JP2022162999A5 - - Google Patents

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Publication number
JP2022162999A5
JP2022162999A5 JP2022065790A JP2022065790A JP2022162999A5 JP 2022162999 A5 JP2022162999 A5 JP 2022162999A5 JP 2022065790 A JP2022065790 A JP 2022065790A JP 2022065790 A JP2022065790 A JP 2022065790A JP 2022162999 A5 JP2022162999 A5 JP 2022162999A5
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JP
Japan
Prior art keywords
objective lens
microscope system
lens
light beam
illumination optical
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2022065790A
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English (en)
Japanese (ja)
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JP2022162999A (ja
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Publication date
Priority claimed from GB2105232.9A external-priority patent/GB2605793B/en
Application filed filed Critical
Publication of JP2022162999A publication Critical patent/JP2022162999A/ja
Publication of JP2022162999A5 publication Critical patent/JP2022162999A5/ja
Pending legal-status Critical Current

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JP2022065790A 2021-04-13 2022-04-12 斜め照明式顕微鏡システム Pending JP2022162999A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
GB2105232.9 2021-04-13
GB2105232.9A GB2605793B (en) 2021-04-13 2021-04-13 Microscope system with oblique illumination

Publications (2)

Publication Number Publication Date
JP2022162999A JP2022162999A (ja) 2022-10-25
JP2022162999A5 true JP2022162999A5 (enExample) 2025-04-15

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Family Applications (1)

Application Number Title Priority Date Filing Date
JP2022065790A Pending JP2022162999A (ja) 2021-04-13 2022-04-12 斜め照明式顕微鏡システム

Country Status (5)

Country Link
US (1) US20220326498A1 (enExample)
EP (1) EP4075181A1 (enExample)
JP (1) JP2022162999A (enExample)
CN (1) CN115202025A (enExample)
GB (1) GB2605793B (enExample)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20240410818A1 (en) * 2021-10-05 2024-12-12 Leica Microsystems Cms Gmbh Sample carrier and method for imaging a sample
CN114324436A (zh) * 2021-12-23 2022-04-12 江苏大学 一种微纳结构的激光加工与实时原位高分辨观测装置
US12422661B2 (en) * 2023-01-27 2025-09-23 POSTECH Research and Business Development Foundation Photographing apparatus and photographing method
CN119438158B (zh) * 2024-11-11 2025-11-18 湖北大学 一种基于物镜光轴偏离显微镜主光轴实现超分辨光学显微成像的方法

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102008034137A1 (de) * 2007-09-28 2009-04-02 Carl Zeiss Microlmaging Gmbh Mikroskop und Verfahren zum Betreiben eines Mikroskops
DE102009037366A1 (de) * 2009-08-13 2011-02-17 Carl Zeiss Microlmaging Gmbh Mikroskop, insbesondere zur Messung von Totalreflexions-Fluoreszenz, und Betriebsverfahren für ein solches
DE112013002113B4 (de) * 2012-04-20 2019-03-21 Hamamatsu Photonics K.K. Strahlformer
CN104246582A (zh) * 2012-04-20 2014-12-24 浜松光子学株式会社 光束整形装置
EP2720075B1 (en) * 2012-10-12 2017-11-29 Spectral Applied Research Inc. Total internal reflectance fluorescence (TIRF) microscopy across multiple wavelengths simultaneously
LU92505B1 (de) * 2014-07-22 2016-01-25 Leica Microsystems Verfahren und vorrichtung zum mikroskopischen untersuchen einer probe
EP3382441A4 (en) * 2015-11-27 2019-08-07 Nikon Corporation MICROSCOPE, CONSIDERATION PROCEDURE AND CONTROL PROGRAM
JP7112686B2 (ja) * 2018-07-18 2022-08-04 株式会社エビデント 標本観察装置
DE102018009056A1 (de) * 2018-11-12 2020-05-14 Carl Zeiss Microscopy Gmbh Beschleunigte Verfahren und Vorrichtungen für die dreidimensionale Mikroskopie mit strukturierter Beleuchtung
JP7261903B2 (ja) * 2019-05-06 2023-04-20 エーエスエムエル ネザーランズ ビー．ブイ． 暗視野顕微鏡
GB2585072B (en) * 2019-06-27 2024-01-24 Andor Tech Limited Radiation Delivery apparatus for microscope systems

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