JP2019504315A5 - - Google Patents

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Publication number
JP2019504315A5
JP2019504315A5 JP2018534555A JP2018534555A JP2019504315A5 JP 2019504315 A5 JP2019504315 A5 JP 2019504315A5 JP 2018534555 A JP2018534555 A JP 2018534555A JP 2018534555 A JP2018534555 A JP 2018534555A JP 2019504315 A5 JP2019504315 A5 JP 2019504315A5
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JP
Japan
Prior art keywords
fluorometer
carrier
assay device
item
fluorescent surface
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JP2018534555A
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English (en)
Japanese (ja)
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JP2019504315A (ja
JP6845858B2 (ja
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Priority claimed from PCT/US2016/068384 external-priority patent/WO2017117011A1/en
Publication of JP2019504315A publication Critical patent/JP2019504315A/ja
Publication of JP2019504315A5 publication Critical patent/JP2019504315A5/ja
Priority to JP2020150320A priority Critical patent/JP7320480B2/ja
Application granted granted Critical
Publication of JP6845858B2 publication Critical patent/JP6845858B2/ja
Priority to JP2022069401A priority patent/JP2022093423A/ja
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JP2018534555A 2015-12-31 2016-12-22 サンプルを分析し、光信号検出器の性能を監視するシステム及び方法 Active JP6845858B2 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2020150320A JP7320480B2 (ja) 2015-12-31 2020-09-08 サンプルを分析し、光信号検出器の性能を監視するシステム及び方法
JP2022069401A JP2022093423A (ja) 2015-12-31 2022-04-20 サンプルを分析し、光信号検出器の性能を監視するシステム及び方法

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US201562274027P 2015-12-31 2015-12-31
US62/274,027 2015-12-31
PCT/US2016/068384 WO2017117011A1 (en) 2015-12-31 2016-12-22 Systems and methods for analyzing a sample and for monitoring the performance of an optical signal detector

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP2020150320A Division JP7320480B2 (ja) 2015-12-31 2020-09-08 サンプルを分析し、光信号検出器の性能を監視するシステム及び方法

Publications (3)

Publication Number Publication Date
JP2019504315A JP2019504315A (ja) 2019-02-14
JP2019504315A5 true JP2019504315A5 (enExample) 2019-12-12
JP6845858B2 JP6845858B2 (ja) 2021-03-24

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ID=57777757

Family Applications (3)

Application Number Title Priority Date Filing Date
JP2018534555A Active JP6845858B2 (ja) 2015-12-31 2016-12-22 サンプルを分析し、光信号検出器の性能を監視するシステム及び方法
JP2020150320A Active JP7320480B2 (ja) 2015-12-31 2020-09-08 サンプルを分析し、光信号検出器の性能を監視するシステム及び方法
JP2022069401A Withdrawn JP2022093423A (ja) 2015-12-31 2022-04-20 サンプルを分析し、光信号検出器の性能を監視するシステム及び方法

Family Applications After (2)

Application Number Title Priority Date Filing Date
JP2020150320A Active JP7320480B2 (ja) 2015-12-31 2020-09-08 サンプルを分析し、光信号検出器の性能を監視するシステム及び方法
JP2022069401A Withdrawn JP2022093423A (ja) 2015-12-31 2022-04-20 サンプルを分析し、光信号検出器の性能を監視するシステム及び方法

Country Status (7)

Country Link
US (4) US10190984B2 (enExample)
EP (2) EP3764079B1 (enExample)
JP (3) JP6845858B2 (enExample)
CN (1) CN108369180B (enExample)
AU (3) AU2016380168B2 (enExample)
CA (1) CA3008891C (enExample)
WO (1) WO2017117011A1 (enExample)

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EP3764079B1 (en) 2015-12-31 2023-08-09 Gen-Probe Incorporated System and method for monitoring the performance of an optical signal detector
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GB202001397D0 (en) * 2020-01-31 2020-03-18 Odx Innovations Ltd Apparatus, system and method for measuring properties of a sample
US20230107314A1 (en) * 2020-03-17 2023-04-06 Hitachi High-Tech Corporation Automatic analyzer
CN113567690B (zh) * 2020-04-28 2024-10-01 深圳迎凯生物科技有限公司 孵育组件、孵育装置和自动分析装置
CN116601482A (zh) * 2020-12-21 2023-08-15 恩德莱斯和豪瑟尔分析仪表两合公司 用于测量测量介质中发光分析物的光化学传感器和方法
US20250155460A1 (en) * 2022-02-14 2025-05-15 Hitachi High-Tech Corporation Parts Anomaly Detection System, Automatic Analyzer and Parts Anomaly Detection Method
US20240329212A1 (en) * 2023-03-27 2024-10-03 Rosemount Aerospace Inc. Optical imaging device degradation check

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JP6244556B2 (ja) * 2012-04-25 2017-12-13 パナソニックIpマネジメント株式会社 試料保持担体およびそれを用いた蛍光検出装置
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EP3764079B1 (en) 2015-12-31 2023-08-09 Gen-Probe Incorporated System and method for monitoring the performance of an optical signal detector

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