JP2021060420A5 - - Google Patents

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Publication number
JP2021060420A5
JP2021060420A5 JP2021000650A JP2021000650A JP2021060420A5 JP 2021060420 A5 JP2021060420 A5 JP 2021060420A5 JP 2021000650 A JP2021000650 A JP 2021000650A JP 2021000650 A JP2021000650 A JP 2021000650A JP 2021060420 A5 JP2021060420 A5 JP 2021060420A5
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JP
Japan
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profile
surface profile
nominal
offset
measured
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JP2021000650A
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English (en)
Japanese (ja)
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JP2021060420A (ja
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Publication of JP2021060420A publication Critical patent/JP2021060420A/ja
Publication of JP2021060420A5 publication Critical patent/JP2021060420A5/ja
Priority to JP2023027890A priority Critical patent/JP2023078153A/ja
Pending legal-status Critical Current

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JP2021000650A 2014-11-11 2021-01-06 複製（製造）光学デバイスの品質を判断するためのシステム及び方法 Pending JP2021060420A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2023027890A JP2023078153A (ja) 2014-11-11 2023-02-27 複製（製造）光学デバイスの品質を判断するためのシステム及び方法

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US201462078310P 2014-11-11 2014-11-11
US62/078,310 2014-11-11

Related Parent Applications (1)

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JP2017543853A Division JP2018503100A (ja) 2014-11-11 2015-11-11 複製（製造）光学デバイスの品質を判断するためのシステム及び方法

Related Child Applications (1)

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JP2023027890A Division JP2023078153A (ja) 2014-11-11 2023-02-27 複製（製造）光学デバイスの品質を判断するためのシステム及び方法

Publications (2)

Publication Number Publication Date
JP2021060420A JP2021060420A (ja) 2021-04-15
JP2021060420A5 true JP2021060420A5 (https=) 2022-07-26

Family

ID=55955207

Family Applications (3)

Application Number Title Priority Date Filing Date
JP2017543853A Pending JP2018503100A (ja) 2014-11-11 2015-11-11 複製（製造）光学デバイスの品質を判断するためのシステム及び方法
JP2021000650A Pending JP2021060420A (ja) 2014-11-11 2021-01-06 複製（製造）光学デバイスの品質を判断するためのシステム及び方法
JP2023027890A Pending JP2023078153A (ja) 2014-11-11 2023-02-27 複製（製造）光学デバイスの品質を判断するためのシステム及び方法

Family Applications Before (1)

Application Number Title Priority Date Filing Date
JP2017543853A Pending JP2018503100A (ja) 2014-11-11 2015-11-11 複製（製造）光学デバイスの品質を判断するためのシステム及び方法

Family Applications After (1)

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JP2023027890A Pending JP2023078153A (ja) 2014-11-11 2023-02-27 複製（製造）光学デバイスの品質を判断するためのシステム及び方法

Country Status (10)

Country Link
US (2) US10352816B2 (https=)
EP (1) EP3218685B1 (https=)
JP (3) JP2018503100A (https=)
KR (1) KR20170080696A (https=)
CN (1) CN107110740B (https=)
ES (1) ES2887113T3 (https=)
HU (1) HUE055799T2 (https=)
SG (1) SG11201703751YA (https=)
TW (1) TWI679466B (https=)
WO (1) WO2016074034A2 (https=)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
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WO2016074034A2 (en) * 2014-11-11 2016-05-19 Brien Holden Vision Institute Systems and methods for determining the quality of a reproduced (manufactured) optic device
US10557773B2 (en) 2016-05-18 2020-02-11 Jand, Inc. Fixtureless lensmeter system
US10036685B2 (en) * 2016-05-18 2018-07-31 Jand, Inc. Fixtureless lensmeter and methods of operating same
US11488239B2 (en) 2019-08-26 2022-11-01 Warby Parker Inc. Virtual fitting systems and methods for spectacles
KR20230002738A (ko) 2020-04-15 2023-01-05 와비 파커 인코포레이티드 참조 프레임을 사용하는 안경용 가상 시착 시스템
US12108988B2 (en) 2020-06-17 2024-10-08 Warby Parker Inc. System and method for measuring pupillary distance and uses thereof

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EP1468580A1 (en) * 2002-01-21 2004-10-20 Siemens Mobile Communications S.p.A. Method and mobile station to perform the initial cell search in time slotted systems
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JP2007170888A (ja) * 2005-12-20 2007-07-05 Olympus Corp 光学素子検査装置
JP2007281003A (ja) * 2006-04-03 2007-10-25 Canon Inc 測定方法及び装置、並びに、露光装置
US7416300B2 (en) * 2006-05-25 2008-08-26 Coopervision International Holding Company, Lp Measurement of lenses and lens molds using optical coherence tomography
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WO2013119775A1 (en) * 2012-02-10 2013-08-15 Johnson & Johnson Vision Care, Inc. Method and apparatus for determining a thickness profile of an ophthalmic lens using a single point thickness and refractive index measurements
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WO2016074034A2 (en) * 2014-11-11 2016-05-19 Brien Holden Vision Institute Systems and methods for determining the quality of a reproduced (manufactured) optic device

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