JP2020507776A - 対象物を分析するためのデバイス及び方法 - Google Patents
対象物を分析するためのデバイス及び方法 Download PDFInfo
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Abstract
Description
(1)砂利砂壁とそれに関連するスペクトル挙動、
(2)壁上で成長する有機物質(プランまたはコケ)とそれに関連するスペクトル挙動、
(3)レンガの壁とそれに関連するスペクトル挙動、
(4)鉄のフェンスとそれに関連するスペクトル挙動、
(5)白漆喰とそれに関連するスペクトル挙動、
(6)木製フレームの白いペンキとそれに関連するスペクトル挙動、
(7)パイプの金属雨とそれに関連するスペクトル挙動、
(8)屋根瓦(レンガまたはコンクリート)およびそれに関連するスペクトル挙動。
Claims (18)
- 建物、建築環境、及び/又は環境領域を含む対象物を分析するためのデバイスであって、
前記対象物の画像データ点を検出するための撮像手段と、
対象物データ点を取得するためにそれぞれの前記画像データ点に空間座標を割り当てるための割り当て手段と、
前記対象物データ点に基づいて、少なくとも前記対象物の材料特性を決定するための決定手段と
を備え、
前記決定のために少なくともスペクトルライブラリデータが使用され、前記スペクトルライブラリデータは、物理的、構成的、化学的及び/又は生物学的材料特性に対応する材料スペクトル特性の集合を含む、
デバイス。 - 前記材料特性は、前記対象物の劣化度を少なくとも含む、請求項1に記載のデバイス。
- 前記材料特性は、前記対象物の被覆度、汚染度及び/又は湿度を少なくとも含む、請求項1又は2に記載のデバイス。
- 前記スペクトルライブラリデータは、複数のそれぞれの材料の様々な空間的、時間的、大気的および照射的な条件および組成変動に関連する予め定められたスペクトル情報を含む、請求項1から3のいずれか一項に記載のデバイス。
- 前記対象物に関連する1又は複数のスペクトル特性が取得され、前記予め定められたスペクトル情報と比較され、前記対象物の材料特性は、取得された前記1又は複数のスペクトル特性と前記予め定められたスペクトル情報との間の適合性に基づいて決定される、請求項4に記載のデバイス。
- 前記対象物データ点は、予め定められた土地登記チャート及び/又はウェブマッピングサービスチャートの基準座標上にマッピングされる、請求項1から5のいずれか一項に記載のデバイス。
- マッピングされた前記対象物データ点(ボクセル)は、前記対象物の3次元モデルを生成するために利用され、前記対象物の前記3次元モデルは、前記予め定められた土地登記チャートの大きさに対してスケーリングされる、請求項6に記載のデバイス。
- 前記デバイスは、自律的及び/又は非自律的に移動する実在物によって構成される、請求項1から7のいずれか一項に記載のデバイス。
- 前記自律的及び/又は非自律的に移動する実在物は、空中輸送体及び/又は陸上ベースの輸送体である、請求項8に記載のデバイス。
- 前記撮像手段は、レーザースキャナ、光学カメラ、赤外線カメラ、撮像分光計、慣性測定ユニット、IPSセンサ及び/又はGPSセンサのうちの少なくとも1つを含む、請求項1から9のいずれか一項に記載のデバイス。
- 前記対象物データ点は、一組の3次元グラフィック情報ユニット(ボクセル)として表され、各3次元グラフィック情報ユニットは、それぞれの空間座標に関連するスペクトル、RGB、及び/又は熱データ情報を示す、請求項1から10のいずれか一項に記載のデバイス。
- 前記対象物データ点は、平面に投影され、前記対象物のそれぞれの幾何学的要素の識別は、前記平面におけるデータ点クラスタ密度分布の評価に基づく、請求項1から11のいずれか一項に記載のデバイス。
- 前記識別は、予め定められた密度閾値を超える密度のみを考慮することにより実現できる、請求項12に記載のデバイス。
- 前記平面を空間角度だけ回転させることにより、様々なデータ点クラスタ密度分布プロファイルが取得される、請求項12に記載のデバイス。
- 前記データ点クラスタ密度分布)から1又は複数の対象物面を識別し、
前記1又は複数の対象物面の外部輪郭を外挿し、
前記外部輪郭の特性線を抽出し、
前記特性線の幾何学的2次元特性を決定し、その密度に関係なく同じ特性を有するすべての特性線を抽出し、
一組の線形依存性2次元点を構築するために、決定された前記幾何学的2次元特性と比較して同じ範囲において幾何学的特性を有する領域を決定する
ように構成される、請求項12に記載のデバイス。 - 前記データ点クラスタ密度分布の評価は、前記対象物の3次元モデルの内部および外部の微細な構造及び/又は構成の生成を支援するために利用される、請求項12から15のいずれか一項に記載のデバイス。
- 建物、建築環境、及び/又は環境領域を含む対象物を分析する方法であって、
前記対象物の画像データ点を検出する段階と、
対象物データ点を取得するために、それぞれの前記画像データ点に空間座標を割り当てる段階と、
前記対象物データ点に基づいて、少なくとも前記対象物の材料特性を決定する段階であって、前記決定のために少なくともスペクトルライブラリデータが使用され、前記スペクトルライブラリデータには、物理的、構成的、化学的及び/又は生物学的材料特性に対応する材料スペクトル特性の集合を有する、段階と
を備える方法。 - 前記対象物データ点は、予め定められた土地登記チャート及び/又はウェブマッピングサービスチャートの基準座標にマッピングされ、前記マッピングされた対象物データ点は、前記対象物の3次元モデルを生成するために利用され、前記対象物の前記3次元モデルは予め定められたチャートの大きさに対してスケーリングされる、請求項17に記載の方法。
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EP17000215.8A EP3361235A1 (en) | 2017-02-10 | 2017-02-10 | Device and method for analysing objects |
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CN110678737A (zh) | 2020-01-10 |
CN110678737B (zh) | 2023-02-28 |
JP2022101552A (ja) | 2022-07-06 |
WO2018146279A1 (en) | 2018-08-16 |
JP7136422B2 (ja) | 2022-09-13 |
US20190371056A1 (en) | 2019-12-05 |
EP3580547A1 (en) | 2019-12-18 |
US11002669B2 (en) | 2021-05-11 |
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