JP2022162999A - 斜め照明式顕微鏡システム - Google Patents

斜め照明式顕微鏡システム Download PDF

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Publication number
JP2022162999A
JP2022162999A JP2022065790A JP2022065790A JP2022162999A JP 2022162999 A JP2022162999 A JP 2022162999A JP 2022065790 A JP2022065790 A JP 2022065790A JP 2022065790 A JP2022065790 A JP 2022065790A JP 2022162999 A JP2022162999 A JP 2022162999A
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JP
Japan
Prior art keywords
objective lens
sample
lens
light
plane
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Pending
Application number
JP2022065790A
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English (en)
Japanese (ja)
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JP2022162999A5 (enExample
Inventor
オレオプロス，ジョン
Oreopoulos John
シンクレア，ピーター
Sinclair Peter
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Andor Technology Ltd
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Andor Technology Ltd
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Publication date
Application filed by Andor Technology Ltd filed Critical Andor Technology Ltd
Publication of JP2022162999A publication Critical patent/JP2022162999A/ja
Publication of JP2022162999A5 publication Critical patent/JP2022162999A5/ja
Pending legal-status Critical Current

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    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/06—Means for illuminating specimens
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/06—Means for illuminating specimens
    • G02B21/08—Condensers
    • G02B21/082—Condensers for incident illumination only
    • G02B21/084—Condensers for incident illumination only having annular illumination around the objective
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/06—Means for illuminating specimens
    • G02B21/08—Condensers
    • G02B21/10—Condensers affording dark-field illumination
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0032—Optical details of illumination, e.g. light-sources, pinholes, beam splitters, slits, fibers
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/02—Objectives
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/06—Means for illuminating specimens
    • G02B21/08—Condensers
    • G02B21/082—Condensers for incident illumination only
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/06—Means for illuminating specimens
    • G02B21/08—Condensers
    • G02B21/12—Condensers affording bright-field illumination
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/06—Means for illuminating specimens
    • G02B21/08—Condensers
    • G02B21/12—Condensers affording bright-field illumination
    • G02B21/125—Condensers affording bright-field illumination affording both dark- and bright-field illumination
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/16—Microscopes adapted for ultraviolet illumination ; Fluorescence microscopes
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B6/00—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings
    • G02B6/0001—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings specially adapted for lighting devices or systems
    • G02B6/0005—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings specially adapted for lighting devices or systems the light guides being of the fibre type
    • G02B6/0006—Coupling light into the fibre
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G01N21/645—Specially adapted constructive features of fluorimeters
    • G01N2021/6463—Optics
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G01N21/645—Specially adapted constructive features of fluorimeters
    • G01N2021/6484—Optical fibres
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G01N21/645—Specially adapted constructive features of fluorimeters
    • G01N21/6456—Spatial resolved fluorescence measurements; Imaging
    • G01N21/6458—Fluorescence microscopy
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G01N21/645—Specially adapted constructive features of fluorimeters
    • G01N21/648—Specially adapted constructive features of fluorimeters using evanescent coupling or surface plasmon coupling for the excitation of fluorescence
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/56—Optics using evanescent waves, i.e. inhomogeneous waves

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Microscoopes, Condenser (AREA)
JP2022065790A 2021-04-13 2022-04-12 斜め照明式顕微鏡システム Pending JP2022162999A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
GB2105232.9A GB2605793B (en) 2021-04-13 2021-04-13 Microscope system with oblique illumination
GB2105232.9 2021-04-13

Publications (2)

Publication Number Publication Date
JP2022162999A true JP2022162999A (ja) 2022-10-25
JP2022162999A5 JP2022162999A5 (enExample) 2025-04-15

Family

ID=75949391

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2022065790A Pending JP2022162999A (ja) 2021-04-13 2022-04-12 斜め照明式顕微鏡システム

Country Status (5)

Country Link
US (1) US20220326498A1 (enExample)
EP (1) EP4075181A1 (enExample)
JP (1) JP2022162999A (enExample)
CN (1) CN115202025A (enExample)
GB (1) GB2605793B (enExample)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2023057348A1 (en) * 2021-10-05 2023-04-13 Leica Microsystems Cms Gmbh Sample carrier and method for imaging a sample
CN114324436A (zh) * 2021-12-23 2022-04-12 江苏大学 一种微纳结构的激光加工与实时原位高分辨观测装置
US12422661B2 (en) * 2023-01-27 2025-09-23 POSTECH Research and Business Development Foundation Photographing apparatus and photographing method
CN119438158B (zh) * 2024-11-11 2025-11-18 湖北大学 一种基于物镜光轴偏离显微镜主光轴实现超分辨光学显微成像的方法

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102008034137A1 (de) * 2007-09-28 2009-04-02 Carl Zeiss Microlmaging Gmbh Mikroskop und Verfahren zum Betreiben eines Mikroskops
DE102009037366A1 (de) * 2009-08-13 2011-02-17 Carl Zeiss Microlmaging Gmbh Mikroskop, insbesondere zur Messung von Totalreflexions-Fluoreszenz, und Betriebsverfahren für ein solches
CN104246582A (zh) * 2012-04-20 2014-12-24 浜松光子学株式会社 光束整形装置
DE112013002113B4 (de) * 2012-04-20 2019-03-21 Hamamatsu Photonics K.K. Strahlformer
US9500847B2 (en) * 2012-10-12 2016-11-22 Spectral Applied Research Inc. Total internal reflectance fluorescence (TIRF) microscopy across multiple wavelengths simultaneously
LU92505B1 (de) * 2014-07-22 2016-01-25 Leica Microsystems Verfahren und vorrichtung zum mikroskopischen untersuchen einer probe
JP6540823B2 (ja) * 2015-11-27 2019-07-10 株式会社ニコン 顕微鏡、観察方法、及び制御プログラム
JP7112686B2 (ja) * 2018-07-18 2022-08-04 株式会社エビデント 標本観察装置
DE102018009056A1 (de) * 2018-11-12 2020-05-14 Carl Zeiss Microscopy Gmbh Beschleunigte Verfahren und Vorrichtungen für die dreidimensionale Mikroskopie mit strukturierter Beleuchtung
JP7261903B2 (ja) * 2019-05-06 2023-04-20 エーエスエムエル ネザーランズ ビー．ブイ． 暗視野顕微鏡
GB2585072B (en) * 2019-06-27 2024-01-24 Andor Tech Limited Radiation Delivery apparatus for microscope systems

Also Published As

Publication number Publication date
GB202105232D0 (en) 2021-05-26
GB2605793B (en) 2025-04-30
EP4075181A1 (en) 2022-10-19
US20220326498A1 (en) 2022-10-13
GB2605793A (en) 2022-10-19
CN115202025A (zh) 2022-10-18

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