JP2019504498A - 磁場生成器 - Google Patents
磁場生成器 Download PDFInfo
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- JP2019504498A JP2019504498A JP2018536110A JP2018536110A JP2019504498A JP 2019504498 A JP2019504498 A JP 2019504498A JP 2018536110 A JP2018536110 A JP 2018536110A JP 2018536110 A JP2018536110 A JP 2018536110A JP 2019504498 A JP2019504498 A JP 2019504498A
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- polar
- coil
- arm
- generator
- magnetic field
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01F—MAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES
- H01F7/00—Magnets
- H01F7/06—Electromagnets; Actuators including electromagnets
- H01F7/20—Electromagnets; Actuators including electromagnets without armatures
- H01F7/202—Electromagnets for high magnetic field strength
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01F—MAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES
- H01F7/00—Magnets
- H01F7/06—Electromagnets; Actuators including electromagnets
- H01F7/20—Electromagnets; Actuators including electromagnets without armatures
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/12—Measuring magnetic properties of articles or specimens of solids or fluids
- G01R33/1207—Testing individual magnetic storage devices, e.g. records carriers or digital storage elements
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/02—Detection or location of defective auxiliary circuits, e.g. defective refresh counters
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/50—Marginal testing, e.g. race, voltage or current testing
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
- G11C29/56016—Apparatus features
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01F—MAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES
- H01F27/00—Details of transformers or inductances, in general
- H01F27/28—Coils; Windings; Conductive connections
- H01F27/2823—Wires
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01F—MAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES
- H01F7/00—Magnets
- H01F7/06—Electromagnets; Actuators including electromagnets
- H01F7/064—Circuit arrangements for actuating electromagnets
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/50—Marginal testing, e.g. race, voltage or current testing
- G11C2029/5002—Characteristic
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/50—Marginal testing, e.g. race, voltage or current testing
- G11C2029/5006—Current
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
- G11C2029/5602—Interface to device under test
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/50—Marginal testing, e.g. race, voltage or current testing
- G11C29/50008—Marginal testing, e.g. race, voltage or current testing of impedance
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N50/00—Galvanomagnetic devices
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- Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Hall/Mr Elements (AREA)
- Mram Or Spin Memory Techniques (AREA)
- Measuring Magnetic Variables (AREA)
- Particle Accelerators (AREA)
- Magnetic Treatment Devices (AREA)
Abstract
Description
Claims (10)
- 水平面(29、100)の上方に配置される、垂直軸(Z)の第1極性端部(37、90)と、
前記水平面上に対称に配置される、少なくとも2つの第2極性端部(28A〜28D、102、102’)と、を備える磁気回路を有する、方向を調整可能な磁場の生成器であって、
前記生成器は、更に、
2つの極性端部を接続するそれぞれの磁気回路部分が少なくとも1つのコイルの内部を通過するように配置されるコイル(50A〜50D、52A、52B、82)であって、設定可能な強度および選択された方向の電流を伝導するように構成される回路に接続されるように適合するコイルを備える、生成器。 - 隣接する第2極性端部の対のそれぞれの極性端部(28A〜28D、102、102’)は、前記垂直軸(Z)を含む面に関して対称に配置される平行な垂直面(40A〜40D、42A〜42D、104、104’)を有する、請求項1に記載の生成器。
- 前記第1極性端部(37、90)は、前記水平面(29、100)の上方に、0.5〜5mmの範囲の高さ(H)において配置される円形下側表面(38、92)を有する切断された円錐の形状を有する、請求項1または2に記載の生成器。
- 前記垂直軸を含む2つの直交面に関して対称な4つの第2極性端部(28A〜28D)を備える、請求項1〜3のいずれか一項に記載の生成器。
- それぞれの極性端部は、フレーム(22)に接続されるアーム(26、36)の端部にある、請求項4に記載の生成器。
- それぞれの第2極性端部(28A〜28D)に繋がる前記アーム(26)は、コイル(50A〜50D)により包囲されるバー(24)を水平方向に延長する、請求項5に記載の生成器。
- 前記第1極性端部(37)に繋がる前記アーム(36)は、前記フレーム(22)の相対する側の中央に接続される水平ロッド(32)に接続され、コイル(52A、52B)は、前記水平ロッドのそれぞれの半分の周りに配置される、請求項5または6に記載の生成器。
- 前記第1極性端部(37)に繋がる前記アーム(36)は、コイルにより包囲される、請求項6または7に記載の生成器。
- 2つの第2極性端部(102、102’)を備え、前記第1極性端部および前記第2極性端部(90、102、102’)のそれぞれは、ロッド(84)に接続されるアームの端部(88、96、96’)にあり、前記第1極性端部に繋がる前記アーム(88)は、前記ロッドの中心に接続され、コイル(82)は、前記ロッドのそれぞれの半分の周りに配置される、請求項1〜3のいずれか一項に記載の生成器。
- 前記第1極性端部(90)に繋がる前記アーム(88)は、コイルにより包囲される、請求項9に記載の生成器。
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2021184934A JP2022027765A (ja) | 2016-01-11 | 2021-11-12 | 磁場生成器 |
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR1650184 | 2016-01-11 | ||
FR1650184A FR3046695B1 (fr) | 2016-01-11 | 2016-01-11 | Generateur de champ magnetique |
PCT/FR2017/050034 WO2017121947A1 (fr) | 2016-01-11 | 2017-01-05 | Generateur de champ magnetique |
Related Child Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2021184934A Division JP2022027765A (ja) | 2016-01-11 | 2021-11-12 | 磁場生成器 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2019504498A true JP2019504498A (ja) | 2019-02-14 |
JP7028779B2 JP7028779B2 (ja) | 2022-03-02 |
Family
ID=56084157
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JP2018536110A Active JP7028779B2 (ja) | 2016-01-11 | 2017-01-05 | 磁場生成器 |
JP2021184934A Pending JP2022027765A (ja) | 2016-01-11 | 2021-11-12 | 磁場生成器 |
Family Applications After (1)
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JP2021184934A Pending JP2022027765A (ja) | 2016-01-11 | 2021-11-12 | 磁場生成器 |
Country Status (11)
Country | Link |
---|---|
US (1) | US11139099B2 (ja) |
EP (1) | EP3403268B1 (ja) |
JP (2) | JP7028779B2 (ja) |
KR (1) | KR20180101388A (ja) |
CN (1) | CN108885932B (ja) |
ES (1) | ES2839499T3 (ja) |
FR (1) | FR3046695B1 (ja) |
PT (1) | PT3403268T (ja) |
SG (1) | SG11201805850SA (ja) |
TW (1) | TWI685864B (ja) |
WO (1) | WO2017121947A1 (ja) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2021132191A (ja) * | 2020-02-21 | 2021-09-09 | 株式会社東栄科学産業 | 電磁石、磁場印加システム |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR102079024B1 (ko) | 2018-10-25 | 2020-04-07 | 한국기초과학지원연구원 | 자기장스테이션, 인서트어셈블리, 마운트어셈블리 및 이들을 포함하는 2축자기형성장비 |
CN111508683B (zh) * | 2020-04-26 | 2022-07-05 | 南方科技大学 | 一种磁场产生系统 |
CN111952035B (zh) * | 2020-07-14 | 2022-03-08 | 中国科学院电工研究所 | 一种摆动磁场发生装置及其控制方法 |
FR3119240B3 (fr) | 2021-01-28 | 2023-02-10 | Hprobe | Système de test électrique de plaquette de circuits intégrés sous champ magnétique |
FR3130067B1 (fr) * | 2021-12-07 | 2023-12-29 | Hprobe | Système de génération de champ magnétique |
Citations (3)
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JPS62279504A (ja) * | 1986-05-28 | 1987-12-04 | Sony Corp | 高周波変調磁界発生装置 |
JP2003069111A (ja) * | 2001-08-23 | 2003-03-07 | Daido Steel Co Ltd | 磁気抵抗素子の感応特性評価装置 |
JP2010212453A (ja) * | 2009-03-10 | 2010-09-24 | Toei Scientific Industrial Co Ltd | 電磁石、磁場印加装置および磁場印加システム |
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JPS609693A (ja) * | 1983-06-28 | 1985-01-18 | 梅谷 陽二 | 多自由度アクチエ−タ |
US5539366A (en) | 1994-07-27 | 1996-07-23 | General Electric Company | Magnet having contoured pole faces for magnetic field homogeneity |
JPH08264604A (ja) * | 1995-01-25 | 1996-10-11 | Hitachi Ltd | 電子回路装置の製造方法 |
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EP3149503A4 (en) * | 2014-06-02 | 2018-01-03 | Monash University | Magnetic circuit for producing a concentrated magnetic field |
-
2016
- 2016-01-11 FR FR1650184A patent/FR3046695B1/fr active Active
-
2017
- 2017-01-05 US US16/069,079 patent/US11139099B2/en active Active
- 2017-01-05 WO PCT/FR2017/050034 patent/WO2017121947A1/fr active Application Filing
- 2017-01-05 PT PT177116993T patent/PT3403268T/pt unknown
- 2017-01-05 KR KR1020187019833A patent/KR20180101388A/ko not_active Application Discontinuation
- 2017-01-05 JP JP2018536110A patent/JP7028779B2/ja active Active
- 2017-01-05 ES ES17711699T patent/ES2839499T3/es active Active
- 2017-01-05 CN CN201780006165.1A patent/CN108885932B/zh active Active
- 2017-01-05 SG SG11201805850SA patent/SG11201805850SA/en unknown
- 2017-01-05 EP EP17711699.3A patent/EP3403268B1/fr active Active
- 2017-01-06 TW TW106100381A patent/TWI685864B/zh active
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2021
- 2021-11-12 JP JP2021184934A patent/JP2022027765A/ja active Pending
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
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JPS62279504A (ja) * | 1986-05-28 | 1987-12-04 | Sony Corp | 高周波変調磁界発生装置 |
JP2003069111A (ja) * | 2001-08-23 | 2003-03-07 | Daido Steel Co Ltd | 磁気抵抗素子の感応特性評価装置 |
JP2010212453A (ja) * | 2009-03-10 | 2010-09-24 | Toei Scientific Industrial Co Ltd | 電磁石、磁場印加装置および磁場印加システム |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2021132191A (ja) * | 2020-02-21 | 2021-09-09 | 株式会社東栄科学産業 | 電磁石、磁場印加システム |
Also Published As
Publication number | Publication date |
---|---|
JP2022027765A (ja) | 2022-02-14 |
US20190027291A1 (en) | 2019-01-24 |
EP3403268A1 (fr) | 2018-11-21 |
KR20180101388A (ko) | 2018-09-12 |
WO2017121947A1 (fr) | 2017-07-20 |
JP7028779B2 (ja) | 2022-03-02 |
SG11201805850SA (en) | 2018-08-30 |
CN108885932B (zh) | 2022-04-01 |
TWI685864B (zh) | 2020-02-21 |
EP3403268B1 (fr) | 2020-11-18 |
FR3046695B1 (fr) | 2018-05-11 |
CN108885932A (zh) | 2018-11-23 |
TW201801103A (zh) | 2018-01-01 |
FR3046695A1 (fr) | 2017-07-14 |
US11139099B2 (en) | 2021-10-05 |
ES2839499T3 (es) | 2021-07-05 |
PT3403268T (pt) | 2021-01-22 |
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