JP2021117232A5 - - Google Patents

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JP2021117232A5
JP2021117232A5 JP2021010501A JP2021010501A JP2021117232A5 JP 2021117232 A5 JP2021117232 A5 JP 2021117232A5 JP 2021010501 A JP2021010501 A JP 2021010501A JP 2021010501 A JP2021010501 A JP 2021010501A JP 2021117232 A5 JP2021117232 A5 JP 2021117232A5
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JP2021117232A (ja
JP7413293B2 (ja
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JP2021010501A 2020-01-27 2021-01-26 複数タイプの光を用いるビジョン検査のためのシステム及び方法 Active JP7413293B2 (ja)

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US202062966323P 2020-01-27 2020-01-27
US62/966,323 2020-01-27

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JP2021117232A JP2021117232A (ja) 2021-08-10
JP2021117232A5 true JP2021117232A5 (https=) 2023-04-28
JP7413293B2 JP7413293B2 (ja) 2024-01-15

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JP2021010501A Active JP7413293B2 (ja) 2020-01-27 2021-01-26 複数タイプの光を用いるビジョン検査のためのシステム及び方法

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US (1) US11651505B2 (https=)
EP (1) EP3855170B1 (https=)
JP (1) JP7413293B2 (https=)
KR (2) KR102558937B1 (https=)
CN (1) CN113256552A (https=)

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Publication number Priority date Publication date Assignee Title
JP7609075B2 (ja) * 2019-11-15 2025-01-07 ソニーグループ株式会社 情報処理装置および情報処理方法
US12372461B2 (en) * 2020-11-27 2025-07-29 Kabushiki Kaisha N-Tech Imaging device, inspection device, and imaging method
JP7686965B2 (ja) * 2020-12-24 2025-06-03 オムロン株式会社 検査システムおよび検査方法
WO2023039224A1 (en) * 2021-09-13 2023-03-16 Gemological Institute Of America, Inc. (Gia) Laser inscription for gemstones
US20250067660A1 (en) * 2022-03-02 2025-02-27 Cognex Corporation System and method for use of polarized light to image transparent materials applied to objects
JP2023140822A (ja) * 2022-03-23 2023-10-05 株式会社東芝 検査装置、検査方法及びプログラム
CN115265375A (zh) * 2022-08-02 2022-11-01 芯伏(北京)检测科技有限公司 一种采用单相机同时记录多个位移场光学干涉图像的方法
US20250046636A1 (en) * 2023-08-04 2025-02-06 Jun-Fu Technology Inc Robotic arm with vibration detection and image recognition
KR102819626B1 (ko) * 2024-03-12 2025-06-12 주식회사 슈텍 2차전지 엔드 플레이트 표면 검사기 및 그 방법

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DE50303239D1 (de) * 2002-09-23 2006-06-08 Tropf Hermann Erfassen und greifen von gegenst nden
US7285767B2 (en) * 2005-10-24 2007-10-23 General Electric Company Methods and apparatus for inspecting an object
US7760256B2 (en) 2007-05-31 2010-07-20 Panasonic Corporation Image processing apparatus that obtains color and polarization information
JP5365644B2 (ja) 2011-01-13 2013-12-11 オムロン株式会社 はんだ付け検査方法、およびはんだ付け検査機ならびに基板検査システム
KR101087180B1 (ko) * 2011-06-22 2011-11-28 동국대학교 경주캠퍼스 산학협력단 신뢰성 있는 금속 표면 ３차원 형상 추출 기법 및 시스템
WO2013044149A1 (en) * 2011-09-21 2013-03-28 Aptina Imaging Corporation Image sensors with multiple lenses of varying polarizations
US10498933B2 (en) * 2011-11-22 2019-12-03 Cognex Corporation Camera system with exchangeable illumination assembly
TWI482054B (zh) * 2012-03-15 2015-04-21 李文傑 具有多數個彩色光源的高解析度與高敏感度移動偵測器
JP6403445B2 (ja) 2014-06-09 2018-10-10 株式会社キーエンス 検査装置、検査方法およびプログラム
KR102223279B1 (ko) * 2014-07-08 2021-03-05 엘지전자 주식회사 측정장치 및 이를 구비하는 웨어러블 디바이스
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JP7238278B2 (ja) 2018-06-22 2023-03-14 カシオ計算機株式会社 診断支援装置
JP7447916B2 (ja) 2019-12-13 2024-03-12 ソニーグループ株式会社 撮像装置、情報処理装置、撮像方法、および情報処理方法

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