JP2022521225A - イオン化装置を備えたガス検知器 - Google Patents
イオン化装置を備えたガス検知器 Download PDFInfo
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- JP2022521225A JP2022521225A JP2021548612A JP2021548612A JP2022521225A JP 2022521225 A JP2022521225 A JP 2022521225A JP 2021548612 A JP2021548612 A JP 2021548612A JP 2021548612 A JP2021548612 A JP 2021548612A JP 2022521225 A JP2022521225 A JP 2022521225A
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- 238000005259 measurement Methods 0.000 claims description 61
- 239000004020 conductor Substances 0.000 claims description 38
- 150000002500 ions Chemical class 0.000 claims description 10
- 238000001514 detection method Methods 0.000 claims 1
- 238000010586 diagram Methods 0.000 abstract description 4
- 230000003071 parasitic effect Effects 0.000 description 2
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 1
- 229910052799 carbon Inorganic materials 0.000 description 1
- 238000009413 insulation Methods 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
- G01N27/62—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating the ionisation of gases, e.g. aerosols; by investigating electric discharges, e.g. emission of cathode
- G01N27/68—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating the ionisation of gases, e.g. aerosols; by investigating electric discharges, e.g. emission of cathode using electric discharge to ionise a gas
- G01N27/70—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating the ionisation of gases, e.g. aerosols; by investigating electric discharges, e.g. emission of cathode using electric discharge to ionise a gas and measuring current or voltage
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
- G01N27/62—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating the ionisation of gases, e.g. aerosols; by investigating electric discharges, e.g. emission of cathode
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
- G01N27/62—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating the ionisation of gases, e.g. aerosols; by investigating electric discharges, e.g. emission of cathode
- G01N27/64—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating the ionisation of gases, e.g. aerosols; by investigating electric discharges, e.g. emission of cathode using wave or particle radiation to ionise a gas, e.g. in an ionisation chamber
- G01N27/66—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating the ionisation of gases, e.g. aerosols; by investigating electric discharges, e.g. emission of cathode using wave or particle radiation to ionise a gas, e.g. in an ionisation chamber and measuring current or voltage
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
- G01N33/0004—Gaseous mixtures, e.g. polluted air
- G01N33/0009—General constructional details of gas analysers, e.g. portable test equipment
- G01N33/0027—General constructional details of gas analysers, e.g. portable test equipment concerning the detector
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F1/00—Details of amplifiers with only discharge tubes, only semiconductor devices or only unspecified devices as amplifying elements
- H03F1/08—Modifications of amplifiers to reduce detrimental influences of internal impedances of amplifying elements
- H03F1/083—Modifications of amplifiers to reduce detrimental influences of internal impedances of amplifying elements in transistor amplifiers
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F3/00—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
- H03F3/45—Differential amplifiers
- H03F3/45071—Differential amplifiers with semiconductor devices only
- H03F3/45076—Differential amplifiers with semiconductor devices only characterised by the way of implementation of the active amplifying circuit in the differential amplifier
- H03F3/45475—Differential amplifiers with semiconductor devices only characterised by the way of implementation of the active amplifying circuit in the differential amplifier using IC blocks as the active amplifying circuit
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/0046—Arrangements for measuring currents or voltages or for indicating presence or sign thereof characterised by a specific application or detail not covered by any other subgroup of G01R19/00
- G01R19/0061—Measuring currents of particle-beams, currents from electron multipliers, photocurrents, ion currents; Measuring in plasmas
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F2200/00—Indexing scheme relating to amplifiers
- H03F2200/261—Amplifier which being suitable for instrumentation applications
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F2203/00—Indexing scheme relating to amplifiers with only discharge tubes or only semiconductor devices as amplifying elements covered by H03F3/00
- H03F2203/45—Indexing scheme relating to differential amplifiers
- H03F2203/45528—Indexing scheme relating to differential amplifiers the FBC comprising one or more passive resistors and being coupled between the LC and the IC
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- Chemical & Material Sciences (AREA)
- Health & Medical Sciences (AREA)
- Engineering & Computer Science (AREA)
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- Life Sciences & Earth Sciences (AREA)
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- General Health & Medical Sciences (AREA)
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- Chemical Kinetics & Catalysis (AREA)
- Electrochemistry (AREA)
- Power Engineering (AREA)
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- Medicinal Chemistry (AREA)
- Food Science & Technology (AREA)
- Combustion & Propulsion (AREA)
- Plasma & Fusion (AREA)
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
- Measurement Of Radiation (AREA)
- Measurement Of Resistance Or Impedance (AREA)
- Measuring Instrument Details And Bridges, And Automatic Balancing Devices (AREA)
- Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
- Electron Tubes For Measurement (AREA)
Abstract
Description
Claims (14)
- 検出対象のガスに応じてイオンを生成し、捕捉器で前記イオンにより生成された電流を受けるイオン化装置(12)と、
前記電流から電気測定電位を生じる電気測定抵抗(16)を備えた測定装置(14)と、を備え、
前記測定抵抗は、電気遮蔽抵抗RTにより少なくとも一部が囲まれており、
前記測定抵抗及び前記遮蔽抵抗RTの互いに対向する領域には、最大25%の偏差で、同一電位が印加されることを特徴とする、ガス検知器(10)。 - 請求項1に記載のガス検知器(10)において、前記測定抵抗の2つの端部のうちの一方は、前記遮蔽抵抗RTの2つの端部のうちの一方と電気的に接続され、これにより、当該端部同士が同一電位を有することを特徴とする、ガス検知器(10)。
- 請求項2に記載のガス検知器(10)において、前記測定抵抗及び前記電気遮蔽抵抗RTのそれぞれの他方の端部は、最大25%の偏差で、接地電位となっていることを特徴とする、ガス検知器(10)。
- 請求項1~3のいずれか一項に記載のガス検知器(10)において、前記遮蔽抵抗
RTは前記測定抵抗(16)よりも低い抵抗値を有することを特徴とする、ガス検知器(10)。 - 請求項1又は2に記載のガス検知器(10)において、前記遮蔽抵抗RTの抵抗値は、最大1メガオームであり、前記測定抵抗(16)の抵抗値は1ギガオームより大きいことを特徴とする、ガス検知器(10)。
- 請求項1~5のいずれか一項に記載のガス検知器(10)において、前記測定抵抗
(16)は、その長さがその高さ及び幅よりも大きい形態で細長くなっており、前記遮蔽抵抗RTは少なくとも前記測定抵抗(16)の前記長さの大部分を越えて延在することを特徴とする、ガス検知器(10)。 - 請求項1~6のいずれか一項に記載のガス検知器(10)において、前記遮蔽抵抗RTの長さは前記測定抵抗(16)の前記長さよりも大きく、それぞれ異なる電位を有する前記遮蔽抵抗の部分は、前記測定抵抗(16)のアクティブ領域と同じ長さであることを特徴とする、ガス検知器(10)。
- 請求項1~7のいずれか一項に記載のガス検知器(10)において、前記遮蔽抵抗
RTは複数の導電体(24)のチェーンとして形成され、当該複数の導電体(24)はそれぞれ前記測定抵抗を少なくとも一部囲んでおり、
個別抵抗(RT1・・・RTN)は隣接する前記導電体(24)間に配置され、
前記チェーンの一方の端部(30)は前記測定抵抗(16)の一方の端部(18)と同一の電位を有し、前記チェーンの他方の端部(32)は前記測定抵抗の他方の端部(20)と同一の電位を有することを特徴とする、ガス検知器(10)。 - 請求項8に記載のガス検知器(10)において、前記測定抵抗の下方の面(22)の各導電部分面(22a~22f)上で前記測定抵抗(16)を挟んだ両側に、各々2つの導電体(24)が対になって配置され、前記各導電部分面(22a~22f)に電気的に接続されていることを特徴とする、ガス検知器(10)。
- 請求項8又は9に記載のガス検知器(10)において、前記導電体(24)はそれぞれピン柱として設計されることを特徴とする、ガス検知器(10)。
- 請求項8~10のいずれか一項に記載のガス検知器(10)において、前記導電体(24)はそれぞれ前記測定抵抗(16)を挟んだ両側で突出することを特徴とする、ガス検知器(10)。
- 請求項8~11のいずれか一項に記載のガス検知器(10)において、前記導電体(24)はそれぞれ前記測定抵抗(16)の周囲で湾曲した又は屈曲した部分(34)を有することを特徴とする、ガス検知器(10)。
- 請求項1~12のいずれか一項に記載のガス検知器(10)において、2つの隣接する導電体(24)がそれぞれ電気的に互いに接続されて二重対をなすことを特徴とする、ガス検知器(10)。
- 請求項1~13のいずれか一項に記載のガス検知器(10)において、前記遮蔽抵抗RTは前記測定抵抗(16)を囲む円筒(40)として設計されることを特徴とする、ガス検知器(10)。
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE102019202242.1 | 2019-02-19 | ||
DE102019202242.1A DE102019202242A1 (de) | 2019-02-19 | 2019-02-19 | Gasdetektor mit einer Ionisiervorrichtung |
PCT/EP2020/053756 WO2020169446A1 (de) | 2019-02-19 | 2020-02-13 | Gasdetektor mit einer ionisiervorrichtung |
Publications (3)
Publication Number | Publication Date |
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JP2022521225A true JP2022521225A (ja) | 2022-04-06 |
JPWO2020169446A5 JPWO2020169446A5 (ja) | 2022-11-29 |
JP7454586B2 JP7454586B2 (ja) | 2024-03-22 |
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ID=69630283
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Application Number | Title | Priority Date | Filing Date |
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JP2021548612A Active JP7454586B2 (ja) | 2019-02-19 | 2020-02-13 | イオン化装置を備えたガス検知器 |
Country Status (7)
Country | Link |
---|---|
US (1) | US11754525B2 (ja) |
EP (1) | EP3928090B1 (ja) |
JP (1) | JP7454586B2 (ja) |
KR (1) | KR20210126594A (ja) |
DE (1) | DE102019202242A1 (ja) |
TW (1) | TWI841685B (ja) |
WO (1) | WO2020169446A1 (ja) |
Citations (5)
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JPH05206752A (ja) * | 1992-01-30 | 1993-08-13 | Hitachi Ltd | 半導体集積回路 |
JP2006284198A (ja) * | 2005-03-31 | 2006-10-19 | Agilent Technol Inc | 抵抗器ならびにそれを用いた電流測定装置および方法 |
US20060244526A1 (en) * | 2005-04-28 | 2006-11-02 | Dejan Mijuskovic | High bandwidth resistor |
JP2015526698A (ja) * | 2012-06-01 | 2015-09-10 | スミスズ ディテクション−ワトフォード リミテッド | 集積化容量性トランスインピーダンス増幅器 |
US20150357981A1 (en) * | 2014-06-05 | 2015-12-10 | Thermo Fisher Scientific (Bremen) Gmbh | Transimpedance Amplifier |
Family Cites Families (12)
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DE3575362D1 (de) | 1985-10-12 | 1990-02-15 | Leybold Ag | Verfahren und vorrichtung zur ueberpruefung des messsignalpfades einer messeinrichtung. |
DE3842399C2 (de) * | 1988-12-16 | 1997-07-31 | Fisher Rosemount Gmbh & Co Ges | Mikroströmungsfühler für Gase |
US5104513A (en) | 1990-10-18 | 1992-04-14 | Leybold Inficon Inc. | Gas sensor |
DE19833453C2 (de) * | 1998-07-24 | 2000-06-15 | Siemens Ag | Vorrichtung und Betriebsverfahren an/in geheizten Gassensoren zur Minimierung von Leckstrom-Einflüssen |
DE19960798C2 (de) * | 1999-12-16 | 2001-11-29 | Siemens Ag | Elektrisch beheizter Hochtemperaturgassensor |
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GB0505438D0 (en) | 2005-03-17 | 2005-04-20 | Hamilton Scott | Improved transimpedance amplifier for low currents |
US10309929B2 (en) * | 2006-02-14 | 2019-06-04 | Excellims Corporation | Practical ion mobility spectrometer apparatus and methods for chemical and/or biological detection |
CN101063672A (zh) * | 2006-04-29 | 2007-10-31 | 复旦大学 | 离子阱阵列 |
TWI484529B (zh) * | 2006-11-13 | 2015-05-11 | Mks Instr Inc | 離子阱質譜儀、利用其得到質譜之方法、離子阱、捕捉離子阱內之離子之方法和設備 |
TWI539154B (zh) * | 2012-12-19 | 2016-06-21 | 英福康公司 | 雙重偵測殘餘氣體分析器 |
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2019
- 2019-02-19 DE DE102019202242.1A patent/DE102019202242A1/de active Pending
-
2020
- 2020-02-13 EP EP20705918.9A patent/EP3928090B1/de active Active
- 2020-02-13 WO PCT/EP2020/053756 patent/WO2020169446A1/de unknown
- 2020-02-13 US US17/431,996 patent/US11754525B2/en active Active
- 2020-02-13 JP JP2021548612A patent/JP7454586B2/ja active Active
- 2020-02-13 KR KR1020217025317A patent/KR20210126594A/ko not_active Application Discontinuation
- 2020-02-18 TW TW109105225A patent/TWI841685B/zh active
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH05206752A (ja) * | 1992-01-30 | 1993-08-13 | Hitachi Ltd | 半導体集積回路 |
JP2006284198A (ja) * | 2005-03-31 | 2006-10-19 | Agilent Technol Inc | 抵抗器ならびにそれを用いた電流測定装置および方法 |
US20060244526A1 (en) * | 2005-04-28 | 2006-11-02 | Dejan Mijuskovic | High bandwidth resistor |
JP2015526698A (ja) * | 2012-06-01 | 2015-09-10 | スミスズ ディテクション−ワトフォード リミテッド | 集積化容量性トランスインピーダンス増幅器 |
US20150357981A1 (en) * | 2014-06-05 | 2015-12-10 | Thermo Fisher Scientific (Bremen) Gmbh | Transimpedance Amplifier |
Also Published As
Publication number | Publication date |
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WO2020169446A1 (de) | 2020-08-27 |
TWI841685B (zh) | 2024-05-11 |
US20220136997A1 (en) | 2022-05-05 |
JP7454586B2 (ja) | 2024-03-22 |
EP3928090A1 (de) | 2021-12-29 |
CN113439210A (zh) | 2021-09-24 |
TW202045918A (zh) | 2020-12-16 |
EP3928090B1 (de) | 2022-11-23 |
DE102019202242A1 (de) | 2020-08-20 |
US11754525B2 (en) | 2023-09-12 |
KR20210126594A (ko) | 2021-10-20 |
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