindrical coupling portion of the sleeve is provided with a second circular trench (E2) bent inward along the circumference,
The probe and the sleeve are fixed to each other by seating the second circular trench (E2) in the first circular trench (E1),
Pogo pin for ultra-high current. delete In claim 1,
The probe includes a head portion located on the outside of the outer cylinder 40 on the opposite side of the portion,
The upper surface of the head portion is provided with a contact portion 14' formed by cutting an array of sharp protrusions for contact with the outside.
Pogo pin for ultra-high current. In claim 1,
The probe includes a cylindrical head located on the outside of the outer cylinder 40 on the opposite side of the portion,
Characterized in that it is fitted and coupled to the side of the head portion, but exposes a contact portion for contact with the outside from the head portion upward, and further comprises a separator (80) composed of an electrically insulating cylinder,
Pogo pin for ultra-high current.