JP2019211366A - 分析用閾値生成装置及び分析用閾値生成方法 - Google Patents
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Abstract
Description
まず、第1実施形態に係る分析用閾値生成装置及び分析用閾値生成方法について詳細に説明する。
VHa=VHi(VLcp/VLci) (3)
Vtha=Vthi(VLcp/VLci) (4)
次に、第2実施形態に係る分析用閾値生成装置100及び分析用閾値生成方法について詳細に説明する。なお、第1実施形態と同一の構成には同一符号を付し、重複する説明は省略する。
13 検出対象物質、
14 粒子、
25 光ピックアップ、
25b 照射光、
33 パルス判定部、
34 パルス計数部、
41 閾値演算部、
46 閾値補正部、
100 分析用閾値生成装置、
JS 受光レベル信号
Claims (6)
- 検出対象物質と前記検出対象物質に結合する粒子とが表面に固定された分析用基板に照射光を照射し、前記照射光による前記分析用基板からの反射光を受光して受光レベル信号を生成する光ピックアップと、
前記受光レベル信号に含まれるパルスのパルス幅について一対の閾値、または前記パルスのパルス振幅について一対の閾値を生成する閾値演算部と、
前記パルス幅がパルス幅についての一対の閾値の範囲内に存在するかを判定するか、または前記パルス振幅がパルス振幅についての一対の閾値の範囲内に存在するかを判定するパルス判定部と、
前記パルス判定部が前記生成された一対の閾値の範囲内に存在すると判定したパルスを計数し、前記計数したパルスの計数値を出力するパルス計数部と、
前記閾値演算部が生成した一対の閾値と、前記パルス計数部が出力した計数値と、に基づいて、分析に用いる一対の閾値を生成する閾値補正部と、
を備え、
前記閾値演算部は、前記パルス計数部がパルスを計数するごとに、前記一対の閾値のうちの少なくとも一方の閾値を変化させた新たな一対の閾値を、所定の値に至るまで繰り返し生成することを特徴とする分析用閾値生成装置。 - 前記閾値補正部は、前記生成された各一対の閾値を階級とし、前記パルス計数部が出力した前記計数値を度数とした度数分布に基づいて、前記分析に用いる一対の閾値を生成する請求項1に記載の分析用閾値生成装置。
- 前記閾値補正部は、前記度数分布が最頻値をとる階級の値に基づいて、前記分析に用いる一対の閾値を生成する請求項2に記載の分析用閾値生成装置。
- 前記度数分布はヒストグラムであり、前記閾値補正部は前記ヒストグラムの積分値に基づいて前記分析に用いる一対の閾値を生成する請求項2に記載の分析用閾値生成装置。
- 前記閾値補正部は分析条件と関連付けて前記分析に用いる一対の閾値を記憶部に記憶させる請求項1〜4のいずれか1項に記載の分析用閾値生成装置。
- 検出対象物質と前記検出対象物質に結合する粒子とが表面に固定された分析用基板に照射光を照射する照射ステップと、
前記照射光による前記分析用基板からの反射光を受光して受光レベル信号を生成する信号生成ステップと、
前記受光レベル信号に含まれるパルスが、パルス幅について設定された一対の閾値、または前記パルスがパルス振幅について設定された一対の閾値の範囲内に存在するかを判定する判定ステップと、
前記判定ステップにおいて、前記設定された一対の閾値の範囲内に存在すると判定されたパルスを計数し、前記計数したパルスの計数値を出力する計数値出力ステップと、
前記計数値出力ステップにおいてパルスを計数するごとに、前記一対の閾値のうちの少なくとも一方の閾値を変化させた新たな一対の閾値を、所定の値に至るまで繰り返し生成する第一閾値生成ステップと、
生成された各一対の閾値と前記計数値出力ステップで出力された計数値とに基づいて、分析に用いる一対の閾値を生成する第二閾値生成ステップと、
を含む分析用閾値生成方法。
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EP19814025.3A EP3805734A4 (en) | 2018-06-06 | 2019-05-21 | ANALYTICAL THRESHOLD GENERATION DEVICE AND ANALYTICAL THRESHOLD GENERATION PROCESS |
PCT/JP2019/020060 WO2019235208A1 (ja) | 2018-06-06 | 2019-05-21 | 分析用閾値生成装置及び分析用閾値生成方法 |
CN201980037369.0A CN112219107B (zh) | 2018-06-06 | 2019-05-21 | 分析用阈值生成装置以及分析用阈值生成方法 |
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WO2021166713A1 (ja) | 2020-02-17 | 2021-08-26 | 株式会社Jvcケンウッド | 生体試料分析方法 |
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WO2021166713A1 (ja) | 2020-02-17 | 2021-08-26 | 株式会社Jvcケンウッド | 生体試料分析方法 |
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