JP2021189109A - センサ駆動回路 - Google Patents
センサ駆動回路 Download PDFInfo
- Publication number
- JP2021189109A JP2021189109A JP2020096948A JP2020096948A JP2021189109A JP 2021189109 A JP2021189109 A JP 2021189109A JP 2020096948 A JP2020096948 A JP 2020096948A JP 2020096948 A JP2020096948 A JP 2020096948A JP 2021189109 A JP2021189109 A JP 2021189109A
- Authority
- JP
- Japan
- Prior art keywords
- current
- sensor
- drive circuit
- coefficient
- temperature
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000003199 nucleic acid amplification method Methods 0.000 claims abstract description 39
- 230000003321 amplification Effects 0.000 claims abstract description 37
- 230000035945 sensitivity Effects 0.000 claims abstract description 4
- 238000009966 trimming Methods 0.000 claims description 15
- 238000004364 calculation method Methods 0.000 claims description 12
- 238000000034 method Methods 0.000 description 12
- 229910021420 polycrystalline silicon Inorganic materials 0.000 description 12
- 229920005591 polysilicon Polymers 0.000 description 12
- 230000008859 change Effects 0.000 description 5
- 238000010586 diagram Methods 0.000 description 5
- 230000008569 process Effects 0.000 description 3
- 238000006243 chemical reaction Methods 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 230000001133 acceleration Effects 0.000 description 1
- 230000003247 decreasing effect Effects 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 230000006870 function Effects 0.000 description 1
- 229920000515 polycarbonate Polymers 0.000 description 1
- 239000004417 polycarbonate Substances 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 238000004088 simulation Methods 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
- G01D3/00—Indicating or recording apparatus with provision for the special purposes referred to in the subgroups
- G01D3/028—Indicating or recording apparatus with provision for the special purposes referred to in the subgroups mitigating undesired influences, e.g. temperature, pressure
- G01D3/036—Indicating or recording apparatus with provision for the special purposes referred to in the subgroups mitigating undesired influences, e.g. temperature, pressure on measuring arrangements themselves
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K7/00—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements
- G01K7/16—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using resistive elements
- G01K7/18—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using resistive elements the element being a linear resistance, e.g. platinum resistance thermometer
- G01K7/20—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using resistive elements the element being a linear resistance, e.g. platinum resistance thermometer in a specially-adapted circuit, e.g. bridge circuit
- G01K7/21—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using resistive elements the element being a linear resistance, e.g. platinum resistance thermometer in a specially-adapted circuit, e.g. bridge circuit for modifying the output characteristic, e.g. linearising
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
- G01D3/00—Indicating or recording apparatus with provision for the special purposes referred to in the subgroups
- G01D3/028—Indicating or recording apparatus with provision for the special purposes referred to in the subgroups mitigating undesired influences, e.g. temperature, pressure
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K7/00—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements
- G01K7/16—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using resistive elements
- G01K7/18—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using resistive elements the element being a linear resistance, e.g. platinum resistance thermometer
- G01K7/20—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using resistive elements the element being a linear resistance, e.g. platinum resistance thermometer in a specially-adapted circuit, e.g. bridge circuit
- G01K7/206—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using resistive elements the element being a linear resistance, e.g. platinum resistance thermometer in a specially-adapted circuit, e.g. bridge circuit in a potentiometer circuit
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K7/00—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements
- G01K7/16—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using resistive elements
- G01K7/22—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using resistive elements the element being a non-linear resistance, e.g. thermistor
- G01K7/24—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using resistive elements the element being a non-linear resistance, e.g. thermistor in a specially-adapted circuit, e.g. bridge circuit
- G01K7/25—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using resistive elements the element being a non-linear resistance, e.g. thermistor in a specially-adapted circuit, e.g. bridge circuit for modifying the output characteristic, e.g. linearising
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
- G01L1/00—Measuring force or stress, in general
- G01L1/26—Auxiliary measures taken, or devices used, in connection with the measurement of force, e.g. for preventing influence of transverse components of force, for preventing overload
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
- G01L19/00—Details of, or accessories for, apparatus for measuring steady or quasi-steady pressure of a fluent medium insofar as such details or accessories are not special to particular types of pressure gauges
- G01L19/0092—Pressure sensor associated with other sensors, e.g. for measuring acceleration or temperature
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
- G01L19/00—Details of, or accessories for, apparatus for measuring steady or quasi-steady pressure of a fluent medium insofar as such details or accessories are not special to particular types of pressure gauges
- G01L19/04—Means for compensating for effects of changes of temperature, i.e. other than electric compensation
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
- G01L9/00—Measuring steady of quasi-steady pressure of fluid or fluent solid material by electric or magnetic pressure-sensitive elements; Transmitting or indicating the displacement of mechanical pressure-sensitive elements, used to measure the steady or quasi-steady pressure of a fluid or fluent solid material, by electric or magnetic means
- G01L9/02—Measuring steady of quasi-steady pressure of fluid or fluent solid material by electric or magnetic pressure-sensitive elements; Transmitting or indicating the displacement of mechanical pressure-sensitive elements, used to measure the steady or quasi-steady pressure of a fluid or fluent solid material, by electric or magnetic means by making use of variations in ohmic resistance, e.g. of potentiometers, electric circuits therefor, e.g. bridges, amplifiers or signal conditioning
- G01L9/06—Measuring steady of quasi-steady pressure of fluid or fluent solid material by electric or magnetic pressure-sensitive elements; Transmitting or indicating the displacement of mechanical pressure-sensitive elements, used to measure the steady or quasi-steady pressure of a fluid or fluent solid material, by electric or magnetic means by making use of variations in ohmic resistance, e.g. of potentiometers, electric circuits therefor, e.g. bridges, amplifiers or signal conditioning of piezo-resistive devices
- G01L9/065—Measuring steady of quasi-steady pressure of fluid or fluent solid material by electric or magnetic pressure-sensitive elements; Transmitting or indicating the displacement of mechanical pressure-sensitive elements, used to measure the steady or quasi-steady pressure of a fluid or fluent solid material, by electric or magnetic means by making use of variations in ohmic resistance, e.g. of potentiometers, electric circuits therefor, e.g. bridges, amplifiers or signal conditioning of piezo-resistive devices with temperature compensating means
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Nonlinear Science (AREA)
- Measuring Fluid Pressure (AREA)
Abstract
Description
図1は、第1実施形態に係るセンサ駆動回路100の回路構成を示す図である。図1に示すセンサ駆動回路100は、MEMS圧力センサ12を電流駆動することができる。特に、センサ駆動回路100は、MEMS圧力センサ12の駆動電流loutに対し、MEMS圧力センサ12のスパン電圧の温度特性と逆特性の温度特性(二次成分を含む)を持たせることにより、MEMS圧力センサ12のスパン電圧の温度特性の二次成分を打ち消すことができる。これにより、センサ駆動回路100は、温度によるMEMS圧力センサ12の出力誤差を高精度に補正することができる。図1に示す例では、MEMS圧力センサ12の検出信号(アナログ信号)は、A−Dコンバータ14へ供給され、A−Dコンバータ14によってデジタル信号に変換される。
次に、図2を参照して、第1実施形態に係るセンサ駆動回路100の一実施例を説明する。図2は、第1実施形態に係るセンサ駆動回路100によるMEMS圧力センサ12のスパン電圧の温度特性の補正結果の一例を示す図である。
・第1の電流源110の電圧V1に用いた定電圧:1.1V
・第1の電流源110のNMOSFET112のサイズ:W=2um, L=35um
・ポリシリコン抵抗122の抵抗値R2:86kΩ
・基準温度「25℃」において、駆動電流Ioutが「300uA」となるように、第1の定電流源140から出力される第1の定電流Icを調整した。
次に、図3を参照して、第2実施形態について説明する。図3は、第2実施形態に係るセンサ駆動回路100−2の回路構成を示す図である。以下、第2実施形態に係るセンサ駆動回路100−2に関し、第1実施形態に係るセンサ駆動回路100からの変更点について説明する。
次に、図4を参照して、第3実施形態について説明する。図4は、第3実施形態に係るセンサ駆動回路100−3の回路構成を示す図である。以下、第3実施形態に係るセンサ駆動回路100−3に関し、第1実施形態に係るセンサ駆動回路100からの変更点について説明する。
次に、図5を参照して、第4実施形態について説明する。図5は、第4実施形態に係るセンサ駆動回路100−4の回路構成を示す図である。以下、第4実施形態に係るセンサ駆動回路100−4に関し、第3実施形態に係るセンサ駆動回路100−3からの変更点について説明する。
14 A−Dコンバータ
100,100−2,100−3,100−4 センサ駆動回路
110,110−2 第1の電流源
111 バイポーラトランジスタ
112 NMOSFET(第1の抵抗)
113 ポリシリコン抵抗
120,120−2 第2の電流源
121 バイポーラトランジスタ
122 ポリシリコン抵抗(第2の抵抗)
123 NMOSFET
130 電流増幅部
140 第1の定電流源
142 第2の定電流源
150 トリミングブロック(トリミング部)
A 接続点(第1の電流演算部)
B 接続点(第2の電流演算部)
C 接続点
D 接続点
I1,I1a 第1の電流
I2,I2a 第2の電流
I3,I4 減算後電流
ITC,ITCa 第3の電流
ITC2,ITC3 第4の電流
ITC',ITCa',I4' 増幅後電流
Ic 第1の定電流
Ic2 第2の定電流
Iout 駆動電流
Claims (6)
- センサを電流で駆動するセンサ駆動回路であって、
前記センサの出力電圧の温度特性とは逆特性の温度特性を有する前記センサの駆動電流を生成する
ことを特徴とするセンサ駆動回路。 - 感度の温度特性の一次係数が負であり、二次係数が正である前記センサを電流で駆動する前記センサ駆動回路であって、
温度特性の一次係数が正であり、二次係数が負である第1の電流を生成する第1の電流源と、
温度特性の一次係数が負であり、二次係数が負である第2の電流を生成する第2の電流源と、
前記第1の電流と前記第2の電流とを加算して第3の電流を生成する第1の電流演算部と、
前記第3の電流を増幅して増幅後電流を生成する電流増幅部と、
温度補正された定電流を生成する定電流源と、
前記増幅後電流に前記定電流を加算して前記センサを駆動する駆動電流を生成する第2の電流演算部と
を備えることを特徴とする請求項1に記載のセンサ駆動回路。 - 前記駆動電流は、
前記センサの出力電圧の温度特性の一次係数および二次係数を打ち消す
ことを特徴とする請求項2に記載のセンサ駆動回路。 - 前記第1の電流をトリミング可能なトリミング部を備える
ことを特徴とする請求項2または3に記載のセンサ駆動回路。 - 前記増幅後電流をトリミング可能なトリミング部を備える
ことを特徴とする請求項2から4のいずれか一項に記載のセンサ駆動回路。 - 感度の温度特性の一次係数が負であり、二次係数が正である前記センサを電流で駆動する前記センサ駆動回路であって、
温度特性の一次係数が正であり、二次係数が正である第1の電流を生成する第1の電流源と、
温度特性の一次係数が負であり、二次係数が正である第2の電流を生成する第2の電流源と、
前記第1の電流と前記第2の電流とを加算して第3の電流を生成する第1の電流演算部と、
前記第3の電流を増幅して増幅後電流を生成する電流増幅部と、
温度補正された第1の定電流を生成する第1の定電流源と、
前記第1の定電流から前記増幅後電流を減算して減算後電流を生成する第2の電流演算部と
温度補正された第2の定電流を生成する第2の定電流源と、
前記減算後電流に前記第2の定電流を加算して前記センサを駆動する駆動電流を生成する第3の電流演算部と
を備えることを特徴とする請求項1に記載のセンサ駆動回路。
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2020096948A JP2021189109A (ja) | 2020-06-03 | 2020-06-03 | センサ駆動回路 |
CN202110478038.XA CN113758596A (zh) | 2020-06-03 | 2021-04-30 | 传感器驱动电路 |
US17/303,282 US11525751B2 (en) | 2020-06-03 | 2021-05-26 | Sensor drive circuit with improved temperature characteristic compensation |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2020096948A JP2021189109A (ja) | 2020-06-03 | 2020-06-03 | センサ駆動回路 |
Publications (1)
Publication Number | Publication Date |
---|---|
JP2021189109A true JP2021189109A (ja) | 2021-12-13 |
Family
ID=78786975
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2020096948A Pending JP2021189109A (ja) | 2020-06-03 | 2020-06-03 | センサ駆動回路 |
Country Status (3)
Country | Link |
---|---|
US (1) | US11525751B2 (ja) |
JP (1) | JP2021189109A (ja) |
CN (1) | CN113758596A (ja) |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH06289111A (ja) * | 1993-04-02 | 1994-10-18 | Stanley Electric Co Ltd | ホール素子の駆動回路 |
JPH09101211A (ja) | 1995-10-09 | 1997-04-15 | Hitachi Ltd | 半導体圧力センサのスパン電圧温度補償回路 |
JP3419274B2 (ja) * | 1997-10-03 | 2003-06-23 | 富士電機株式会社 | センサ出力補償回路 |
US6163202A (en) * | 1998-10-05 | 2000-12-19 | Lucent Technologies Inc. | Temperature compensation circuit for semiconductor switch and method of operation thereof |
JP2001091296A (ja) | 1999-09-21 | 2001-04-06 | Tokai Rika Co Ltd | 温度補償機能付センサ |
JP2001091387A (ja) | 1999-09-27 | 2001-04-06 | Matsushita Electric Works Ltd | 圧力センサ温度補償回路 |
KR100733407B1 (ko) * | 2005-06-30 | 2007-06-29 | 주식회사 하이닉스반도체 | 반도체 메모리 소자의 벌크 바이어스 전압 레벨 검출기 |
-
2020
- 2020-06-03 JP JP2020096948A patent/JP2021189109A/ja active Pending
-
2021
- 2021-04-30 CN CN202110478038.XA patent/CN113758596A/zh active Pending
- 2021-05-26 US US17/303,282 patent/US11525751B2/en active Active
Also Published As
Publication number | Publication date |
---|---|
US11525751B2 (en) | 2022-12-13 |
CN113758596A (zh) | 2021-12-07 |
US20210381917A1 (en) | 2021-12-09 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US10302509B2 (en) | Temperature sensing for integrated circuits | |
JP2928526B2 (ja) | 電源回路及び前記回路を備えるブリッジ型測定器出力補償回路 | |
JP2009014386A (ja) | 温度検出回路 | |
JPS6144360B2 (ja) | ||
JPS6331206A (ja) | 電荷増幅回路 | |
US8446141B1 (en) | Bandgap curvature correction circuit for compensating temperature dependent bandgap reference signal | |
JP3222367B2 (ja) | 温度測定回路 | |
JP3707281B2 (ja) | 圧力センサ回路 | |
US6101883A (en) | Semiconductor pressure sensor including a resistive element which compensates for the effects of temperature on a reference voltage and a pressure sensor | |
JP2021189109A (ja) | センサ駆動回路 | |
JP2001091387A (ja) | 圧力センサ温度補償回路 | |
US6335657B1 (en) | MOSFET amplifier circuit | |
JP3352006B2 (ja) | センサの温度補償回路 | |
JPWO2006057054A1 (ja) | 湿度計測装置 | |
JPS6255629B2 (ja) | ||
JPH1096675A (ja) | 温度補償回路及び温度補償方法 | |
US20240097632A1 (en) | Integrated circuit and semiconductor device | |
JP5003176B2 (ja) | 差動増幅回路 | |
RU2165602C2 (ru) | Полупроводниковый датчик давления | |
JPH0347525B2 (ja) | ||
KR100256979B1 (ko) | 신호 보상 회로 | |
JPH11142256A (ja) | パラレルオフセット補正センサ装置 | |
JP2000241202A (ja) | センサ装置 | |
JPH11237254A (ja) | 抵抗ブリッジ型センサの温度補償回路 | |
JP2565289B2 (ja) | 指数アンプ |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20230517 |
|
A977 | Report on retrieval |
Free format text: JAPANESE INTERMEDIATE CODE: A971007 Effective date: 20240228 |
|
A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20240305 |
|
A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20240424 |
|
A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 Effective date: 20240702 |