JP2020514987A5 - - Google Patents

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Publication number
JP2020514987A5
JP2020514987A5 JP2019538349A JP2019538349A JP2020514987A5 JP 2020514987 A5 JP2020514987 A5 JP 2020514987A5 JP 2019538349 A JP2019538349 A JP 2019538349A JP 2019538349 A JP2019538349 A JP 2019538349A JP 2020514987 A5 JP2020514987 A5 JP 2020514987A5
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JP
Japan
Prior art keywords
controller
converter
source device
ray source
control signal
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JP2019538349A
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English (en)
Japanese (ja)
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JP7216650B2 (ja
JP2020514987A (ja
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Priority claimed from PCT/EP2018/051291 external-priority patent/WO2018134347A1/en
Publication of JP2020514987A publication Critical patent/JP2020514987A/ja
Publication of JP2020514987A5 publication Critical patent/JP2020514987A5/ja
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Publication of JP7216650B2 publication Critical patent/JP7216650B2/ja
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JP2019538349A 2017-01-19 2018-01-19 X線放射を生成するためのx線源装置 Active JP7216650B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
EP17152132 2017-01-19
EP17152132.1 2017-01-19
PCT/EP2018/051291 WO2018134347A1 (en) 2017-01-19 2018-01-19 X-ray source arrangement for generating x-ray radiation

Publications (3)

Publication Number Publication Date
JP2020514987A JP2020514987A (ja) 2020-05-21
JP2020514987A5 true JP2020514987A5 (https=) 2021-02-25
JP7216650B2 JP7216650B2 (ja) 2023-02-01

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Family Applications (1)

Application Number Title Priority Date Filing Date
JP2019538349A Active JP7216650B2 (ja) 2017-01-19 2018-01-19 X線放射を生成するためのx線源装置

Country Status (5)

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US (1) US10966307B2 (https=)
EP (1) EP3571898A1 (https=)
JP (1) JP7216650B2 (https=)
CN (1) CN110199575B (https=)
WO (1) WO2018134347A1 (https=)

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US10295485B2 (en) 2013-12-05 2019-05-21 Sigray, Inc. X-ray transmission spectrometer system
USRE48612E1 (en) 2013-10-31 2021-06-29 Sigray, Inc. X-ray interferometric imaging system
US10845491B2 (en) 2018-06-04 2020-11-24 Sigray, Inc. Energy-resolving x-ray detection system
GB2591630B (en) 2018-07-26 2023-05-24 Sigray Inc High brightness x-ray reflection source
US10656105B2 (en) 2018-08-06 2020-05-19 Sigray, Inc. Talbot-lau x-ray source and interferometric system
WO2020051061A1 (en) 2018-09-04 2020-03-12 Sigray, Inc. System and method for x-ray fluorescence with filtering
WO2020051221A2 (en) 2018-09-07 2020-03-12 Sigray, Inc. System and method for depth-selectable x-ray analysis
WO2021011209A1 (en) 2019-07-15 2021-01-21 Sigray, Inc. X-ray source with rotating anode at atmospheric pressure
DE102019213065A1 (de) * 2019-08-30 2021-03-04 Robert Bosch Gmbh Regelvorrichtung für einen Gleichspannungswandler, Gleichspannungswandler und Verfahren zur Regelung eines Gleichspannungswandlers
CN113056077B (zh) * 2019-12-27 2024-02-09 韩国威泰有限公司 X射线发生器
DE102020212085A1 (de) * 2020-09-25 2022-03-31 Siemens Healthcare Gmbh System zur Regelung einer Hochspannung für Röntgenanwendungen, ein Röntgenerzeugungssystem und ein Verfahren zur Regelung einer Hochspannung
DE112023000574B4 (de) 2022-01-13 2026-02-26 Sigray, Inc. Mikrofokus-röntgenquelle zur erzeugung von röntgenstrahlen mit hohem fluss und niedriger energie
WO2023168204A1 (en) 2022-03-02 2023-09-07 Sigray, Inc. X-ray fluorescence system and x-ray source with electrically insulative target material
CN119233509A (zh) * 2023-06-30 2024-12-31 上海联影医疗科技股份有限公司 一种用于高压发生器的控制装置和方法
US12181423B1 (en) 2023-09-07 2024-12-31 Sigray, Inc. Secondary image removal using high resolution x-ray transmission sources

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JP3736906B2 (ja) * 1996-06-13 2006-01-18 株式会社日立メディコ インバータ式x線高電圧装置
DE10123789A1 (de) 2001-05-16 2002-11-21 Philips Corp Intellectual Pty Stromversorgungssystem
DE10126256A1 (de) * 2001-05-29 2002-12-05 Philips Corp Intellectual Pty Stromversorgungssystem
US7448802B2 (en) * 2002-02-20 2008-11-11 Newton Scientific, Inc. Integrated X-ray source module
US7448801B2 (en) * 2002-02-20 2008-11-11 Inpho, Inc. Integrated X-ray source module
JP2004040995A (ja) * 2002-06-28 2004-02-05 Oce Technol Bv 負荷に供給される電力の制御方法及び制御装置
DE102004017180B4 (de) * 2004-04-07 2007-08-02 Siemens Ag Röntgendiagnostikeinrichtung zur digitalen Radiographie
CN103078510B (zh) * 2011-10-25 2015-11-25 通用电气公司 谐振电源、磁共振成像系统及控制方法
CN103971678B (zh) * 2013-01-29 2015-08-12 腾讯科技(深圳)有限公司 关键词检测方法和装置
EP2956954B1 (en) * 2013-02-13 2017-03-15 Koninklijke Philips N.V. Multiple x-ray beam tube
CN103414345B (zh) 2013-08-27 2015-11-11 东北大学 一种用于x射线管的负高压直流集成电源及其控制方法
US9119592B2 (en) * 2013-09-03 2015-09-01 General Electric Company Interleaved resonant converter
DE102014202954A1 (de) * 2014-02-18 2015-08-20 Siemens Aktiengesellschaft Verfahren zum Betrieb eines Resonanzwandlers und Resonanzwandler
WO2015173053A1 (en) * 2014-05-16 2015-11-19 Koninklijke Philips N.V. Resonant converter for high voltage generation and method for controlling a resonant converter
KR101487970B1 (ko) * 2014-07-21 2015-01-29 (주)디알젬 고주파 엑스선 발생장치
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