JP2019106360A - プロトン伝導体および膜電極接合体 - Google Patents
プロトン伝導体および膜電極接合体 Download PDFInfo
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Abstract
Description
本発明者らは、上記した従来のプロトン伝導体に関して鋭意検討を行った。その結果、以下の知見を得た。
(膜電極接合体の構成)
本発明の実施の形態に係る膜電極接合体10について、図1を参照して説明する。図1は、本発明の実施の形態1に係る膜電極接合体10の構成を模式的に示す図である。膜電極接合体10は、電気化学デバイスを構成するために用いられる部材であり、図1に示すように、電極11と、固体電解質膜12とを備え、電極11と固体電解質膜12とが接した構造となっている。換言すると、膜電極接合体10は、固体電解質膜12の一方の側面側で電極11と接しており、両者を積層させた構造となっている。なお、電気化学デバイスとしては、例えば、燃料電池、ガスセンサ、水素ポンプ、または水電解装置等が挙げられる。
次に、図2を参照して実施の形態に係る電極11または固体電解質膜12に含まれるプロトン伝導体の合成処理について説明する。図2は、実施の形態に係るプロトン伝導体の合成処理の一例を示すフローチャートである。
まず、Niの固溶限界を調べるために、上記した合成処理により作成した、組成式が、BaZr0.65Yb0.2Ni0.15O3−δおよびBaZr0.6Yb0.2Ni0.2O3−δとなるプロトン伝導体を準備した。そして、これらプロトン伝導体について、X線構造解析により、結晶構造解析の分析を行った。X線構造解析測定はRigaku製のX線回折装置を用いて行った。X線構造解析測定の結果を図3および図4を用いて説明する。図3は、本発明の実施の形態に係るBaZr0.65Yb0.2Ni0.15O3−δの還元処理後のX線構造解析測定結果を示すグラフである。図4は、本発明の実施の形態に係るBaZr0.6Yb0.2Ni0.2O3−δの還元処理後のX線構造解析測定結果を示すグラフである。図3および図4の横軸は回折角(2θ°)であり、縦軸は強度を示す。
を行った。以下、プロトン伝導率評価について以下に説明する。
まず、上記した「合成処理」により得られた焼結体をディスク状に加工し、表面を3μm砥粒のラッピングフィルムシートで表面を研磨する評価サンプルを作製した。得られたディスク状のサンプルにスクリーン印刷によってAgペースト(田中貴金属工業製)を塗布し、900℃で1時間焼成した。
11 電極
12 固体電解質膜
Claims (7)
- 組成式がBaaZr1−x−yYbxNiyO3−δ(0.95≦a≦1.05,0.1≦x≦0.4,0.15≦y≦0.30)であるプロトン伝導体。
- Niを固溶限界まで含む、請求項1に記載のプロトン伝導体。
- 前記aは、0.95≦a≦1.00である、請求項1に記載のプロトン伝導体。
- 前記yは、0.20≦y≦0.30である、請求項1に記載のプロトン伝導体。
- 請求項1に記載のプロトン伝導体を含む固体電解質膜と、
前記固体電解質膜と接する、少なくともNiを含む電極と、を備える膜電極接合体。 - 前記固体電解質膜は、NiOを含む請求項5に記載の膜電極接合体。
- 前記電極は、組成式がBaaZr1−x−yYbxNiyO3−δ(0.95≦a≦1.05,0.1≦x≦0.4,0.15≦y≦0.30)であるプロトン伝導体を含む請求項5または6に記載の膜電極接合体。
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WO2021140817A1 (ja) * | 2020-01-07 | 2021-07-15 | パナソニックIpマネジメント株式会社 | 電解質膜、膜電極接合体、電気化学セル、電解質膜の製造方法 |
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JP2009231075A (ja) * | 2008-03-24 | 2009-10-08 | Toyota Central R&D Labs Inc | ペロブスカイト型複合酸化物薄膜 |
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