JP2021085725A - プローブ - Google Patents
プローブ Download PDFInfo
- Publication number
- JP2021085725A JP2021085725A JP2019213959A JP2019213959A JP2021085725A JP 2021085725 A JP2021085725 A JP 2021085725A JP 2019213959 A JP2019213959 A JP 2019213959A JP 2019213959 A JP2019213959 A JP 2019213959A JP 2021085725 A JP2021085725 A JP 2021085725A
- Authority
- JP
- Japan
- Prior art keywords
- coil spring
- barrel
- probe
- plunger
- outer diameter
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000000523 sample Substances 0.000 title claims abstract description 98
- 238000003780 insertion Methods 0.000 claims abstract description 24
- 230000037431 insertion Effects 0.000 claims abstract description 24
- 238000005259 measurement Methods 0.000 description 19
- 238000007689 inspection Methods 0.000 description 9
- 238000010586 diagram Methods 0.000 description 8
- 230000000052 comparative effect Effects 0.000 description 5
- 238000000034 method Methods 0.000 description 4
- 230000036316 preload Effects 0.000 description 4
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 description 3
- KDLHZDBZIXYQEI-UHFFFAOYSA-N Palladium Chemical compound [Pd] KDLHZDBZIXYQEI-UHFFFAOYSA-N 0.000 description 3
- 239000000463 material Substances 0.000 description 3
- 229910000881 Cu alloy Inorganic materials 0.000 description 2
- 230000002411 adverse Effects 0.000 description 2
- 239000004020 conductor Substances 0.000 description 2
- 239000010949 copper Substances 0.000 description 2
- 230000007423 decrease Effects 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 239000007769 metal material Substances 0.000 description 2
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 1
- 229910000990 Ni alloy Inorganic materials 0.000 description 1
- 229910000831 Steel Inorganic materials 0.000 description 1
- 229910045601 alloy Inorganic materials 0.000 description 1
- 239000000956 alloy Substances 0.000 description 1
- 239000000919 ceramic Substances 0.000 description 1
- 230000008602 contraction Effects 0.000 description 1
- 229910052802 copper Inorganic materials 0.000 description 1
- 238000002788 crimping Methods 0.000 description 1
- 230000014759 maintenance of location Effects 0.000 description 1
- 229910052759 nickel Inorganic materials 0.000 description 1
- 229910052763 palladium Inorganic materials 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 229910000679 solder Inorganic materials 0.000 description 1
- 229910001220 stainless steel Inorganic materials 0.000 description 1
- 239000010959 steel Substances 0.000 description 1
- 238000003466 welding Methods 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R11/00—Individual connecting elements providing two or more spaced connecting locations for conductive members which are, or may be, thereby interconnected, e.g. end pieces for wires or cables supported by the wire or cable and having means for facilitating electrical connection to some other wire, terminal, or conductive member, blocks of binding posts
- H01R11/11—End pieces or tapping pieces for wires, supported by the wire and for facilitating electrical connection to some other wire, terminal or conductive member
- H01R11/18—End pieces terminating in a probe
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
- G01R1/06716—Elastic
- G01R1/06722—Spring-loaded
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
- H01R13/02—Contact members
- H01R13/22—Contacts for co-operating by abutting
- H01R13/24—Contacts for co-operating by abutting resilient; resiliently-mounted
- H01R13/2407—Contacts for co-operating by abutting resilient; resiliently-mounted characterized by the resilient means
- H01R13/2421—Contacts for co-operating by abutting resilient; resiliently-mounted characterized by the resilient means using coil springs
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R2201/00—Connectors or connections adapted for particular applications
- H01R2201/20—Connectors or connections adapted for particular applications for testing or measuring purposes
Abstract
Description
S(i)=OD−i×(OD/n) ・・・(1)
このように、コイルばね40Aの摺動量が第1プランジャー側で大きいため、コイルばね40Aやバレル10Aの損傷が第1プランジャー側で生じる。
上記のように本発明は実施形態によって記載したが、この開示の一部をなす論述及び図面はこの発明を限定するものであると理解すべきではない。この開示から当業者には様々な代替実施形態、実施例及び運用技術が明らかとなろう。
10…バレル
20…第1プランジャー
21…基端部
30…第2プランジャー
40…コイルばね
211…挿入部
212…頭部
Claims (5)
- 管形状のバレルと、
前記バレルの一方の開口端から基端部が挿入され、先端が露出した状態で前記バレルの軸方向に沿って摺動する第1プランジャーと、
前記バレルの内部に配置され、前記第1プランジャーを前記バレルの軸方向に付勢するコイルばねとを備え、
前記第1プランジャーの基端部が、
前記コイルばねの一端から前記コイルばねの内側を延伸する挿入部と、
前記挿入部に連結し、前記コイルばねの外径よりも外径が大きく前記コイルばねの前記一端に当接する頭部とを有することを特徴とするプローブ。 - 前記バレルの他方の開口端から基端部が挿入され、先端が露出した状態で前記バレルに接合された第2プランジャーを更に備え、
前記コイルばねが、前記第1プランジャーと前記第2プランジャーを相互に離間する方向に付勢することを特徴とする請求項1に記載のプローブ。 - 前記挿入部の前記コイルばねの内側を延伸する長さが、測定対象物の測定時に掛けるオーバードライブ量の最大値以上であることを特徴とする請求項1又は2に記載のプローブ。
- 前記頭部の前記バレルの軸方向に沿った長さが、測定対象物の測定時に掛けるオーバードライブ量の最大値以上であることを特徴とする請求項1乃至3のいずれか1項に記載のプローブ。
- 前記コイルばねの内径と前記挿入部の外径のクリアランスが、前記バレルの内径と前記コイルばねの外径のクリアランスよりも小さいことを特徴とする請求項1乃至4のいずれか1項に記載のプローブ。
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2019213959A JP2021085725A (ja) | 2019-11-27 | 2019-11-27 | プローブ |
US16/950,721 US20210156885A1 (en) | 2019-11-27 | 2020-11-17 | Probe |
TW109140544A TWI804777B (zh) | 2019-11-27 | 2020-11-19 | 探針 |
CN202011330976.7A CN112858744A (zh) | 2019-11-27 | 2020-11-24 | 探针 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2019213959A JP2021085725A (ja) | 2019-11-27 | 2019-11-27 | プローブ |
Publications (1)
Publication Number | Publication Date |
---|---|
JP2021085725A true JP2021085725A (ja) | 2021-06-03 |
Family
ID=75973843
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2019213959A Pending JP2021085725A (ja) | 2019-11-27 | 2019-11-27 | プローブ |
Country Status (4)
Country | Link |
---|---|
US (1) | US20210156885A1 (ja) |
JP (1) | JP2021085725A (ja) |
CN (1) | CN112858744A (ja) |
TW (1) | TWI804777B (ja) |
Family Cites Families (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6377059B2 (en) * | 1999-02-19 | 2002-04-23 | Delaware Capital Formation, Inc. | Crown shaped contact barrel configuration for spring probe |
WO2006007440A1 (en) * | 2004-06-16 | 2006-01-19 | Rika Denshi America, Inc. | Electrical test probes, methods of making, and methods of using |
US20070018666A1 (en) * | 2005-07-22 | 2007-01-25 | Nasser Barabi | Spring contact pin for an IC chip tester |
JP5394264B2 (ja) * | 2008-02-14 | 2014-01-22 | 日本発條株式会社 | プローブユニット |
JP5624746B2 (ja) * | 2009-10-23 | 2014-11-12 | 株式会社ヨコオ | コンタクトプローブ及びソケット |
JP5782261B2 (ja) * | 2011-01-17 | 2015-09-24 | 株式会社ヨコオ | ソケット |
JP5847576B2 (ja) * | 2011-12-29 | 2016-01-27 | 株式会社エンプラス | プローブピン及び電気部品用ソケット |
JP2016008904A (ja) * | 2014-06-25 | 2016-01-18 | 株式会社ミタカ | コンタクトプローブ |
-
2019
- 2019-11-27 JP JP2019213959A patent/JP2021085725A/ja active Pending
-
2020
- 2020-11-17 US US16/950,721 patent/US20210156885A1/en not_active Abandoned
- 2020-11-19 TW TW109140544A patent/TWI804777B/zh active
- 2020-11-24 CN CN202011330976.7A patent/CN112858744A/zh active Pending
Also Published As
Publication number | Publication date |
---|---|
TWI804777B (zh) | 2023-06-11 |
US20210156885A1 (en) | 2021-05-27 |
CN112858744A (zh) | 2021-05-28 |
TW202120934A (zh) | 2021-06-01 |
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