JP2020051965A - 破壊試験装置、及び破片回収方法 - Google Patents
破壊試験装置、及び破片回収方法 Download PDFInfo
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- JP2020051965A JP2020051965A JP2018183296A JP2018183296A JP2020051965A JP 2020051965 A JP2020051965 A JP 2020051965A JP 2018183296 A JP2018183296 A JP 2018183296A JP 2018183296 A JP2018183296 A JP 2018183296A JP 2020051965 A JP2020051965 A JP 2020051965A
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Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
- H01L22/10—Measuring as part of the manufacturing process
- H01L22/12—Measuring as part of the manufacturing process for structural parameters, e.g. thickness, line width, refractive index, temperature, warp, bond strength, defects, optical inspection, electrical measurement of structural dimensions, metallurgic measurement of diffusions
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67242—Apparatus for monitoring, sorting or marking
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N3/00—Investigating strength properties of solid materials by application of mechanical stress
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67092—Apparatus for mechanical treatment
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
- H01L21/67763—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations the wafers being stored in a carrier, involving loading and unloading
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
- H01L22/20—Sequence of activities consisting of a plurality of measurements, corrections, marking or sorting steps
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
- H01L22/30—Structural arrangements specially adapted for testing or measuring during manufacture or treatment, or specially adapted for reliability measurements
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2203/00—Investigating strength properties of solid materials by application of mechanical stress
- G01N2203/0058—Kind of property studied
- G01N2203/006—Crack, flaws, fracture or rupture
- G01N2203/0067—Fracture or rupture
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2018183296A JP7134567B2 (ja) | 2018-09-28 | 2018-09-28 | 破壊試験装置、及び破片回収方法 |
KR1020190102954A KR20200036729A (ko) | 2018-09-28 | 2019-08-22 | 파괴 시험 장치 및 파편 회수 방법 |
CN201910869125.0A CN110970316A (zh) | 2018-09-28 | 2019-09-16 | 破坏试验装置和碎片回收方法 |
TW108134530A TWI807105B (zh) | 2018-09-28 | 2019-09-25 | 破壞試驗裝置以及碎片回收方法 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2018183296A JP7134567B2 (ja) | 2018-09-28 | 2018-09-28 | 破壊試験装置、及び破片回収方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2020051965A true JP2020051965A (ja) | 2020-04-02 |
JP7134567B2 JP7134567B2 (ja) | 2022-09-12 |
Family
ID=69996830
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2018183296A Active JP7134567B2 (ja) | 2018-09-28 | 2018-09-28 | 破壊試験装置、及び破片回収方法 |
Country Status (4)
Country | Link |
---|---|
JP (1) | JP7134567B2 (zh) |
KR (1) | KR20200036729A (zh) |
CN (1) | CN110970316A (zh) |
TW (1) | TWI807105B (zh) |
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR102542402B1 (ko) * | 2023-04-14 | 2023-06-13 | 윤진성 | 샤르피 충격시험기 |
KR102626080B1 (ko) * | 2023-04-14 | 2024-01-16 | 윤진성 | 충격시험기용 시편 회수 장치 |
KR102627832B1 (ko) * | 2023-04-14 | 2024-01-19 | 윤진성 | 시편회수부를 가지는 충격시험기 |
KR102629626B1 (ko) * | 2023-04-14 | 2024-01-24 | 윤진성 | 시험기용 시편수집기 |
KR102633202B1 (ko) * | 2023-04-14 | 2024-02-01 | 윤진성 | 시편가열부를 가지는 충격시험기 |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN112833946B (zh) * | 2020-12-31 | 2022-07-15 | 深圳市展芯科技有限公司 | 一种芯片快速检测设备及快速检测方法 |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2003194688A (ja) * | 2001-12-26 | 2003-07-09 | Shimadzu Corp | 曲げ試験機 |
JP2011033376A (ja) * | 2009-07-30 | 2011-02-17 | Seiko Epson Corp | 試験装置、試験方法 |
WO2014171247A1 (ja) * | 2013-04-15 | 2014-10-23 | 旭硝子株式会社 | 曲げ試験方法、シート物の製造方法、曲げ試験装置、脆性シート、素子付き脆性シート、および電子デバイス |
Family Cites Families (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3012513B2 (ja) * | 1996-03-04 | 2000-02-21 | 山口日本電気株式会社 | 半導体装置の試験方法及び試験装置 |
JP4415893B2 (ja) * | 2005-04-05 | 2010-02-17 | 信越半導体株式会社 | 半導体ウエーハの機械的強度測定装置及び機械的強度測定方法 |
JP5954254B2 (ja) | 2013-05-13 | 2016-07-20 | 信越半導体株式会社 | 半導体ウェーハの評価システム及び評価方法 |
JP2015044633A (ja) * | 2013-08-27 | 2015-03-12 | 株式会社村田製作所 | チップ部品回収装置 |
-
2018
- 2018-09-28 JP JP2018183296A patent/JP7134567B2/ja active Active
-
2019
- 2019-08-22 KR KR1020190102954A patent/KR20200036729A/ko not_active Application Discontinuation
- 2019-09-16 CN CN201910869125.0A patent/CN110970316A/zh active Pending
- 2019-09-25 TW TW108134530A patent/TWI807105B/zh active
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2003194688A (ja) * | 2001-12-26 | 2003-07-09 | Shimadzu Corp | 曲げ試験機 |
JP2011033376A (ja) * | 2009-07-30 | 2011-02-17 | Seiko Epson Corp | 試験装置、試験方法 |
WO2014171247A1 (ja) * | 2013-04-15 | 2014-10-23 | 旭硝子株式会社 | 曲げ試験方法、シート物の製造方法、曲げ試験装置、脆性シート、素子付き脆性シート、および電子デバイス |
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR102542402B1 (ko) * | 2023-04-14 | 2023-06-13 | 윤진성 | 샤르피 충격시험기 |
KR102626080B1 (ko) * | 2023-04-14 | 2024-01-16 | 윤진성 | 충격시험기용 시편 회수 장치 |
KR102627832B1 (ko) * | 2023-04-14 | 2024-01-19 | 윤진성 | 시편회수부를 가지는 충격시험기 |
KR102629626B1 (ko) * | 2023-04-14 | 2024-01-24 | 윤진성 | 시험기용 시편수집기 |
KR102633202B1 (ko) * | 2023-04-14 | 2024-02-01 | 윤진성 | 시편가열부를 가지는 충격시험기 |
Also Published As
Publication number | Publication date |
---|---|
KR20200036729A (ko) | 2020-04-07 |
JP7134567B2 (ja) | 2022-09-12 |
CN110970316A (zh) | 2020-04-07 |
TWI807105B (zh) | 2023-07-01 |
TW202013547A (zh) | 2020-04-01 |
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