JP2022512468A5 - - Google Patents

Info

Publication number
JP2022512468A5
JP2022512468A5 JP2021532844A JP2021532844A JP2022512468A5 JP 2022512468 A5 JP2022512468 A5 JP 2022512468A5 JP 2021532844 A JP2021532844 A JP 2021532844A JP 2021532844 A JP2021532844 A JP 2021532844A JP 2022512468 A5 JP2022512468 A5 JP 2022512468A5
Authority
JP
Japan
Prior art keywords
lifting device
pin lifting
temperature
status information
measurement signal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2021532844A
Other languages
English (en)
Japanese (ja)
Other versions
JP2022512468A (ja
JP7524187B2 (ja
Filing date
Publication date
Priority claimed from DE102018009630.1A external-priority patent/DE102018009630A1/de
Application filed filed Critical
Publication of JP2022512468A publication Critical patent/JP2022512468A/ja
Publication of JP2022512468A5 publication Critical patent/JP2022512468A5/ja
Application granted granted Critical
Publication of JP7524187B2 publication Critical patent/JP7524187B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

JP2021532844A 2018-12-11 2019-12-10 温度センサを有するピンリフティング装置 Active JP7524187B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
DE102018009630.1 2018-12-11
DE102018009630.1A DE102018009630A1 (de) 2018-12-11 2018-12-11 Stifthubvorrichtung mit Temperatursensor
PCT/EP2019/084516 WO2020120510A1 (de) 2018-12-11 2019-12-10 Stifthubvorrichtung mit temperatursensor

Publications (3)

Publication Number Publication Date
JP2022512468A JP2022512468A (ja) 2022-02-04
JP2022512468A5 true JP2022512468A5 (https=) 2022-10-21
JP7524187B2 JP7524187B2 (ja) 2024-07-29

Family

ID=68848296

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2021532844A Active JP7524187B2 (ja) 2018-12-11 2019-12-10 温度センサを有するピンリフティング装置

Country Status (7)

Country Link
US (1) US12381108B2 (https=)
JP (1) JP7524187B2 (https=)
KR (1) KR102805233B1 (https=)
CN (1) CN112970101B (https=)
DE (1) DE102018009630A1 (https=)
TW (1) TWI837223B (https=)
WO (1) WO2020120510A1 (https=)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102018009630A1 (de) * 2018-12-11 2020-06-18 Vat Holding Ag Stifthubvorrichtung mit Temperatursensor
CN113488370B (zh) * 2021-07-06 2024-05-31 北京屹唐半导体科技股份有限公司 用于等离子体处理设备的升降销组件
JP7715464B2 (ja) * 2021-09-02 2025-07-30 東京エレクトロン株式会社 基板処理装置
CN120291061B (zh) * 2025-06-09 2025-08-26 蓝河科技(绍兴)有限公司 气体分配装置和半导体设备

Family Cites Families (28)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100260587B1 (ko) * 1993-06-01 2000-08-01 히가시 데쓰로 정전척 및 그의 제조방법
JP3604522B2 (ja) 1995-11-28 2004-12-22 東京エレクトロン株式会社 熱処理方法及びその装置
US5900062A (en) 1995-12-28 1999-05-04 Applied Materials, Inc. Lift pin for dechucking substrates
US5886864A (en) * 1996-12-02 1999-03-23 Applied Materials, Inc. Substrate support member for uniform heating of a substrate
JP3398936B2 (ja) 1999-04-09 2003-04-21 日本エー・エス・エム株式会社 半導体処理装置
US6481723B1 (en) 2001-03-30 2002-11-19 Lam Research Corporation Lift pin impact management
US6646857B2 (en) 2001-03-30 2003-11-11 Lam Research Corporation Semiconductor wafer lifting device and methods for implementing the same
JP2004022803A (ja) 2002-06-17 2004-01-22 Taiheiyo Cement Corp 温度測定機能付き突き上げピン
KR100964619B1 (ko) * 2003-10-06 2010-06-22 삼성전자주식회사 리프트 핀, 이를 포함하는 리프팅 장치
US7244311B2 (en) * 2004-10-13 2007-07-17 Lam Research Corporation Heat transfer system for improved semiconductor processing uniformity
KR101402875B1 (ko) * 2006-12-11 2014-06-03 엘아이지에이디피 주식회사 리프트 핀, 리프트 핀용 가열장치 및 이를 갖춘평판표시소자 제조장치
JP5008147B2 (ja) * 2008-06-05 2012-08-22 東京エレクトロン株式会社 減圧乾燥装置
JP2010087342A (ja) * 2008-10-01 2010-04-15 Toray Eng Co Ltd リフトピン
US8313612B2 (en) 2009-03-24 2012-11-20 Lam Research Corporation Method and apparatus for reduction of voltage potential spike during dechucking
JP5484981B2 (ja) * 2010-03-25 2014-05-07 東京エレクトロン株式会社 基板載置台及び基板処理装置
TWI624903B (zh) * 2013-03-15 2018-05-21 應用材料股份有限公司 在雜訊環境中之現場溫度測量
KR20150066285A (ko) * 2013-12-06 2015-06-16 세메스 주식회사 기판 지지 유닛 및 이를 포함하는 기판 처리 장치
US10049905B2 (en) 2014-09-25 2018-08-14 Tokyo Electron Limited Substrate heat treatment apparatus, substrate heat treatment method, storage medium and heat-treatment-condition detecting apparatus
US20170352565A1 (en) * 2016-06-07 2017-12-07 Chunlei Zhang Workpiece carrier with gas pressure in inner cavities
US10184183B2 (en) 2016-06-21 2019-01-22 Applied Materials, Inc. Substrate temperature monitoring
US9892956B1 (en) * 2016-10-12 2018-02-13 Lam Research Corporation Wafer positioning pedestal for semiconductor processing
TWI765936B (zh) 2016-11-29 2022-06-01 美商東京威力科創Fsi股份有限公司 用以對處理腔室中之微電子基板進行處理的平移與旋轉夾頭
JP7130359B2 (ja) 2016-12-05 2022-09-05 東京エレクトロン株式会社 プラズマ処理装置
EP3361316A1 (de) * 2017-02-14 2018-08-15 VAT Holding AG Pneumatische stifthubvorrichtung und pneumatischer hubzylinder
EP3421849A1 (de) * 2017-06-30 2019-01-02 VAT Holding AG Vakuumventil mit temperatursensor
DE102018009630A1 (de) * 2018-12-11 2020-06-18 Vat Holding Ag Stifthubvorrichtung mit Temperatursensor
DE102018009871A1 (de) * 2018-12-19 2020-06-25 Vat Holding Ag Stifthubvorrichtung mit Zustandsüberwachung
US12211734B2 (en) * 2021-03-12 2025-01-28 Applied Materials, Inc. Lift pin mechanism

Similar Documents

Publication Publication Date Title
JP2022512468A5 (https=)
TWI690706B (zh) 感測器系統及用以測量及控制加熱器系統之效能之整合式加熱器感測器
US7654733B2 (en) Method and device for identifying a temperature sensor connected to a control unit
US10656036B2 (en) Self-heated pressure sensor assemblies
US8667839B2 (en) Heat conduction-type sensor for calibrating effects of temperature and type of fluid, and thermal flow sensor and thermal barometric sensor using this sensor
US10481031B2 (en) Fluid property sensor with heat loss compensation and operating method thereof
JP6802703B2 (ja) 気体センサ装置
US20180269089A1 (en) Non-contact temperature calibration tool for a substrate support and method of using the same
JP7524187B2 (ja) 温度センサを有するピンリフティング装置
US20050184044A1 (en) Temperature sensor
JP6119701B2 (ja) ガスセンサ
CN108027287B (zh) 用于校准位于自动化技术过程中的温度传感器的方法
JPH1090084A (ja) ガラス、ガラスセラミック等の基板上の温度測定レジスタの較正方法
EP3478025B1 (en) Self-regulating heater compensation
JP7731373B2 (ja) 抵抗ヒーターのための受動的及び能動的な較正方法
JP7640014B2 (ja) 電気機械的リレー構造
KR100413646B1 (ko) 온도검출소자
US1617416A (en) Means for measuring and controlling temperatures
JP5328303B2 (ja) 光学素子の製造装置及びその製造方法
JP5761589B2 (ja) 電気素子、集積素子、電子回路及び温度較正装置
CN114678286A (zh) 晶圆变形的测量方法
Jeong et al. Transient thermal characteristics of a heated infrared temperature sensor for noncontact medical thermometry
Kreider et al. Lightpipe proximity effects on Si wafer temperature in rapid thermal processing tools
KR100974502B1 (ko) 로내부의 온도감지장치
JP2003308955A (ja) 加熱調理器