CN113973507A - Spring needle for super-large current - Google Patents
Spring needle for super-large current Download PDFInfo
- Publication number
- CN113973507A CN113973507A CN202180001183.7A CN202180001183A CN113973507A CN 113973507 A CN113973507 A CN 113973507A CN 202180001183 A CN202180001183 A CN 202180001183A CN 113973507 A CN113973507 A CN 113973507A
- Authority
- CN
- China
- Prior art keywords
- probe
- outer cylinder
- pogo pin
- diameter portion
- sleeve
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000000523 sample Substances 0.000 claims abstract description 127
- 239000000463 material Substances 0.000 claims abstract description 44
- 230000008878 coupling Effects 0.000 claims description 11
- 238000010168 coupling process Methods 0.000 claims description 11
- 238000005859 coupling reaction Methods 0.000 claims description 11
- 230000002093 peripheral effect Effects 0.000 claims description 10
- 238000005520 cutting process Methods 0.000 claims description 7
- 238000000034 method Methods 0.000 description 13
- 230000008569 process Effects 0.000 description 13
- 238000004519 manufacturing process Methods 0.000 description 12
- 230000000694 effects Effects 0.000 description 6
- 230000005489 elastic deformation Effects 0.000 description 6
- 230000004048 modification Effects 0.000 description 3
- 238000012986 modification Methods 0.000 description 3
- 230000006835 compression Effects 0.000 description 2
- 238000007906 compression Methods 0.000 description 2
- 230000002950 deficient Effects 0.000 description 2
- 239000013067 intermediate product Substances 0.000 description 2
- 229910052751 metal Inorganic materials 0.000 description 2
- 239000002184 metal Substances 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- 229910052685 Curium Inorganic materials 0.000 description 1
- 230000008901 benefit Effects 0.000 description 1
- 230000000903 blocking effect Effects 0.000 description 1
- NIWWFAAXEMMFMS-UHFFFAOYSA-N curium atom Chemical compound [Cm] NIWWFAAXEMMFMS-UHFFFAOYSA-N 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000004049 embossing Methods 0.000 description 1
- 238000003780 insertion Methods 0.000 description 1
- 230000037431 insertion Effects 0.000 description 1
- 230000010354 integration Effects 0.000 description 1
- 238000003754 machining Methods 0.000 description 1
- 238000003825 pressing Methods 0.000 description 1
- 230000000750 progressive effect Effects 0.000 description 1
- 238000004080 punching Methods 0.000 description 1
- 238000005476 soldering Methods 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
- H01R13/02—Contact members
- H01R13/22—Contacts for co-operating by abutting
- H01R13/24—Contacts for co-operating by abutting resilient; resiliently-mounted
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
- G01R1/06716—Elastic
- G01R1/06722—Spring-loaded
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
- G01R1/06733—Geometry aspects
- G01R1/06738—Geometry aspects related to tip portion
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
- G01R1/06733—Geometry aspects
- G01R1/0675—Needle-like
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
- H01R13/40—Securing contact members in or to a base or case; Insulating of contact members
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Geometry (AREA)
- Measuring Leads Or Probes (AREA)
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
Abstract
According to the invention, the spring needle for super large current is provided with a spring (60) for supporting a probe (50) in an elastic manner and guiding an outer cylinder (70) for sliding the probe (50), wherein the probe (50) comprises: a small diameter part (51); a large diameter part (52) integrally connected to the small diameter part (51), the outer diameter of the large diameter part being larger than that of the small diameter part (51); and a plurality of brushes (53) extending from the large diameter portion (52), being in elastic contact with the inner circumferential surface of the outer cylinder (70) and being slidable, wherein the probe (50) is formed by processing a flat plate material.
Description
Technical Field
The invention relates to a spring needle capable of transmitting super-large current.
Background
A conventional Pogo Pin (Pogo Pin)) is configured such that when a tip of a probe supported by a spring is pressed, the probe is slightly tilted due to its instability, so that a part of the probe is in contact with an outer cylinder, and an electrical path is formed between the probe and the outer cylinder due to the contact as described above. For example, when probes (an upper probe and a lower probe) are formed at the upper and lower ends of a pogo pin, an electrical path is formed by the upper probe, an outer cylinder, and the lower probe, and the probe and the outer cylinder can be brought into contact with each other by tilting the probe.
In order to solve the above problems, various modified pogo pins and joint pins have been developed, and it is necessary to develop a pogo pin having electrical characteristics such as a super large current and a super low impedance while maintaining or improving physical characteristics such as stroke, spring force, integration (miniaturization), durability, and stability.
The problems and problems of the prior art have been described above, and it is not obvious for a person skilled in the art of the present invention to understand the problems and problems.
Disclosure of Invention
Technical problem to be solved by the invention
The invention aims to provide a pogo pin which has more excellent electrical characteristics without losing the physical characteristics of the pogo pin, or which can improve the physical characteristics without losing the electrical characteristics.
It is another object of the present invention to provide a pogo pin which is simpler and more cost effective to manufacture.
Technical scheme for solving problems
According to an embodiment of the present invention, as a pogo pin for an ultra-high current formed with a spring 30 for elastically supporting a probe therein and an outer cylinder 40 for guiding a sliding of the probe, the probe includes: a small diameter portion and a large diameter portion integrally connected thereto, having a larger outer diameter than the small diameter portion, and located inside the outer cylinder 40, and including a sleeve 20,10' including: a cylindrical coupling portion which wraps the large diameter portion of the probe and is fixedly coupled to the large diameter portion, and a plurality of brushes which extend from the cylindrical coupling portion, elastically contact with the inner circumferential surface of the outer cylinder 40, and are slidable.
In the pogo pin, the probe pin and the sleeve are both made by processing a flat plate material, and the sleeve is formed by processing a flat plate material thinner than the probe pin.
In the pogo pin, the sleeve is formed by processing a flat plate material, and a contact surface of the brush which is elastically contacted with the inner circumferential surface of the outer cylinder 40 is a side plane of the flat plate material which is not a cut surface of the flat plate material.
In the pogo pin, a catching ridge 21a, a part of which is punched and bent inward, is formed at the lower end of the cylindrical coupling portion of the sleeve; the hooking ridge 21a prevents one end of the large diameter portion of the probe from being separated to the outside of the sleeve 20 when the pogo pin is compressed.
In the pogo pin, the probe is formed by cutting a cylindrical material, and the sleeve is formed by processing a flat material.
In the pogo pin, the probe pin is further formed with a head portion extending from the small diameter portion, having a larger outer diameter than the small diameter portion, outside the outer cylinder 40, on the opposite side of the large diameter portion, and a contact portion 14' formed on the upper surface of the head portion by cutting to form an array of pointed protrusions so as to contact the outside.
In the pogo pin, a1 st circular groove E1 cut inward along a circumference is formed at a large-diameter portion of the probe, a2 nd circular groove E2 bent inward along a circumference is formed at a cylindrical bonding portion of the sleeve, and the 2 nd circular groove E2 is seated in the 1 st circular groove E1, thereby fixing the probe and the sleeve to each other.
In the pogo pin, a tightening portion 23 is formed above the cylindrical coupling portion 21 of the hub 20; the constriction 23 prevents the other end of the large diameter portion 12 of the probe 10 from being separated to the outside of the sleeve 20 when the pogo pin is extended.
According to the pogo pin of an embodiment of the present invention, as a pogo pin for an over current formed with an outer cylinder 70 which embeds a spring 60 elastically supporting a probe 50 and guides a sliding of the probe 50, the probe 50 includes: a small diameter part 51; a large diameter portion 52 integrally connected to the small diameter portion 51 and having a larger outer diameter than the small diameter portion 51; and a plurality of brushes 53 extending from the large diameter portion 52, elastically contacting an inner circumferential surface of the outer cylinder 40, and slidably, and the probe 50 is formed by processing a flat plate material.
In the pogo pin, a contact surface of the brush 53 elastically contacting with the inner circumferential surface of the outer cylinder 40 is a side plane of the flat plate material derived from a section plane of the flat plate material other than the flat plate material.
In the pogo pin, the flat plate material is processed such that the thickness t2 of the brush 53 in the probe pin 50 is thinner than the thickness t1 of the small-diameter portion 51 and the large-diameter portion 52.
In the pogo pin, the brush 53 includes: a needle arm 53a extending long in the longitudinal direction on the circumference of the large diameter portion 52; and a sliding contact portion 53b formed integrally with a free end of the needle arm 53a and elastically contacting an inner circumferential surface of the outer cylinder 40.
In the pogo pin, the sliding contact portion 53b has a curved portion that contacts the inner peripheral surface of the outer cylinder 7.
In the pogo pin, the outer cylinder 70 is also formed by processing a flat plate material, and a circular protrusion B which is formed by pressing a circular protrusion inward on the circumference of the outer cylinder 70 is formed on the outer cylinder 70, so that the 1 st step a1 between the large diameter portion 52 and the small diameter portion 51 is hooked, and the probe 50 is prevented from being detached to the outside of the outer cylinder 70.
In the pogo pin, the outer cylinder 70 comprises, bounded by a circular boss B of the outer cylinder 70: a1 st cylindrical portion 71 that guides the large diameter portion 52 and provides an inner circumferential surface on which the brush 53 slides; and a2 nd cylindrical part 72 coupled to the 1 st cylindrical part 71 and formed at one or both end parts of the outer cylinder 70, wherein the 1 st cylindrical part 71 and the 2 nd cylindrical part 72 have the same inner diameter.
In the pogo pin, the probe pin 50 further includes a contact portion 54 extending after forming a2 nd step a2 from the small diameter portion 51, and an inner diameter of the contact portion 54 is smaller than that of the small diameter portion 51 so that one end of the spring 60 is supported by the 2 nd step a 2.
ADVANTAGEOUS EFFECTS OF INVENTION
According to an embodiment of the present invention, the following effects are provided: the brush can be used to increase the elastic deformation range of the brush and have a shorter length, and the characteristics of the pogo pin can be improved by using the brush without greatly increasing the length of the pogo pin.
According to an embodiment of the present invention, the following effects are provided: the need for a seam (closing) in the prior spring needle manufacturing process is eliminated, thereby reducing the fraction defective and greatly saving the manufacturing cost.
According to an embodiment of the present invention, the following effects are provided: since the structure allows the spring to pass through the probe, the length of the spring can be made longer and the stroke of the spring can be made longer.
Drawings
Fig. 1 to 3 are spring pins for a super large current according to embodiment 1 of the present invention, and fig. 1 is a perspective view showing an external appearance; FIG. 2 is an exploded perspective view; fig. 3 is a vertical sectional view.
Fig. 4 to 6 show the structure of a pogo pin for a very large current according to embodiment 2 of the present invention; fig. 4 is a perspective view showing an external appearance; FIG. 5 is an exploded perspective view; fig. 6 is a sectional view.
Fig. 7 to 8 are modification examples of the pogo pin for an excessive current according to embodiment 1 of the present invention; fig. 7 is a perspective view showing an external appearance; FIG. 8 is an exploded perspective view; fig. 9 is a vertical sectional view.
Detailed Description
Embodiments of the present invention will be described in detail below with reference to the accompanying drawings so that those skilled in the art of the present invention can easily implement the embodiments. However, the present invention may be implemented in various forms, and is not limited to the embodiments described herein. In order to clearly explain the present invention, portions that are not related to the description are omitted in the drawings, and like names and reference numerals are used for like portions throughout the specification.
Fig. 1 to 3 are spring pins for a super large current according to embodiment 1 of the present invention, and fig. 1 is a perspective view showing an external appearance; FIG. 2 is an exploded perspective view; fig. 3 is a vertical sectional view.
The pogo pin of embodiment 1 of the present invention includes: probe 10, sleeve 20, spring 30 and outer cylinder 40. The probe 10, the sleeve 20, and the outer cylinder 40 except for the spring 30 are manufactured by processing a flat plate material.
The outer cylinder 40 is used to house a coil-shaped spring 30 capable of elastically supporting the probe 10, guide sliding of the probe 10, and guide the spring 30 at the time of compression and extension of the spring 30. Embodiment 1 of the present invention exemplifies that a probe 10 is formed in one direction, so that a part of the probe 10 is exposed to the outside in one direction (upper direction) of an outer cylinder, and the exposed part varies depending on the situation. The other direction (lower direction) of the outer cylinder is closed by a disk portion 41 on the bottom surface, and in the outer cylinder manufactured by processing a flat plate material, the disk portion 41 is physically connected to the cylindrical portion 43 on the lower end side of the cylindrical portion 43 of the outer cylinder, and the hook 42 extending from the disk portion 41 is bent to be fitted in a hook groove H formed in the lower end of the cylindrical portion 43 on the opposite side to the connection of the disk portion 41, thereby fixing the disk portion 41 to the cylindrical portion 43.
For example, when the pogo pin is applied to a socket, the pogo pin 10, more specifically, the contact portion 14 of the pogo pin 10 is to be in contact with a terminal of a semiconductor element, and the lower end of the outer cylinder 40 including the disk portion 41 is to be in direct contact with a PCB board or in contact with a soldering manner. If necessary, the outer wall of the outer cylinder 40 may contact other contact portions.
The embodiment 1 of the present invention is exemplified by forming the probe 10 in one direction, and as another embodiment, the probe 10 may be formed in both directions of the pogo pin, that is, both sides in the longitudinal direction. In this case, the shape of the contact portion 14 of the probe 10 can be applied to various shapes such as a crown shape, a cone shape, and a cylinder shape according to the purpose of use, that is, according to the contact partner.
The probe 10 has a substantially cylindrical shape with a step, and the small diameter portion 11 and the large diameter portion 12 are each formed in a cylindrical shape. The large diameter portion 12 of the probe 10 is integrally connected to the small diameter portion 11, has a larger outer diameter than the small diameter portion 11, and is located inside the outer cylinder 40. The small diameter portion 11 has a contact portion 14 extending from the small diameter portion 11 on the opposite side of the direction in which the large diameter portion 12 extends.
The probe 10 has a stepped portion (a1) formed between the small diameter portion 11 and the large diameter portion 12, and the outer diameter of the spring 30 is larger than the inner diameter of the small diameter portion 11 and smaller than the inner diameter of the large diameter portion 12, so that the spring 30 is supported by the lower end of the small diameter portion 11 via the large diameter portion 12. The large diameter portion 12 of the probe 10 is a structure for a guide function of the probe 10 while allowing the spring 30 to pass therethrough, and therefore, a longer length of the spring 30 and a longer stroke of the spring can be formed. Thereby, a longer stroke is formed than the length of the pogo pin.
The sleeve 20 is one of the most important features of the present invention, and comprises: a cylindrical coupling portion 21 which wraps the large diameter portion 12 of the probe 10, is coupled and fixed to the large diameter portion 12, and has a substantially cylindrical shape; and a plurality of brushes 22 extending from the cylindrical coupling portion 21, elastically supported by the inner circumferential surface of the outer cylinder 40, and slidable.
A constricted portion 23 is formed above the cylindrical coupling portion 21, and the constricted portion 23 is bent at about 90 ° with respect to the longitudinal direction of the sleeve to wrap the step portion (a1) of the probe 10, and can prevent the large diameter portion 12 of the probe 10 from coming off to the outside of the sleeve 20 when the pogo pin is pulled.
A hooking ridge 21a, a part of which is punched and bent inward, is formed at the lower end of the cylindrical coupling portion 21 of the sleeve 20 substantially in the shape of a rectangle
The shape of the letter is punched, and an edge that is not punched is formed on the side of the sleeve 20 in the longitudinal direction where the brush 22 is formed. Therefore, the free end of the hanging edge 21a is bent upward and inward of the sleeve 20, and when the probe 10 and the sleeve 20 are assembled, the hanging edge 21a makes the large diameter portion 12 of the probe 10 easily enter into the cylindrical connection portion 21 of the sleeve 20, and at the same time, the pogo pin is used after the assemblyThe hooking ridge 21a prevents the one end (lower end) of the large diameter portion 12 of the probe 10 from being removed to the outside of the sleeve 20 when the pogo pin is compressed.
After assembly, the probe 10 and the sleeve 20 are integrated with each other, and can be integrally reciprocated in the vertical direction while being supported by the spring 30.
The brushes 22 extend from the cylindrical joint portion 21, and a plurality of, for example, 10 brushes are provided upright on the lower end circumference of the cylindrical joint portion 21 at equal intervals. A space is formed between adjacent brushes, the fixed ends of the brushes are coupled to the cylindrical coupling portion 21, and the free ends of the brushes or portions near the free ends are elastically contacted to the inner circumferential surface of the outer tube 40.
The probe 10 and the sleeve 20 are made of a flat material. The contact surface of the brush 22, which is in elastic contact with the inner peripheral surface of the outer cylinder 40, is a flat surface on one side of the flat plate material derived from a non-flat plate material cut surface. Thus, when the brush functions as a needle arm, the thickness of the needle arm is made thin.
The sleeve 20 is made by processing a flat plate material thinner than the probe 10, and the thickness of the sleeve 20 is formed thinner than that of the probe 10. Since the thickness of the sleeve is smaller than that of the probe, the curved portion of the constricted portion 23 of the sleeve has a smaller radius of curvature, and the integrated probe and sleeve can be more firmly engaged with the step portion (a2) formed between the cylindrical portion 43 and the inlet portion 44 of the outer cylinder 40, and can be completely prevented from being detached to the outside.
Further, the thin sleeve 20 can increase the elastic deformation range of the brush 22, and thus, a brush having a short length can be used, whereby the electrical characteristics of the pogo pin can be improved by using the brush without increasing the length of the pogo pin or greatly increasing the length.
Before the sleeve 20 is inserted into the outer tube 40, the brushes 22 of the sleeve 20 are bent outward so that the brushes 22 are brought into a desired elastic contact with the outer tube 40 after assembly. However, if the elastic deformation range below the required standard is formed, there is a problem that plastic deformation and defects of the sleeve 20 occur after assembly.
For example, when the thickness of the sleeve 20 is reduced to 1/2, the elastic range of the brush is increased by a factor of 8. If the same elastic deformation range is to be achieved without reducing the thickness of the sleeve 20, the length of the brush needs to be greatly increased, and the length of the pogo pin is excessively long in consideration of the remaining space in which the probe can freely reciprocate up and down. According to embodiment 1 of the present invention, the sleeve separately assembled with the probe is applied, thereby facilitating the use of a sleeve thinner than the probe, and having an effect of improving the electrical characteristics of the pogo pin using the brush without increasing or greatly increasing the length of the pogo pin.
Fig. 4 to 6 show the structure of a pogo pin for a very large current according to embodiment 2 of the present invention; fig. 4 is a perspective view showing an external appearance; FIG. 5 is an exploded perspective view; fig. 6 is a sectional view.
In fig. 4 to 6, the form in which the probe is formed at both ends of the pogo pin is described for convenience, but it is needless to say that the form having the same features and formed only at one end of the pogo pin is also within the scope of the present invention. In the description about the 2 nd embodiment, portions similar to those of the 1 st embodiment may be omitted, and the structures existing in the 1 st embodiment may also be used.
The pogo pin of embodiment 2 of the present invention includes: the two probes 50, the spring 60, and the outer cylinder 70 are respectively located at both ends, and the two probes 50 and the outer cylinder are manufactured by processing a flat plate material except for the spring 60.
The outer cylinder 70 houses a coil-shaped spring 60 for elastically supporting the probe 10, guides sliding of the probe 10, and guides the spring 60 at the time of compression and extension of the spring 60. After assembly, the outer cylinder 70 prevents the probe 50 from being separated from the outer cylinder 70 by a predetermined range or more by the elastic force of the spring 60, and guides the probe and the spring when the pogo pin is compressed and extended.
The outer cylinder 70 is defined by a circular projection (B) and includes: a1 st cylindrical portion 71 that guides the large diameter portion 52 of the probe 50 and provides an inner circumferential surface on which the brush 53 of the probe 50 slides; and a2 nd cylindrical portion 72 coupled to the 1 st cylindrical portion 71 and formed at one end portion or both end portions of the outer cylinder 70 (in the illustrated embodiment).
The outer cylinder 70 is also formed by processing a flat plate material, and the outer cylinder 70 is formed with a circular protrusion (B) formed by press-fitting a circular protrusion inward in the circumference on one side or both sides of the outer cylinder 70 for engaging a1 st step (a1) formed between the large diameter portion 52 and the small diameter portion 51 of the probe 50, thereby preventing the probe 50 from being detached to the outside of the outer cylinder 70.
However, in particular, embodiment 2 of the present invention is characterized in that the inner diameters of the 1 st cylinder portion 71 and the 2 nd cylinder portion 72 are formed to be the same. Therefore, the distance between the small diameter portion 51 and the 2 nd cylindrical portion 72 of the probe 50 is slightly larger than the distance between the large diameter portion 52 and the 1 st cylindrical portion 71 of the probe 50, and is slightly strange, but the above feature has an advantage of making the assembling process of the pogo pin easier.
In the manufacturing process of the spring needle, a caulking (closing) is needed to prevent the probe from separating to the outside of the outer cylinder by tightening the end of the outer cylinder after the probe is positioned in the outer cylinder by resisting the elastic force of the spring. The caulking is performed separately from the manufacture of each component only in the assembling process, and is performed in a state where the elastic force of the spring is suppressed, and a precise operation is required, so that the process difficulty is high, and the process cost is high.
However, according to the present invention, the inner diameter of the 2 nd outer tube part 72 is the same as the inner diameter of the 1 st tube part 71, so that the large diameter part 52 of the probe 50 is easily inserted into the 2 nd outer tube part 72 of the outer tube inlet (the brush is inserted into the 2 nd outer tube part in a tightened or non-tightened state) when the probe and the outer tube are assembled, and the outer tube made of a flat plate material is slightly opened to pass over when encountering the circular convex part (B), so that the probe is easily inserted into the inner part of the outer tube, thereby eliminating a caulking (blocking) required in the manufacturing process of the conventional pogo pin, reducing the defective rate, and greatly saving the manufacturing cost.
A latching protrusion (D) having a part punched and a free end bent to protrude outward in a state of extending from the outer cylinder is formed at one position of the outer cylinder, and the latching protrusion (D) can prevent the pogo pin from being detached from the socket body in a manufacturing process after the pogo pin is mounted in a hole of the socket body (housing) or the like. In the conventional socket main body (housing), two housings, i.e., an upper housing and a lower housing, are required, and the two housings are coupled to each other after housing the pogo pin on one side.
The probe 50 includes: a small diameter part 51 having an outer diameter smaller than that of the large diameter part 52; a large diameter portion 52 integrally connected to the small diameter portion 51 and having an outer diameter larger than that of the small diameter portion 51; a contact portion 53 for electrical contact with the outside; and a plurality of brushes 53 extending from the large diameter portion 52, elastically contacting the inner circumferential surface of the outer cylinder 40, and capable of sliding. The large diameter portion 52 mainly functions to allow the probe to be guided by the outer cylinder in an upright state.
The probe 50 is also formed by processing a flat plate material, and the probe 50 forms a1 st step (a1) between a small diameter portion 51 that enters and exits to the outside of the outer cylinder and a large diameter portion 52 that reciprocates up and down inside the outer cylinder. As described above, the 1 st step portion (a1) is caught by the circular boss portion (B) of the outer cylinder to prevent the probe 50 from coming off. Further, the contact portion 54 is formed to extend from the small diameter portion 51 after the 2 nd step portion (a2) is formed, and as shown in fig. 6, the inner diameter of the contact portion 54 is smaller than the inner diameter of the small diameter portion 51, and one end of the spring 60 is supported by the 2 nd step portion (a 2). The shape of the contact portion 54 of the probe 50 can be applied to various shapes such as a crown shape, a cone shape, and a cylinder shape according to the purpose of use, that is, according to the partner of contact.
The small diameter portion 51, the large diameter portion 52 and the space inside the brush 53 formed by machining a flat plate material allow insertion of a spring therethrough, so that a spring having a sufficient length can be easily formed to provide a sufficient stroke.
The brush 53 extends after forming a step (3 rd step (a3)) on the circumference of the large diameter portion 52 as shown in the figure or extends without a step. The brush 53 is provided in plurality standing along the circumference of the large diameter portion 52, and includes: a needle arm 53a extending long in the longitudinal direction on the circumference of the large diameter portion 52; and a sliding contact portion 53b formed integrally with the free end of the needle arm 53a and slidably in elastic contact with the inner peripheral surface of the outer cylinder 40.
The sliding contact portion 53a is formed with a curved portion that is curved toward the inner peripheral surface of the outer cylinder 70 in a curium shape, a semicircular shape, or the like to be in contact with the inner peripheral surface, and the tip end of the sliding contact portion 53a is formed at an angle that is slightly inclined toward the center side so as to be inserted into the outer cylinder more easily at the time of assembly.
The contact surface (contact surface of the contact portion) of the brush 53 that elastically contacts the inner peripheral surface of the outer cylinder 40 is a one-side flat surface of the flat plate material that is derived from a non-flat-plate-material cut surface. Thus, the thickness of the needle arm can be made small.
In the probe 50 according to the present invention, the thickness (t2) of the brush 53 is made by processing a flat metal plate material thinner than the thickness (t1) of the small-diameter portion 51 and the large-diameter portion 52. The location of the thickness variation may be at the end of the large diameter portion 52, or at the entrance of the brush 53 or exactly in between, but either case falls within the above-mentioned range. Preferably, the 3 rd step (a3) is included to form a thicker thickness (t 1).
The small diameter portion 51, the large diameter portion 52, and the brush 53 are all integrally formed, and not separately manufactured as a flat plate material and then combined, but may be formed to have different thicknesses as described above, and for this reason, corresponding portions where the brushes are formed by a punching process or the like in the manufacturing process of the probe can be processed to be thinner.
In embodiment 1, a sleeve formed separately from the probe is used to form a thin thickness, but in embodiment 2, the brush is formed integrally with the probe to form a thin thickness.
A thinner brush can increase its elastic deformation range, and thus, a brush having a shorter length can be used, thereby having an effect of improving the electrical characteristics of the pogo pin by using the brush even without lengthening the length of the pogo pin or greatly lengthening the pogo pin, and the detailed description thereof will refer to the description of embodiment 1. For example, when the thickness is reduced by 25%, the elastic deformation range is increased by about 2.37 times.
Hereinafter, a method of manufacturing the pogo pin will be briefly described, and a process of manufacturing the probe of embodiment 2 will be described, and the other components, i.e., the components of embodiment 1 or the outer cylinder of embodiment 2, etc., can be easily analogized from such description.
First, a flat metal plate material in a thin plate shape is punched by a die based on an expanded view of a probe to manufacture a flat plate-shaped intermediate product punched in a predetermined expanded view.
In addition, as described above, the portion where the brush is to be formed is compressed and thinned by the press process, and punched again by the same die, so that the intermediate product having the expanded outer contour is formed by the press process, and the second press process can be omitted. Further, the probe having the shape shown in fig. 5 and 6 can be manufactured by forming the sliding contact portion and the step portion (which can also be formed by a subsequent roll process) which are bent by the embossing process, and then curling into a cylindrical shape by the roll process. The above process may be performed by progressive stamping.
Fig. 7 to 8 are modification examples of the pogo pin for an excessive current according to embodiment 1 of the present invention; fig. 7 is a perspective view showing an external appearance; FIG. 8 is an exploded perspective view; fig. 9 is a vertical sectional view.
Since the modified example of the present invention is similar to the pogo pin of embodiment 1, the description of the same or similar parts will be largely omitted. The pogo pin according to the modification includes: probe 10', sleeve 20', spring 30 and outer cylinder 40. The sleeve 20 'and the outer cylinder 40 except for the spring 30 and the probe 10' are manufactured by processing a flat plate material.
When the pogo pin is applied to the socket, the contact portion 14' of the pogo pin probe 10', or more specifically, the probe 10' is intended to contact the terminal of the semiconductor device.
The probe 10' is formed by cutting a cylindrical material, and has a substantially cylindrical shape with a step. The small diameter portion 11', the head portion 13', and the large diameter portion 12 'of the probe 10' are also formed in a substantially cylindrical shape, respectively, and the large diameter portion 12 'of the probe 10' is integrally connected to the small diameter portion 11', has an outer diameter larger than that of the small diameter portion 11', and is positioned inside the outer cylinder 40. The head 13 'is formed by extending from the small diameter portion 11' on the opposite side of the direction in which the large diameter portion 12 'of the small diameter portion 11' extends. On the upper face of the head portion 13 'is formed a contact portion 14' which forms an array of pointed projections by cutting for contact with the outside. The pointed protrusions are arranged in a two-dimensional plane, which forms an arrangement of protrusions by forming V-shaped grooves in a lattice shape by cutting work.
The lower end of the large diameter portion 12 'of the probe 10' is formed in a conical shape, so that the upper end of the spring 30 can be stably supported. The outer diameter becomes smaller from the middle portion toward the upper end of the spring 30, so that interference between the probe and the spring can be reduced at the time of assembling the probe and the spring, and the assembly can be performed more smoothly.
A1 st circular groove (E1) cut inward along the circumference is formed in the large-diameter portion 12 'of the probe 10', and a2 nd circular groove (E2) bent inward along the circumference is formed in the cylindrical coupling portion 21 'of the sleeve 20'. The 2 nd circular groove (E2) is positioned in the 1 st circular groove (E1) such that the probe 10 'and the sleeve 20' are fixed to each other. That is, the probe 10 'and the sleeve 20' are integrated after assembly, and integrally reciprocate in the vertical direction while being supported by the spring 30.
Claims (17)
1. A spring needle for extra-large current, which is provided with a spring (30) for elastically supporting a probe and an outer cylinder (40) for guiding the sliding of the probe,
the probe includes: a small diameter portion and a large diameter portion integrally connected to the small diameter portion, having an outer diameter larger than the small diameter portion, and located inside the outer cylinder (40),
and, comprising a sleeve (20,10') comprising: a cylindrical combination part which wraps the large diameter part of the probe and is fixedly combined with the large diameter part, and a plurality of brushes which extend from the cylindrical combination part, elastically contact with the inner circumferential surface of the outer cylinder (40) and can slide.
2. The pogo pin for ultra large current according to claim 1,
the probe and the sleeve are both made by processing a flat material,
the sleeve is formed by processing a flat plate material thinner than the probe.
3. The pogo pin for ultra large current according to claim 1,
the sleeve is made by processing a flat sheet of material,
the contact surface of the brush, which is elastically contacted with the inner peripheral surface of the outer cylinder (40), is a side plane of the flat plate material, which is not a cut surface of the flat plate material.
4. The ultra-high current pogo pin of claim 2 or 3,
a hooking ridge (21a) which is partially punched and bent inward is formed at the lower end of the cylindrical coupling portion of the sleeve;
the hanging ridge (21a) prevents one end of the large-diameter portion of the probe from being separated to the outside of the sleeve (20) when the pogo pin is compressed.
5. The pogo pin for ultra large current according to claim 4,
a tightening part (23) is formed above the cylindrical joint part of the sleeve;
the tightening part (23) prevents the other end of the large diameter part of the probe from being separated to the outside of the sleeve when the pogo pin is extended.
6. A spring needle for extra-high current, which is provided with a spring (60) for elastically supporting a probe (50) and an outer cylinder (70) for guiding the sliding of the probe (50),
the probe (50) comprises:
a small diameter part (51);
a large diameter part (52) integrally connected to the small diameter part (51), the outer diameter of the large diameter part being larger than that of the small diameter part (51);
a plurality of brushes (53) extending from the large diameter portion (52) and elastically contacting the inner peripheral surface of the outer cylinder (70) to be slidable,
the probe (50) is formed by processing a flat plate material.
7. The pogo pin for ultra large current according to claim 6,
the contact surface of the brush (53) elastically contacting the inner peripheral surface of the outer cylinder (70) is a plane surface on one side of the flat plate material, which is not a cut surface of the flat plate material.
8. The pogo pin for ultra large current according to claim 6,
the flat plate material is processed such that a thickness (t2) of the brush (53) in the probe (50) is thinner than thicknesses (t1) of the small diameter portion (51) and the large diameter portion (52).
9. The pogo pin for ultra large current according to claim 6,
the brush (53) includes:
a needle arm (53a) that extends long in the longitudinal direction on the circumference of the large diameter portion (52); and a sliding contact part (53b) which is formed integrally with the free end of the needle arm (53a) and elastically contacts the inner circumferential surface of the outer cylinder (70).
10. The pogo pin for ultra large current according to claim 9,
the sliding contact portion (53b) has a curved portion that contacts the inner peripheral surface of the outer cylinder (70).
11. The pogo pin for ultra large current according to claim 6,
the outer cylinder (70) is also made by processing a flat plate material,
a circular convex part (B) which is pressed inwards on the circumference of the outer cylinder (70) to form a circular convex is formed on the outer cylinder (70), so that the 1 st step part (A1) between the large diameter part (52) and the small diameter part (51) is hooked, and the probe (50) is prevented from being separated to the outside of the outer cylinder (70).
12. The pogo pin for ultra large current according to claim 11,
the outer cylinder (70) comprises, delimited by a circular projection (B) of the outer cylinder (70):
a1 st cylindrical portion (71) that guides the large diameter portion (52) and provides an inner circumferential surface on which the brush (53) slides; a2 nd cylindrical part (72) coupled to the 1 st cylindrical part (71) and formed at one or both side ends of the outer cylinder (70),
the 1 st cylindrical portion (71) and the 2 nd cylindrical portion (72) have the same inner diameter.
13. The pogo pin for ultra large current according to claim 6,
the probe (50) further includes a contact portion (54) extending after a2 nd step (a2) is formed from the small diameter portion (51), and an inner diameter of the contact portion (54) is smaller than that of the small diameter portion (51) so that one end of the spring (60) is supported by the 2 nd step (a 2).
14. The pogo pin for ultra large current according to claim 6,
a locking projection (D) is formed at one position of the outer cylinder (70), a part of which is punched, and the free end of which is protruded and bent outward in a state of extending from the outer cylinder (70).
15. The pogo pin for ultra large current according to claim 1,
the probe is made by cutting a cylindrical material,
the sleeve is made by processing a flat plate material.
16. The pogo pin for ultra large current according to claim 15,
the probe further has a head portion extending from the small diameter portion and having an outer diameter larger than the small diameter portion and located outside the outer tube (40) on the opposite side of the large diameter portion,
and, a contact portion (14') is formed on the upper surface of the head portion, and is formed to contact with the outside by cutting an array of pointed protrusions.
17. The pogo pin for ultra large current according to claim 1,
a1 st circular groove (E1) cut inward along the circumference is formed on the large diameter portion of the probe,
a2 nd circular groove (E2) bent inward along the circumference is formed at the cylindrical joint portion of the sleeve,
the 2 nd circular groove (E2) is seated in the 1 st circular groove (E1), thereby fixing the probe and the sleeve to each other.
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR1020200061715A KR102259074B1 (en) | 2020-05-22 | 2020-05-22 | Pogo pin for super high current |
| KR10-2020-0061715 | 2020-05-22 | ||
| PCT/KR2021/004772 WO2021235704A1 (en) | 2020-05-22 | 2021-04-15 | Pogo pin for ultra-high current |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN113973507A true CN113973507A (en) | 2022-01-25 |
| CN113973507B CN113973507B (en) | 2024-06-14 |
Family
ID=76372550
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202180001183.7A Active CN113973507B (en) | 2020-05-22 | 2021-04-15 | Spring needle for super-large current |
Country Status (4)
| Country | Link |
|---|---|
| JP (1) | JP7240534B2 (en) |
| KR (2) | KR102259074B1 (en) |
| CN (1) | CN113973507B (en) |
| WO (1) | WO2021235704A1 (en) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2023140648A1 (en) * | 2022-01-21 | 2023-07-27 | (주)아이윈솔루션 | Low-cost high-performance pogo pin |
| KR102663575B1 (en) | 2024-02-02 | 2024-05-03 | 주식회사 나노시스 | Elastic contactor with enhanced bonding strength |
Citations (14)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4904213A (en) * | 1989-04-06 | 1990-02-27 | Motorola, Inc. | Low impedance electric connector |
| EP0405323A2 (en) * | 1989-06-24 | 1991-01-02 | Feinmetall Gesellschaft mit beschrÀ¤nkter Haftung | Elastic contact probe |
| JPH0650260U (en) * | 1992-12-18 | 1994-07-08 | 株式会社ヨコオ | Spring connector |
| JP3088866U (en) * | 2002-03-27 | 2002-10-04 | 株式会社精研 | Inspection probe |
| KR20110002962A (en) * | 2009-07-03 | 2011-01-11 | 리노공업주식회사 | A probe |
| CN202025900U (en) * | 2011-03-25 | 2011-11-02 | 富港电子（东莞）有限公司 | Probe connector |
| CN202205934U (en) * | 2011-09-01 | 2012-04-25 | 东莞中探探针有限公司 | Spring-type connector with improved structure |
| KR20120044960A (en) * | 2012-04-04 | 2012-05-08 | 박상량 | Test pin and semiconductor test socket for fine pitch |
| CN103022773A (en) * | 2012-12-17 | 2013-04-03 | 福立旺精密机电(中国)有限公司 | Probe type connector |
| CN107942109A (en) * | 2017-12-21 | 2018-04-20 | 东莞市燊瑞电子科技有限公司 | A kind of testing needle for being used for transmission high-frequency signal |
| CN109103643A (en) * | 2018-07-25 | 2018-12-28 | 深圳市爱默斯科技有限公司 | A kind of POGO PIN connector |
| KR20190009233A (en) * | 2017-07-18 | 2019-01-28 | 송유선 | Pogo pin and test socket for implementing array of the same |
| CN109638514A (en) * | 2017-10-05 | 2019-04-16 | 株式会社友华 | Spring connector |
| CN110462408A (en) * | 2017-03-30 | 2019-11-15 | 日本发条株式会社 | Contact type probe and probe unit |
Family Cites Families (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6028699Y2 (en) * | 1977-02-24 | 1985-08-30 | 帝人株式会社 | Cloth for dust removal |
| JPH0712846A (en) * | 1993-06-29 | 1995-01-17 | Fuji Photo Film Co Ltd | Contact probe |
| JP2005009927A (en) | 2003-06-17 | 2005-01-13 | Tesu Hanbai Kk | Spring probe |
| KR200432906Y1 (en) * | 2006-09-08 | 2006-12-07 | 씨.씨.피. 콘택트 프로우브스 컴퍼니 리미티드 | Replaceable probe |
| EP2180326B1 (en) * | 2008-10-24 | 2017-05-03 | Tyco Electronics Services GmbH | Test probe |
| JP2011203087A (en) * | 2010-03-25 | 2011-10-13 | Nhk Spring Co Ltd | Contact probe |
| JP6028699B2 (en) | 2013-09-13 | 2016-11-16 | 第一精工株式会社 | Connector terminal, electrical connector, and electrical connector manufacturing method |
| JP2018200821A (en) * | 2017-05-29 | 2018-12-20 | 株式会社エンプラス | Electric contactor and socket for electrical component |
| KR102092005B1 (en) * | 2018-07-05 | 2020-03-23 | 박상량 | Connector pin for guaranteeing stable contact |
| KR102202827B1 (en) * | 2020-10-27 | 2021-01-14 | (주) 네스텍코리아 | Probe pin and coaxial probe assembly using the same |
-
2020
- 2020-05-22 KR KR1020200061715A patent/KR102259074B1/en active IP Right Grant
-
2021
- 2021-04-15 CN CN202180001183.7A patent/CN113973507B/en active Active
- 2021-04-15 JP JP2021571769A patent/JP7240534B2/en active Active
- 2021-04-15 WO PCT/KR2021/004772 patent/WO2021235704A1/en active Application Filing
- 2021-11-05 KR KR1020210151757A patent/KR102622471B1/en active IP Right Grant
Patent Citations (14)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4904213A (en) * | 1989-04-06 | 1990-02-27 | Motorola, Inc. | Low impedance electric connector |
| EP0405323A2 (en) * | 1989-06-24 | 1991-01-02 | Feinmetall Gesellschaft mit beschrÀ¤nkter Haftung | Elastic contact probe |
| JPH0650260U (en) * | 1992-12-18 | 1994-07-08 | 株式会社ヨコオ | Spring connector |
| JP3088866U (en) * | 2002-03-27 | 2002-10-04 | 株式会社精研 | Inspection probe |
| KR20110002962A (en) * | 2009-07-03 | 2011-01-11 | 리노공업주식회사 | A probe |
| CN202025900U (en) * | 2011-03-25 | 2011-11-02 | 富港电子（东莞）有限公司 | Probe connector |
| CN202205934U (en) * | 2011-09-01 | 2012-04-25 | 东莞中探探针有限公司 | Spring-type connector with improved structure |
| KR20120044960A (en) * | 2012-04-04 | 2012-05-08 | 박상량 | Test pin and semiconductor test socket for fine pitch |
| CN103022773A (en) * | 2012-12-17 | 2013-04-03 | 福立旺精密机电(中国)有限公司 | Probe type connector |
| CN110462408A (en) * | 2017-03-30 | 2019-11-15 | 日本发条株式会社 | Contact type probe and probe unit |
| KR20190009233A (en) * | 2017-07-18 | 2019-01-28 | 송유선 | Pogo pin and test socket for implementing array of the same |
| CN109638514A (en) * | 2017-10-05 | 2019-04-16 | 株式会社友华 | Spring connector |
| CN107942109A (en) * | 2017-12-21 | 2018-04-20 | 东莞市燊瑞电子科技有限公司 | A kind of testing needle for being used for transmission high-frequency signal |
| CN109103643A (en) * | 2018-07-25 | 2018-12-28 | 深圳市爱默斯科技有限公司 | A kind of POGO PIN connector |
Also Published As
| Publication number | Publication date |
|---|---|
| CN113973507B (en) | 2024-06-14 |
| JP2022541987A (en) | 2022-09-29 |
| WO2021235704A1 (en) | 2021-11-25 |
| JP7240534B2 (en) | 2023-03-15 |
| KR20220143545A (en) | 2022-10-25 |
| KR102259074B1 (en) | 2021-06-02 |
| KR102622471B1 (en) | 2024-01-09 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN113973507A (en) | Spring needle for super-large current | |
| US6083059A (en) | Structure of a terminal | |
| US7476132B2 (en) | Double-ended pressure contacting electrical terminal | |
| US5593328A (en) | Female terminal fitting for connector | |
| EP1299735B1 (en) | Self-retained spring probe | |
| US7021976B2 (en) | Spring connector | |
| US3786401A (en) | Contact socket | |
| KR101043447B1 (en) | Electrical contact with wire trap | |
| US10855017B2 (en) | Connector terminal, connector, and size adjustment device | |
| EP1037055A2 (en) | Spring probe | |
| EP1798822A1 (en) | Connector assembly | |
| US20150070040A1 (en) | Test probe assembly and related methods | |
| US6328615B1 (en) | Contact formed of joined pieces | |
| US5626500A (en) | Contact and connector | |
| US7257869B2 (en) | Zipper head assembly structure | |
| US7351121B2 (en) | Electrical terminal | |
| US7253647B2 (en) | Probe for high electric current | |
| EP3588687B1 (en) | Terminal metal fitting | |
| US6162103A (en) | Terminal structure of a connector | |
| EP3764476A1 (en) | Electrical connection device | |
| JPH11307158A (en) | Coaxial connector | |
| JPH07313217A (en) | Cord stopper | |
| KR101103538B1 (en) | Supporting structure of antenna | |
| US11196202B2 (en) | Electrical connector and electronic device | |
| WO2023181906A1 (en) | Spring connector |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant |