JP2020503231A5 - - Google Patents
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- Publication number
- JP2020503231A5 JP2020503231A5 JP2019535251A JP2019535251A JP2020503231A5 JP 2020503231 A5 JP2020503231 A5 JP 2020503231A5 JP 2019535251 A JP2019535251 A JP 2019535251A JP 2019535251 A JP2019535251 A JP 2019535251A JP 2020503231 A5 JP2020503231 A5 JP 2020503231A5
- Authority
- JP
- Japan
- Prior art keywords
- silicon
- crucible
- gallium
- indium
- resistivity
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000000034 method Methods 0.000 claims 29
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 claims 19
- 229910052710 silicon Inorganic materials 0.000 claims 19
- 239000010703 silicon Substances 0.000 claims 19
- GYHNNYVSQQEPJS-UHFFFAOYSA-N Gallium Chemical compound [Ga] GYHNNYVSQQEPJS-UHFFFAOYSA-N 0.000 claims 11
- 229910052733 gallium Inorganic materials 0.000 claims 11
- 239000002019 doping agent Substances 0.000 claims 8
- 229910052738 indium Inorganic materials 0.000 claims 8
- APFVFJFRJDLVQX-UHFFFAOYSA-N indium atom Chemical compound [In] APFVFJFRJDLVQX-UHFFFAOYSA-N 0.000 claims 8
- 229910021420 polycrystalline silicon Inorganic materials 0.000 claims 6
- 229910045601 alloy Inorganic materials 0.000 claims 5
- 239000000956 alloy Substances 0.000 claims 5
- DGRIPWYWLYDWDO-UHFFFAOYSA-N [Si][In] Chemical compound [Si][In] DGRIPWYWLYDWDO-UHFFFAOYSA-N 0.000 claims 4
- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical group [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 claims 2
- 238000010438 heat treatment Methods 0.000 claims 2
- 229910021421 monocrystalline silicon Inorganic materials 0.000 claims 2
- 229910052698 phosphorus Inorganic materials 0.000 claims 2
- 239000011574 phosphorus Substances 0.000 claims 2
- 239000004065 semiconductor Substances 0.000 claims 2
- ZOXJGFHDIHLPTG-UHFFFAOYSA-N Boron Chemical compound [B] ZOXJGFHDIHLPTG-UHFFFAOYSA-N 0.000 claims 1
- 229910000807 Ga alloy Inorganic materials 0.000 claims 1
- 229910000846 In alloy Inorganic materials 0.000 claims 1
- 229910052796 boron Inorganic materials 0.000 claims 1
- 229920001296 polysiloxane Polymers 0.000 claims 1
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2022151550A JP2022180551A (ja) | 2016-12-28 | 2022-09-22 | 改善された抵抗率制御により単結晶シリコンインゴットを形成する方法 |
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US201662439743P | 2016-12-28 | 2016-12-28 | |
| US62/439,743 | 2016-12-28 | ||
| PCT/US2017/068632 WO2018125958A1 (en) | 2016-12-28 | 2017-12-28 | Methods for forming single crystal silicon ingots with improved resistivity control |
Related Child Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2022151550A Division JP2022180551A (ja) | 2016-12-28 | 2022-09-22 | 改善された抵抗率制御により単結晶シリコンインゴットを形成する方法 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2020503231A JP2020503231A (ja) | 2020-01-30 |
| JP2020503231A5 true JP2020503231A5 (enExample) | 2021-01-28 |
| JP7365900B2 JP7365900B2 (ja) | 2023-10-20 |
Family
ID=61007847
Family Applications (2)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2019535251A Active JP7365900B2 (ja) | 2016-12-28 | 2017-12-28 | 改善された抵抗率制御により単結晶シリコンインゴットを形成する方法 |
| JP2022151550A Withdrawn JP2022180551A (ja) | 2016-12-28 | 2022-09-22 | 改善された抵抗率制御により単結晶シリコンインゴットを形成する方法 |
Family Applications After (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2022151550A Withdrawn JP2022180551A (ja) | 2016-12-28 | 2022-09-22 | 改善された抵抗率制御により単結晶シリコンインゴットを形成する方法 |
Country Status (5)
| Country | Link |
|---|---|
| US (2) | US10920337B2 (enExample) |
| JP (2) | JP7365900B2 (enExample) |
| CN (1) | CN110382748B (enExample) |
| TW (1) | TWI745520B (enExample) |
| WO (1) | WO2018125958A1 (enExample) |
Families Citing this family (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US10793969B2 (en) | 2018-06-27 | 2020-10-06 | Globalwafers Co., Ltd. | Sample rod growth and resistivity measurement during single crystal silicon ingot production |
| US10781532B2 (en) | 2018-06-27 | 2020-09-22 | Globalwafers Co., Ltd. | Methods for determining the resistivity of a polycrystalline silicon melt |
| WO2020131458A1 (en) * | 2018-12-21 | 2020-06-25 | Globalwafers Co., Ltd. | Sample rod center slab resistivity measurement during single crystal silicon ingot production |
| US11739437B2 (en) | 2018-12-27 | 2023-08-29 | Globalwafers Co., Ltd. | Resistivity stabilization measurement of fat neck slabs for high resistivity and ultra-high resistivity single crystal silicon ingot growth |
| US11585010B2 (en) * | 2019-06-28 | 2023-02-21 | Globalwafers Co., Ltd. | Methods for producing a single crystal silicon ingot using boric acid as a dopant and ingot puller apparatus that use a solid-phase dopant |
| US20220359195A1 (en) * | 2021-05-05 | 2022-11-10 | Globalwafers Co., Ltd. | Methods for forming an epitaxial wafer |
| CN115341271A (zh) * | 2021-05-13 | 2022-11-15 | 内蒙古中环协鑫光伏材料有限公司 | 一种控制单晶电阻率轴向衰减速率的方法 |
| US20230112094A1 (en) * | 2021-10-11 | 2023-04-13 | Globalwafers Co., Ltd. | Modeling thermal donor formation and target resistivity for single crystal silicon ingot production |
| US12351938B2 (en) | 2022-02-10 | 2025-07-08 | Globalwafers Co., Ltd. | Methods for producing a product ingot having low oxygen content |
| CN114690643B (zh) * | 2022-05-31 | 2022-08-23 | 广东高景太阳能科技有限公司 | 基于掺镓单晶中镓含量的电阻率控制方法、系统及设备 |
| CN115233292A (zh) * | 2022-07-25 | 2022-10-25 | 北京麦竹吉科技有限公司 | 一种低电阻率硅单晶及其制备方法 |
Family Cites Families (17)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US2847544A (en) * | 1955-12-16 | 1958-08-12 | Gen Electric | Silicon semiconductive devices |
| DE3049376A1 (de) | 1980-12-29 | 1982-07-29 | Heliotronic Forschungs- und Entwicklungsgesellschaft für Solarzellen-Grundstoffe mbH, 8263 Burghausen | Verfahren zur herstellung vertikaler pn-uebergaenge beim ziehen von siliciumscheiben aus einer siliciumschmelze |
| JPH1029894A (ja) * | 1996-07-15 | 1998-02-03 | Hitachi Ltd | 単結晶シリコンの比抵抗調整方法および単結晶シリコン製造装置 |
| JP2002226295A (ja) | 2001-01-31 | 2002-08-14 | Shin Etsu Handotai Co Ltd | チョクラルスキー法によるシリコン単結晶製造工程の管理方法及びチョクラルスキー法による高抵抗シリコン単結晶の製造方法並びにシリコン単結晶 |
| US8021483B2 (en) * | 2002-02-20 | 2011-09-20 | Hemlock Semiconductor Corporation | Flowable chips and methods for the preparation and use of same, and apparatus for use in the methods |
| US7635414B2 (en) | 2003-11-03 | 2009-12-22 | Solaicx, Inc. | System for continuous growing of monocrystalline silicon |
| FR2929960B1 (fr) | 2008-04-11 | 2011-05-13 | Apollon Solar | Procede de fabrication de silicium cristallin de qualite photovoltaique par ajout d'impuretes dopantes |
| CN103249875B (zh) * | 2010-09-03 | 2016-10-12 | Gtatip控股有限责任公司 | 镓、铟、或铝掺杂单晶硅 |
| CN102181919B (zh) * | 2011-04-13 | 2012-12-26 | 天津市环欧半导体材料技术有限公司 | 一种控制直拉硅单晶头部电阻率的方法 |
| MY173316A (en) | 2011-04-14 | 2020-01-15 | Gtat Ip Holding Llc | Silicon ingot having uniform multiple dopants and method and apparats for producing same |
| CN102260900B (zh) | 2011-07-14 | 2013-11-27 | 西安华晶电子技术股份有限公司 | 提高单晶硅纵向电阻率一致性的装置及其处理工艺 |
| US20130047913A1 (en) * | 2011-08-29 | 2013-02-28 | Max Era, Inc. | Method and Apparatus for Doping by Lane in a Multi-Lane Sheet Wafer Furnace |
| JP5470349B2 (ja) * | 2011-10-17 | 2014-04-16 | ジルトロニック アクチエンゲゼルシャフト | ｐ型シリコン単結晶およびその製造方法 |
| JP2016503964A (ja) * | 2012-12-31 | 2016-02-08 | エムイーエムシー・エレクトロニック・マテリアルズ・ソシエタ・ペル・アチオニＭＥＭＣ Ｅｌｅｃｔｒｏｎｉｃ Ｍａｔｅｒｉａｌｓ， ＳｐＡ | インジウムドープシリコンウェハおよびそれを用いた太陽電池セル |
| JP6168011B2 (ja) * | 2014-08-19 | 2017-07-26 | 信越半導体株式会社 | 単結晶育成装置及びその装置を用いた単結晶育成方法 |
| JP6222013B2 (ja) | 2014-08-29 | 2017-11-01 | 信越半導体株式会社 | 抵抗率制御方法 |
| CN105887194A (zh) * | 2016-05-30 | 2016-08-24 | 上海超硅半导体有限公司 | 一种n型单晶硅的生长方法 |
-
2017
- 2017-12-27 US US15/855,466 patent/US10920337B2/en active Active
- 2017-12-28 CN CN201780080972.8A patent/CN110382748B/zh active Active
- 2017-12-28 TW TW106146322A patent/TWI745520B/zh active
- 2017-12-28 JP JP2019535251A patent/JP7365900B2/ja active Active
- 2017-12-28 WO PCT/US2017/068632 patent/WO2018125958A1/en not_active Ceased
-
2020
- 2020-10-15 US US17/071,714 patent/US12024789B2/en active Active
-
2022
- 2022-09-22 JP JP2022151550A patent/JP2022180551A/ja not_active Withdrawn
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