JP2020535666A5 - - Google Patents

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Publication number
JP2020535666A5
JP2020535666A5 JP2020538754A JP2020538754A JP2020535666A5 JP 2020535666 A5 JP2020535666 A5 JP 2020535666A5 JP 2020538754 A JP2020538754 A JP 2020538754A JP 2020538754 A JP2020538754 A JP 2020538754A JP 2020535666 A5 JP2020535666 A5 JP 2020535666A5
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JP
Japan
Prior art keywords
processing system
substrate processing
injector assemblies
valve
pulse width
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Application number
JP2020538754A
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English (en)
Japanese (ja)
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JP2020535666A (ja
JP7421482B2 (ja
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Priority claimed from PCT/US2018/052246 external-priority patent/WO2019067323A1/en
Publication of JP2020535666A publication Critical patent/JP2020535666A/ja
Publication of JP2020535666A5 publication Critical patent/JP2020535666A5/ja
Priority to JP2024002916A priority Critical patent/JP7754960B2/ja
Application granted granted Critical
Publication of JP7421482B2 publication Critical patent/JP7421482B2/ja
Active legal-status Critical Current
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JP2020538754A 2017-09-26 2018-09-21 パルス幅変調されたドーズ制御のためのシステムおよび方法 Active JP7421482B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2024002916A JP7754960B2 (ja) 2017-09-26 2024-01-12 パルス幅変調されたドーズ制御のためのシステムおよび方法

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
US201762563129P 2017-09-26 2017-09-26
US62/563,129 2017-09-26
US201762590815P 2017-11-27 2017-11-27
US62/590,815 2017-11-27
PCT/US2018/052246 WO2019067323A1 (en) 2017-09-26 2018-09-21 DOSE CONTROL SYSTEMS AND METHODS MODULATED BY TIME PULSES

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP2024002916A Division JP7754960B2 (ja) 2017-09-26 2024-01-12 パルス幅変調されたドーズ制御のためのシステムおよび方法

Publications (3)

Publication Number Publication Date
JP2020535666A JP2020535666A (ja) 2020-12-03
JP2020535666A5 true JP2020535666A5 (https=) 2021-11-04
JP7421482B2 JP7421482B2 (ja) 2024-01-24

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ID=65903780

Family Applications (2)

Application Number Title Priority Date Filing Date
JP2020538754A Active JP7421482B2 (ja) 2017-09-26 2018-09-21 パルス幅変調されたドーズ制御のためのシステムおよび方法
JP2024002916A Active JP7754960B2 (ja) 2017-09-26 2024-01-12 パルス幅変調されたドーズ制御のためのシステムおよび方法

Family Applications After (1)

Application Number Title Priority Date Filing Date
JP2024002916A Active JP7754960B2 (ja) 2017-09-26 2024-01-12 パルス幅変調されたドーズ制御のためのシステムおよび方法

Country Status (8)

Country Link
US (4) US11542598B2 (https=)
EP (3) EP3688794B1 (https=)
JP (2) JP7421482B2 (https=)
KR (3) KR20250139892A (https=)
CN (2) CN111164743B (https=)
SG (1) SG11202002686YA (https=)
TW (3) TWI829651B (https=)
WO (1) WO2019067323A1 (https=)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111164743B (zh) 2017-09-26 2025-06-17 朗姆研究公司 用于脉宽调制的剂量控制的系统及方法
TW202318493A (zh) * 2021-07-07 2023-05-01 美商英福康公司 用於沉積和蝕刻腔室的上游過程監視
US20240203695A1 (en) * 2022-12-16 2024-06-20 Applied Materials, Inc. Fast gas switching
KR20250148210A (ko) 2024-04-05 2025-10-14 주식회사 엘지에너지솔루션 배터리 팩 및 이를 포함하는 자동차

Family Cites Families (29)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4761269A (en) * 1986-06-12 1988-08-02 Crystal Specialties, Inc. Apparatus for depositing material on a substrate
US6197123B1 (en) * 1997-12-18 2001-03-06 Texas Instruments Incorporated Method for cleaning a process chamber used for manufacturing substrates during nonproduction intervals
JP3830670B2 (ja) * 1998-09-03 2006-10-04 三菱電機株式会社 半導体製造装置
JP2002535122A (ja) * 1999-01-20 2002-10-22 マイクロリス・コーポレーション 流れコントローラ
US6143080A (en) * 1999-02-02 2000-11-07 Silicon Valley Group Thermal Systems Llc Wafer processing reactor having a gas flow control system and method
US6706541B1 (en) * 1999-10-20 2004-03-16 Advanced Micro Devices, Inc. Method and apparatus for controlling wafer uniformity using spatially resolved sensors
US20040224504A1 (en) * 2000-06-23 2004-11-11 Gadgil Prasad N. Apparatus and method for plasma enhanced monolayer processing
US6333272B1 (en) 2000-10-06 2001-12-25 Lam Research Corporation Gas distribution apparatus for semiconductor processing
US20030116089A1 (en) * 2001-12-04 2003-06-26 Walther Steven R. Plasma implantation system and method with target movement
US20030101935A1 (en) * 2001-12-04 2003-06-05 Walther Steven R. Dose uniformity control for plasma doping systems
US20040040502A1 (en) * 2002-08-29 2004-03-04 Micron Technology, Inc. Micromachines for delivering precursors and gases for film deposition
US20040040503A1 (en) * 2002-08-29 2004-03-04 Micron Technology, Inc. Micromachines for delivering precursors and gases for film deposition
US20040050325A1 (en) * 2002-09-12 2004-03-18 Samoilov Arkadii V. Apparatus and method for delivering process gas to a substrate processing system
US7628860B2 (en) * 2004-04-12 2009-12-08 Mks Instruments, Inc. Pulsed mass flow delivery system and method
JP4502189B2 (ja) * 2004-06-02 2010-07-14 ルネサスエレクトロニクス株式会社 薄膜の形成方法および半導体装置の製造方法
US7228645B2 (en) * 2005-01-11 2007-06-12 Xuyen Ngoc Pham Multi-zone shower head for drying single semiconductor substrate
JP2006253696A (ja) 2005-03-10 2006-09-21 Asm America Inc ガスインジェクタ制御システム
US7846497B2 (en) 2007-02-26 2010-12-07 Applied Materials, Inc. Method and apparatus for controlling gas flow to a processing chamber
US8486191B2 (en) * 2009-04-07 2013-07-16 Asm America, Inc. Substrate reactor with adjustable injectors for mixing gases within reaction chamber
US9303319B2 (en) * 2010-12-17 2016-04-05 Veeco Instruments Inc. Gas injection system for chemical vapor deposition using sequenced valves
US9840778B2 (en) * 2012-06-01 2017-12-12 Taiwan Semiconductor Manufacturing Company, Ltd. Plasma chamber having an upper electrode having controllable valves and a method of using the same
US9488315B2 (en) * 2013-03-15 2016-11-08 Applied Materials, Inc. Gas distribution apparatus for directional and proportional delivery of process gas to a process chamber
US9624805B2 (en) * 2014-08-26 2017-04-18 Caterpillar Inc. Aftertreatment system having dynamic independent injector control
JP6502779B2 (ja) * 2015-07-29 2019-04-17 東京エレクトロン株式会社 ガス供給系のバルブのリークを検査する方法
US20170092470A1 (en) * 2015-09-28 2017-03-30 Applied Materials, Inc. Plasma reactor for processing a workpiece with an array of plasma point sources
US10256075B2 (en) * 2016-01-22 2019-04-09 Applied Materials, Inc. Gas splitting by time average injection into different zones by fast gas valves
US10453721B2 (en) * 2016-03-15 2019-10-22 Applied Materials, Inc. Methods and assemblies for gas flow ratio control
US10403476B2 (en) 2016-11-09 2019-09-03 Lam Research Corporation Active showerhead
CN111164743B (zh) 2017-09-26 2025-06-17 朗姆研究公司 用于脉宽调制的剂量控制的系统及方法

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