JP2022027765A - 磁場生成器 - Google Patents
磁場生成器 Download PDFInfo
- Publication number
- JP2022027765A JP2022027765A JP2021184934A JP2021184934A JP2022027765A JP 2022027765 A JP2022027765 A JP 2022027765A JP 2021184934 A JP2021184934 A JP 2021184934A JP 2021184934 A JP2021184934 A JP 2021184934A JP 2022027765 A JP2022027765 A JP 2022027765A
- Authority
- JP
- Japan
- Prior art keywords
- polar
- coil
- arm
- generator
- magnetic field
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 230000005291 magnetic effect Effects 0.000 title claims abstract description 88
- 238000012360 testing method Methods 0.000 description 12
- 239000000523 sample Substances 0.000 description 6
- 241000238876 Acari Species 0.000 description 5
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 5
- 230000006698 induction Effects 0.000 description 4
- 230000004048 modification Effects 0.000 description 4
- 238000012986 modification Methods 0.000 description 4
- 229910052710 silicon Inorganic materials 0.000 description 4
- 239000010703 silicon Substances 0.000 description 4
- 238000013459 approach Methods 0.000 description 3
- 230000004907 flux Effects 0.000 description 3
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 2
- XEEYBQQBJWHFJM-UHFFFAOYSA-N Iron Chemical compound [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 239000002184 metal Substances 0.000 description 2
- 229910052751 metal Inorganic materials 0.000 description 2
- 230000003287 optical effect Effects 0.000 description 2
- 239000012141 concentrate Substances 0.000 description 1
- 229910052802 copper Inorganic materials 0.000 description 1
- 239000010949 copper Substances 0.000 description 1
- 239000003302 ferromagnetic material Substances 0.000 description 1
- 230000006872 improvement Effects 0.000 description 1
- 229910052742 iron Inorganic materials 0.000 description 1
- 230000001902 propagating effect Effects 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01F—MAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES
- H01F7/00—Magnets
- H01F7/06—Electromagnets; Actuators including electromagnets
- H01F7/20—Electromagnets; Actuators including electromagnets without armatures
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/12—Measuring magnetic properties of articles or specimens of solids or fluids
- G01R33/1207—Testing individual magnetic storage devices, e.g. records carriers or digital storage elements
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/02—Detection or location of defective auxiliary circuits, e.g. defective refresh counters
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/50—Marginal testing, e.g. race, voltage or current testing
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
- G11C29/56016—Apparatus features
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01F—MAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES
- H01F27/00—Details of transformers or inductances, in general
- H01F27/28—Coils; Windings; Conductive connections
- H01F27/2823—Wires
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01F—MAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES
- H01F7/00—Magnets
- H01F7/06—Electromagnets; Actuators including electromagnets
- H01F7/064—Circuit arrangements for actuating electromagnets
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01F—MAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES
- H01F7/00—Magnets
- H01F7/06—Electromagnets; Actuators including electromagnets
- H01F7/20—Electromagnets; Actuators including electromagnets without armatures
- H01F7/202—Electromagnets for high magnetic field strength
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/50—Marginal testing, e.g. race, voltage or current testing
- G11C2029/5002—Characteristic
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/50—Marginal testing, e.g. race, voltage or current testing
- G11C2029/5006—Current
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
- G11C2029/5602—Interface to device under test
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/50—Marginal testing, e.g. race, voltage or current testing
- G11C29/50008—Marginal testing, e.g. race, voltage or current testing of impedance
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N50/00—Galvanomagnetic devices
Landscapes
- Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Hall/Mr Elements (AREA)
- Mram Or Spin Memory Techniques (AREA)
- Particle Accelerators (AREA)
- Magnetic Treatment Devices (AREA)
- Measuring Magnetic Variables (AREA)
Abstract
Description
Claims (10)
- 水平面(29、100)の上方に配置される、垂直軸(Z)の第1極性端部(37、90)と、
前記水平面上に対称に配置される、少なくとも2つの第2極性端部(28A~28D、102、102’)と、を備える磁気回路を有する、方向を調整可能な磁場の生成器であって、
前記生成器は、更に、
2つの極性端部を接続するそれぞれの磁気回路部分が少なくとも1つのコイルの内部を通過するように配置されるコイル(50A~50D、52A、52B、82)であって、設定可能な強度および選択された方向の電流を伝導するように構成される回路に接続されるように適合するコイルを備える、生成器。 - 隣接する第2極性端部の対のそれぞれの極性端部(28A~28D、102、102’)は、前記垂直軸(Z)を含む面に関して対称に配置される平行な垂直面(40A~40D、42A~42D、104、104’)を有する、請求項1に記載の生成器。
- 前記第1極性端部(37、90)は、前記水平面(29、100)の上方に、0.5~5mmの範囲の高さ(H)において配置される円形下側表面(38、92)を有する切断された円錐の形状を有する、請求項1または2に記載の生成器。
- 前記垂直軸を含む2つの直交面に関して対称な4つの第2極性端部(28A~28D)を備える、請求項1~3のいずれか一項に記載の生成器。
- それぞれの極性端部は、フレーム(22)に接続されるアーム(26、36)の端部にある、請求項4に記載の生成器。
- それぞれの第2極性端部(28A~28D)に繋がる前記アーム(26)は、コイル(50A~50D)により包囲されるバー(24)を水平方向に延長する、請求項5に記載の生成器。
- 前記第1極性端部(37)に繋がる前記アーム(36)は、前記フレーム(22)の相対する側の中央に接続される水平ロッド(32)に接続され、コイル(52A、52B)は、前記水平ロッドのそれぞれの半分の周りに配置される、請求項5または6に記載の生成器。
- 前記第1極性端部(37)に繋がる前記アーム(36)は、コイルにより包囲される、請求項6または7に記載の生成器。
- 2つの第2極性端部(102、102’)を備え、前記第1極性端部および前記第2極性端部(90、102、102’)のそれぞれは、ロッド(84)に接続されるアームの端部(88、96、96’)にあり、前記第1極性端部に繋がる前記アーム(88)は、前記ロッドの中心に接続され、コイル(82)は、前記ロッドのそれぞれの半分の周りに配置される、請求項1~3のいずれか一項に記載の生成器。
- 前記第1極性端部(90)に繋がる前記アーム(88)は、コイルにより包囲される、請求項9に記載の生成器。
Applications Claiming Priority (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR1650184A FR3046695B1 (fr) | 2016-01-11 | 2016-01-11 | Generateur de champ magnetique |
FR1650184 | 2016-01-11 | ||
PCT/FR2017/050034 WO2017121947A1 (fr) | 2016-01-11 | 2017-01-05 | Generateur de champ magnetique |
JP2018536110A JP7028779B2 (ja) | 2016-01-11 | 2017-01-05 | 磁場生成器 |
Related Parent Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2018536110A Division JP7028779B2 (ja) | 2016-01-11 | 2017-01-05 | 磁場生成器 |
Publications (1)
Publication Number | Publication Date |
---|---|
JP2022027765A true JP2022027765A (ja) | 2022-02-14 |
Family
ID=56084157
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2018536110A Active JP7028779B2 (ja) | 2016-01-11 | 2017-01-05 | 磁場生成器 |
JP2021184934A Pending JP2022027765A (ja) | 2016-01-11 | 2021-11-12 | 磁場生成器 |
Family Applications Before (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2018536110A Active JP7028779B2 (ja) | 2016-01-11 | 2017-01-05 | 磁場生成器 |
Country Status (11)
Country | Link |
---|---|
US (1) | US11139099B2 (ja) |
EP (1) | EP3403268B1 (ja) |
JP (2) | JP7028779B2 (ja) |
KR (1) | KR20180101388A (ja) |
CN (1) | CN108885932B (ja) |
ES (1) | ES2839499T3 (ja) |
FR (1) | FR3046695B1 (ja) |
PT (1) | PT3403268T (ja) |
SG (1) | SG11201805850SA (ja) |
TW (1) | TWI685864B (ja) |
WO (1) | WO2017121947A1 (ja) |
Families Citing this family (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR102079024B1 (ko) | 2018-10-25 | 2020-04-07 | 한국기초과학지원연구원 | 자기장스테이션, 인서트어셈블리, 마운트어셈블리 및 이들을 포함하는 2축자기형성장비 |
JP6892161B1 (ja) * | 2020-02-21 | 2021-06-23 | 株式会社東栄科学産業 | 電磁石、磁場印加システム |
CN111508683B (zh) * | 2020-04-26 | 2022-07-05 | 南方科技大学 | 一种磁场产生系统 |
CN111952035B (zh) * | 2020-07-14 | 2022-03-08 | 中国科学院电工研究所 | 一种摆动磁场发生装置及其控制方法 |
WO2022161674A1 (fr) | 2021-01-28 | 2022-08-04 | Hprobe | Systeme de test electrique de plaquette de circuits integres sous champ magnetique |
FR3130067B1 (fr) * | 2021-12-07 | 2023-12-29 | Hprobe | Système de génération de champ magnétique |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS609693A (ja) * | 1983-06-28 | 1985-01-18 | 梅谷 陽二 | 多自由度アクチエ−タ |
JP2003069111A (ja) * | 2001-08-23 | 2003-03-07 | Daido Steel Co Ltd | 磁気抵抗素子の感応特性評価装置 |
US20060049823A1 (en) * | 2004-07-09 | 2006-03-09 | Takashi Suzuki | Probe card and method for testing magnetic sensor |
JP2011146618A (ja) * | 2010-01-18 | 2011-07-28 | Tohoku Tokushuko Kk | 磁気抵抗評価装置 |
Family Cites Families (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US2380197A (en) * | 1943-12-30 | 1945-07-10 | Westinghouse Electric Corp | Double-loop four-pole directional element |
US3930212A (en) * | 1968-12-25 | 1975-12-30 | Inst Fiz An Latvssr | Method of orienting electrically conductive bodies, preferably non-magnetic ones, in a magnetic field and apparatus for performing same |
JPS62279504A (ja) * | 1986-05-28 | 1987-12-04 | Sony Corp | 高周波変調磁界発生装置 |
US5539366A (en) * | 1994-07-27 | 1996-07-23 | General Electric Company | Magnet having contoured pole faces for magnetic field homogeneity |
JPH08264604A (ja) * | 1995-01-25 | 1996-10-11 | Hitachi Ltd | 電子回路装置の製造方法 |
US7764020B2 (en) * | 2006-07-20 | 2010-07-27 | Barnett Larry R | Electro-permanent magnet for power microwave tubes |
US7719295B2 (en) * | 2007-01-31 | 2010-05-18 | International Business Machines Corporation | Method and apparatus for implementing IC device testing with improved SPQL, reliability and yield performance |
DE102008020445A1 (de) * | 2008-04-23 | 2009-10-29 | Gsi Helmholtzzentrum Für Schwerionenforschung Gmbh | Magnetfelderzeugungsvorrichtung |
JP4761483B2 (ja) * | 2009-03-10 | 2011-08-31 | 株式会社東栄科学産業 | 電磁石、磁場印加装置および磁場印加システム |
GB201006656D0 (en) | 2010-04-21 | 2010-06-09 | Foulds Stephen A L | Apparatus and method for reducing the magnetic field strength in the vicinity of a weld zone in high magnetic field environments to facilitate arc welding |
CN103365101B (zh) * | 2012-04-01 | 2015-04-08 | 中国科学院物理研究所 | 一种纳米图形化系统及其磁场施加装置 |
DE102014003536A1 (de) * | 2014-03-13 | 2015-09-17 | Forschungszentrum Jülich GmbH Fachbereich Patente | Supraleitender Magnetfeldstabilisator |
CA2985822A1 (en) * | 2014-06-02 | 2015-12-10 | Monash University | Magnetic circuit for producing a concentrated magnetic field |
-
2016
- 2016-01-11 FR FR1650184A patent/FR3046695B1/fr active Active
-
2017
- 2017-01-05 US US16/069,079 patent/US11139099B2/en active Active
- 2017-01-05 ES ES17711699T patent/ES2839499T3/es active Active
- 2017-01-05 KR KR1020187019833A patent/KR20180101388A/ko not_active Application Discontinuation
- 2017-01-05 SG SG11201805850SA patent/SG11201805850SA/en unknown
- 2017-01-05 JP JP2018536110A patent/JP7028779B2/ja active Active
- 2017-01-05 EP EP17711699.3A patent/EP3403268B1/fr active Active
- 2017-01-05 PT PT177116993T patent/PT3403268T/pt unknown
- 2017-01-05 CN CN201780006165.1A patent/CN108885932B/zh active Active
- 2017-01-05 WO PCT/FR2017/050034 patent/WO2017121947A1/fr active Application Filing
- 2017-01-06 TW TW106100381A patent/TWI685864B/zh active
-
2021
- 2021-11-12 JP JP2021184934A patent/JP2022027765A/ja active Pending
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS609693A (ja) * | 1983-06-28 | 1985-01-18 | 梅谷 陽二 | 多自由度アクチエ−タ |
JP2003069111A (ja) * | 2001-08-23 | 2003-03-07 | Daido Steel Co Ltd | 磁気抵抗素子の感応特性評価装置 |
US20060049823A1 (en) * | 2004-07-09 | 2006-03-09 | Takashi Suzuki | Probe card and method for testing magnetic sensor |
JP2011146618A (ja) * | 2010-01-18 | 2011-07-28 | Tohoku Tokushuko Kk | 磁気抵抗評価装置 |
Also Published As
Publication number | Publication date |
---|---|
JP7028779B2 (ja) | 2022-03-02 |
TW201801103A (zh) | 2018-01-01 |
JP2019504498A (ja) | 2019-02-14 |
ES2839499T3 (es) | 2021-07-05 |
TWI685864B (zh) | 2020-02-21 |
US11139099B2 (en) | 2021-10-05 |
WO2017121947A1 (fr) | 2017-07-20 |
FR3046695B1 (fr) | 2018-05-11 |
KR20180101388A (ko) | 2018-09-12 |
US20190027291A1 (en) | 2019-01-24 |
EP3403268A1 (fr) | 2018-11-21 |
PT3403268T (pt) | 2021-01-22 |
EP3403268B1 (fr) | 2020-11-18 |
CN108885932A (zh) | 2018-11-23 |
SG11201805850SA (en) | 2018-08-30 |
FR3046695A1 (fr) | 2017-07-14 |
CN108885932B (zh) | 2022-04-01 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JP7028779B2 (ja) | 磁場生成器 | |
US9952294B2 (en) | Lattice configurations of polyhedral component magnets | |
Krishnapriya et al. | Significance of non-spiral planar microcoils over spiral coils for biomedical applications: Design, simulation and comparison with spiral coil | |
US9927507B2 (en) | Gradient magnetic field coil device and magnetic resonance imaging device | |
CN110879345B (zh) | 用于测试磁性器件的设备和系统 | |
US6181227B1 (en) | Magnet coil with parallel conductor paths | |
JP5403828B2 (ja) | 被検査体の磁化装置、磁粉探傷装置 | |
JP2011131009A (ja) | 磁気共鳴イメージング装置 | |
Janssen et al. | High-performance moving-coil actuators with double-sided PM arrays: A design comparison | |
JP3377822B2 (ja) | 磁気共鳴イメージング装置 | |
Donghua et al. | Eddy current damping suppression of air-core monopole linear motor for nanopositioning system | |
JP5660660B2 (ja) | 磁気抵抗評価装置 | |
JP5465803B2 (ja) | 被検査体の磁化装置の調整方法 | |
JPS5873850A (ja) | 磁界発生用装置およびその製造方法 | |
JP7447883B2 (ja) | 検査装置および磁気センサの検査方法 | |
Vicci | A 3D magnetic force manipulator dc prototype | |
JP4393176B2 (ja) | 超電導磁石装置 | |
US6674284B2 (en) | Magnetic resonance apparatus having a horizontal basic magnetic field | |
JP2016506852A (ja) | 単一の厚いループを用いた磁気共有イメージング | |
JP2011072433A (ja) | 磁気共鳴イメージング装置 | |
Nomura et al. | Analysis of radially unbalanced magnetic force acting on a large superconducting magnet with iron yoke by'TOSCA' | |
JPH1176198A (ja) | 傾斜磁場コイル | |
Janssen et al. | Design of an Ironless Voice Coil Actuator With a Rectangular Coil and Quasi-Halbach Magnetization | |
Pereirinha et al. | Computational Electromagnetics in an Electromagnetic Laboratory | |
ITTO20110290A1 (it) | Complesso magnetico aperto a tre facce attive, particolarmente per la formazione di immagini per risonanza magnetica. |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20211210 |
|
A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20211210 |
|
A977 | Report on retrieval |
Free format text: JAPANESE INTERMEDIATE CODE: A971007 Effective date: 20230119 |
|
A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20230131 |
|
A02 | Decision of refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A02 Effective date: 20230905 |